For more course tutorials visit www.newtonhelp.com
Key Results:
Key Conclusions (technical):
Key Conclusions (critical thinking):
I. OBJECTIVES
1. Introduction to the MATLAB Communications Toolbox.
2. Use various functions of the Communications
For more course tutorials visit www.newtonhelp.com
Key Results:
Key Conclusions (technical):
Key Conclusions (critical thinking):
I. OBJECTIVES
1. Introduction to the MATLAB Communications Toolbox.
2. Use various functions of the Communications
Pipelining is an implementation technique where multiple instructions are overlapped in execution. The computer pipeline is divided in stages. Each stage completes a part of an instruction in parallel.
Ecet 380 Enthusiastic Study / snaptutorial.comStephenson60
Antenna Design
Key Conclusions (technical):
Key Conclusions (critical thinking):
I.OBJECTIVES
Introduction to the most commonly used antenna types and significant design parameters
Design an antenna suitable for a 2G, 3G or 4G wireless application deployment.
Agilent flash programming agilent utility card versus deep serial memory-ca...AgilentT&M EMEA
This case study compares the flash programming performances of the Agilent Medalist i3070 Series (http://bit.ly/16hd1as) 5 in-circuit tester (ICT) with utility card flash programming solution against the Teradyne in-circuit tester with deep serial memory programming solution
A NETWORK-BASED DAC OPTIMIZATION PROTOTYPE SOFTWARE 2 (1).pdfSaiReddy794166
The International Journal of Engineering and Science and Research is online journal in English published. The aim is to publish peer review and research articles without delay in the developing in engineering and science Research.The International Journal of Engineering and Science and Research is online journal in English published. The aim is to publish peer review and research articles without delay in the developing in engineering and science Research.
Pipelining is an implementation technique where multiple instructions are overlapped in execution. The computer pipeline is divided in stages. Each stage completes a part of an instruction in parallel.
Ecet 380 Enthusiastic Study / snaptutorial.comStephenson60
Antenna Design
Key Conclusions (technical):
Key Conclusions (critical thinking):
I.OBJECTIVES
Introduction to the most commonly used antenna types and significant design parameters
Design an antenna suitable for a 2G, 3G or 4G wireless application deployment.
Agilent flash programming agilent utility card versus deep serial memory-ca...AgilentT&M EMEA
This case study compares the flash programming performances of the Agilent Medalist i3070 Series (http://bit.ly/16hd1as) 5 in-circuit tester (ICT) with utility card flash programming solution against the Teradyne in-circuit tester with deep serial memory programming solution
A NETWORK-BASED DAC OPTIMIZATION PROTOTYPE SOFTWARE 2 (1).pdfSaiReddy794166
The International Journal of Engineering and Science and Research is online journal in English published. The aim is to publish peer review and research articles without delay in the developing in engineering and science Research.The International Journal of Engineering and Science and Research is online journal in English published. The aim is to publish peer review and research articles without delay in the developing in engineering and science Research.
Problem statement:
Possibility to command set of CDSEMs tools in remote mode and instantly adress any failures and issues during POR run of the products ( patter recognition failures, measurement failures, lot release, beam adjustment, etc..) are highly valuable in HVM environment. CDSEM manufactures marketing such features for failrly long period of time, but significant issues is related to the cost and flexibility (layout dependence, tool type restriction, etc..)
Solution:
Development of the low cost remote operation center which virtually independent of listed above shortages and has basic operational capabililties of the manufacturers systems with wide range of flexibility regarding layout and type tool mdependance.
Such system succesfully developed in F18 and implemented for Litho Metrology operation..
Benefits results & summary:
1. HC reduction.
2. Cost - up to 20 times less than OEM.
3. Flexibility - could work with any tool type where remote operation could be beneficial.
4. No impact on local network.
IMAGE CAPTURE, PROCESSING AND TRANSFER VIA ETHERNET UNDER CONTROL OF MATLAB G...Christopher Diamantopoulos
This implemented DSP system utilizes TCP socket communication. Upon message reception, it decides the appropriate process to be executed based on cases which can be categorized as follows:
1) image capture
2) image transfer
3) image processing
4) sensor calibration
A user-friendly MATLAB GUI, named DIPeth, facilitates the system's control.
ile-CDS is a 3D deterministic propagation tool with unlimited potential in areas such as; RF characterization of specific regions, wireless protocol evaluation and military applications. Its internal engine is based on ray-tracing technology and the code is fully parallelized, specially designed for 4G/5G Simulation (e.g. LTE or mmW)
@Station is an Integrated Control and Protection designed for the operation of transmission and distribution substations. The system incorporates the latest technology in the field of substation automation to provide its users with innovative solutions to their requirements.
