1. Sponsor Peter Zhou
Coach Peter Zhou
Champion XXXXX
Leader XXXX
Team
Member
XXXX,
XXXX
XXXX
ABCD Product AOI First Time Yield
Improvement
Oct 13, 2008 1

2. Continental/Tianjin - Chrysler
ALCOA
AM I CD
2

3. CTQ & CTP Chart
CTQ CCR Customer
Issues
VOC
Pin Position
return ppm
No Positioning
defects during
AOI test (Meet
Spec: +/-
0.4mm)
Pin positioning
problem will
cause ALCOA
assembly line
problem
TIPM board
not reliable
enough
VOB Business
Issues
CBR CTP
High scrap rate
(14%FYI)
Low output
rate with high
cost
Improve FTY%
by 10% at least
from current
86%
Reduce
Misalignment
defect rate
Remark
1. Voice of customer and voice of business to be prioritized to those which are related to project objective
2. Use VOB or VOC or both depending on the project objectives
AM I CD
3

4. F/E Process AOI and Packing process
ICT
PC Board
Loading
Screen Print
Component
Placement
Solder Reflow
UMG Machine
Loading
2nd UMG
Machine
Coating
Machine
Function
test
AOI Tester for
Complaint pins
AOI Tester for Tuning
fork pins
Finished Good
Packing
Shipping to customer
Process Flow AM I CD
4

5. Yield Current Performance – Pin Misalignment
Y = Scrap Rate
TIPM Product AOI First Time Yield Performance Trend
75.00%
80.00%
85.00%
90.00%
95.00%
100.00%
28-Oct-07
29-Oct-07
30-Oct-07
31-Oct-07
1-Nov-07
2-Nov-07
3-Nov-07
4-Nov-07
5-Nov-07
6-Nov-07
7-Nov-07
8-Nov-07
9-Nov-07
10-Nov-07
%
Average 86%
y = Pins Position Defect Rate
AM I CD
5

6. 96%
May’08
YieldPerformance
86%
Nov’07
Project Target
AM I CDTarget
6

7. Team Charter Project
Selection
ID
CCR
Team
Charter
Build
Team
Map
Process
Financial
Estimation
Goal Statement
Indicator Baseline Target Target Date
Process Output 86% 96% Aug 1st 2008
Finance …… Saving 200k Aug 1st 2008
Subsequent
Team Selection
Sponsor/Champion: Scott Stryker/Chrysler, Angie Liu/Continental
Team leader.: XXX 35% - Con%
Team member: Michael Quality engineer 35%
Wang Test engineer 10%
Cao line leader 5%
Han Quality engineer 5%
Zhang Process engineer 5%
White Production super. 5%
Project Schedule
Phase Start End Remark
Define 11/30/2007 12/15/2007
Measure 12/15/2007 01/15/2008
Analyze 01/15/2008 04/28/2008
Improve 04/28/2008 05/30/2008
Control 05/30/2008 07/30/2008
Business Case
Chrysler is the biggest customer for XXX factory. TIPM for Chrysler
has been launched since end 2006. It is brand-new design product
for Continental/Tianjin, which has two sides pin on the top and
bottom PCB slide. As the pin straightness (perpendicular to the
board) is very important to customer assembly process, therefore
Tianjin factory install AOI test for inspection, but the first time yield
FTY% can’t meet the target which is above 96%.
Opportunity Statement
If we can meet FTY target 96%, we can
achieve saving at least 200k and meet
customer requirement accordingly. On time
delivery will also be assured.
Project Scope
Process Front End Process
Start Point UMG Station
End Point Packing process
Scope Focus on Tianjin facility for TIPM product
7

8. TIPM Product AOI First Time Yield Daily Performance Trend
65.00%
70.00%
75.00%
80.00%
85.00%
90.00%
95.00%
28-Oct-07
29-Oct-07
30-Oct-07
31-Oct-07
1-Nov-07
2-Nov-07
3-Nov-07
4-Nov-07
5-Nov-07
6-Nov-07
7-Nov-07
8-Nov-07
9-Nov-07
10-Nov-07
11-Nov-07
12-Nov-07
13-Nov-07
14-Nov-07
15-Nov-07
16-Nov-07
17-Nov-07
18-Nov-07
19-Nov-07
20-Nov-07
21-Nov-07
22-Nov-07
23-Nov-07
24-Nov-07
%
86%
88%
Quick Win Opportunity
Yield Improved to 88%
by Implement three
Opportunities from Quick Win
AM I CD
8

