The document discusses modern techniques for materials characterization. It begins with an overview of various probes that can be used, including electrons, ions, neutrons, photons, heat, and fields. It then discusses different analysis techniques based on these probes, including electron microscopy, diffraction techniques, and photon-based techniques. The document provides details on scanning electron microscopy, transmission electron microscopy, x-ray diffraction, neutron diffraction, Raman spectroscopy, and other analytical tools and their basic principles and applications for materials characterization.
Electron microscopy provides high resolution imaging of nanoscale structures using electron beams. There are two main types: transmission electron microscopy (TEM) and scanning electron microscopy (SEM). TEM uses transmitted electrons to image ultra thin samples, allowing visualization of structures less than an angstrom in size. SEM scans a focused electron beam across a sample to generate topographical and compositional information from electron interactions within microns of the surface. Both techniques require specialized sample preparation and equipment to produce high quality images for research applications across biology, materials science, and other fields.
Materials characterization techniques are used to analyze the internal structure and properties of a material. Common techniques include microscopic analysis using optical microscopes, scanning electron microscopes, and transmission electron microscopes to visualize internal structure at different magnifications. Other techniques include chemical analysis using techniques like x-ray spectroscopy and diffraction to determine composition, and thermal analysis to examine properties under temperature changes. Characterization provides information on properties like structure, defects, composition, and thermal behavior.
This document discusses various characterization techniques for nanoparticles. It describes microscopy methods like scanning electron microscopy (SEM), transmission electron microscopy (TEM), and scanning tunneling microscopy (STM) that can be used to determine nanoparticle size, shape, composition and crystalline structure at high resolution. Spectroscopy methods like X-ray diffraction (XRD), small angle X-ray scattering (SAXS), X-ray photoelectron spectroscopy (XPS), UV-vis spectroscopy, and Fourier transform infrared spectroscopy (FT-IR) are also outlined for analyzing nanoparticle properties. The key techniques of SEM, TEM, XRD and SAXS are then explained in more detail regarding their basic principles and what types of nanoparticle information can be obtained
This document discusses various characterization techniques for bionanomaterials. Structural characterization techniques like X-ray diffraction (XRD), scanning electron microscopy (SEM), and transmission electron microscopy (TEM) are used to determine structure and morphology. Chemical characterization techniques like optical spectroscopy, electron spectroscopy, and mass spectrometry are used to determine surface and interior atoms, compounds, and spatial distributions. Additional techniques discussed include small angle X-ray scattering (SAXS) and gas adsorption. Characterization at the nanoscale requires high resolution and sensitivity to provide atomic-level detail.
The document provides an overview of scanning electron microscopes (SEMs). It discusses the history and development of SEMs. Key components of SEMs are described, including the electron gun, electromagnetic lenses, vacuum chamber, detectors, and sample stage. SEMs produce high-resolution images of sample surfaces by scanning them with a focused beam of electrons. Signals produced by electron-sample interactions reveal information about morphology, composition, and structure. Applications of SEMs discussed include nanomaterial characterization, archaeology, biology, and industrial quality control. Limitations include sample size constraints and specialized training required.
This document provides an overview of characterization techniques for nanomaterials. It discusses various microscopy tools like optical microscopy, scanning electron microscopy (SEM), transmission electron microscopy (TEM), and scanning probe microscopy (SPM) techniques like atomic force microscopy (AFM) and scanning tunneling microscopy (STM) that are used to characterize the structure, morphology, and properties of nanomaterials at high resolution. It also describes other characterization methods like X-ray diffraction (XRD) analysis, UV-Vis spectroscopy, and particle size analysis that provide structural and chemical information about nanoscale structures.
The document discusses modern techniques for materials characterization. It begins with an overview of various probes that can be used, including electrons, ions, neutrons, photons, heat, and fields. It then discusses different analysis techniques based on these probes, including electron microscopy, diffraction techniques, and photon-based techniques. The document provides details on scanning electron microscopy, transmission electron microscopy, x-ray diffraction, neutron diffraction, Raman spectroscopy, and other analytical tools and their basic principles and applications for materials characterization.
Electron microscopy provides high resolution imaging of nanoscale structures using electron beams. There are two main types: transmission electron microscopy (TEM) and scanning electron microscopy (SEM). TEM uses transmitted electrons to image ultra thin samples, allowing visualization of structures less than an angstrom in size. SEM scans a focused electron beam across a sample to generate topographical and compositional information from electron interactions within microns of the surface. Both techniques require specialized sample preparation and equipment to produce high quality images for research applications across biology, materials science, and other fields.