We develop custom Image Recognition systems for Aerospace and defence applications. Using algorithms like Deep Convolutional Neural Networks and Regional Convolutional Neural Networks.
Our algorithms for Target Recognition and Tracking are designed from the beginning to be run on embedded systems. We target both GPU and FPGA devices.
To Train and Validate our algorithms we developed a process to generate photorealistic 3D environments.
Those 3D Environments are used to produce realistic video streams of the targets in different environmental conditions (lighting, adverse meteorological conditions, camouflage, point-of-view).
The same technology can be used to Train and Test Automotive Vision Systems.
THRIS (Telecom Hardware Robustness Inspection System) is an automatic qualification and test environment developed in co-operation by CSELT, the central research laboratory of the STET group in the telecommunication field, HP and HDT under commitment of Telecom Italia.
THRIS is a new conception tool focused on the most critical issues affecting the quality of telecom hardware, well suited for both operating companies and manufactures. It can be utilised with great benefits and cost savings through the entire life of a telecom product from the early design stage up to field operation.
Steganographic Application of improved Genetic Shifting algorithm against RS ...Vladislav Kaplan
Steganography is a “science”, the method of hiding sent information. Unlike cryptography that deals with coding of information, the main idea of steganography is hiding the fact that the message exists. It embeds the secret message in cover media (image, audio, video, text, etc.). During the last years with the development of digital image processing, methods of digital steganography have gained a lot of popularity. The most popular steganography method is LSB (Last Significant Bit) replacement in the cover image. With extensive evolution of steganography, Steganalysis methods have a lot of importance. Steganalysis algorithms role is to detect a hidden secret message inside any media. The most notable Steganalysis algorithm is the RS method [1], which detects stegamesage by the statistical analysis applied on image pixels.
Shen Wang and others [2] created a new algorithm based on Genetic Shifting method (GSM). GSM performs manipulation and modification of the original image pixels. GSM algorithm keeps image statistic after inserting a hidden message and is hard to be detected by the RS analysis. The goal of the project is to demonstrate effectiveness and stability of GSM algorithm against RS analysis by using mathematical and statistical methods.
Project presentation - Steganographic Application of improved Genetic Shifti...Vladislav Kaplan
Steganography is a “science”, the method of hiding sent information. Unlike cryptography that deals with coding of information, the main idea of steganography is hiding the fact that the message exists. It embeds the secret message in cover media (image, audio, video, text, etc.). During the last years with the development of digital image processing, methods of digital steganography have gained a lot of popularity. The most popular steganography method is LSB (Last Significant Bit) replacement in the cover image. With extensive evolution of steganography, Steganalysis methods have a lot of importance. Steganalysis algorithms role is to detect a hidden secret message inside any media. The most notable Steganalysis algorithm is the RS method [1], which detects stegamesage by the statistical analysis applied on image pixels.
Shen Wang and others [2] created a new algorithm based on Genetic Shifting method (GSM). GSM performs manipulation and modification of the original image pixels. GSM algorithm keeps image statistic after inserting a hidden message and is hard to be detected by the RS analysis. The goal of the project is to demonstrate effectiveness and stability of GSM algorithm against RS analysis by using mathematical and statistical methods.