9. Pin Misalignment Position
Complaint Bent pin TIPM Medium
The complaint pin use the mechanical connective design, The tail of complain pin directly
contact PCB through hole without any soldering. So they are more easily bent during normal
production process.
X Direction
Y Direction
Bent
Pins
AM I CD
9

10. Pin Misalignment Position
J4-37
J4-11
J2-
17
Bent Pin Most Happened Position Is On Then Edge of
PCB Board
AM I CD
10

11. Pin Misalignment Position
Position Pareto chart for Real bent pin
The Pareto chart
show the major
bent pin issue
are from the
compliant pin
and occurred
more frequently
at position J4-37
& J2-17.
AM I CD
11

12. MachineManpower
Drop to The Ground
Transportation Shock
Material
Tilted Pin
Wrong Handling
Mounting Machine
Temperature Chamber
ICT Machine
Operator Touch Up
Separation Machine
Coating Machine
Function Fixture
Method
Unsafe Package In Process
Process Flow
Pin Handing
Temp Test Time
Oven Temp,
Time
PCB Hole Tilt
Pin Roller Defect
Fishbone Diagram
Pin Snap Slot Defect
(Top Layer pin may be
touched accidentally)
Unsafe Package after AOI
AM I CD
Different Pin Position
12

13. Identify
Critical
Process
Characteristic
s and Input
Indicators
AM I CD
13

14. MachineManpower
Drop to The Ground
Transportation Shock
Material
Tilted Pin
Wrong Handling
UMG Mounting Machine
Temperature Test
ICT Machine
Operator Touch Up
Separation Machine
Routing Machine
Function Fixture
Method
Unsafe Package In Process
Process Flow
Pin Handing
Temp Test Time
Oven Temp,
Time
PCB Hole Tilt
Pin Roller Defect
Fishbone Diagram
Pin Snap Slot Defect
(Top Layer pin may be
touched accidentally)
Unsafe Package after AOI
AM I CD
Different Pin Position
14

15. UMG Mounting Machine
Temperature Test
ICT Machine
Operator Touch Up
Routing Machine
Unsafe Package In Process
Pin Snap Slot Defect
AM I CDScreening
Function Fixture
15

16. Data Collection Plan ID IPO
Indicators
Collect Data MSA
Process
Capability
Remarks:
Other data refers to additional information from stratification perspective.
Performance
measure (Y)
Operational
definition
Data source
and location
Sample
size
Who will
collect the data
When will
data be
collected
How will
data be
collected
Other data that
should be
collected at the
same time
PIN
Misalignment
Rate
Pin
Straightness
Requirement
(+/- 0.4mm)
AOI Tester 100% QA Nov 07 AOI Tester
Process /
Input (X)
Operational
definition
Data source
and location
Sample
size
Who will
collect the data
When will
data be
collected
How will
data be
collected
Other data that
should be
collected at the
same time
Pin Position Measure Pin
Position
Jasper System 100% Jasper System Every Shift Jasper System -
16

17. MSA Results
MSA study on these test items
To ensure the data are reasonable, we will do MSA study for AOI 1 tester
These AOI Tester GR&R% are all less than 10% , acceptable!
See the MSA_Demo.PPT for the GR&R% study demonstration.
AM I CD
17

