Data-independent acquisition (DIA) is becoming increasingly important for quantitative proteomics, especially for large-scale targeted protein quantification. DIA provides better reproducibility, acquires fragment ions of all precursors, and breaks through the limit of quantification throughput. Learn more here: www.thermoscientific.com/DIAwebinar
This document summarizes the free vibration analysis of a plate under free-free boundary conditions. The analysis was conducted using ANSYS software. Modal analysis was performed to determine the natural frequencies and mode shapes of the plate. Experimental modal testing was also conducted and the results were compared to the numerical analysis. The MAC (Modal Assurance Criterion) was calculated to determine the correlation between experimental and numerical mode shapes. The best correlation was seen in the first and third modes, while the second mode showed the worst correlation. Further work is needed to improve the correlation between numerical model and experimental results.
This document provides specifications for the CX series of total stations from Topcon, including:
1) Measurement ranges from 0.3 to 500m for the standard models and enhanced ranges for low-temperature and high-temperature models.
2) Angular measurement accuracy of 0.5-1 seconds and 1-5 seconds depending on the model.
3) Various distance measurement capabilities including reflectorless, mini prism, reflective sheet, and prism modes.
4) Features such as dual-axis compensation, IP66 dust and water resistance, and a 36 hour battery life.
5) Interface options including Bluetooth, USB, and internal memory storage.
Data-independent acquisition (DIA) is becoming increasingly important for quantitative proteomics, especially for large-scale targeted protein quantification. DIA provides better reproducibility, acquires fragment ions of all precursors, and breaks through the limit of quantification throughput. DIA with the Thermo Scientific™ Orbitrap™ LC-MS enables ultimate flexibility. The Thermo Scientific™ Orbitrap™ LC-MS pushes the boundaries of large scale quantitation, with highest mass accuracy, Orbitrap high resolution, short cycle times, and narrow isolation windows. Learn more at www.thermoscientific.com/DIAwebinar
The document describes the X-Max large area silicon drift detector (SDD) for use in scanning electron microscopes. It provides advantages over traditional smaller SDDs including higher count rates even at low beam currents, allowing for more accurate analysis at the nanoscale. The X-Max features an 80mm2 active area sensor enclosed in a vacuum for improved resolution and uses a unique magnetic trap design for maximized solid angle collection. It provides high throughput analysis while minimizing beam damage to samples.
This document is Patrick Mead's design portfolio, which includes summaries of his PCB designs, chip designs, and training. It contains sections on FR4 boards, ceramic boards, chip designs, and summaries of his training including a Bachelor's degree in electronics engineering technology and various software certifications.
This document describes a laser spot welding system called FoRza. It has an adjustable touchscreen display and stores 100 memory parameters. It uses a Leica 10x lens and has UV and laser radiation protection for the eyes. It has a new generation laser rail and is completely digital. It also has an integrated standard webcam and can connect to a PC/laptop. Some key features include a digital microprocessor that works 100 times faster than traditional systems, automatic regulation of the power supply, double LCD touchscreen, 30 Hz frequency, automatic control of the laser lamp, and a powerful cooling system. The laser can be used to weld precious metals like gold, silver, and palladium without removing stones. It is suitable for
This document provides specifications for an optical power meter and various optical sensors that can be used with it. It includes:
1) Descriptions of 9 types of optical sensors for different applications including general purpose, blue-violet, high-power, and three-wavelength sensors.
2) Details on the optical power meter including a 51⁄2 digit display, USB interface, automatic wavelength sensitivity correction, and data storage/output functions.
3) Specifications for each type of sensor including measurement ranges, wavelength coverage, power linearity, and form factors.
4) Information on optional accessories and software required to use discontinued sensor models with the optical power meter.
This document summarizes the free vibration analysis of a plate under free-free boundary conditions. The analysis was conducted using ANSYS software. Modal analysis was performed to determine the natural frequencies and mode shapes of the plate. Experimental modal testing was also conducted and the results were compared to the numerical analysis. The MAC (Modal Assurance Criterion) was calculated to determine the correlation between experimental and numerical mode shapes. The best correlation was seen in the first and third modes, while the second mode showed the worst correlation. Further work is needed to improve the correlation between numerical model and experimental results.
This document provides specifications for the CX series of total stations from Topcon, including:
1) Measurement ranges from 0.3 to 500m for the standard models and enhanced ranges for low-temperature and high-temperature models.
2) Angular measurement accuracy of 0.5-1 seconds and 1-5 seconds depending on the model.
3) Various distance measurement capabilities including reflectorless, mini prism, reflective sheet, and prism modes.
4) Features such as dual-axis compensation, IP66 dust and water resistance, and a 36 hour battery life.
5) Interface options including Bluetooth, USB, and internal memory storage.
Data-independent acquisition (DIA) is becoming increasingly important for quantitative proteomics, especially for large-scale targeted protein quantification. DIA provides better reproducibility, acquires fragment ions of all precursors, and breaks through the limit of quantification throughput. DIA with the Thermo Scientific™ Orbitrap™ LC-MS enables ultimate flexibility. The Thermo Scientific™ Orbitrap™ LC-MS pushes the boundaries of large scale quantitation, with highest mass accuracy, Orbitrap high resolution, short cycle times, and narrow isolation windows. Learn more at www.thermoscientific.com/DIAwebinar
The document describes the X-Max large area silicon drift detector (SDD) for use in scanning electron microscopes. It provides advantages over traditional smaller SDDs including higher count rates even at low beam currents, allowing for more accurate analysis at the nanoscale. The X-Max features an 80mm2 active area sensor enclosed in a vacuum for improved resolution and uses a unique magnetic trap design for maximized solid angle collection. It provides high throughput analysis while minimizing beam damage to samples.
This document is Patrick Mead's design portfolio, which includes summaries of his PCB designs, chip designs, and training. It contains sections on FR4 boards, ceramic boards, chip designs, and summaries of his training including a Bachelor's degree in electronics engineering technology and various software certifications.