LVTS - Image Resolution Monitor for Litho-MetrologyVladislav Kaplan
Significant challenges for various Critical Dimension (CD) measurement matching procedures are reaching a comparable complexity as result of negative effects of roughness on the features. Due to the constant trend of integrated circuit in features reduction, impact of roughness start to be more destructive for various sets of measurement algorithms. Commonly used attempts to increase magnification for pattern recognition in measurement mode could in turn detect higher deviation from predefined patterns and thus initiate shift in placement of measurement gate. The purpose of this paper is to discuss how to reduce measurement gate (MG) placement variation impact and filter acquired data using edge correlation approach. The essence of listed above approach is to create set of width correlation function represents particular feature under test and compare it to “golden” one as a mean of detection of uncorrelated scans, which in turn should be excluded from overall computation of matching results. We describe general approach for algorithm stepping and various techniques for judgment of measurement comparison validity. Presented approach also has particular interest in determination of specified tool performance for predefined pattern recognition feature as well as for pattern recognition algorithm robustness study - direct interest for manufacturer. Precise matching estimation as part of Round Robin (RR) routines creating possibility to work with restricted amount of data and perform quick reliable qualification procedures. This paper concentrated on practical approach and used both simulation and actual data measurements data before and after proposed optimization taken by various generation tools by Hitachi (S-8840, S-9300, S-9380) in production environment
Problem statement:
Challenges in achievement of critical layers CD stability in advanced flash processes are reaching significant complexity as result of tight process window imposed on expected focus/dose variation in lithography tool. Common way to perform feed forward prediction for focus/dose variation is creation of FE (Focus /Exposure) Map. In current methodology CD measurements is the only source of FE map construction. Taking in account that for critical layers significant amount of most sensitive features are created using OPC techniques which in turn impact shape/roughness of targeted CD with minimal variation of the focus/dose. Thus CD measurements could be highly unreliable for FE map predictor with commonly used quadratic approximation. Manual CD measurements data filtering is necessary condition in this case. Furthermore for some features quadratic approximation approach itself raising additional concerns about focus shifts for different dose levels. Also no well defined techniques exist for online focus performance tracing and focus trend detection partly due to the mentioned above approximation approach.
Solution:
The purpose of this paper is to discuss how to perform reliable feed forward FE prediction taking in account challenges in advanced flash processes. We introduce here additional variable for FE determination – pattern recognition score and thus elimination manual data preprocessing. Also modification in commonly used approximation techniques introduced with sole purpose to differentiate positive and negative focus trends as part of superposition of classical FE map with score FE maps.
Description of general approach for algorithm stepping and various techniques for judgment of measurement validity presented in paper as well.
Benefits results & summary:
Elimination of manual data preprocessing and construction of reliable FE map predictor which
could in turn be used for online FE drift estimation as part of routine DCCD/FCCD check as well
as drastically reduction of FE measurement
Problem statement:
Challenges in achievement of critical layers CD stability in advanced flash processes are reaching significant complexity as result of tight process window imposed on expected focus/dose variation in lithography tool. Common way to perform feed forward prediction for focus/dose variation is creation of FE (Focus /Exposure) Map. In current methodology CD measurements is the only source of FE map construction. Taking in account that for critical layers significant amount of most sensitive features are created using OPC techniques which in turn impact shape/roughness of targeted CD with minimal variation of the focus/dose. Thus CD measurements could be highly unreliable for FE map predictor with commonly used quadratic approximation. Manual CD measurements data filtering is necessary condition in this case. Furthermore for some features quadratic approximation approach itself raising additional concerns about focus shifts for different dose levels. Also no well defined techniques exist for online focus performance tracing and focus trend detection partly due to the mentioned above approximation approach.
Solution:
The purpose of this paper is to discuss how to perform reliable feed forward FE prediction taking in account challenges in advanced flash processes. We introduce here additional variable for FE determination – pattern recognition score and thus elimination manual data preprocessing. Also modification in commonly used approximation techniques introduced with sole purpose to differentiate positive and negative focus trends as part of superposition of classical FE map with score FE maps.
Description of general approach for algorithm stepping and various techniques for judgment of measurement validity presented in paper as well.
Benefits results & summary:
Elimination of manual data preprocessing and construction of reliable FE map predictor which
could in turn be used for online FE drift estimation as part of routine DCCD/FCCD check as well
as drastically reduction of FE measurement
LVTS Advanced matching matching concept for CDSEMVladislav Kaplan
Motivation:
Significant challenges for various CD measurement matching procedures are reaching a comparable complexity as result of negative effects of roughness on the features. Due to the constant trend of integrated circuit in features reduction, impact of roughness start to be more destructive for various sets of measurement algorithms. Commonly used attempts to increase magnification for pattern recognition in addressing mode could in turn detect higher deviation from predefined patterns and thus initiate shift in placement of measurement gate.