18. Pin Misalignment distribution
Check the TOP defect data distribution, The P-value is more than 0.05. It is normal distribution. But
the mean value deviation to spec center, which need further analysis.
300225150750-75
Median
Mean
11010510095908580
1st Q uartile 23.500
Median 99.500
3rd Q uartile 168.750
Maximum 308.000
84.558 107.163
82.113 113.000
88.722 104.768
A -Squared 0.72
P-V alue 0.061
Mean 95.861
StDev 96.076
V ariance 9230.529
Skewness -0.082150
Kurtosis -0.688619
N 280
Minimum -130.000
A nderson-Darling Normality Test
95% C onfidence Interv al for Mean
95% C onfidence Interv al for Median
95% C onfidence Interv al for StDev
95% Confidence Intervals
Summary for Y_j2-17
-60-120-180-240-300-360
Median
Mean
-160-165-170-175-180-185-190
1st Q uartile -214.75
Median -169.50
3rd Q uartile -134.25
Maximum -21.00
-186.81 -170.63
-187.00 -163.00
61.01 72.50
A -Squared 0.70
P-V alue 0.066
Mean -178.72
StDev 66.26
V ariance 4389.96
Skewness -0.295591
Kurtosis -0.063028
N 260
Minimum -352.00
A nderson-Darling Normality Test
95% C onfidence Interv al for Mean
95% C onfidence Interv al for Median
95% C onfidence Interv al for StDev
95% Confidence Intervals
Summary for X_j2-17
3002001000-100-200-300
Median
Mean
1051009590858075
1st Q uartile 25.500
Median 84.000
3rd Q uartile 154.500
Maximum 369.000
76.747 100.411
75.485 104.545
93.773 110.569
A -Squared 0.72
P-V alue 0.058
Mean 88.579
StDev 101.477
V ariance 10297.505
Skewness -0.240282
Kurtosis 0.998535
N 285
Minimum -319.000
A nderson-Darling Normality Test
95% C onfidence Interv al for Mean
95% C onfidence Interv al for Median
95% C onfidence Interv al for StDev
95% Confidence Intervals
Summary for X_j4-37
AM I CD
18

19. IndividualValue
272421181512963
0
-200
-400
_
X=-181.7
UCL=2.6
LCL=-366.0
MovingRange
272421181512963
200
100
0
__
MR=69.3
UCL=226.4
LCL=0
Observation
Values
252015105
0
-150
-300
-50-100-150-200-250-300-350
0-200-400
Within
Overall
Specs
Within
StDev 61.43289
C p 2.17
C pk 1.18
C C pk 2.17
O v erall
StDev 67.56258
Pp 1.97
Ppk 1.08
C pm *
Process Capability Sixpack of Before
I Chart
Moving Range Chart
Last 25 Observations
Capability Histogram
Normal Prob Plot
A D: 0.234, P: 0.775
Capability Plot
Bent pin Analysis
Cp/Cpk study for “Bent pin ”:
CPK: 1.18
AM I CDCapability Analysis
19

20. Key Process Characteristics Identified During Measurement Phase
Shows That Four Stations Need To Be Focus On…
AM I CDInitial Analysis
UMG Mounting Machine
Temperature Test/Chamber
ICT Machine
Operator Touch Up
Routing Machine
Unsafe Package In Process
Pin Snap Slot Defect
Function Fixture
20

21. UMG Machine
ICT Machine
Routing
Chamber & 3-temp. Testing
Same Lot PCB Board Go
Through Four Processes, Pin
Position Data Were Taken To
Analysis & Identify The Key
Process
AM I CDANOVA
21

22. Bent Pin Analysis – Independent and Normality Test
300250200150100500-50
99
95
90
80
70
60
50
40
30
20
10
5
1
Measure UMG
Percent
Mean 119.8
StDev 66.91
N 30
AD 0.435
P-Value 0.281
Probability Plot of Measure UMG
Normal
p-values > 0.05,
normal distribution!
30282624222018161412108642
250
200
150
100
50
0
Observation
MeasureUMG
Number of runs about median: 13
Expected number of runs: 16.0
Longest run about median: 8
Approx P-Value for Clustering: 0.132
Approx P-Value for Mixtures: 0.868
Number of runs up or down: 20
Expected number of runs: 19.7
Longest run up or down: 3
Approx P-Value for Trends: 0.559
Approx P-Value for Oscillation: 0.441
Run Chart of Measure UMG
30282624222018161412108642
300
200
100
0
-100
Observation
MeasureICT
Number of runs about median: 17
Expected number of runs: 16.0
Longest run about median: 4
Approx P-Value for Clustering: 0.645
Approx P-Value for Mixtures: 0.355
Number of runs up or down: 21
Expected number of runs: 19.7
Longest run up or down: 3
Approx P-Value for Trends: 0.724
Approx P-Value for Oscillation: 0.276
Run Chart of Measure ICT
30282624222018161412108642
250
200
150
100
50
0
Observation
MeasureRouter
Number of runs about median: 13
Expected number of runs: 16.0
Longest run about median: 6
Approx P-Value for Clustering: 0.132
Approx P-Value for Mixtures: 0.868
Number of runs up or down: 22
Expected number of runs: 19.7
Longest run up or down: 2
Approx P-Value for Trends: 0.851
Approx P-Value for Oscillation: 0.149
Run Chart of Measure Router
3002001000-100
99
95
90
80
70
60
50
40
30
20
10
5
1
Measure ICT
Percent
Mean 125
StDev 66.76
N 30
AD 0.378
P-Value 0.385
Probability Plot of Measure ICT
Normal
p-values > 0.05,
normal distribution!
250200150100500
99
95
90
80
70
60
50
40
30
20
10
5
1
Measure Router
Percent
Mean 116.5
StDev 54.66
N 30
AD 0.405
P-Value 0.332
Probability Plot of Measure Router
Normal
p-values > 0.05,
normal distribution!
All 4 p-values > 0.05,
data are independent!
AM I CDData Analysis
22

