Lessons for MEMS Test Engineers - Ira Feldman 111020Ira Feldman
Semiconductor Wafer Test Technology and Trends: Lessons for MEMS Test Engineers presentation at MEMS Testing and Reliability 3rd Annual Conference (October 20, 2011) by Ira Feldman (www.hightechbizdev.com)
Ideal 3D Stacked Die Test - IEEE Semiconductor Wafer Test Workshop SWTW 2013Ira Feldman
My presentation from IEEE SWTW 2013 - For a full description please see my blog:
http://hightechbizdev.com/2013/06/10/ira-feldman-high-technology-business-development-ieee-semiconductor-wafer-test-workshop-2013/
Probe Card Cost Drivers from Architecture to Zero Defects - IEEE Semiconductor Wafer Test Workshop 2011 presentation by Ira Feldman (www.hightechbizdev.com)
Ira Feldman's presentation about cost drivers for the design and fabrication of semiconductor wafer test probe cards. Presented at the IEEE Semiconductor Wafer Test Workshop, June 2011.
Lessons for MEMS Test Engineers - Ira Feldman 111020Ira Feldman
Semiconductor Wafer Test Technology and Trends: Lessons for MEMS Test Engineers presentation at MEMS Testing and Reliability 3rd Annual Conference (October 20, 2011) by Ira Feldman (www.hightechbizdev.com)
Ideal 3D Stacked Die Test - IEEE Semiconductor Wafer Test Workshop SWTW 2013Ira Feldman
My presentation from IEEE SWTW 2013 - For a full description please see my blog:
http://hightechbizdev.com/2013/06/10/ira-feldman-high-technology-business-development-ieee-semiconductor-wafer-test-workshop-2013/
Probe Card Cost Drivers from Architecture to Zero Defects - IEEE Semiconductor Wafer Test Workshop 2011 presentation by Ira Feldman (www.hightechbizdev.com)
Ira Feldman's presentation about cost drivers for the design and fabrication of semiconductor wafer test probe cards. Presented at the IEEE Semiconductor Wafer Test Workshop, June 2011.
Achieving Market Dominance through Technology Leadership -Cascade Microtech, Inc. is the leading provider of advanced probing systems, non-memory probes and sockets, from design through production
- Software Testing Markets in India
- Software Testing Trends & Transformation
- Transformation Areas and Details
- User Experience
- New Requirement
- Standards / Protocol
- Technology
- Testers Competencies
- Test Techniques
- Test Tools
- Test Process
- Deployment Integration
- Key note speech conclusion
Powerful Test-Taking Strategies - Elementary LevelJennifer Jones
If you know me or follow my blog, you know I'm not a fan of worksheet or pages and pages of test-prep material. However, I do believe in setting kids up for success and teaching them strategies to capture all they know on end-of-grade tests. Follow my blog at helloliteracy.blogspot.com
Hypothesis is usually considered as the principal instrument in research and quality control. Its main function is to suggest new experiments and observations. In fact, many experiments are carried out with the deliberate object of testing hypothesis. Decision makers often face situations wherein they are interested in testing hypothesis on the basis of available information and then take decisions on the basis of such testing. In Six –Sigma methodology, hypothesis testing is a tool of substance and used in analysis phase of the six sigma project so that improvement can be done in right direction
Achieving Market Dominance through Technology Leadership -Cascade Microtech, Inc. is the leading provider of advanced probing systems, non-memory probes and sockets, from design through production
- Software Testing Markets in India
- Software Testing Trends & Transformation
- Transformation Areas and Details
- User Experience
- New Requirement
- Standards / Protocol
- Technology
- Testers Competencies
- Test Techniques
- Test Tools
- Test Process
- Deployment Integration
- Key note speech conclusion
Powerful Test-Taking Strategies - Elementary LevelJennifer Jones
If you know me or follow my blog, you know I'm not a fan of worksheet or pages and pages of test-prep material. However, I do believe in setting kids up for success and teaching them strategies to capture all they know on end-of-grade tests. Follow my blog at helloliteracy.blogspot.com
Hypothesis is usually considered as the principal instrument in research and quality control. Its main function is to suggest new experiments and observations. In fact, many experiments are carried out with the deliberate object of testing hypothesis. Decision makers often face situations wherein they are interested in testing hypothesis on the basis of available information and then take decisions on the basis of such testing. In Six –Sigma methodology, hypothesis testing is a tool of substance and used in analysis phase of the six sigma project so that improvement can be done in right direction
This presentation show National instruments platform to design, prototype and validate algorithms and solutions for inverter control used in hybrid vehicles, wind turbines, etc
Internet of Things - structured approach to the physical plant network - Rock...Carotek
The convergence of new technologies that securely connect plant information with enterprise systems can bring greater productivity, better utilization of assets, and improved decision-making to industrial companies. By bridging the gap between factory-level systems and enterprise systems, Rockwell Automation and Cisco can show how the connected enterprise offers ease of use, lower total cost of ownership, and improved operations.