Description of the approach:
The purpose of this paper is to discuss how to reduce measurement gate placement variation
impact and filter acquired data using edge correlation approach – creation of width correlation
function represents particular feature under test and it’s comparison to “golden” one as a mean of
detection of uncorrelated scans, which in turn should be excluded from overall computation of
matching results.
We describe general approach for algorithm stepping and various techniques for judgment of measurement comparison validity. Presented approach also has particular interest in determination of specified tool performance for predefined pattern recognition feature as well as for pattern recognition algorithm robustness study - direct interest for manufacturer.
Evaluation of results:
Precise matching estimation as part of Round Robin routines creating possibility to work with
restricted amount of data and perform quick reliable qualification procedures.
This paper concentrated on practical approach and used both simulation data and actual
measurement data before and after proposed optimization taken by various generation tools by
Hitachi (S-8840, S-9300, S-9380) in production environment.
In order to check performance of Fuzzy APC vs. WA APC simulation of the system performed (Labview).
Dose values were taken as input variables, also Focus values are present, but not used in simulation.
Membership function were created as well as for Dose and Focus variables.
Rules includes Dose and Focus impact, but feedback loop updates just Dose performance (close simulation for FAB Litho tool activity).
Actual simulation not included any translation of Dose values to CD values for given Focus, it assumes that any inconsistencies are added as WN or trend in the final measurement.
WA APC simulated as 5 tag window with 0.35/0.25/0.2/0.14/0.06 weights accordingly which is effectively matched NSO exponential weights average approach.
1. LV tailoring software portfolio 4/20/2010 1 LV Tailoring Software Semiconductor and Medical industry projects
2. 4/20/2010 2 LV Tailoring Software ARM retical cleaner modification for variable pressure based PR: PC ARM retical cleaner modification for variable pressure based PR: Flexible RT system allowing fast tracking of tool robotic arm position and switching mask cleaning pressure accordingly (20 to 60 psi). System was implemented in order to support mask cleaning quality issues. Configuration: 1. Nozzle proximity switch – trigger for image acquisition. 2. USB camera connected to Labview based program looking for distinctive pattern. 3. Pattern acquisition success – LTP port send triggering to smart valve to 60 psi 4. Pattern acquisition failure – LTP port send triggering to smart valve to 20 psi Introduction of the system reduced head count N-3 and increased throughput 4 times.
3. Advanced matching in CDSEM metrology Tool/layer CDSEM qualification matching procedures are strict – 1nm for critical layers at line, space and pitch measurements for 65nm and up modes. Significant feature roughness as result of CD size reduction will decrease repeatability of the measurement and impact of measurement gate placement will be exclusively high, which is complicate comparison matching procedures. Common way to deal with listed above restrictions is to increase measurement set or….. just through away non correlated parts of scanned images - our approach giving possibility to detect non correlated scans and exclude them from overall measurement result. 4/20/2010 3 LV Tailoring Software Advanced matching in CDSEM metrology
4. Typical example of no correlated scans for Poly lines On the top we could see correlation function shift which could easily compensated to increase "true" measurement precision. 4/20/2010 4 LV Tailoring Software Advanced matching in CDSEM metrology
5. 4/20/2010 5 LV Tailoring Software Resolution Monitor for CDSEM Resolution Monitor for CDSEM Resolution estimation approach based on image processing techniques involved spatial transforms, spectral FFT and basic morphology operations. As mean for image sharpness (resolution) estimation chosen a STP carbon targets attached to every CDSEM toolset, used for beam alignment procedure. 1. High density of the targets and relatively high resemblance virtually permit us to perform statistic sampling on non unique targets - thus remove charging impact. 2. Second stage require FFT transform of the images to define spectral distribution. 3. Low pass filter applied for high frequency noise reduction 4. Applied threshold turns 8 bit image to binary one in order to allow morphological operations 5. Basic morphology operations such as erosion and dilation require for closure of isolated regions. 6. Radius of binary circle (in pixels) will be representation of image resolution and upon conversion result could be estimated in nm, even possible astigmatism impact will be detected.