23. ANOVA For All Related Process
Data
Measure 3-tempMeasure ICTMeasure RouterMeasure UMG
300
200
100
0
-100
Boxplot of Measure UMG, Measure Router, Measure ICT, Measure 3-temp
Process
95% Bonferroni Confidence Intervals for StDevs
Measure Router
Measure ICT
Measure 3-temp
Measure UMG
10090807060504030
Bartlett's Test
0.394
Test Statistic 7.43
P-Value 0.059
Levene's Test
Test Statistic 1.00
P-Value
Test for Equal Variances for Measure
Measure 3 –Temp caused the
most difference (Mean Shift
a lot as compared with the
other 3 process). Equal
Variance showed at the test.
AM I CD
23

24. Why the 3-temp test process contribute the most
Put unit into the
trays
Put into cold
chamber
Cold temperature
function test
Put unit into the
trays
Put into hot
chamber
Room temperature
function test
AOI test
equipment
Input From Front Line
To packing station
?
3 – Temp Test Steps Breakdown
AM I CDTemperature Inspection
24

25. MachineManpower
Transportation Shock
Material
Tilted Pin
Wrong Handling
High Temp Chamber +85 Degree C
Function Test Fixture
Low Temp Chamber -40 Degree C
Operator Touch Up
Conveyor
Method
Unsafe Package
In Process
Process Flow
Temperature PCB Hole Tilt
Pin Roller Defect
Fishbone Diagram
Pin Snap Slot Defect
AM I CD
25

26. SOV
Chamber
Measure
8540
-50
-100
-150
-200
-250
Fixture
1
2
Multi-Vari Chart for Measure by Fixture - Chamber
Chamber 1
-40 Degree C
1
Chamber
Fixture
Chamber 2
+85 Degree C
2 1 2
Conduct Source Of Variation Studies (SOV)
AM I CD
26

27. UMG Mounting Machine
Temperature Test/Chamber
ICT Machine
Operator Touch Up
Routing Machine
Unsafe Package In Process
Pin Snap Slot Defect
Screening
Chamber Temperature
Function Fixture
AM I CD
Function Fixture
Chamber
Measure
8540
-50
-100
-150
-200
-250
Fixture
1
2
Multi-Vari Chart for Measure by Fixture - Chamber
27

28. Fixture 1 Fixture 2 Comparison
Mfg Date Same Same
Maintenance
Schedule
Same Same
Open Angle 85 degree 70 degree
Operation
Force
16 Ib 20 Ib
Close Angle 6 degree 2 degree
Operator A B
Usage Rate Same Same
AM I CDSetting Comparison
28

29. Objective of DOE
Condition I: -45 Degree C Condition II: 85 Degree C
Level 1 Level 2 Level 1 Level 2
Open Angle 85 degree 70 degree 85 degree 70 degree
Open Force 16 Ib 20 Ib 16 Ib 20 Ib
Close Angle 6 degree 2 degree 6 degree 2 degree
In order to minimize the pin bent possibility, plan to design
an experiment to optimize all the factors…
AM I CD
29