Materials characterization techniques are used to analyze the internal structure and properties of a material. Common techniques include microscopic analysis using optical microscopes, scanning electron microscopes, and transmission electron microscopes to visualize internal structure at different magnifications. Other techniques include chemical analysis using techniques like x-ray spectroscopy and diffraction to determine composition, and thermal analysis to examine properties under temperature changes. Characterization provides information on properties like structure, defects, composition, and thermal behavior.
This document discusses various characterization techniques for nanoparticles. It describes microscopy methods like scanning electron microscopy (SEM), transmission electron microscopy (TEM), and scanning tunneling microscopy (STM) that can be used to determine nanoparticle size, shape, composition and crystalline structure at high resolution. Spectroscopy methods like X-ray diffraction (XRD), small angle X-ray scattering (SAXS), X-ray photoelectron spectroscopy (XPS), UV-vis spectroscopy, and Fourier transform infrared spectroscopy (FT-IR) are also outlined for analyzing nanoparticle properties. The key techniques of SEM, TEM, XRD and SAXS are then explained in more detail regarding their basic principles and what types of nanoparticle information can be obtained
This document discusses various characterization techniques for bionanomaterials. Structural characterization techniques like X-ray diffraction (XRD), scanning electron microscopy (SEM), and transmission electron microscopy (TEM) are used to determine structure and morphology. Chemical characterization techniques like optical spectroscopy, electron spectroscopy, and mass spectrometry are used to determine surface and interior atoms, compounds, and spatial distributions. Additional techniques discussed include small angle X-ray scattering (SAXS) and gas adsorption. Characterization at the nanoscale requires high resolution and sensitivity to provide atomic-level detail.
The document provides an overview of scanning electron microscopes (SEMs). It discusses the history and development of SEMs. Key components of SEMs are described, including the electron gun, electromagnetic lenses, vacuum chamber, detectors, and sample stage. SEMs produce high-resolution images of sample surfaces by scanning them with a focused beam of electrons. Signals produced by electron-sample interactions reveal information about morphology, composition, and structure. Applications of SEMs discussed include nanomaterial characterization, archaeology, biology, and industrial quality control. Limitations include sample size constraints and specialized training required.
This document provides an overview of characterization techniques for nanomaterials. It discusses various microscopy tools like optical microscopy, scanning electron microscopy (SEM), transmission electron microscopy (TEM), and scanning probe microscopy (SPM) techniques like atomic force microscopy (AFM) and scanning tunneling microscopy (STM) that are used to characterize the structure, morphology, and properties of nanomaterials at high resolution. It also describes other characterization methods like X-ray diffraction (XRD) analysis, UV-Vis spectroscopy, and particle size analysis that provide structural and chemical information about nanoscale structures.
Scanning electron microscopy (SEM) uses a scanning electron microscope to inspect specimen topographies at high magnifications. SEM works by focusing a beam of electrons onto a specimen, causing secondary electrons to dislodge and be collected to form an image. Magnifications can exceed 300,000x but most semiconductor applications require less than 3,000x. SEM is used to analyze defects on device surfaces. Transmission electron microscopy (TEM) works by transmitting an electron beam through a thin specimen. The electron intensity distribution behind the specimen is magnified and viewed on a screen or captured digitally. TEM provides higher resolution than SEM and is used to examine ultrastructures of biological specimens like mitochondria at high magnifications.
Why is spectrophotometer used in the leather & textile footwear industry?
In the leather & textile footwear industry, using a spectrophotometer to capture both color and appearance on a physical sample has greatly improved quality, consistency, and speed to market. To make color approvals on-screen, the digital color file must also be color-accurate when it is imported into the design software
This document provides an overview of X-ray spectroscopy techniques, including X-ray absorption and fluorescence. It discusses the production of X-rays, the principles of X-ray absorption spectroscopy and X-ray fluorescence spectroscopy, and their applications. Key topics covered include X-ray sources like X-ray tubes and synchrotrons, Beer's law and how it relates to X-ray absorption, X-ray absorption near edge structure (XANES) and extended X-ray absorption fine structure (EXAFS), and the use of these techniques in fields like chemistry, physics and materials science.
This document provides information about testing methods for ceramics. It discusses several techniques for analyzing the chemical composition, optical properties, and mechanical properties of ceramics. Specifically, it describes X-ray photoelectron spectroscopy for elemental analysis, secondary ion mass spectrometry for surface composition analysis, energy dispersive X-ray spectroscopy for elemental quantification, and various tests for measuring hardness, strength, gloss, refractive index, and color.