6. 4/20/2010 6 LV Tailoring Software Remote CDSEM control Center Remote CDSEM control Center Ability for tool remote control have various aspects and already widely introduced as part of full Fab automation concept. Unfortunately every manufacturer using different standards and communication solution. Here we tried to unify remote control for every tool in Clean Room environment. Our concept based on the most widely used Monitor/Keyboard/Mouse interface and we are prepared to give appropriate solution for every tool with such configuration. Our system based on the HW configuration including conventional HW video/PS2 multiplier, CAT5 remote switch, signal coder/converter to optical communication signal, fiber optic communication cable and decoder/converter to conventional format effectively replicating monitor image of chosen tool and feed back input device signals (keyboard, mouse). Development of remote central operation system based on Hitachi CDSEM completed in 2007. This concept could be transferable to any set of equipment with minimal configuration changes (Defect metrology, Labs...etc) with option to connect to Remote operation program developed by IT department. In this case significant cost saving were archived - 15% of the cost of original manufacturer.
7. 4/20/2010 7 LV Tailoring Software Remote CDSEM control Center Actual pictures from the FabX floor. As result – improved CDSEM utilization and N-1 head count reduction. Instant access outside of clean room for engineering – improvement in quality and R&D activity.
8. DSQ (MicroScan)tracer: Flexible offline system allowing fast tracking of tool setting and run parameters (DSQ). System was implemented in order to support PCS review tasks and DSQ Features: 1. SPC style presentation of tool configuration settings per tool/product/layer/parameter. 2. Possibility for creation and load from local DB for repeatable analysis. 3. Excel style output. 4. Automatic analysis for "X“ sigma violation and report. 5. Interactive help. 4/20/2010 8 LV Tailoring Software DSQ tracer
9. Implant tracer Flexible online system allowing fast tracking of Implant errors and sorting per predefined algorithm. Features: 1. Automatic save of implant assists and errors. 2. Tracing of the recipes impacted by related errors. 2. Loading data from shared lcsamba.lc.xxxxx.comusc_logsmp server. 3. Excel style output. 6. Created in framework stile - allowing easy migration for other areas. 4/20/2010 9 LV Tailoring Software Implant tracer
10. QML tracker Flexible online system allowing fast tracking of QML errors and sorting per predefined parameters as well as mail notifications per configured requirements. Features: 1. High resolution of error tracking - name and count per predefined time range. 2. Loading data from shared QML server HD. 3. No maintenance - plug and play, simple reconfiguration with adding/subtracting tools and mail recipients. 4. Sending mail notification about occurred errors in tools daily. 6. Created in framework stile - allowing easy migration for other areas. 4/20/2010 10 LV Tailoring Software NSO_NSJ_Golden files comparison tool QML tracker NSO_NSJ_Golden files comparison tool Flexible online system allowing fast tracking of tool setting and comparison with golden one. System was implemented in order to replace historical tracker with no longer support from IT. Features: 1. Comparison of setting files of the stepper with golden one and matching comparison of setting files between steppers. 2. Loading data from tools (NSO and/or NSJ) per required configuration. 3. No maintenance - plug and play, simple reconfiguration with adding/subtracting tools and mail recipients. 4. Sending mail notification about differences in tool setting files daily. 5. Created in framework stile - allowing easy migration for other areas.