30. DOE at -40 Degree C AM I CD
30

31. Step 1. View Data
>> Data Is Normal ------ P Value > 0.05
>> No Outlier Point
>> No Apparent Upward or Downward Trend
-60-80-100-120-140-160-180
Median
Mean
-100-110-120-130-140-150
A nderson-Darling Normality Test
V ariance 1161.42
Skewness 0.311887
Kurtosis -0.532572
N 18
Minimum -179.91
A -Squared
1st Q uartile -151.12
Median -130.44
3rd Q uartile -96.99
Maximum -61.44
95% C onfidence Interv al for Mean
-144.65
0.21
-110.75
95% C onfidence Interv al for Median
-149.42 -104.81
95% C onfidence Interv al for StDev
25.57 51.09
P-V alue 0.825
Mean -127.70
StDev 34.08
95% Confidence Intervals
Summary for Measure -40
RunOrder
Measure-40
20151050
-50
-75
-100
-125
-150
-175
CenterPt
0
1
Scatterplot of Measure -40 vs RunOrder
AM I CDDOE at -40 Degree C
31

32. Step 2 and 3. Create and Fit Model
Term
Standardized Effect
ABC
BC
AB
AC
B
C
A
121086420
2.23
Factor Name
A O pen A ngle
B C lose A ngle
C O peration Force
Pareto Chart of the Standardized Effects (-40 Degree)
(response is Measure -40, Alpha = .05)
Factor Open Angle, Close Angle, Operation Force and
interaction between Open Angle and Operation Force are
signification a = 0.05
AM I CDDOE at -40 Degree C
32

33. Standardized Effect
Percent
151050-5-10
99
95
90
80
70
60
50
40
30
20
10
5
1
Factor Name
A O pen A ngle
B C lose A ngle
C O peration Force
Effect Type
Not Significant
Significant
AC
C
B
A
Normal Probability Plot of the Standardized Effects
(response is Measure -40, Alpha = .05)
Normal probability plot of effects also shows the same
effects to be significant.
AM I CDDOE at -40 Degree C
33

34. Open A ngle
642 201816
-100
-150
-200
Close A ngle
-100
-150
-200
Operation Force
Open
77.5 Center
85.0 Corner
Angle Point Type
70.0 Corner
Close
4 Center
6 Corner
Angle Point Type
2 Corner
Interaction Plot (data means) for Measure -40
MeanofMeasure-40
85.077.570.0
-100
-120
-140
-160
642
201816
-100
-120
-140
-160
Open Angle Close Angle
Operation Force
Point Type
Corner
Center
Main Effects Plot (data means) for Measure -40
These plots are consistent with our previous
conclusions about the effects.
AM I CDDOE at -40 Degree C
34

35. ANOVA indicates that at least one main effect is significant
at a = 0.05. It also indicates that curvature is NOT
significant.
AM I CDDOE at -40 Degree C
35

36.  Estimated effects and coefficients indicate that Open Angle, Close
Angle, Operation Force and interaction Open Angle*Operation Force
are significant at a = 0.05. The results agreed with the earlier graphs
 R-Sq = 96.38% R-Sq(adj) = 93.85%
AM I CDDOE at -40 Degree C
36

37. Step 4. Perform Residual Diagnostics
 The residual vs fitted (predicted) value and residual vs run order
plots do not show any patterns or trends, and do not indicate any
violations of the assumptions. The normal probability plot indicates
residuals are normally distributed
Residual
Percent
20100-10-20
99
90
50
10
1
Fitted ValueResidual
-50-100-150-200
10
0
-10
Residual
Frequency
151050-5-10-15
4.8
3.6
2.4
1.2
0.0
Observation Order
Residual
18161412108642
10
0
-10
Normal Probability Plot of the Residuals Residuals Versus the Fitted Values
Histogram of the Residuals Residuals Versus the Order of the Data
Residual Plots for Measure -40
AM I CDDOE at -40 Degree C
37

38. Open Angle
Residual
868482807876747270
15
10
5
0
-5
-10
Residuals Versus Open Angle
(response is Measure -40)
Close Angle
Residual
65432
15
10
5
0
-5
-10
Residuals Versus Close Angle
(response is Measure -40)
The residual vs each X do not
show any pattern
Operation Force
Residual
2019181716
15
10
5
0
-5
-10
Residuals Versus Operation Force
(response is Measure -40)
AM I CDDOE at -40 Degree C
38

39. Step 6. Remove non-significant terms / Refit reduced model
Remove the non-significant terms
 ANOVA indicates at least one main effect and at least one two-factor
interactions are significant at a = 0.05
 Also, curvature is not significant.
Step 5. Check for possible transformations.
AM I CDDOE at -40 Degree C
39