Electron microprobe analysis (EMPA) is a technique that uses a focused electron beam to determine the elemental composition of materials at the micrometer scale. It works by generating characteristic x-rays from sample atoms when bombarded by electrons. These x-rays can then be analyzed using either wavelength dispersive spectrometry (WDS) or energy dispersive spectrometry (EDS) to identify and quantify elemental composition. EMPA provides highly accurate micrometer-scale compositional data but requires standards for quantification and corrections due to factors like excitation volume.
This document provides an overview of scanning electron microscopy (SEM) for analyzing polymer composites and nanocomposites. It describes the basic components of an electron microscope, including the illumination system, imaging system, specimen stage, vacuum pump system, and image recording system. It explains that SEM uses a scanned beam of electrons to produce images of a sample by detecting secondary and backscattered electrons emitted from the surface. The document outlines the signals produced in electron microscopy and discusses scanning electron microscopy and transmission electron microscopy for analyzing polymer composites. It provides details on SEM instrumentation and imaging formation.
Transmission electron microscopy (TEM) uses a beam of electrons to examine objects at a very fine scale. TEM can image at a higher resolution than light microscopes due to the shorter wavelength of electron beams. In TEM, a beam of electrons is transmitted through an ultrathin specimen, interacting with the sample as it passes through. This interaction is used to form an image that is magnified and focused onto a screen, with resolutions down to fractions of a nanometer. TEM is widely used in materials science, biology, and medicine for examining nanostructures.
X-ray crystallography uses X-rays to determine the atomic structure of crystals. Crystals are bombarded with X-rays, which diffract upon contact with the atoms in the crystal. The angles and intensities of the diffracted X-rays are measured to deduce the positions of atoms in the crystal. This technique is useful for visualizing protein structures and identifying unknown crystal structures. It involves growing a crystal, exposing it to X-rays, and computationally analyzing the diffraction pattern to produce an atomic model of the crystal structure. X-ray crystallography has applications in characterizing polymers, assessing metal fatigue, and soil classification.
The document provides information on various materials characterization techniques, including scanning electron microscopy (SEM), scanning tunneling microscopy and scanning force microscopy (STM/SFM), transmission electron microscopy (TEM), energy-dispersive X-ray spectroscopy (EDS), scanning transmission electron microscopy (STEM), X-ray diffraction (XRD), X-ray photoelectron and Auger electron diffraction (XPD/AED), and Auger electron spectroscopy (AES). Each technique is described in one or two paragraphs covering its operating parameters, capabilities, sample requirements, and applications.
ANALYSIs TECHNIQUES : Spectroscopies - SHREYA NAIR
INTRODUCTION - Spectroscopies are useful for chemical state analysis (bonding or charge transfer amongst the atoms), electronic structure (energy gaps, impurity levels, band formation and transition probabilities) and other properties of materials.
RAMAN SPECTROSCOPY
PHOTOLUMINESENCE SPECTROMETER
AUGER ELECTRON SPECTROSCOPY
X-Ray and Ultra Violet Photoelectron Spectroscopies (XPS or ESCA and UPS)
REFERENCE
THANK YOU
Spectroscopy is the study of how light interacts with matter and can provide information about a molecule's structure. Different types of electromagnetic radiation excite molecules to different energy states. Infrared spectroscopy analyzes molecular vibrations to determine functional groups, UV-visible spectroscopy analyzes electronic transitions to study conjugated systems, and NMR spectroscopy uses radio waves to analyze nuclear spin transitions and determine atomic connectivity. Together these techniques allow chemists to learn about molecular structures without being able to directly see individual molecules.
Electron Energy Loss Spectroscopy (EELS) involves analyzing the energy distribution of electrons that have undergone inelastic scattering in a transmission electron microscope. The technique provides information about a sample's composition, bonding properties, and local structure from features in the EELS spectrum including peaks corresponding to ionization edges that identify elements and fine structures related to bonding and coordination. However, EELS has limitations in usable sample thickness, especially for heavier elements where thickness must be less than 20 nm.
This document provides an introduction to electron microscopy. It begins with fundamental concepts and then discusses the construction of transmission and scanning electron microscopes. It explains key differences between electron microscopes and optical microscopes, such as electrons having no visible wavelength. The document compares the similarities and differences between EM and LM, such as both having illumination, specimen, and imaging systems, but EM using magnetic lenses. It discusses electron-specimen interactions that EM can detect such as backscattered electrons, secondary electrons, Auger electrons, X-rays, and diffraction patterns. Finally, it covers high resolution EM and examples of discoveries it enabled.
1. Electron microscopy techniques like SEM and TEM use electrons accelerated to high energies to interact with and provide information about samples on the nanometer scale.