11. Polyimide log file analyzer/real time EP system Interactive PC based SW commutating duration of the process stage in the tool in real time and flagging if Queue-time exceeded defined by user thresholds. Main targeting – spin/develop defects. Algorithm, developed for SW used as prototype for real time EP system which was successfully developed and implemented. Features: 1. Possibility to use SC logs to monitor Queue-time of lot in real time 2. Possibility to use SC logs to monitor Queue-time offline (post analysis) 3. Possibility for define flexible thresholds per station. 4. Online/Offline alarm generation and possibility to download it to Excel. 5. Possibility to activate sound alarm.... 4/20/2010 11 LV Tailoring Software Polyimide log file analyzer/real time EP system
12. CMP log file alarm/warning analyzer– interactive PC based SW downloading alarms/warnings from CMP tools as well as from related station controllers and performing Pareto calculation per defined by user key words. Features: 1. Possibility to analyze SC logs. 2. Possibility to analyze CMP tool logs. 3. Possibility to download alarm/warning in Excel format. 4. Possibility to perform Pareto analysis per chosen by user keywords. 4/20/2010 12 LV Tailoring Software CMP log file alarm/warning analyzer
13. Advanced CDSEM NPI system Flexible offline system allowing fast creation of the New Product Class for CDSEM tool in very restricted time. System was implemented in order to support expected high loading for NPI type 1 and possible migration of current system out of FabX. Features: 1. Creation of full NPI CDSEM class in 2 minutes ( prerequisites (Alladin*.xml, *_fab.txt, Image templates in the tools and process definition file) should be ready prior to run of the program). 2. Distribution of class to every tool in CR. 3. Bug fix (1x1,2x1) of current NPI system. 4. Possibility to load in die coordinates. 5. Possibility to analyze possible errors. 6. Possibility to create NPI from home. 7. Visual representation of created product ( necessary help for sample plane creation and adjustment) 4/20/2010 13 LV Tailoring Software Advanced CDSEM NPI system
14. Advanced Overlay NPI system Flexible offline system allowing fast creation of the New Product Class for Overlay tool in very restricted time. System was implemented in order to support expected high loading for NPI type 1 and possible migration of current system out of FabX. Features: 1. Creation of full NPI Overlay class in 2 minutes ( prerequisites (tapeout*.xml,) should be ready prior to run of the program). 2. Distribution of class to every tool in CR. 3. Flexible configuration (1x1,2x1,2x2 steppers). 4. Possibility to load in die coordinates. 5. Possibility to analyze possible errors. 6. Possibility to create NPI from home. 7. Visual representation of created product ( necessary help for sample plane creation and adjustment) 8. Sampling plan optimization. 4/20/2010 14 LV Tailoring Software Advanced Overlay NPI system
15. WET support system based on Tadin Application Flexible online system allowing real time tracking of AWB tools and instant log of error events. System was implemented in order to support activities in Quality control in WET area. Features: 1. Online tracking of AWB tools with visual representation (replication of TadinAnnunciator). 2. Allow Error tracking. 3. Allow log of activities by technician per errors 4. Allow definition, logging activities and tracking of severe errors (could be incidental or coincidental) 5. Possibility get RFC per every error - no additional system needed. 4/20/2010 15 LV Tailoring Software WET support system based on Tadin Application
16. Archer(KLA) to Biorad LRD overlay converter Flexible support offline system allowing fast conversion of LRD ARCHER(KLA) data to format of Biorad overlay tool. Developed for REG metro group FabX Features: 1. Conversion of GER Raw LRD data file to RT format. 2. Flexible sorting (Fields, Sites) by X or Y scan by ascending or descending order. 3. Flexible automatic tool/test support (NSJ,QML/SLOT,SCAN...) 4/20/2010 16 LV Tailoring Software Archer(KLA) to Biorad LRD converter
17. Dry Etch flexible recipe tracking system Flexible offline system allowing fast tracking of recipe setting and sorting per predefined parameters. System was implemented in order to support multiple recipe run project in Oxa area FabX Features: 1. Creation local database for repeatable search. 2. Loading data from lcsamba.lc.xxxxx.comisc_logsxa....dnt.txt or from local DB created earlier. 3. Extensive search capabilities including multiple parameters search per logical operation (And or Or) 4. Sending parsed data to Excel. 5. Created in framework stile - allowing easy migration for other areas. 4/20/2010 17 LV Tailoring Software Dry Etch flexible recipe tracking development
18. CDSEM flexible recipe health error tracking system (SATI). Flexible offline system allowing fast tracking of recipe failures and sorting per predefined parameters. Features: 1. High resolution of error tracking - option for failure per measurement point implemented - significant addition to original specifications. 2. Creation local database for repeatable search. 3. Loading data from CDSEM tools - independent from SC. 4. Extensive search capabilities including multiple parameters search per logical operation (And or Or) 5. Sending parsed data and Graph for error distribution to Excel. 6. Created in framework stile - allowing easy migration for other areas. 4/20/2010 18 LV Tailoring Software CDSEM flexible recipe health error tracking system.
