Hudson McKay - IEEE 1584:2018 vs IEEE 1584:2002

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IEEE 1584:2002 vs IEEE 1584:2018
Guide to Performing Arc Flash Hazard Calculations
What’s Different & What Will Be The Impact on a Typical Arc Flash Management Protocol
Brad Gradwell
Managing Director/Executive Engineer
Brad.Gradwell@HudsonMckay.com.au
0419515223

Copyright & Disclaimers
This paper contains content from IEEE P1585/D6 July 2018. IEEE draft and approved standards are copyrighted by IEEE under U.S. and international copyright laws.
A copy of IEEE P1585/D6 July 2018 is available at: https://ieeexplore.ieee.org/document/8403238/
IEEE does not warrant or represent the accuracy or content of the material contained in its standards, and expressly disclaims all warranties (express, implied and statutory) not
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services related to the scope of the IEEE standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through
developments in the state of the art and comments received from users of the standard.
Hudson McKay has used its best endeavours to procure, analyse and provide information in this document which is accurate and reliable based on information available to Hudson
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Historical Context

Stokes & Sweeting – IEEE1584-2002 Criticism
• A significant portion of the arc energy is stored in the plasma cloud;
• Ejected arc scenarios can contain up to 300-330% more incident
energy;
• High arc voltages in low voltage systems reduce Iarc ≈ 30%-70% x 3Ø
fault current;
• Digital relays can reset on low voltage systems due to time
delay in the restrike on lower fault levels.

Wilkins, Allison & Lang – Ejected Arc in a Box
Fault Current
Limiting Fuse
• Vertical Electrode at Back of Box,
IEEE1584:2002 Iarc Model
Confirmed;
• Horizontal Electrodes at Back of Box,
Iarc particularly when Isc;
• Horizontal Electrodes lead to more
violent but less stable arcing;
• Horizontal Electrodes at D=48”
(1219mm) IE  = 3-3.3 times.
<4ms

Wilkins, Allison & Lang – Vertical on Barrier
T = 6ms
T = 12ms
• In 205 tests of VCBB Iarc ≈ 20%;
• High Current Arcs (Isc ≈ 45kA) are violent and
chaotic;
• At 480V IE ≈ 1.5 x IEEE1584:2002;
• At 600V IE  ≈ 1.9 x IEEE1584:2002;
• The plasma is concentrated, hotter, Cu and
more toxic.
• Shorter arc lengths produce self-sustaining
arcs.

IEEE 1584:2002 – Key Short Falls
• Electrode Orientation;
• Personal exposed to ejected arc are exposed to the plasma jet rather than radiated heat calculated by the
IEEE1584 -2002.
• Electrode orientations found within electrical switchgear produce 260-330% more incident energy due to
“ejected arc”/”contained arc” mechanism.
• In the case of the horizontal case the arcing current is significantly lower than the bolted fault current.
• Arc Voltage Influence;
• The voltage across an arc is approximately 10Vcm. The arc voltage is less than the nominal operating
voltage, Voc. Therefore in low voltage systems arcing currents can be 30-70% lower than the maximum
bolted fault current, Is/c
• Arc Conditions
• At low voltages less than 480V, during the initiation phase of the fault, it is possible that all three phases
of arc current may remain near zero for several cycles until the insulation fails again, restrike, which could
cause a reset on electronic protection modules.

IEEE 1584:2018 – The Journey to a New
Guide

IEEE 1584:2018 – Empirical Model Range

IEEE 1584:2018 – Empirical Model Integrity
• IEEE1584:2002 (300 tests);
• IEEE1584:2018 (1860 tests);
• 932 tests between 0.208 to 0.6 kV
• 325 tests at 2.7 kV
• 202 tests at 4 kV and over
• 400 tests between 12 to 15 kV
• Extensive reference made to research conducted and published by IEEE authors
(100+ Peer Reviewed Papers);
• Extensive Empirical Model Evaluation and Statistical Validation;
• This model produces results that are more accurate than those of its
predecessor for configurations that are common to both.

IEEE1584:2018 Technical Group Conclusions
1. Arc time has a linear effect on incident energy.
2. Distance from the arc to the calorimeters has an inverse exponential affect.
3. The inclusion of system grounding had the effect of improving the R-square of the incident
energy equation by 1% [R-square is a measure of the equation fit to the data].
4. System X/R ratio, frequency, electrode material and other variables that were considered were
found to have little or no effect on arc current and incident energy, and so they are neglected.
5. Arc current depends primarily on available short-circuit current. Bus gap (the distance between
conductors at the point of fault), system voltage, and grounding type are smaller factors.
6. Incident energy depends primarily on calculated arc current, arcing duration and working
distance. Bus gap is a small factor.

