David Bernard is a French national with over 15 years of experience in ESD protection development and library design at Atmel. He has led projects developing IO libraries and defining ESD strategies. His expertise includes defining ESD test structures, analyzing TLP results, and implementing ESD protection at the device, cell, library, and chip levels. He also has experience developing standard cell and IO libraries, defining compaction and generation rules. Bernard holds a PhD in microelectronics and has published several papers in the field of ESD protection and interconnect modeling.