The document describes Core Wafer Systems' Apollo On-wafer Magnetic Test System for characterizing magnetic devices like MRAM on wafer. It provides uniform magnetic fields up to 100 Oersted continuous or 900 Oersted pulsed. Data can be analyzed instantly using ASUR RDA software. Test libraries are available for reliability measurements, magnetoresistance, non-volatile memory, and magnetic field calibration. The system uses a Suss Microtec 300mm prober for low-noise DC and high-frequency RF/microwave probing of devices.
JUNXY's key power solutions for your standby power system, product ranges include: battery load bank, battery resistance & conductance tester, battery charger, battery regenerator for single cell and string, battery monitoring system, battery manageme"
PacTec 2nd Source provides replacement JDS Uniphase and Spectra Physics lasers with new argon tubes used on KLA inspection systems. We provide argon lasers used on various KLA systems using 30mW and 75mW lasers.
Pemesanan produk, hubungi PT Siwali Swantika melalui WhatsApp, Jakarta : 0811-1519-949 (chat only) | Surabaya : 0811-1519-948 (chat only). Kunjungi website kami di www.siwali.com, untuk detail informasi spesifikasi dan model alat.
JUNXY's key power solutions for your standby power system, product ranges include: battery load bank, battery resistance & conductance tester, battery charger, battery regenerator for single cell and string, battery monitoring system, battery manageme"
PacTec 2nd Source provides replacement JDS Uniphase and Spectra Physics lasers with new argon tubes used on KLA inspection systems. We provide argon lasers used on various KLA systems using 30mW and 75mW lasers.
Pemesanan produk, hubungi PT Siwali Swantika melalui WhatsApp, Jakarta : 0811-1519-949 (chat only) | Surabaya : 0811-1519-948 (chat only). Kunjungi website kami di www.siwali.com, untuk detail informasi spesifikasi dan model alat.
DATASYST Engineering & Testing Services, Inc. is a Wisconsin based, independent, nationally accredited, third-party engineering and testing laboratory providing industry and manufacturing markets with reliable, solution-focused and cost effective product testing and development for mechanical and electrical assemblies and components. For more information please visit http://www.datasysttest.com/seismic-testing.php
SCR-Based ESD Protection Designs for RF ICsjournal ijrtem
Abstract: CMOS technology has been used to implement the radio-frequency integrated circuits (RF ICs). However, it was known that advanced CMOS technologies seriously degrade the electrostatic discharge (ESD) robustness of ICs. Therefore, on-chip ESD protection devices must be added into the chip, including RF ICs. To minimize the impacts from ESD protection devices on RF performances, the ESD protection at RF pads must be carefully designed. A review on ESD protection designs with silicon-controlled rectifier (SCR) devices in RF ICs is presented in this article. Keywords: CMOS, ESD, RF, SCR.
TN013 ESD Failure Analysis of PV Module Diodes and TLP Test MethodWei Huang
Bypass diodes inserted across the strings of the solar panel arrays are essential to ensure the efficiency of the solar power system. However, those diodes are found to be susceptible to potential Electrostatic Discharge (ESD) events in the process of solar Photovoltaic (PV) panel manufacture, transportation and on-site installation. Please refer [1], where an International PV Module Quality Assurance Forum has been setup to investigate PV Module reliability, and Task Force 4 has been setting guidelines for testing the ESD robustness of diodes used to enhance PV panel performance. This document explains the theory behind the ESD damage and the proper test and analysis methods for ESD failure of diodes. To demonstrate the proposed testing methodology that follows, we will be evaluating six different types of diode models as supplied by our customer, who manufactures solar panel arrays.
ST on 96Boards OpenHours - System level ESD protection96Boards
These are the presentation slides that are linked to the 96Boards OpenHours episode #36. This episode can be found on YouTube here:
https://youtu.be/pgK_JRJtBzY
Please join us every week: www.96Boards.org/OpenHours
TN006 frequency compensation method for vf-tlp measurementsWei Huang
The objective of this article is to demonstrate a frequency compensation technique for measuring the current and voltage of a device under test in a Very Fast Transmission Line Pulser (VF-TLP) test environment. The current measurement utilizes Non-Overlapping Time Domain Reflectometry, which is useful for On-Wafer testing because the measurement can be made with low profile small pitch probes, such as the Picoprobe Model 10. Further, to increase the bandwidth of the current measurement over common techniques, such as current transformers with 1GHz bandwidth, the method utilizes a resistive Pick-Off. The Pick-Off can be finely tuned to have as little insertion loss as possible, thereby enhancing the bandwidth. Although this method can also yield a DUT voltage measurement, the result suffers from numerical errors for low ohmic devices. A separate, direct measurement is presented that will demonstrate an extremely accurate voltage measurement that also utilizes frequency compensation.