This document describes a laser spot welding system called FoRza. It has an adjustable touchscreen display and stores 100 memory parameters. It uses a Leica 10x lens and has UV and laser radiation protection for the eyes. It has a new generation laser rail and is completely digital. It also has an integrated standard webcam and can connect to a PC/laptop. Some key features include a digital microprocessor that works 100 times faster than traditional systems, automatic regulation of the power supply, double LCD touchscreen, 30 Hz frequency, automatic control of the laser lamp, and a powerful cooling system. The laser can be used to weld precious metals like gold, silver, and palladium without removing stones. It is suitable for
This document provides specifications for an optical power meter and various optical sensors that can be used with it. It includes:
1) Descriptions of 9 types of optical sensors for different applications including general purpose, blue-violet, high-power, and three-wavelength sensors.
2) Details on the optical power meter including a 51⁄2 digit display, USB interface, automatic wavelength sensitivity correction, and data storage/output functions.
3) Specifications for each type of sensor including measurement ranges, wavelength coverage, power linearity, and form factors.
4) Information on optional accessories and software required to use discontinued sensor models with the optical power meter.
20140211 - Paper 9052-6 Next-generation multi-wavelength lithography PrintoutJohn Petersen
This document summarizes next-generation multi-wavelength lithography techniques that can achieve resolutions below 10 nm. It discusses using multiple wavelengths of light - an activation wavelength to expose areas and a deactivating wavelength to trim the exposed areas via stimulated emission depletion (STED). This allows placing features closer together than the diffraction limit. The document outlines resist requirements, throughput estimates for different pattern types, and status of material development challenges. It proposes that multi-color resists using 3 wavelengths provide the best path to small pitches and require further industrial support.
The QS30 laser sensor has visible laser beams for diffuse sensing and is available with Class 1 or long-range Class 2 lasers. It has easy-to-set programming options including static, dynamic, and single-point teaching plus manual adjustment. Models have 2m or 9m cables or quick-disconnect fittings and provide bipolar discrete outputs.
The Krautkramer USM 36 is GE's latest portable ultrasonic flaw detector. It features a large 7-inch high-resolution display, intuitive operation, flexible data storage and reporting, and robust design allowing use in harsh environments. The instrument can be used for non-destructive testing applications such as weld inspection, corrosion measurement, and inspection of castings.
The Angstrom Advanced ADX-2500 X-ray Diffraction Instrument is designed for microstructure measurement and research investigations. It can analyze the structure of single crystals, powders, and amorphous materials. The instrument precisely measures diffraction angles and has a stable X-ray generator to provide accurate analysis, including phase analysis, crystallite size determination, and residual stress analysis. It incorporates high-quality hardware and software for various analytical techniques.
This document provides information about the 7200 Series Q-TOF for GC/MS, a new mass spectrometry instrument from Agilent. The 7200 combines a quadrupole mass filter with time-of-flight mass analyzer to provide high resolution and accurate mass capabilities. It offers improved sensitivity, mass accuracy, and dynamic range over previous instruments. The document describes the instrument's design features and provides examples of how it can be used for applications like pesticide residue analysis, metabolomics, and structural elucidation of unknown compounds.
데이타로직 Datalogic DS6300 1D 산업용 고정식 바코드스캐너 레이저스캐너 매뉴얼HION IT
데이타로직의 고성능 DS6300 산업용 고정식 바코드스캐너는 고급 코드 복원기능 (ACR4)을 제공하며 리딩 성능이 우수합니다.
리딩범위 최대 300mm에서 2000mm의 범위를 스캔합니다.
초점 조절 가능, Flash™ (Dynamic)기술
다국어 지원의 Genius™ 설정 툴
Step-A-Head™기술
ACR4™ 코드 재조합 기술
오실레이팅 미러 모델
이더넷/ 디바이스넷/ 프로피버스 통신 지원
PackTrack™ 추적 시스템
내장 디스플레이 및 키패드
다국어 지원의 Genius™ 설정 툴
광학 : 조절가능(DS6300) Flash™
전원 : 15-30VDC, 최대15W
스캔속도 : 최대 1200scans/s
리딩범위 : 최대 300mm에서 2000mm(DS6300) 300mm에서 2500mm(DS6400)
최대해상도 : 최대 0.2mm(8mils)
통신연결 : RS232, RS485
I/O : 4 inputs, 3 outputs; 광결합
전원 : 15-30VDC, 최대15W
적용분야:
물류산업
작은 컨베이어에서의 분류
자동차, 가전제품, 식품&음료업
물류, 유통의 분류작업
ELECTRICAL CHARACTERISTICS
Power Supply : 15 to 30 Vdc
Power Consumption : 15 W max.
MECHANICAL CHARACTERISTICS
Dimensions : 113 x 110 x 99 mm (4.45 x 4.33 x 3.90 in.)
Weight :
- Linear version: 1.3 kg. (2 lb 14 oz)
- Integrated OM version: 2 kg. (4 lb 8 oz)
Case meterial : Aluminium
PERFORMANCE
Light Source : Visible Laser Diode (650 nm)
Light Receiver : Avalanche Photodiode
Max. Resolution : 0.2 mm (8 mils )
Scan Rate : 600 to 1,200 scan/s (SW adjustable)
Max. Reading Distance : See diagram
Max. Depth of Field : See diagram
Max. Reading Field : See diagram
Readable Codes : All the most used symbologies
Main Interface : RS232 / RS485 (20 mA C.L. optional)
Auxiliary Interface : RS232
Other Available Interface : Lonworks (Master/Slave), Ethernet, Devicenet, Profibus 2400
Baud Rate : 1,200 to 115,200 bauds
Input Signals : ‘Presence sensor’ plus 3 auxiliary digital inputs
Output Signals : 3 SW programmable digital outputs
Operating Modes : ‘On line’, ‘Serial On line’, ‘Continuous’, ‘Test’
LED Indecators : ‘Power ON’, ‘Phase ON’, ‘TX Data’
Display : 2 lines by 16 characters LCD
Keypad : 3 keys
Laser Classification : IEC 825 Class 2
Laser Control : Security system to turn laser OFF in case of motor slow down
ENVIRONMENT
Operating Temperature : 0 to 40 °C (32 to 104 °F),
Storage Temperature : -20 to 70 °C (-4 to 158 °F)
Protection Class : IP64 for standard models; IP65 on request
>하이온아이티
주소 : 서울 금천구 가산디지털2로 165, 1304호 (백상스타타워2차)
대표번호 : 02-2038-0018 / 이메일 : hion@hionit.com
홈페이지 : http://hionsmart.com
As the inventors of the first high-performance, computer-controlled LED spectroradiometers, Gamma Scientific has continued to set the standard in spectroradiometer accuracy and reliability.