IEEE 1584:2018 – The AF Hazard Model
Human Hazard Model600V < Model 600V > Model < 15kV

IEEE 1584:2018 - The Process Summary
Configuration Voltage k1 k2 k3 k4 k5 k6 k7 k8 k9 k10
600V -0.04287 1.035 -0.083 0 0 -4.78E-09 0.000001962 -0.000229 0.003141 1.092
VCB 2700V 0.0065 1.001 -0.024 -1.56E-12 4.556E-10 -4.19E-08 8.346E-07 5.48E-05 -0.003191 0.9729
14300V 0.005795 1.015 -0.011 -1.56E-12 4.556E-10 -4.19E-08 8.346E-07 5.48E-05 -0.003191 0.9729
600V -0.017432 0.98 -0.05 0 0 -5.77E-09 0.000002524 -0.00034 0.01187 1.013
VCBB 2700V 0.002823 0.995 -0.0125 0 -9.20E-11 2.901E-08 -3.26E-06 0.000157 -0.004003 0.9825
14300V 0.014827 1.01 -0.01 0 -9.20E-11 2.901E-08 -3.26E-06 0.000157 -0.004003 0.9825
600V 0.054922 0.988 -0.11 0 0 -5.38E-09 0.000002316 -0.000302 0.0091 0.9725
HCB 2700V 0.001011 1.003 -0.0249 0 0 4.859E-10 -1.81E-07 -9.13E-06 -0.0007 0.9881
14300V 0.008693 0.999 -0.02 0 -5.04E-11 2.233E-08 -3.05E-06 0.000116 -0.001145 0.9839
600V 0.043785 1.04 -0.18 0 0 -4.78E-09 0.000001962 -0.000229 0.003141 1.092
VOA 2700V -0.02395 1.006 -0.0188 -1.56E-12 4.556E-10 -4.19E-08 8.346E-07 5.48E-05 -0.003191 0.9729
14300V 0.005371 1.0102 -0.029 -1.56E-12 4.556E-10 -4.19E-08 8.346E-07 5.48E-05 -0.003191 0.9729
600V 0.111147 1.008 -0.24 0 0 -3.90E-09 0.000001641 -0.000197 0.002615 1.1
HOA 2700V 0.000435 1.006 -0.038 0 0 7.859E-10 -1.91E-07 -9.13E-06 -0.0007 0.9981
14300V 0.000904 0.999 -0.02 0 0 7.859E-10 -1.91E-07 -9.13E-06 -0.0007 0.9981
Step 1 – Calculate Intermediate Average Arcing Currents

IEEE 1584:2018 – The Process Summary
Step 2 - Calculate Interpolation Arcing Current
Step 3 - Determine the Final Arcing Current
Step 4 - Determine Arc Duration
Step 5 - Calculate Enclosure Size Correction Factor
Step 6 - Calculate the Intermediate Incident
Energy
Step 7 - Calculate Interpolation Incident Energy
Step 8 - Calculate the Intermediate Arc Flash
Boundary
Step 9 - Calculate Interpolation Arc Flash
Boundary
Step 10 - Calculate the Final Incident Energy & Arc
Flash Boundary
Step 11 - Calculate Iarc_min Correction Factor
Step 12 - Adjust the Intermediate Arcing Currents
Step 13 - Calculate Interpolation Arcing Currents
Step 14 - Determine the Final Arcing Currents
Step 15 - Determine Arc Duration
Step 16 - Calculate the Intermediate Incident Energy
Step 17 - Calculate Interpolation Incident Energy
Step 18 - Calculate the Intermediate Arc Flash
Boundary
Step 19 - Calculate Interpolation Arc Flash Boundary
Step 20 - Calculate the Final IE & AFB

IEEE 1584:2018 – Electrode Case - VCB
Theoretical - VCB Testing - VCB Actual - VCB

IEEE 1584:2018 – Electrode Case - VCCB
Theoretical - VCB Testing - VCB Actual - VCB

IEEE 1584:2018 – Electrode Case - HCB
Theoretical - HCB Testing - HCB Actual - HCB

IEEE 1584:2018 – Electrode Case - VOA
Theoretical - VOA Testing - VOA Actual - VOA