Software Measurement for Lean Application ManagementCAST
Learn how the Lean practices pioneered in the Toyota Production System apply to the Application Development and Maintenance (ADM) of business software. Applying Lean to ADM decreases total cost of ownership and improves business responsiveness and operational dependability.
High-Level Synthesis Skill Development Needs - IEDECJack Erickson
Presentation at the March 2013 IEDEC conference in Santa Clara, CA. Outlines the need for hardware design to move up in abstraction to SystemC and high-level synthesis, and the main barrier left preventing this - a rare combination of skills. The best place to address this skill set gap is in university curricula.
Reliability growth planning (RGP) is emerging as a promising technique to address the reliability challenges arising from the distributed manufacturing environment. Unlike RGT (reliability growth testing), RGP drives the reliability growth of new products by spanning the product’s lifecycle from design, prototyping, manufacturing, to field use. It is a lifetime commitment to the product reliability via systematic failure analysis, rigorous corrective actions, and cost-effective financial investment. RGP has shown to be very effective, particularly in new product introductions under the fast time-to-market requirement.
The RGP process will be introduced based on the three-phase product lifecycle: 1) design for reliability during early product development; 2) accelerated lifetime testing and corrective actions in pilot line stage; and 3) continuous reliability improvement following the volume shipment. Trade-offs among reliability investment, warranty cost reduction, and customer satisfactions will be investigated from the perspective of the manufacturer and the customer. Reliability growth tools such as Crow/AMSAA, Pareto graphs, failure mode run chart, FIT (failure-in-time), and FMECA will be reviewed and their roles in the GRP process will be discussed and demonstrated. Case studies drawn from electronics equipment industry will be used to demonstrate the RGP applications and justify its benefits as well.
In parallel with the RGP, efforts have been devoted to developing optimal preventative maintenance programs, either time-based or usage-based strategies. Recently, CBM (condition based maintenance) is showing a great potential to achieve just-in-time maintenance or zero-downtime equipment. RGP and maintenance strategies share a common objective, i.e. achieving high system reliability and availability. In this presentation, optimal maintenance policies will be devised in the context of system reliability growth.