RadOMA spectroradiometers are trusted by the world’s leading organizations to provide accurate measurements.
RadOMA spectroradiometers feature a proprietary optical design and back thinned CCD technology that provides exceptional low-light measurements, superior blue light sensitivity and highly accurate measurements of wavelength, color and power.
ADX-2700 θ-θ Powder X-ray Diffraction Instrument is multi-function diffractometer with exceptional analysis speed, reliability and reproducibility. The ADX2700 is a diffraction instrument designed for the challenges of modern materials research. ADX2700 can analyze powders, liquids, thin films, nanomaterials and many other different materials. The ADX2700 can be used for many different applications: Academic, Pharmaceuticals, Chemical & Petrochemical, Material Research, Thin Film Metrology, Nano technology, Food & Cosmetics, Forensics, Mining & Minerals, Metals, Plastics & Polymers, etc.
Mass spectrometry assay optimization using functional programming patterns in...Bennett Kalafut
An advantage of multi-paradigm programming languages is the ability to select a programming paradigm that best suits the problem at hand, especially to be able to use different paradigms in different layers of the code. Here I show how functional programming is well-suited for automatic assay optimization and other mass spectrometer instrument control features.
The mass spectrometer is itself best thought of as a state machine, but once functions and decorators are in place to acquire data and handle side effects, composition and higher-order functions can be used to build up complex tasks at run-time.
Presented at the 2016 Lua Workshop in San Francisco, California.
3310 g logger acceleration acquisition systemprg4770
The Model 3310 is a portable data acquisition system that logs acceleration, velocity, temperature and event data. It contains 3 accelerometers, flash memory, a microprocessor and operates from -20 to 60°C. The system samples up to 4000 times/second on 3 axes, logs to internal memory, and transfers data via an included cable to a PC for programming and download. It is powered by batteries or an optional adapter and is used for applications like vehicle testing, machinery monitoring and more.
This document is a PhD thesis presented by Stepan Sutula to obtain the title of Doctor in Microelectronics and Electronic Systems. The thesis explores methods to increase the power efficiency and resolution of switched-capacitor Delta-Sigma analog-to-digital converters (ADCs) using novel low-power CMOS circuits.
It describes the development of low-current analog circuit techniques targeting power efficiency, including novel Class-AB operational amplifiers. A 96.6-dB-SNDR 50-kHz-BW 1.8-V 7.9-mW Delta-Sigma modulator for ADCs is implemented in a 0.18-μm CMOS process based on these techniques. Measurement results indicate
Our premium line of products includes Digital and Mixed Signal Oscilloscopes, Spectrum Analyzers and RF Signal Generators, Arbitrary waveform Generators, Sensitive Measurement Products, and Data Acquisition Systems. Our test solutions combine uncompromised product performance, quality, and advanced product features; all delivered at extremely attractive price points. Our solutions delight customers in many applications such as technical education, embedded design, WiFi integration, EMC, and manufacturing. Across all markets and products we deliver our customers with unprecedented value for their investment, reduce their overall cost of test, and help speed time to completion of their designs or projects.
https://www.n-denkei.com/singapore/inquiry/
Profilograph-profilometr is capable to provide measurement of parameters of surfaces in three-dimensional (3D) the image of their condition to within 1нм on height of a relief. This device allows to receive qualitatively new information which, in turn, will lead to development and creation of the newest technologies in mechanical engineering
Jasa Kalibrasi, Rental dan Jual Total Station Sokkia IM-52 Call/ wa 082119953499Budi anto
RUANG LINGKUP KEGIATAN
PENJUALAN, SERVICE / PERBAIKAN DAN PENYEWAAN ALAT-ALAT UKUR
PENJUALAN :
• Alat Ukur
- Total Station ( baru dan second hand )
- Theodolite ( baru dan second hand )
- Levels ( baru dan second hand )
- GPS
- Compass
- Clinometer
- Tandem/ Clino
- Binocular
- Digital Level
- Digital Planimeter
• Accessories :
- Tripod
- Prisma Polygon
- Prisma Detail
- Rambu Ukur
- Meteran
- Jalon
- Tripod Jepit
PENYEWAAN :
- Total Station
- Theodolite
- Automatic Level
- GPS Geodetik
MEREK ALAT UKUR YANG TERSEDIA :
- Minds
- Spectra
- Nikon
- Suunto
- Garmin
- Topcon
- Horizon
- Sokkia
SERVICE / PERBAIKAN DAN KALIBRASI MACAM-MACAM ALAT UKUR
HARGA MENARIK / COMPETITIVE
Catatan : Price List akan dikirim sesuai permintaan
This document provides information on Anton Paar's surface characterization and tribology testing solutions. It discusses their indentation testers, scratch testers, tribometers, and atomic force microscopes. Indentation testing is used to determine mechanical properties like hardness and modulus. Scratch testing evaluates properties like adhesion, scratch resistance, and wear. Tribology testing simulates friction conditions. The atomic force microscope images surfaces with nanometer resolution.
The document describes Core Wafer Systems' Apollo On-wafer Magnetic Test System for characterizing magnetic devices like MRAM on wafer. It provides uniform magnetic fields up to 100 Oersted continuous or 900 Oersted pulsed. Data can be analyzed instantly using ASUR RDA software. Test libraries are available for reliability measurements, magnetoresistance, non-volatile memory, and magnetic field calibration. The system uses a Suss Microtec 300mm prober for low-noise DC and high-frequency RF/microwave probing of devices.
The document summarizes the features of the ES series total station, including its fast and powerful reflectorless EDM, long battery life of 36 hours, rugged and user-friendly design, and advanced angle measurement accuracy down to 1 second. It has a 30x magnification and precise angular measurements. Additional features include long-range Bluetooth communication, USB port for data transfer, and IP66 dust and water resistance. The total station offers reliable, efficient surveying in all conditions.
The document summarizes the features of the ES series total station, including its fast and powerful reflectorless EDM, long battery life of 36 hours, rugged and user-friendly design, and advanced angle measurement accuracy down to 1 second. It has a 30x magnification telescope, USB port for data transfer, and Bluetooth communication as an option. The total station provides fast, precise distance and angle measurements for surveying applications.