19. Focus Monitor New approach for monitoring of the Dose and/or Focus in Litho area – switching from traditional CDSEM metrology concept to CDSEM morphology. Detailed explanation of the project in presentation, as well as findings and next steps. SW application developed in order to confirm and validate approach. 4/20/2010 19 LV Tailoring Software Focus Monitor
20. 2D data analyzer Labview Tailoring software present product for processing Nexygen batch files as well as any 2D measurement files stored in the form of *.txt databases. One of the major advantages of LVTS design is ability for Multi Signal Graph representation of the 2 dimensional data and on-fly interactive analytical operation based on extraction of the extremes values and mathematical computation of the all related parameters (areas, ratios, etc.. and all their derivatives). 4/20/2010 20 LV Tailoring Software 2D data analyzer
25. Unrestricted addition of cursors and their basic representation User capable to load unrestricted amount of data .Load the data performed by Pressing Load button and all required for representation channels could be chosen in Select channels for view window. By choosing “File” or “Folder” user have possibility to load populated *.txt folder or review just one file at a time. Mathematical Engine: Mathematical engine for LVTS data mining SW based on determination of the Peaks and Valleys of the function. For any represented of data set we need to define points of interest (minimum and maximum of the function) and let the program know which one of them are used in calculation and what kind of math transformation required to receive required result. The process of definition of the “rule set” we called recipe creation. Recipe in our program based on simple .txt file You could create the recipe by simply filling points of interest or their derivatives (areas, ratios and any other standard mathematical operation) into form of equation. Then you saving it and the program are ready to apply certain “rule set” on the 2D data array. By carefully reviewing expected points of interests in the process of recipe creation you choose required parameters. For example we need to extract value of the function at first maximum and integral (area) between first and second local maximums. In this case we have 2 independent sets of equation - first representing initial local maximum and second – area between first and second local maximums. Please refer to listed below examples for clarification. Program automatically defines 6 type of point of interest: Amplitude of the valley (local minimum), time of the valley and it’s 2’nd derivative. Same operations with peaks (local maximums). You also could define areas in the recipe (including partial areas between extremes). Upon calculation of the 2D data by applied equation, you are getting results data which could be easily review in SPC or Box plot form. It is also possible to apply statistical tests (Z-test and T-test) to check the validity of results. Limits definition – for validity check of received results you could define UCL and LCL I the recipe as well as give the program to define limits using auto calculation based on sigma value the obtained results (any multiplier of sigma). Another important part of the mathematical engine is preprocessing – by defining the max value of requested extremes you could effectively filter unrelated noise of 2D function. Also you could define the effective filtering window for extreme calculation. Report generation: By performing all mathematical calculation it is possible to create standardized report which could include all related data and images. You need just to fill up the necessary batch information and add the comments. Report will be stored in .html format. User have full command on allowed fields except result representation and Pass/Fail flag which is defined as statistical limits in recipe or automatically computed from data sequence. We have full flexibility in data report creation and representation, additional templates could be suggested by customer. 4/20/2010 21 LV Tailoring Software 2D data analyzer
26.
27. UCL/LCL could be defined from recipe or alternatively by sigma calculation of result data set with manual multiplication (n*sigma).
32. Flexible result representation – you could put just one set of result on Graph or Multiple set of result from Select result to view window.
33. Important feature - possibility to use totally different set of data an result processes by different recipes just by pressing Hold button – so you could multiply graph representation and represent it in the same report. 4/20/2010 22 LV Tailoring Software 2D data analyzer
34. Solid State Device Tester In this project we archived interactive control over Solid State device (MOSFET transistor) through GPIB communication over 2 Agilent power supply sources and Keithley power generator. Simulating various transistor modes system are capable to log output data up to 1 ksamples per sec and represent signal (Ids) in real time. 4/20/2010 23 LV Tailoring Software Solid State Device Tester
35. Defect Classifier Purpose of this project is archive some level of automation in defect classification routine. All defect classifiers existed on the market has limited capabilities in process defects recognitions due to the fact that existed hierarchy in Defect Metro based of diversification of the process issues, not necessary visual representation of the defect itself. Here we tried to combine visual classification approach with the fact that not just defect itself but it's surrounding are vital to classify inconsistency according to process requirement. 4/20/2010 24 LV Tailoring Software Defect Classifier
36. Thank you for your attention 4/20/2010 25 LV Tailoring Software