2. Industry Transformation
Industry Transformation
Vertically Integrated Horizontal Structure
Assembly & Test (SATs)
Fabless Design Houses
Customer Fulfillment
3rd Party Designers
Foundry Players
EDA Players
Assembly & Test
Backend Production
Competition
Economics
Productization
Standardization
Talent Access
Silicon Design Market Access
IP & Process Development
Test Optimization Software
Test Optimization
Design Tools Software is
Off Shoring
supporting the
Si Technology & Manufacturing
transformation of Vertically Integrated Companies
the industry
structure
3. An Industry in Transition
2003-07 2008-11 2012+
Chipmakers need to keep pace
with technology & focus on design
Increasing Complexity
~$1,300M
~$600M-
~$310M- $900M
400M
65nm 45-32nm 22-12nm ~$4.5B-
~$3.5B- $6.0B
~$2.5B-
…while the costs of manufacturing $4.0B
$3.0B
& R&D continue to grow
90-65nm 45-32nm 22-12nm
5. An Evolved Fabless Manufacturing Model – 2009
Source: Jim Clifford, QCT, 2009
A Networked EcoSystem
6. Adaptive Test “Building Blocks” – ITRS TWG
Data
Various sources … may be real time, historical or feed-forward, &
structured to feed decision “engine” (algorithms)
Data Structure & Control Path
Deliver targeted data to the analysis engine & decisions to the action
point
Decision Algorithms
Models to automatically adjust test … based on input data
Analysis Engine(s)
Executes “rules”/algorithms on the data … based on product
parameters. May be separate or embedded in test program or
station controller software
Station Controller
To communicate with or run the analysis engine and take action
8. Email Notification
includes:
Specific Lot
Information
Rule Information
Alert Information
Link to OT-PORTAL
TI/OT Confidential 7/20/2010 8
9. – Illustrating the Problem
in the eMail Alert
eMail links to the “live” OT-
Portal view of the Rule that
has been triggered:
5% S2S Yield Variation
TI/OT Confidential 7/20/2010 9
10. Examples
– Product Engineer's View
Multiple layouts Wide variety of
accessible via tabs "widgets" with
all relevant KPI's
Highlight
equipment
outliers
11. - Application Interface
Drilldown –
presented data
is “actionable”,
allowing the
user to interact
and perform a
“drilldown”
into a deeper
level of
information
12. Engineering Productivity
Adaptive TTR Analysis and Simulation
Adaptive TTR implementation without recompiling test programs
Process-related
signature identified
by OT tools
Wafer Map
recompiled from ~40
lots of final test data
displayed as a single
wafer
13. Integrated Fabless Model
Off-line & Near Time At the Design the SAT O Box
At T
Center Tester
APPLICATIONS
Handler
Prober
TTR & Outlier
OT-Portal OT-Rules2
Simulation
O Proxy
Real Time T
Tester
ALGORITHMS ALGORITHMS
Real-Time Real-Time
Product Outlier Equipment Real-Time Adaptive Outlier
SPC Detection SPC Product SPC TTR Detection O Proxy
T
Tester
NEAR-TIME PLATFORM REAL-TIME PLATFORM
Test Applications OT-Proxy
OT-Post OT-Box OT-Proxy
Database Server Server Tester
ENTERPRISE TEST IT INFRASTRUCTURE
TP-DB MAP-DB eMail Workflow MES STDF DB
14. Global Operations Model
Off-line & Near Time Real Time
APPLICATIONS APPLICATIONS O Box
T
Tester
TTR & Outlier OT-Control Handler
OT-Portal OT-Rules2 OT-Rules2
Simulation Room Prober
ALGORITHMS ALGORITHMS
Real-Time Real-Time O Proxy
Product Outlier Equipment Real-Time T
Adaptive Outlier
SPC Detection SPC Product SPC TTR Detection Tester
NEAR-TIME PLATFORM REAL-TIME PLATFORM
Test Applications OT-Proxy O Proxy
OT-Post OT-Box OT-Proxy T
Database Server Server
Tester
ENTERPRISE TEST IT INFRASTRUCTURE
TP-DB MAP-DB eMail Workflow MES STDF DB
Tester
15. Increase Production Yield
Improve Production Yield
Speed Time to Entitled Yield
Increase Product
Reliability
Increase Product Reliability
1-4% Optimize Overall
Equipment Efficiency
Optimize Overall Equipment Efficiency (OEE)
Through Outlier Detection Speed Time to Actionable Data
20-50% 10-20%
MEASURABLE
Improve Product & RESULTS Reduce Test Times
Testing Quality Advanced Adaptive Test for TTR and/or
Increase Product & Testing Quality Improve Capital Utilization
10-30%
Reduce Customer Returns
50-75%