The document summarizes the features of the ES series total station, including its fast and powerful reflectorless EDM, long battery life of 36 hours, rugged and user-friendly design, and advanced angle measurement accuracy down to 1 second. It has a 30x magnification telescope, USB port for data transfer, and Bluetooth communication as an option. The total station provides fast, precise distance and angle measurements for surveying applications.
Sexuality - Issues, Attitude and Behaviour - Applied Social Psychology - Psyc...PsychoTech Services
A proprietary approach developed by bringing together the best of learning theories from Psychology, design principles from the world of visualization, and pedagogical methods from over a decade of training experience, that enables you to: Learn better, faster!
20140211 - Paper 9052-6 Next-generation multi-wavelength lithography PrintoutJohn Petersen
This document summarizes next-generation multi-wavelength lithography techniques that can achieve resolutions below 10 nm. It discusses using multiple wavelengths of light - an activation wavelength to expose areas and a deactivating wavelength to trim the exposed areas via stimulated emission depletion (STED). This allows placing features closer together than the diffraction limit. The document outlines resist requirements, throughput estimates for different pattern types, and status of material development challenges. It proposes that multi-color resists using 3 wavelengths provide the best path to small pitches and require further industrial support.
The QS30 laser sensor has visible laser beams for diffuse sensing and is available with Class 1 or long-range Class 2 lasers. It has easy-to-set programming options including static, dynamic, and single-point teaching plus manual adjustment. Models have 2m or 9m cables or quick-disconnect fittings and provide bipolar discrete outputs.
The Krautkramer USM 36 is GE's latest portable ultrasonic flaw detector. It features a large 7-inch high-resolution display, intuitive operation, flexible data storage and reporting, and robust design allowing use in harsh environments. The instrument can be used for non-destructive testing applications such as weld inspection, corrosion measurement, and inspection of castings.
The Angstrom Advanced ADX-2500 X-ray Diffraction Instrument is designed for microstructure measurement and research investigations. It can analyze the structure of single crystals, powders, and amorphous materials. The instrument precisely measures diffraction angles and has a stable X-ray generator to provide accurate analysis, including phase analysis, crystallite size determination, and residual stress analysis. It incorporates high-quality hardware and software for various analytical techniques.
This document provides information about the 7200 Series Q-TOF for GC/MS, a new mass spectrometry instrument from Agilent. The 7200 combines a quadrupole mass filter with time-of-flight mass analyzer to provide high resolution and accurate mass capabilities. It offers improved sensitivity, mass accuracy, and dynamic range over previous instruments. The document describes the instrument's design features and provides examples of how it can be used for applications like pesticide residue analysis, metabolomics, and structural elucidation of unknown compounds.
데이타로직 Datalogic DS6300 1D 산업용 고정식 바코드스캐너 레이저스캐너 매뉴얼HION IT
데이타로직의 고성능 DS6300 산업용 고정식 바코드스캐너는 고급 코드 복원기능 (ACR4)을 제공하며 리딩 성능이 우수합니다.
리딩범위 최대 300mm에서 2000mm의 범위를 스캔합니다.
초점 조절 가능, Flash™ (Dynamic)기술
다국어 지원의 Genius™ 설정 툴
Step-A-Head™기술
ACR4™ 코드 재조합 기술
오실레이팅 미러 모델
이더넷/ 디바이스넷/ 프로피버스 통신 지원
PackTrack™ 추적 시스템
내장 디스플레이 및 키패드
다국어 지원의 Genius™ 설정 툴
광학 : 조절가능(DS6300) Flash™
전원 : 15-30VDC, 최대15W
스캔속도 : 최대 1200scans/s
리딩범위 : 최대 300mm에서 2000mm(DS6300) 300mm에서 2500mm(DS6400)
최대해상도 : 최대 0.2mm(8mils)
통신연결 : RS232, RS485
I/O : 4 inputs, 3 outputs; 광결합
전원 : 15-30VDC, 최대15W
적용분야:
물류산업
작은 컨베이어에서의 분류
자동차, 가전제품, 식품&음료업
물류, 유통의 분류작업
ELECTRICAL CHARACTERISTICS
Power Supply : 15 to 30 Vdc
Power Consumption : 15 W max.
MECHANICAL CHARACTERISTICS
Dimensions : 113 x 110 x 99 mm (4.45 x 4.33 x 3.90 in.)
Weight :
- Linear version: 1.3 kg. (2 lb 14 oz)
- Integrated OM version: 2 kg. (4 lb 8 oz)
Case meterial : Aluminium
PERFORMANCE
Light Source : Visible Laser Diode (650 nm)
Light Receiver : Avalanche Photodiode
Max. Resolution : 0.2 mm (8 mils )
Scan Rate : 600 to 1,200 scan/s (SW adjustable)
Max. Reading Distance : See diagram
Max. Depth of Field : See diagram
Max. Reading Field : See diagram
Readable Codes : All the most used symbologies
Main Interface : RS232 / RS485 (20 mA C.L. optional)
Auxiliary Interface : RS232
Other Available Interface : Lonworks (Master/Slave), Ethernet, Devicenet, Profibus 2400
Baud Rate : 1,200 to 115,200 bauds
Input Signals : ‘Presence sensor’ plus 3 auxiliary digital inputs
Output Signals : 3 SW programmable digital outputs
Operating Modes : ‘On line’, ‘Serial On line’, ‘Continuous’, ‘Test’
LED Indecators : ‘Power ON’, ‘Phase ON’, ‘TX Data’
Display : 2 lines by 16 characters LCD
Keypad : 3 keys
Laser Classification : IEC 825 Class 2
Laser Control : Security system to turn laser OFF in case of motor slow down
ENVIRONMENT
Operating Temperature : 0 to 40 °C (32 to 104 °F),
Storage Temperature : -20 to 70 °C (-4 to 158 °F)
Protection Class : IP64 for standard models; IP65 on request
>하이온아이티
주소 : 서울 금천구 가산디지털2로 165, 1304호 (백상스타타워2차)
대표번호 : 02-2038-0018 / 이메일 : hion@hionit.com
홈페이지 : http://hionsmart.com
As the inventors of the first high-performance, computer-controlled LED spectroradiometers, Gamma Scientific has continued to set the standard in spectroradiometer accuracy and reliability.