2. SEM can be used to provide information on surface topography, crystalline structure, chemical composition and electrical behavior of the top 1um of a sample through detection of signals like secondary electrons, backscattered electrons, and x-rays.
3. Different signals provide different types of information - secondary electrons provide topographic information at high resolution while backscattered electrons provide compositional information and can also provide crystallographic data through electron channeling effects.
X-ray photoelectron spectroscopy (XPS) is a surface-sensitive technique that uses X-rays to eject electrons from a material's surface and measure their kinetic energy to determine the elemental composition and chemical states. Kai Siegbahn developed XPS in the 1950s and won the Nobel Prize for his work. A study used XPS to analyze the surface chemistry of langasite crystals before and after vacuum annealing, finding that higher-temperature annealing reduced the surface concentration of gallium. XPS provides quantitative and chemical state information from the top 10-100 Angstroms of a surface.
Perovskite: introduction, classification, structure of perovskite, method to synthesis, characterization by XRD and UV- vis spectroscopy , lambert beer's law, material properties and advantage and application.
The document discusses X-ray fluorescence (XRF) theory and applications. XRF involves bombarding a sample with X-rays, which causes fluorescent X-rays to be emitted from the sample that are characteristic of its elemental composition. This allows for both qualitative and quantitative elemental analysis. Key advantages of XRF include rapid, nondestructive analysis of major and trace elements in various materials. Common applications include analysis of soils, minerals, metals, and more in fields like geology, archaeology, and environmental analysis.
LAND USE LAND COVER AND NDVI OF MIRZAPUR DISTRICT, UPRAHUL
This Dissertation explores the particular circumstances of Mirzapur, a region located in the
core of India. Mirzapur, with its varied terrains and abundant biodiversity, offers an optimal
environment for investigating the changes in vegetation cover dynamics. Our study utilizes
advanced technologies such as GIS (Geographic Information Systems) and Remote sensing to
analyze the transformations that have taken place over the course of a decade.
The complex relationship between human activities and the environment has been the focus
of extensive research and worry. As the global community grapples with swift urbanization,
population expansion, and economic progress, the effects on natural ecosystems are becoming
more evident. A crucial element of this impact is the alteration of vegetation cover, which plays a
significant role in maintaining the ecological equilibrium of our planet.Land serves as the foundation for all human activities and provides the necessary materials for
these activities. As the most crucial natural resource, its utilization by humans results in different
'Land uses,' which are determined by both human activities and the physical characteristics of the
land.
The utilization of land is impacted by human needs and environmental factors. In countries
like India, rapid population growth and the emphasis on extensive resource exploitation can lead
to significant land degradation, adversely affecting the region's land cover.
Therefore, human intervention has significantly influenced land use patterns over many
centuries, evolving its structure over time and space. In the present era, these changes have
accelerated due to factors such as agriculture and urbanization. Information regarding land use and
cover is essential for various planning and management tasks related to the Earth's surface,
providing crucial environmental data for scientific, resource management, policy purposes, and
diverse human activities.
Accurate understanding of land use and cover is imperative for the development planning
of any area. Consequently, a wide range of professionals, including earth system scientists, land
and water managers, and urban planners, are interested in obtaining data on land use and cover
changes, conversion trends, and other related patterns. The spatial dimensions of land use and
cover support policymakers and scientists in making well-informed decisions, as alterations in
these patterns indicate shifts in economic and social conditions. Monitoring such changes with the
help of Advanced technologies like Remote Sensing and Geographic Information Systems is
crucial for coordinated efforts across different administrative levels. Advanced technologies like
Remote Sensing and Geographic Information Systems
9
Changes in vegetation cover refer to variations in the distribution, composition, and overall
structure of plant communities across different temporal and spatial scales. These changes can
occur natural.
Leveraging Generative AI to Drive Nonprofit InnovationTechSoup
In this webinar, participants learned how to utilize Generative AI to streamline operations and elevate member engagement. Amazon Web Service experts provided a customer specific use cases and dived into low/no-code tools that are quick and easy to deploy through Amazon Web Service (AWS.)
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Similar to concept of Cathodoluminescence and it's application.pptx
Scanning electron microscopy (SEM) uses a scanning electron microscope to inspect specimen topographies at high magnifications. SEM works by focusing a beam of electrons onto a specimen, causing secondary electrons to dislodge and be collected to form an image. Magnifications can exceed 300,000x but most semiconductor applications require less than 3,000x. SEM is used to analyze defects on device surfaces. Transmission electron microscopy (TEM) works by transmitting an electron beam through a thin specimen. The electron intensity distribution behind the specimen is magnified and viewed on a screen or captured digitally. TEM provides higher resolution than SEM and is used to examine ultrastructures of biological specimens like mitochondria at high magnifications.
