This document discusses test data compression techniques for system-on-chip designs. It presents the XMatchPro algorithm that combines dictionary-based and bit mask-based compression to significantly reduce testing time and memory requirements. The algorithm was applied to benchmarks and achieved a 92% compression efficiency while improving decompression efficiency by up to 90% compared to other techniques without additional overhead. International lossless compression techniques are also overviewed, including dictionary-based Lempel-Ziv methods that have been implemented in hardware using systolic arrays or content addressable memories.