RadOMA spectroradiometers are trusted by the world’s leading organizations to provide accurate measurements.
RadOMA spectroradiometers feature a proprietary optical design and back thinned CCD technology that provides exceptional low-light measurements, superior blue light sensitivity and highly accurate measurements of wavelength, color and power.
ADX-2700 θ-θ Powder X-ray Diffraction Instrument is multi-function diffractometer with exceptional analysis speed, reliability and reproducibility. The ADX2700 is a diffraction instrument designed for the challenges of modern materials research. ADX2700 can analyze powders, liquids, thin films, nanomaterials and many other different materials. The ADX2700 can be used for many different applications: Academic, Pharmaceuticals, Chemical & Petrochemical, Material Research, Thin Film Metrology, Nano technology, Food & Cosmetics, Forensics, Mining & Minerals, Metals, Plastics & Polymers, etc.
Mass spectrometry assay optimization using functional programming patterns in...Bennett Kalafut
An advantage of multi-paradigm programming languages is the ability to select a programming paradigm that best suits the problem at hand, especially to be able to use different paradigms in different layers of the code. Here I show how functional programming is well-suited for automatic assay optimization and other mass spectrometer instrument control features.
The mass spectrometer is itself best thought of as a state machine, but once functions and decorators are in place to acquire data and handle side effects, composition and higher-order functions can be used to build up complex tasks at run-time.
Presented at the 2016 Lua Workshop in San Francisco, California.
3310 g logger acceleration acquisition systemprg4770
The Model 3310 is a portable data acquisition system that logs acceleration, velocity, temperature and event data. It contains 3 accelerometers, flash memory, a microprocessor and operates from -20 to 60°C. The system samples up to 4000 times/second on 3 axes, logs to internal memory, and transfers data via an included cable to a PC for programming and download. It is powered by batteries or an optional adapter and is used for applications like vehicle testing, machinery monitoring and more.
This document is a PhD thesis presented by Stepan Sutula to obtain the title of Doctor in Microelectronics and Electronic Systems. The thesis explores methods to increase the power efficiency and resolution of switched-capacitor Delta-Sigma analog-to-digital converters (ADCs) using novel low-power CMOS circuits.
It describes the development of low-current analog circuit techniques targeting power efficiency, including novel Class-AB operational amplifiers. A 96.6-dB-SNDR 50-kHz-BW 1.8-V 7.9-mW Delta-Sigma modulator for ADCs is implemented in a 0.18-μm CMOS process based on these techniques. Measurement results indicate
Our premium line of products includes Digital and Mixed Signal Oscilloscopes, Spectrum Analyzers and RF Signal Generators, Arbitrary waveform Generators, Sensitive Measurement Products, and Data Acquisition Systems. Our test solutions combine uncompromised product performance, quality, and advanced product features; all delivered at extremely attractive price points. Our solutions delight customers in many applications such as technical education, embedded design, WiFi integration, EMC, and manufacturing. Across all markets and products we deliver our customers with unprecedented value for their investment, reduce their overall cost of test, and help speed time to completion of their designs or projects.
https://www.n-denkei.com/singapore/inquiry/
Profilograph-profilometr is capable to provide measurement of parameters of surfaces in three-dimensional (3D) the image of their condition to within 1нм on height of a relief. This device allows to receive qualitatively new information which, in turn, will lead to development and creation of the newest technologies in mechanical engineering
Jasa Kalibrasi, Rental dan Jual Total Station Sokkia IM-52 Call/ wa 082119953499Budi anto
RUANG LINGKUP KEGIATAN
PENJUALAN, SERVICE / PERBAIKAN DAN PENYEWAAN ALAT-ALAT UKUR
PENJUALAN :
• Alat Ukur
- Total Station ( baru dan second hand )
- Theodolite ( baru dan second hand )
- Levels ( baru dan second hand )
- GPS
- Compass
- Clinometer
- Tandem/ Clino
- Binocular
- Digital Level
- Digital Planimeter
• Accessories :
- Tripod
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Catatan : Price List akan dikirim sesuai permintaan
This document provides information on Anton Paar's surface characterization and tribology testing solutions. It discusses their indentation testers, scratch testers, tribometers, and atomic force microscopes. Indentation testing is used to determine mechanical properties like hardness and modulus. Scratch testing evaluates properties like adhesion, scratch resistance, and wear. Tribology testing simulates friction conditions. The atomic force microscope images surfaces with nanometer resolution.
The document describes Core Wafer Systems' Apollo On-wafer Magnetic Test System for characterizing magnetic devices like MRAM on wafer. It provides uniform magnetic fields up to 100 Oersted continuous or 900 Oersted pulsed. Data can be analyzed instantly using ASUR RDA software. Test libraries are available for reliability measurements, magnetoresistance, non-volatile memory, and magnetic field calibration. The system uses a Suss Microtec 300mm prober for low-noise DC and high-frequency RF/microwave probing of devices.
The document summarizes the features of the ES series total station, including its fast and powerful reflectorless EDM, long battery life of 36 hours, rugged and user-friendly design, and advanced angle measurement accuracy down to 1 second. It has a 30x magnification and precise angular measurements. Additional features include long-range Bluetooth communication, USB port for data transfer, and IP66 dust and water resistance. The total station offers reliable, efficient surveying in all conditions.
The document summarizes the features of the ES series total station, including its fast and powerful reflectorless EDM, long battery life of 36 hours, rugged and user-friendly design, and advanced angle measurement accuracy down to 1 second. It has a 30x magnification telescope, USB port for data transfer, and Bluetooth communication as an option. The total station provides fast, precise distance and angle measurements for surveying applications.
The document summarizes the features of the ES series total station, including its fast and powerful reflectorless EDM, long battery life of 36 hours, rugged and user-friendly design, and advanced angle measurement accuracy down to 1 second. It has a 30x magnification telescope, USB port for data transfer, and Bluetooth communication as an option. The total station provides fast, precise distance and angle measurements for surveying applications.
Similar to New DIA Workflows for Ultimate Flexibility in LCMS Proteomics (20)
Sexuality - Issues, Attitude and Behaviour - Applied Social Psychology - Psyc...PsychoTech Services
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Current Ms word generated power point presentation covers major details about the micronuclei test. It's significance and assays to conduct it. It is used to detect the micronuclei formation inside the cells of nearly every multicellular organism. It's formation takes place during chromosomal sepration at metaphase.
