David Modin is seeking an electrical engineering position in Orange County and has over 20 years of experience in medical device testing. He has expert proficiency in electrical network analysis, mixed signal testing, and various engineering software. His professional experience includes positions at Cardiac Science, Medtronic Diabetes, Cameron Health, and Medtronic where he developed automated test systems and improved product yields. He has a Bachelor's degree in electrical engineering from Arizona State University.

1. David Modin Mobile Phone: 949-813-6274 ModinDavid@yahoo.com
23921 Copenhagen St
Mission Viejo, CA 92691
Seeking an electrical engineering position with a medical device company in the Orange County area.
Skills Proficiency
Electrical Network and Circuit Analysis Expert
Mixed Signal Test Concepts Expert
GPIB & VXI (Agilent,Tektronix,Keithley Instruments) Expert
MS Office, VISIO™, OrCAD, PCAD, Agile Intermediate
Adobe Acrobat™ Expert
NI LabVIEW™ Expert
Boundary Scan (TSSI to SVF, State Machine, HW) Expert
Professional Experience
• 05/2012 – 10/2012 Principal Electrical Engineer, Cardiac Science Laguna Hills, CA
Sustaining product support of hospital monitor and AEDs to implement design enhancements, resolve
component obsolescence issues, and correct supplier quality problems. Electrical circuit analysis, project
management planning, develops and document DVT approaches to verify/validate design changes.
IEC60601-1, IEC60601-2-4, UL260-1, EMC, Mechanical stress testing.
• 01/2011 – 05/2012 Sr. Electrical Engineer (Contractor) Cardiac Science Laguna Hills, CA.
Sustaining engineering.
• 11/2009 – 01/2011 Sr. Electrical Engineer, Medtronic Diabetes Inc | Northridge, CA
Performing failure analysis on new product. Documenting FA results in lab notebook. Test system
validation of new hardware prior to production release. Test system redesign for yield improvement by
replacing combinational logic with a more flexible and observable PIC solution.
• 04/2008 – 11/2009 Principal Test Engineer, Cameron Health Inc | San Clemente, CA
Providing technical expertise and direction in manufacturing test for a midsize up and coming
implantable medical device company. Develop advanced LabVIEW™ programming projects. Author
various specifications in support of production test for the purpose of defining test requirements and
methodologies. Defined test development process to include creating verification protocols for
LabVIEW™ and C# software solutions against product test requirements specifications.
• 05/1993 – 11/2006 Principal Test Engineer, Medtronic Inc. | Tempe, AZ
Test Development Team Leader for the IC & Discrete Hybrid Module for four main line Implantable
Pulse Generators (IPGs). Responsibilities include Test Strategy, Design For Testability Requirements,
Test Coverage goals/reqts, Test Design Documents, writing code in LabVIEW or C, developing vector
files (TSSI to Serial Vector Format for Boundary Scan), Test Verification/Validation and release and
maintenance through production ramp up phase. Support consulting for long term program maintenance
throughout the product lifecycle.
David J. Modin Page 1 5/02/11

2. Worked with IC designers and test community to define our digital test direction (Boundary
Scan,OVS,IDDq) as a Senior Member of R&D team for Next Generation Hybrid Tester (NGHT) Test
System Development project.
Automated Boundary Scan Serial Vector Format (SVF) file generation and IDDq strobe selection SVF
File Splitter Utility using LabVIEW™ resulting in reduced time-to-market and eliminating human error.
Instituted company wide use of Adobe Acrobat for test release documentation review tool to allow
offline document reviews with ensured capture of all reviewers comments by importing all Acrobat
comments into a single PDF resulting in improved review and documentation.
As Senior member of Test System Development team, led effort to replace Tektronix VXI Boundary
Scan solution with state of the art PC Based PCI Boundary Scan Controller card that sped up vector
throughput, reduced test time, and improved yield due to improved SNR as a result of gated TCK clock.
Developed improved scan methodologies via “peek” and “poke” of DUT I/O addresses by a pseudo
macro method of replacing in a compiled SVF file and later DMA replacement of scan cells to setup
DUT for analog tests resulting in improved observability of DUT scan state and reduced test time.
Taught LabVIEW™ applied test based classes internally.
Defined test strategy for the latest product line which was a cost reduction effort to save Medtronic $30
million per year.
Education
01/1987 – 05/1993 Bachelor’s Degree, Arizona State University / BSEE | Tempe, AZ
• GPA 3.42, PHI THETA KAPPA Honor Society
• ETA KAPPA NU Electrical Engineering Honor Society
Professional Memberships
IEEE Member
Awards
• Individual Customer Focused Quality Award (Medtronic Inc.) Awarded for implementing
companywide document review strategy based on Adobe Acrobat which contributed to reduction
of new product line development cycle time from ~5 years on average to 18 months from
concept to production ramp up.
• 8 Team Project Development Awards Awarded on completion of new product development.
These awards are given for innovative test improvement concepts resulting in higher yield,
improved diagnostic capabilities and/or reduced test time.
References
Available upon request
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