Automatically Adjust to 0%,100%
Printer Controlled by Microcomputer Processor
Using 1200/mm High-Performance
Large Sample Room to Place 100mm Cuvette
The Apparatus More Stable and Reliable
Spectrophotometric (UV) is a solid state microcontroller based instrument designed for quick and accurate spectrophotometric analysis of any concentration.
It operates at a wavelength range of 200 nm to 1000 nm.
The instrument uses the latest microprocessor technology and advanced engineering techniques so as to give enhanced accuracy and reproducibility.
www.jlabexport.com/catch.php?request_url=uv-spectrophotometer
Tektronix keithley Product and Application update Q2 2016Jeff Sable
Tektronix delivers innovative, precise and easy-to-operate test, measurement and monitoring solutions that solve problems, unlock insights and drive discovery.
DATASYST Engineering & Testing Services, Inc. is a Wisconsin based, independent, nationally accredited, third-party engineering and testing laboratory providing industry and manufacturing markets with reliable, solution-focused and cost effective product testing and development for mechanical and electrical assemblies and components. For more information please visit http://www.datasysttest.com/seismic-testing.php
SCR-Based ESD Protection Designs for RF ICsjournal ijrtem
Abstract: CMOS technology has been used to implement the radio-frequency integrated circuits (RF ICs). However, it was known that advanced CMOS technologies seriously degrade the electrostatic discharge (ESD) robustness of ICs. Therefore, on-chip ESD protection devices must be added into the chip, including RF ICs. To minimize the impacts from ESD protection devices on RF performances, the ESD protection at RF pads must be carefully designed. A review on ESD protection designs with silicon-controlled rectifier (SCR) devices in RF ICs is presented in this article. Keywords: CMOS, ESD, RF, SCR.
TN013 ESD Failure Analysis of PV Module Diodes and TLP Test MethodWei Huang
Bypass diodes inserted across the strings of the solar panel arrays are essential to ensure the efficiency of the solar power system. However, those diodes are found to be susceptible to potential Electrostatic Discharge (ESD) events in the process of solar Photovoltaic (PV) panel manufacture, transportation and on-site installation. Please refer [1], where an International PV Module Quality Assurance Forum has been setup to investigate PV Module reliability, and Task Force 4 has been setting guidelines for testing the ESD robustness of diodes used to enhance PV panel performance. This document explains the theory behind the ESD damage and the proper test and analysis methods for ESD failure of diodes. To demonstrate the proposed testing methodology that follows, we will be evaluating six different types of diode models as supplied by our customer, who manufactures solar panel arrays.
ST on 96Boards OpenHours - System level ESD protection96Boards
These are the presentation slides that are linked to the 96Boards OpenHours episode #36. This episode can be found on YouTube here:
https://youtu.be/pgK_JRJtBzY
Please join us every week: www.96Boards.org/OpenHours
TN006 frequency compensation method for vf-tlp measurementsWei Huang
The objective of this article is to demonstrate a frequency compensation technique for measuring the current and voltage of a device under test in a Very Fast Transmission Line Pulser (VF-TLP) test environment. The current measurement utilizes Non-Overlapping Time Domain Reflectometry, which is useful for On-Wafer testing because the measurement can be made with low profile small pitch probes, such as the Picoprobe Model 10. Further, to increase the bandwidth of the current measurement over common techniques, such as current transformers with 1GHz bandwidth, the method utilizes a resistive Pick-Off. The Pick-Off can be finely tuned to have as little insertion loss as possible, thereby enhancing the bandwidth. Although this method can also yield a DUT voltage measurement, the result suffers from numerical errors for low ohmic devices. A separate, direct measurement is presented that will demonstrate an extremely accurate voltage measurement that also utilizes frequency compensation.
Automatically Adjust to 0%,100%
Printer Controlled by Microcomputer Processor
Using 1200/mm High-Performance
Large Sample Room to Place 100mm Cuvette
The Apparatus More Stable and Reliable
Spectrophotometric (UV) is a solid state microcontroller based instrument designed for quick and accurate spectrophotometric analysis of any concentration.
It operates at a wavelength range of 200 nm to 1000 nm.
The instrument uses the latest microprocessor technology and advanced engineering techniques so as to give enhanced accuracy and reproducibility.
www.jlabexport.com/catch.php?request_url=uv-spectrophotometer
Tektronix keithley Product and Application update Q2 2016Jeff Sable
Tektronix delivers innovative, precise and easy-to-operate test, measurement and monitoring solutions that solve problems, unlock insights and drive discovery.