EWOCS-I: The catalog of X-ray sources in Westerlund 1 from the Extended Weste...Sérgio Sacani
Context. With a mass exceeding several 104 M⊙ and a rich and dense population of massive stars, supermassive young star clusters
represent the most massive star-forming environment that is dominated by the feedback from massive stars and gravitational interactions
among stars.
Aims. In this paper we present the Extended Westerlund 1 and 2 Open Clusters Survey (EWOCS) project, which aims to investigate
the influence of the starburst environment on the formation of stars and planets, and on the evolution of both low and high mass stars.
The primary targets of this project are Westerlund 1 and 2, the closest supermassive star clusters to the Sun.
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. The X-ray sources exhibit a highly concentrated spatial distribution,
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This is a short talk that I gave at the Banff International Research Station workshop on Modeling and Theory in Population Biology. The idea is to try to understand how the burden of natural selection relates to the amount of information that selection puts into the genome.
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The cost of information acquisition by natural selection
Ryan Seamus McGee, Olivia Kosterlitz, Artem Kaznatcheev, Benjamin Kerr, Carl T. Bergstrom
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The Milky Way’s (MW) inner stellar halo contains an [Fe/H]-rich component with highly eccentric orbits, often referred to as the
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8.Isolation of pure cultures and preservation of cultures.pdf
New DIA Workflows for Ultimate Flexibility in LCMS Proteomics
1. 1
The world leader in serving science
Data-Independent Analysis on Thermo Scientific Orbitrap MS Systems
2. 2
Main Topics
Introduction: Why Do DIA?
•
Advantages of data independent acquisition, where, when, and why its useful
Where does DIA fit in?
•
Positioning of DIA methods with other workflows like DDA and PRM
Data Independent Analysis
•
Prerequisites, hardware and software
Challenges in DIA
•
The three characteristics of the ideal DIA experiment and the compromises among them
Flexibility in DIA Methods
•
Multiple varieties of MS2 and MS1+MS2 methods to suit experimental needs
Conclusion: If you Are Going to Make an Archive…
•
The new Thermo ScientificTM Q ExactiveTM HF MS as a DIA workhorse
3. 3
Introduction: Traditional Quantitation Tools
Relative Quantification (lower accuracy and precision)
Absolute Quantification (highest accuracy and precision)
Discovery
Routine
MS1 level quan., DDA methods, 1000’s analytes
DDA or SRM up to 100 analytes
SRM, MS2 level quan., 1-10 analytes
4. 4
Introduction: Quantitation Transformed
Relative Quantification (lower accuracy and precision)
Absolute Quantification (highest accuracy and precision)
Discovery
Routine
MS1 level quan., DDA methods, 1000’s analytes
DIA or PRM several 100 analytes
SRM, MS2 level quan., 1-10 analytes
5. 5
Introduction: A Time and Place for DIA
Typical Samples Published On:
Best Suited
When
Protein Complexes
Enriched Samples (e.g. phosphopeptides)
Cellular Fractions
IP Pulldowns
GLOBAL QUANTITATION PHASE
Data Dependent Acquisition
Data Independent Acquisition
wiSIM
Methods for a variety of sample conditions:
pSMART
basicDIA
msxDIA
6. 6
Introduction: Advantages of DIA
No targeting or timing
Retrospectively find new targets of interest
Run unmodified sample
Why perform Data Independent Analysis?
7. 7
HIGH QUALITY SPECTRAL LIBRARIES are critical to a successful DIA experiment
Generating Spectral Libraries
Validated High Quality Library
SEQUEST Search
y₁₆⁺1815.73828y₁₅⁺1684.69775y₂⁺248.16026b₁₄⁺1497.80652b₁₀²⁺564.29541b₁₃²⁺-H₂O683.85907y₈⁺907.41931b₁₁⁺1226.65344y₁₀⁺1035.47791b₇⁺754.38391y₁₁⁺1195.50806500100015002000m/z0.00.51.01.5 Intensity [counts] (10^6) Extracted from: D:Yeast_SmartW303_Yeast_50cm_140min_120k30k_2.raw #67524 RT: 120.83 FTMS, HCD@26.00, z=+3, Mono m/z=1104.85144 Da, MH+=3312.53977 Da, Match Tol.=0.02 Da
Matches VALIDATED at 1% FDR
High resolution accurate mass archive of all identified peptides
•
Peptide Intact Mass
•
Fragment Masses
•
Fragment Intensities
•
Retention Time
•
Isotope Ratios
under actual experimental conditions
1 μg HeLa 60 min
The Q Exactive HF MS generates a more comprehensive spectral library
8. 8
Using Libraries to Validate Results
DIA Experimental Data
Wide Window MS2 Fragment Ion Spectra
Validated Spectral Library y₁₆⁺1815.73828y₁₅⁺1684.69775y₂⁺248.16026b₁₄⁺1497.80652b₁₀²⁺564.29541b₁₃²⁺-H₂O683.85907y₈⁺907.41931b₁₁⁺1226.65344y₁₀⁺1035.47791b₇⁺754.38391y₁₁⁺1195.50806500100015002000m/z0.00.51.01.5 Intensity [counts] (10^6) Extracted from: D:Yeast_SmartW303_Yeast_50cm_140min_120k30k_2.raw #67524 RT: 120.83 FTMS, HCD@26.00, z=+3, Mono m/z=1104.85144 Da, MH+=3312.53977 Da, Match Tol.=0.02 Da
y11 y10 y9 Y8 y7
•
Number of Coeluting Library Transitions
•
Retention Time Correlation
•
Dot Product with Library Spectra
•
Mass Accuracy
How many library fragments are in the integrated peak
How close is the RT of the integrated peak to the library peptide (blue line)