IEEE 1584:2018 – Electrode Case - HOA
Theoretical - HOA Testing - HOA Actual - HOA

IEEE 1584:2018 – 415V AFH Iarc & IE ↨ Ibf
+32%
+85%
-10%
+36%
+34%
+55%

IEEE 1584:2018 – 415V AFH Iarc ↨ Ibf
Iarc_ave
Iarc_min
Iarc(2002)
Iarc(2002)x85%

IEEE 1584:2018 – 415V AFH IE ↨ Time
Iarc(2002)
Iarc_ave (VCB)
Iarc_ave (VCBB)
Iarc_ave (HCB)
IE = 8 calcm2

IE ENA NENS09
IE IEEE-2002
IE IEEE-2018

IEEE 1584:2018 – 415V AFH ↨ Cell Size
IE ↓@500mm IE ↑@203.2mm

IEEE 1584:2018 – 1000V AFH Iarc & IE ↨ Ibf
+31%
+105%
-3%
-12%
-13%
-9%

IEEE 1584:2018 – 1000V AFH IE ↨ Ibf
IE ENA NENS09
IE IEEE-2002
IE IEEE-2018

IEEE 1584:2018 – 1000V AFH IE ↨ Time
IE = 8 calcm2
Iarc(2002)
Iarc_ave (VCB)
Iarc_ave (VCBB)
Iarc_ave (HCB)

IEEE 1584:2018 – 3.3kV AFH Iarc & IE ↨ Ibf
+27%
+93%
-11%
-11%
-9%
-7%

IEEE 1584:2018 – 3.3kV AFH IE ↨ Ibf
IE ENA NENS09
IE IEEE-2002
IE IEEE-2018

IEEE 1584:2018 – 3.3kV AFH IE ↨ Time
IE = 8 calcm2
Iarc(2002)
Iarc_ave (VCB)
Iarc_ave (VCBB)
Iarc_ave (HCB)

IEEE 1584:2018 – 11kV AFH Iarc & IE ↨ Ibf
+44%
+94%
-10%
-6%
-8%
-3%

IEEE 1584:2018 – 11kV AFH IE ↨ Ibf
IE ENA NENS09
IE IEEE-2002
IE IEEE-2018

IEEE 1584:2018 – 11kV AFH IE ↨ Time
IE = 8 calcm2
Iarc(2002)
Iarc_ave (VCB)
Iarc_ave (VCBB)
Iarc_ave (HCB)

IEEE 1584:2018 – 415V_AIR Iarc & IE ↨ Ibf
+105%
0%
+42%
+16%

IEEE 1584:2018 – 415V_Air AFH IE ↨ Ibf
IE ENA NENS09
IE IEEE-2002
IE IEEE-2018

Iarc(2002)
Iarc_ave (VOA)
Iarc_ave (HOA)
IE = 8 calcm2

IEEE 1584:2018 – 11kV_AIR Iarc & IE ↨ Ibf
+415%
+81%
-13%
-10%

IEEE 1584:2018 – 11kV_Air AFH IE ↨ Ibf
IE ENA NENS09
IE IEEE-2002
IE IEEE-2018

IEEE 1584:2018 – 11kV AFH IE ↨ Time
Iarc(2002)
Iarc_ave (VOA)
Iarc_ave (HOA)
IE = 8 calcm2

Summary of Changes
ELECTRODE Iarc IE
VCB ≈IEEE1584:2002 ≈IEEE1584:2002
VCBB IEEE1584:2002 20-50% x IEEE:2002
HCB 85% x IEEE:2002 100% x IEEE:2002
VOA ≈IEEE1584:2002 ≈IEEE1584:2002
HOA IEEE:2002 100-400% x IEEE:2002

IEEE 1584:2018 – AF Risk Management
Impact
1. Collection and Storage of Data (Verification)
a) Protective Devices and OCR Curves
b) Impedances
c) Electrode ConfigurationArc Behaviour
d) Photos of Equipment
e) Cubicle Dimensions
f) Work Practices
2. AFH Calculation Model
a) IEC909ANSIComprehensive Fault Current Standard
b) IEEE1584:2018 ≤ 15kV
c) ENA NENS09 ≥ 11kV or Lee Equation or Other Body of Knowledge
3. Protection Coordination Study – Accuracy
4. PPE Adequacy Assessment on a Task Basis, General Usage Policy
5. Safety Integrity Level of your applied AF Risk Mitigation (SIL?)

Thank you

Hudson McKay - IEEE 1584:2018 vs IEEE 1584:2002

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