Single node architecture: hardware and software components of a sensor node - WSN
Network architecture: typical network architectures-data relaying and aggregation strategies -
MAC layer protocols: self-organizing, Hybrid TDMA/FDMA and CSMA based MAC- IEEE
802.15.4
The TOFD PRO System is designed for mechanized testing of welded joints using Time-of Flight Diffraction (TOFD) technique. The System assures the solution of the following tasks - testing the welded joints of:
flat objects;
tubes of mean and large diameters (with min. outer diameter of 600 mm);
spherical and cylindrical oil and gas tanks (with min. dia of 10 m).
TOFD PRO System is implemented on the base of UsC TOFD 2.10 PRO Scanner and OKO-22M-TOFD flaw detector with special configured software.
WT5000 is the updated version of WT3000 with a super LCD for displaying waveforms and parameters directly, and it includes all the functions and technical parameters of WT3000. Reports can be printed if printer is connected. It also meets the latest requirements for electronic ballasts in international standards IEC 60929, IEC 60969, IEC 61000-3-2, GB/T15144-2005, GB/T17263-1998 and so on.
1. Core Wafer Systems
Apollo On-wafer Magnetic Test System
• Magnetic fields in X and Y, optionally Z
• 100 Oersted continuous field
• 900 Oersted low-duty-cycle burst: triangle or pulse
• Uniformity better than 2% within 5 mm cube
surrounding probe contact
• Measurement libraries available
Magnetics: Quasi-static R-H, R-i
NVM: endurance, margin
Noise: 1/f, microwave
300 mm on-wafer DC and RF/Microwave test for
technology development and reliability characterization
of GMR, Spintronic, Ferrite magnetic technologies.
MRAM and Hall Effect magnetic devices
2. ASUR RDA Data Analysis
Using ASUR SDR’s data output for Core Wafer System’s ASUR RDA
data analysis software, data analysis for quality control, reliability
lifetime and wafermap analysis is available instantly.
Data is written in ASCII comma-separated format for easy access
and conversion to other data analysis systems you may already
use.
Core Wafer System’s Apollo On-wafer Magnetic Test System enables on-wafer magnetic
device characterization for technologies such as spintronic and GMR magneto-resistor cells, Hall-
effect magnetic field sensors and monolithic ferrite devices.
Süss Microtec ProbeShield® for DC and
RF/Microwave probing
The Core Wafer Systems Apollo Magnetic Test
System uses the Süss Microtec PA300PS 300 mm
Semiautomatic Probe System featuring
ProbeShield®
technology for truly convenient and
fully shielded measurements for low frequency dc
noise and high frequency RF/Microwave measure-
ments or fast rise-time pulse performance and
s-parameters.
High Performance DC and high frequency probing
RF/Microwave and DC pobing of the device is made using
special magnetically neutralized Süss Microtec Multi-Z
probes. This high performance probe technology allows for
impedance controlled measurements up to 26 GHz, at
temperature (-60C - 200C) with one million touchdown
lifetimes.
ASUR SDR:
The Industry Proven PC-based On-wafer Test Platform
ASUR SDR provides a robust PC-based testplan execution platform
with full prober automation to collect parametric technology devel-
opment data from your magnetic devices.
3. Parametric Test Structure Measurement Library
Parametric test library including 2-wire and 4-wire kelvin resistance,
basic diode and MOS measurements and other common parametric
measurements.
0.0 0.2 0.4 0.6 0.8 1.0
0.0000
0.0005
0.0010
0.0015
0.0020
0.0025
0.0030
General Microelectronic Reliability Library
JEDEC compliant reliability measurements based on CWS PDQ-WLR
including TDDB, EM and HCI measurement. Industry-standard
library for CMOS production WLR measurement.
Resistance, Ohms
-100 -80 -60 -40 -20 0 20 40 60 80 100
0
200
400
600
800
Magnetic Field, Gauss
Magnetoresistor Library
Quasistatic R-vs-H measurements using a variety of
magnetic field options including simple on-axis
(X,Y or Z), rotation in XY vector field.
Angular resolution of 1° allows magnetic anisotropy
to be characterized in any direction.
Test Libraries availble for Magnetic Devices on the Apollo test system
Libraries are available to address specific test needs involving your magnetic device technology
development. These include:
Magnetic Field Utility Library
Calibrate and map magnetic field pattern for
validation/calibration of magnetic bias. Supports
GMR 3-axis telsameter in 1, 2 or 3 simultaneous
axis measurement. Read-back validation of coil
drive current and voltage over time for validation of
field levels.