What is the relative intensity of integrated peak relative to the real fragment masses
What is the mass error of the integrated peak relative to the real fragment masses
9. 9
Achieving the Utmost DIA Performance
Shorter Injection
Longer Injection
More Resolution
Narrower Windows
Less Resolution
Wider Windows
Reduced Mass Range
Greater Mass Range
Speed
Sensitivity
Selectivity
10. 10
basicDIA: 25 Da Segments
Quantify and confirm on the MS2 level using wide isolation windows
400 – 1000 m/z
MS2 No. 1
…
…
…
…
…
…
…
…
…
…
…
MS2 No.30
120 Windows of 6 Da Each with 1 Da Overlap
MS1 No.1
m/z 400
400 – 1000 m/z
MS2 No.2
m/z 1000
60k
120k
4 sec
120k
MS2 No. 1 … … … … … … … … … … … MS2 No.30
60k
DIA
•
26 amu isolation
•
Variable first mass
•
60 000 resolution
•
AGC: 2e5
•
105ms Injection
•
NCE 28%
•
Loop Count 32
Windows
412.5
612.5
812.5
1012.5
437.5
637.5
837.5
1037.5
462.5
662.5
862.5
1062.5
487.5
687.5
887.5
1087.5
512.5
712.5
912.5
1112.5
537.5
737.5
937.5
1137.5
562.5
762.5
962.5
1162.5
587.5
787.5
987.5
1187.5
412.5
612.5
812.5
437.5
637.5
837.5
462.5
662.5
862.5
487.5
687.5
887.5
11. 11
60k
basicDIA at 60K FWHM
25 Da windows covering the mass range from 400 to 1200 (optional MS1)
MS2 No. 1
…
…
…
…
…
…
…
…
…
…
…
…
…
MS2 No.32
32 Windows of 26 Da Each with 1 Da Overlap
m/z 400
m/z 1200
60k
4 sec
MS2 No. 1 … … … … … … … … … … … … … MS2 No.32
basicDIA provides good reproducibility due to short cycle times
12. 12
msxDIA
Speed / Cycle Time of using 20 Da windows with the selectivity of 10 Da windows
400 – 1000 m/z
MS2 No. 1
…
…
…
…
…
…
…
…
…
…
…
MS2 No.30
120 Windows of 6 Da Each with 1 Da Overlap
MS1 No.1
m/z 400
400 – 1000 m/z
MS2 No.2
m/z 1000
60k
120k
20 sec
4 sec
120k
MS2 No. 1
…
…
…
…
…
…
…
…
…
…
…
MS2 No.30
60k
Full MS
•
400-1000 m/z
•
Resolution: 120 000
•
AGC: 3e6
•
60 ms Injection Profile
DIA
•
10 amu isolation
•
Variable first mass
•
60 000 resolution
•
AGC: 1e5
•
54 ms Injection
•
NCE 28%
•
MSX Count 2
•
Loop Count 16
Windows
835.6297
985.6979
635.5388
615.5297
775.6024
765.5979
475.466
925.6706
715.5751
605.5251
915.6661
745.5888
785.607
445.4524
575.5115
685.5615
655.5479
855.6388
555.5024
845.6343
515.4842
795.6115
995.7025
425.4433
885.6525
465.4615
875.6479
625.5342
905.6615
565.5069
705.5706
665.5524
585.516
595.5206
945.6797
505.4796
495.4751
645.5433
805.6161
675.557
955.6843
455.4569
725.5797
405.4342
695.5661
525.4887
825.6252
935.6752
535.4933
435.4478
815.6206
415.4387
965.6888
485.4706
865.6434
545.4978
975.6934
755.5933
895.657
735.5842
Randomized List Generated by Skyline
………... continues to 5000 targets
13. 13
msxDIA
Speed / Cycle Time of using 20 Da windows with the selectivity of 10 Da windows
400 – 1000 m/z
MS2 No. 1 … … … … … … … … … … … MS2 No.30
120 Windows of 6 Da Each with 1 Da Overlap
MS1 No.1
m/z 400
400 – 1000 m/z
MS2 No.2
m/z 1000
60k
120k
20 sec
4 sec
120k
MS2 No. 1
…
…
…
…
…
…
…
…
…
…
…
MS2 No.30
60k
Full MS
•
400-1000 m/z
•
Resolution: 120 000
•
AGC: 3e6
•
60 ms Injection Profile
DIA
•
10 amu isolation
•
Variable first mass
•
60 000 resolution
•
AGC: 1e5
•
54 ms Injection
•
NCE 28%
•
MSX Count 2
•
Loop Count 16
………... continues to 5000 targets
14. 14
DIA on the Q Exactive HF MS: msxDIA
Speed / Cycle Time of using 20 Da windows with the selectivity of 10 Da windows
400 – 1000 m/z
MS2 No. 3
…
…
…
…
…
…
…
…
…
…
…
…
…
…
…
MS2 No.30
60 Windows of 10 Da Each
Full Coverage of 400–1000 m/z
Based upon: Egertson et al. (2013) Nature Methods 10, 744-766
Multiplex 2 x 10 Da Windows Simultaneously
MS1 No.1
m/z 400
400 – 1000 m/z
MS1 No.2
MS2 No. 1
MS2 No. 2
m/z 1000
MS2 No. 1
Randomly Distributed Windows
60k
120k
120k
60k
5 sec
2.5 sec
60k
15. 15
DIA on the Q Exactive HF MS: msxDIA
Speed / Cycle Time of using 20 Da windows with the selectivity of 10 Da windows
400 – 1000 m/z
MS2 No. 3
…
…
…
…
…
…
…
…
…
…
…
…
…
…
…
MS2 No.30
60 Windows of 10 Da Each
Full Coverage of 400–1000 m/z
Based upon: Egertson et al. (2013) Nature Methods 10, 744-766
Multiplex 2 x 10 Da Windows Simultaneously
MS1 No.1
m/z 400
400 – 1000 m/z
MS1 No.2
MS2 No. 1
MS2 No. 2
m/z 1000
MS2 No. 1
Randomly Distributed Windows
60k
120k
120k
60k
5 sec
2.5 sec
An approach providing a good balance of selectivity, speed, and sensitivity suited for complex mixtures
60k
16. 16
DIA on the Thermo Scientific™ Orbitrap Fusion™ Tribrid™ MS: WiSIM
The power of two detectors working in parallel: unsurpassed speed and sensitivity
400 – 1000 m/z
MS2 No. 1
…
…
…
…
…
…
…
…
…
…
…
MS2 No.30
120 Windows of 6 Da Each with 1 Da Overlap
MS1 No.1
m/z 400
400 – 1000 m/z
MS2 No.2
m/z 1000
60k
120k
20 sec
4 sec
120k
MS2 No. 1
…
…
…
…
…
…
…
…
…
…
…
MS2 No.30
60k
SIM
•
400-600, 600-800, 800- 1000 m/z
•
200 amu isolation
•
Resolution: 240 000
•
AGC: 3e4
•
50 ms injection
•
Profile
tMS2
•
12 amu isolation
•
150-1850 m/z
•
Ion Trap
•
AGC: 5e4
•
47 ms Injection
•
CID 30
•
Rapid Scan
Windows
406
514
606
714
806
914
418
526
618
726
818
926
430
538
630
738
830
938
442
550
642
750
842
950
454
562
654
762
854
962
466
574
666
774
866
974
478
586
678
786
878
986
490
598
690
798
890
998
502
702
902
Large-Scale Targeted Protein Quantification Using WiSIM-DIA on an Orbitrap Fusion Tribrid Mass Spectrometer
Kiyonami R, Senko M, Zabrouskov V, Huhmer A, Egertson J, Ting S, and MacCoss M.
