The document discusses a study on the effects of wire type and mold compound on the wearout reliability of semiconductor flash Fineline BGA. It outlines the experimental matrix used to test different wire and mold compound combinations via high-temperature storage life and high-temperature operating life. The results are analyzed using wearout reliability plotting and scanning electron microscopy to determine the wearout mechanisms and effects of different materials. Future work is proposed to further characterize the wearout reliability and intermetallic compound diffusion kinetics for various wire types, including palladium-doped copper wire.