Uploaded byDeb Ahlgren
Ot Tech Site Ahlgren
The document discusses the ongoing transformation in the semiconductor industry, focusing on test operations optimization, adaptive test proliferation, and the need for chipmakers to adapt to increasing complexity in design and manufacturing costs. It highlights an evolved fabless manufacturing model and the importance of real-time data analysis for improving yield and reliability in production. Key strategies include enhancing overall equipment efficiency, reducing test times, and increasing product quality to meet market demands.
Ot Tech Site Ahlgren
- 1. Test Operations Optimization &Adaptive Test Proliferation Debbora Ahlgren 14th-July-2010 TechSite
- 2. Industry Transformation Industry Transformation Vertically Integrated Horizontal Structure Assembly & Test (SATs) Fabless Design Houses Customer Fulfillment 3rd Party Designers Foundry Players EDA Players Assembly & Test Backend Production Competition Economics Productization Standardization Talent Access Silicon Design Market Access IP & Process Development Test Optimization Software Test Optimization Design Tools Software is Off Shoring supporting the Si Technology & Manufacturing transformation of Vertically Integrated Companies the industry structure
- 3. An Industry inTransition 2003-07 2008-11 2012+ Chipmakers need to keep pace with technology & focus on design Increasing Complexity ~$1,300M ~$600M- ~$310M- $900M 400M 65nm 45-32nm 22-12nm ~$4.5B- ~$3.5B- $6.0B ~$2.5B- …while the costs of manufacturing $4.0B $3.0B & R&D continue to grow 90-65nm 45-32nm 22-12nm
- 4. Evolution of TestingInnovation 100% 90% Data & Statistics 80% Analysis & Modeling Automation & Modeling 70% Quality & Reliability 60% DFT, DFM & EDA Intrinsic Defects/Faults 50% Yield Yield 40% EDA 30% Mechanical Contacting Cost / Parallelism 20% Interface& I/O Integration & Packaging 10% Device Characteristics 0% 2001 2003 2005 2007 2009 2011 2013 Source: ITRS 7/20/2010 4 OptimalTest Confidential
- 5. An Evolved FablessManufacturing Model – 2009 Source: Jim Clifford, QCT, 2009 A Networked EcoSystem
- 6. Adaptive Test “BuildingBlocks” – ITRS TWG Data Various sources … may be real time, historical or feed-forward, & structured to feed decision “engine” (algorithms) Data Structure & Control Path Deliver targeted data to the analysis engine & decisions to the action point Decision Algorithms Models to automatically adjust test … based on input data Analysis Engine(s) Executes “rules”/algorithms on the data … based on product parameters. May be separate or embedded in test program or station controller software Station Controller To communicate with or run the analysis engine and take action
- 7. linked reports OPTIMAL EST T Database
- 8. Email Notification includes: Specific Lot Information Rule Information Alert Information Link to OT-PORTAL TI/OT Confidential 7/20/2010 8
- 9. – Illustrating theProblem in the eMail Alert eMail links to the “live” OT- Portal view of the Rule that has been triggered: 5% S2S Yield Variation TI/OT Confidential 7/20/2010 9
- 10. Examples – Product Engineer'sView Multiple layouts Wide variety of accessible via tabs "widgets" with all relevant KPI's Highlight equipment outliers
- 11. - Application Interface Drilldown– presented data is “actionable”, allowing the user to interact and perform a “drilldown” into a deeper level of information
- 12. Engineering Productivity AdaptiveTTR Analysis and Simulation Adaptive TTR implementation without recompiling test programs Process-related signature identified by OT tools Wafer Map recompiled from ~40 lots of final test data displayed as a single wafer
- 13. Integrated Fabless Model Off-line & Near Time At the Design the SAT O Box At T Center Tester APPLICATIONS Handler Prober TTR & Outlier OT-Portal OT-Rules2 Simulation O Proxy Real Time T Tester ALGORITHMS ALGORITHMS Real-Time Real-Time Product Outlier Equipment Real-Time Adaptive Outlier SPC Detection SPC Product SPC TTR Detection O Proxy T Tester NEAR-TIME PLATFORM REAL-TIME PLATFORM Test Applications OT-Proxy OT-Post OT-Box OT-Proxy Database Server Server Tester ENTERPRISE TEST IT INFRASTRUCTURE TP-DB MAP-DB eMail Workflow MES STDF DB
- 14. Global Operations Model Off-line & Near Time Real Time APPLICATIONS APPLICATIONS O Box T Tester TTR & Outlier OT-Control Handler OT-Portal OT-Rules2 OT-Rules2 Simulation Room Prober ALGORITHMS ALGORITHMS Real-Time Real-Time O Proxy Product Outlier Equipment Real-Time T Adaptive Outlier SPC Detection SPC Product SPC TTR Detection Tester NEAR-TIME PLATFORM REAL-TIME PLATFORM Test Applications OT-Proxy O Proxy OT-Post OT-Box OT-Proxy T Database Server Server Tester ENTERPRISE TEST IT INFRASTRUCTURE TP-DB MAP-DB eMail Workflow MES STDF DB Tester
- 15. Increase Production Yield Improve Production Yield Speed Time to Entitled Yield Increase Product Reliability Increase Product Reliability 1-4% Optimize Overall Equipment Efficiency Optimize Overall Equipment Efficiency (OEE) Through Outlier Detection Speed Time to Actionable Data 20-50% 10-20% MEASURABLE Improve Product & RESULTS Reduce Test Times Testing Quality Advanced Adaptive Test for TTR and/or Increase Product & Testing Quality Improve Capital Utilization 10-30% Reduce Customer Returns 50-75%
- 16.