17. 17
DIA on the Thermo Scientific™ Orbitrap Fusion™ Tribrid™ MS: WiSIM
The power of two detectors working in parallel: unsurpassed speed and sensitivity
400 – 1000 m/z
MS2 No. 1
…
…
…
…
…
…
…
…
…
…
…
MS2 No.30
120 Windows of 6 Da Each with 1 Da Overlap
MS1 No.1
m/z 400
400 – 1000 m/z
MS2 No.2
m/z 1000
60k
120k
20 sec
4 sec
120k
MS2 No. 1
…
…
…
…
…
…
…
…
…
…
…
MS2 No.30
60k
SIM
•
400-600, 600-800, 800- 1000 m/z
•
200 amu isolation
•
Resolution: 240 000
•
AGC: 3e4
•
50 ms injection
•
Profile
tMS2
•
12 amu isolation
•
150-1850 m/z
•
Ion Trap
•
AGC: 5e4
•
47 ms Injection
•
CID 30
•
Rapid Scan
Large-Scale Targeted Protein Quantification Using WiSIM-DIA on an Orbitrap Fusion Tribrid Mass Spectrometer Kiyonami R, Senko M, Zabrouskov V, Huhmer A, Egertson J, Ting S, and MacCoss M.
18. 18
DIA on the Orbitrap Fusion MS: WiSIM
Quantify using ultra-high resolution MS1 with MS2 confirmation and IT sensitivity
SIM 400 – 600 m/z
MS2 No. 1
…
…
…
…
…
…
MS2 No.17
17 Windows of 12 Da Each
MS1 No.1
SIM 600 – 800 m/z
Ion Trap
240k
3.6 sec
SIM 800 – 1000 m/z
MS1 No.2
240k
MS2 No. 1
…
…
…
…
…
…
MS2 No.17
Ion Trap
MS1 No.3
240k
MS2 No. 1
…
…
…
…
…
…
MS2 No.17
Ion Trap
Parallelized
Parallelized
Parallelized
19. 19
DIA on the Orbitrap Fusion MS: WiSIM
Quantify using ultra-high resolution MS1 with MS2 confirmation and IT sensitivity
SIM 400 – 600 m/z
MS2 No. 1 … … … … … … MS2 No.17
17 Windows of 12 Da Each
MS1 No.1
SIM 600 – 800 m/z
Ion Trap
240k
3.6 sec
SIM 800 – 1000 m/z
MS1 No.2
240k
MS2 No. 1 … … … … … … MS2 No.17
Ion Trap
MS1 No.3
240k
MS2 No. 1
…
…
…
…
…
…
MS2 No.17
Ion Trap
Parallelized
Parallelized
Parallelized
wiSIM provides fully parallelized speed, IT sensitivity, and ultimate resolution
20. 20
Achieving the Utmost DIA Performance
Short cycle times, good reproducibility
Excellent selectivity and sensitivity
Balance of speed, sensitivity, selectivity
Fully parallelized speed, IT sensitivity, ultimate resolution
21. 21
DIA: In Summary y₁₆⁺1815.73828y₁₅⁺1684.69775y₂⁺248.16026b₁₄⁺1497.80652b₁₀²⁺564.29541b₁₃²⁺-H₂O683.85907y₈⁺907.41931b₁₁⁺1226.65344y₁₀⁺1035.47791b₇⁺754.38391y₁₁⁺1195.50806500100015002000m/z0.00.51.01.5 Intensity [counts] (10^6) Extracted from: D:Yeast_SmartW303_Yeast_50cm_140min_120k30k_2.raw #67524 RT: 120.83 FTMS, HCD@26.00, z=+3, Mono m/z=1104.85144 Da, MH+=3312.53977 Da, Match Tol.=0.02 Da
Obtain super deep proteomic profiling using high resolution / accurate mass in under an hour.
22. 22
DIA: In Summary
Access the highest resolutions and mass accuracy.
23. 23
Access the highest resolutions and mass accuracy.
DIA: In Summary
24. 24
DIA: In Summary
Have the flexibility to quantify on either the MS1 or MS2 level at high resolution
25. 25
DIA: In Summary
Have the selectivity of narrow windows AND the speed of wide windows thanks to precursor multiplexing
26. 26
DIA: In Summary
Ensure reproducible quantitation with scan speeds up to 18 Hz !
10 points
3 points
RSD 8-15%
RSD >25%
27. 27
DIA: In Summary
Next generation analyzers provide twice the resolution at the same speed
0
20000
40000
60000
80000
100000
120000
400
600
800
1000
1200
1400
1600
1800
2000
Resolution
m/z
Resolution at 7 Hz Analyzer Setting
Over Typical Fragment Range
35k
27k
19k
28. 28
DIA: In Summary
dotp
0.99
The capabilities of the Orbitrap platform make it the ideal DIA instrument
Next generation analyzers provide twice the resolution at the same speed
0
20000
40000
60000
80000
100000
120000
400
600
800
1000
1200
1400
1600
1800
2000
Resolution
m/z
Resolution at 7 Hz Analyzer Setting
Over Typical Fragment Range
35k
27k
19k
29. 29
Concluding Remarks
Transform your DIA experiment with the latest Orbitrap instruments
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