40. Term
Standardized Effect
AC
B
C
A
121086420
2.16
Factor Name
A O pen A ngle
B C lose A ngle
C O peration Force
Pareto Chart of the Standardized Effects
(response is Measure -40, Alpha = .05)
 P-values show that all effects in the model are significant.
 The value of R-Sq and R-Sq(adj) has decreased
Standardized Effect
Percent
1050-5-10
99
95
90
80
70
60
50
40
30
20
10
5
1
Factor Name
A O pen A ngle
B C lose A ngle
C O peration Force
Effect Type
Not Significant
Significant
AC
C
B
A
Normal Probability Plot of the Standardized Effects
(response is Measure -40, Alpha = .05)
Reduced
Model
Full Model
R Square 94.53% 96.38%
R Square-Adj 92.84% 93.85%
AM I CDDOE at -40 Degree C
40

41. Residual Diagnostics
Residual
Percent
20100-10-20
99
90
50
10
1
Fitted Value
Residual
-50-100-150-200
20
10
0
-10
-20
Residual
Frequency
20151050-5-10-15
4
3
2
1
0
Observation Order
Residual
18161412108642
20
10
0
-10
-20
Normal Probability Plot of the Residuals Residuals Versus the Fitted Values
Histogram of the Residuals Residuals Versus the Order of the Data
Residual Plots for Measure -40
 The residual vs fitted (predicted) value and residual vs run order
plots do not show any patterns or trends, and do not indicate any
violations of the assumptions. The normal probability plot indicates
residuals are normally distributed
AM I CDDOE at -40 Degree C
41

42. Open Angle
Residual
868482807876747270
20
10
0
-10
-20
Residuals Versus Open Angle
(response is Measure -40)
Close Angle
Residual
65432
20
10
0
-10
-20
Residuals Versus Close Angle
(response is Measure -40)
Operation Force
Residual
2019181716
20
10
0
-10
-20
Residuals Versus Operation Force
(response is Measure -40)
The residual vs each X do not
show any pattern
AM I CDDOE at -40 Degree C
42

43. Model is adequate, therefore we can use it for predicting
future responses at specified settings of control factors.
Chosen Model for the Fixture in uncoded units is:
Y (Pin Position) = 597.769 – 6.96360(Open Angle) + 7.18076(Close
Angle) - 60.4389(Operation Force) + 0.628457(Open
Angle)*(Operation Force)
Step 7. Choose Improved Model
AM I CDDOE at -40 Degree C
Pin Position Specification: 0 +/-0.4mm
43

44. Predict Pin Position at the following level of X’s
 Open Angle = 85 degree
 Close Angle = 6 degree
 Operation Force = 16 lb
AM I CDDOE at -40 Degree C
44

45. MeanofMeasure-40
85.077.570.0
-100
-120
-140
-160
642
201816
-100
-120
-140
-160
Open Angle Close Angle
Operation Force
Point Type
Corner
Center
Main Effects Plot (data means) for Measure -40
Open A ngle
642 201816
-100
-150
-200
Close A ngle
-100
-150
-200
Operation Force
Open
77.5 Center
85.0 Corner
Angle Point Type
70.0 Corner
Close
4 Center
6 Corner
Angle Point Type
2 Corner
Interaction Plot (data means) for Measure -40
Step 8. Interpret Chosen Model
AM I CDDOE at -40 Degree C
45

46. 6
ure -40
-120
4
-90
-60
Close Angle70 75 280 85
Open Angle
Hold Values
Operation Force 16
Surface Plot of Measure -40 vs Close Angle, Open Angle
Open Angle
CloseAngle
-70
-80
-90
-100
-110
-120
-130
8482807876747270
6
5
4
3
2
Hold Values
Operation Force 16
Contour Plot of Measure -40 vs Close Angle, Open Angle
Contour plot shows at what
different settings of X’s can
achieve the target Y. It also shows
that the direction of meeting Y
requirement. (0+/-0.4mm)
AM I CDDOE at -40 Degree C
Look For Maximum
46

47. Step 9. Implement New Process/Make Confirmation Runs
 Plan to run 10pcs confirmation runs
 Predict response y=-63.7694 at the optimum settings above
 Compute the appropriate confidence interval of prediction based on the
number of confirmation test run.
 Conduct 10 confirmation runs. Calculated average of the confirmation
runs falls within the calculated confidence interval. (Average 10
confirmation run = - 59.95)
AM I CDDOE at -40 Degree C
47

48. Optimized Setting
Key parameters
Current
Range
Optimized
Range
Open Force 16 Ib~20 Ib 16 Ib
Close Angle 2~6 6
Open Angle 70~85 85
AM I CD
48

49. Pilot Run Result
Sample
SampleMean
121110987654321
0
-50
-100
-150
-200
-250
-300
__
X=-64.9
UCL=7.3
LCL=-137.0
Before After
Xbar Chart of Data by Status
Tests performed with unequal sample sizes
3602401200-120-240-360
LSL USL
LSL -400
Target *
USL 400
Sample Mean -178.719
Sample N 260
StDev (Within) 65.2126
StDev (O v erall) 66.2567
Process Data
C p 2.04
C PL 1.13
C PU 2.96
C pk 1.13
Pp 2.01
PPL 1.11
PPU 2.91
Ppk 1.11
C pm *
O v erall C apability
Potential (Within) C apability
PPM < LSL 0.00
PPM > USL 0.00
PPM Total 0.00
O bserv ed Performance
PPM < LSL 345.38
PPM > USL 0.00
PPM Total 345.38
Exp. Within Performance
PPM < LSL 419.27
PPM > USL 0.00
PPM Total 419.27
Exp. O v erall Performance
Within
Overall
Process Capability of X_j2-17
3752501250-125-250-375
LSL USL
Process Data
Sample?N 29
StDev (Within) 47.18711
StDev (O v erall) 49.35170
LSL -400.00000
Target *
USL 400.00000
Sample Mean -64.88374
Potential (Within) C apability
C C pk 2.83
O v erall C apability
Pp 2.70
PPL 2.26
PPU 3.14
Ppk
C p
2.26
C pm *
2.83
C PL 2.37
C PU 3.28
C pk 2.37
O bserv ed Performance
PPM?<?LSL 0.00
PPM?>?USL 0.00
PPM?Total 0.00
Exp. Within Performance
PPM?<?LSL 0.00
PPM?>?USL 0.00
PPM?Total 0.00
Exp. O v erall Performance
PPM?<?LSL 0.00
PPM?>?USL 0.00
PPM?Total 0.00
Within
Overall
Process Capability of After
CPK: 1.18 CPK 2.37
One month pilot run result
shows before and after
resolution implemented Pin
bent position really improved !
AM I CD
49

50. Pilot run for FTY% tracking
After improvement on the first time yield%, we got this trend chart:
Pilot Run Result
TIPM Product AOI First Time Yield Daily Performance Trend
75.00%
80.00%
85.00%
90.00%
95.00%
100.00%
18-Jun-08
19-Jun-08
20-Jun-08
21-Jun-08
22-Jun-08
23-Jun-08
24-Jun-08
25-Jun-08
26-Jun-08
27-Jun-08
28-Jun-08
%
FTY% is higher than 96%, and
the average FTY value is 97%
TIPM Product AOI First Time Yield Daily Performance Trend
75.00%
80.00%
85.00%
90.00%
95.00%
100.00%
28-Oct-07
29-Oct-07
30-Oct-07
31-Oct-07
1-Nov-07
2-Nov-07
3-Nov-07
4-Nov-07
5-Nov-07
6-Nov-07
7-Nov-07
8-Nov-07
9-Nov-07
10-Nov-07
%
97%
May’08
YieldPerformance
86%
Nov’07
AM I CD
50

51. Add NP chart for test defect counts control in test bay eSPC function:
 Subgroup size =30
 upper limit =3
Add NP chart in
Control plan
AM I CDControl Plan Update
51

52. Standardization
and Documentation
Replication Opportunity
Replication Standardization
Solution Focus Pilot Site Company-wide Similar process
TIPM Product Line
TIPM Product Line
Continental/Tianj
in SMT Line
Continental/Tianjin
and other Continental
Electrical SMT Line
SMT Line and other
product line using
UMG Pin Mounting
Process
AM I CD
52

53. Updated the product handle procedure based on the corrective action and train
related operator and release the WI into system9000:
AM I CDLesson Learned and Training
53