Why is spectrophotometer used in the leather & textile footwear industry?
In the leather & textile footwear industry, using a spectrophotometer to capture both color and appearance on a physical sample has greatly improved quality, consistency, and speed to market. To make color approvals on-screen, the digital color file must also be color-accurate when it is imported into the design software
This document provides an overview of X-ray spectroscopy techniques, including X-ray absorption and fluorescence. It discusses the production of X-rays, the principles of X-ray absorption spectroscopy and X-ray fluorescence spectroscopy, and their applications. Key topics covered include X-ray sources like X-ray tubes and synchrotrons, Beer's law and how it relates to X-ray absorption, X-ray absorption near edge structure (XANES) and extended X-ray absorption fine structure (EXAFS), and the use of these techniques in fields like chemistry, physics and materials science.
This document provides information about testing methods for ceramics. It discusses several techniques for analyzing the chemical composition, optical properties, and mechanical properties of ceramics. Specifically, it describes X-ray photoelectron spectroscopy for elemental analysis, secondary ion mass spectrometry for surface composition analysis, energy dispersive X-ray spectroscopy for elemental quantification, and various tests for measuring hardness, strength, gloss, refractive index, and color.
Electron microprobe analysis (EMPA) is a technique that uses a focused electron beam to determine the elemental composition of materials at the micrometer scale. It works by generating characteristic x-rays from sample atoms when bombarded by electrons. These x-rays can then be analyzed using either wavelength dispersive spectrometry (WDS) or energy dispersive spectrometry (EDS) to identify and quantify elemental composition. EMPA provides highly accurate micrometer-scale compositional data but requires standards for quantification and corrections due to factors like excitation volume.
This document provides an overview of scanning electron microscopy (SEM) for analyzing polymer composites and nanocomposites. It describes the basic components of an electron microscope, including the illumination system, imaging system, specimen stage, vacuum pump system, and image recording system. It explains that SEM uses a scanned beam of electrons to produce images of a sample by detecting secondary and backscattered electrons emitted from the surface. The document outlines the signals produced in electron microscopy and discusses scanning electron microscopy and transmission electron microscopy for analyzing polymer composites. It provides details on SEM instrumentation and imaging formation.
Transmission electron microscopy (TEM) uses a beam of electrons to examine objects at a very fine scale. TEM can image at a higher resolution than light microscopes due to the shorter wavelength of electron beams. In TEM, a beam of electrons is transmitted through an ultrathin specimen, interacting with the sample as it passes through. This interaction is used to form an image that is magnified and focused onto a screen, with resolutions down to fractions of a nanometer. TEM is widely used in materials science, biology, and medicine for examining nanostructures.
X-ray crystallography uses X-rays to determine the atomic structure of crystals. Crystals are bombarded with X-rays, which diffract upon contact with the atoms in the crystal. The angles and intensities of the diffracted X-rays are measured to deduce the positions of atoms in the crystal. This technique is useful for visualizing protein structures and identifying unknown crystal structures. It involves growing a crystal, exposing it to X-rays, and computationally analyzing the diffraction pattern to produce an atomic model of the crystal structure. X-ray crystallography has applications in characterizing polymers, assessing metal fatigue, and soil classification.
The document provides information on various materials characterization techniques, including scanning electron microscopy (SEM), scanning tunneling microscopy and scanning force microscopy (STM/SFM), transmission electron microscopy (TEM), energy-dispersive X-ray spectroscopy (EDS), scanning transmission electron microscopy (STEM), X-ray diffraction (XRD), X-ray photoelectron and Auger electron diffraction (XPD/AED), and Auger electron spectroscopy (AES). Each technique is described in one or two paragraphs covering its operating parameters, capabilities, sample requirements, and applications.
ANALYSIs TECHNIQUES : Spectroscopies - SHREYA NAIR
INTRODUCTION - Spectroscopies are useful for chemical state analysis (bonding or charge transfer amongst the atoms), electronic structure (energy gaps, impurity levels, band formation and transition probabilities) and other properties of materials.
RAMAN SPECTROSCOPY
PHOTOLUMINESENCE SPECTROMETER
AUGER ELECTRON SPECTROSCOPY
X-Ray and Ultra Violet Photoelectron Spectroscopies (XPS or ESCA and UPS)
REFERENCE
THANK YOU
Spectroscopy is the study of how light interacts with matter and can provide information about a molecule's structure. Different types of electromagnetic radiation excite molecules to different energy states. Infrared spectroscopy analyzes molecular vibrations to determine functional groups, UV-visible spectroscopy analyzes electronic transitions to study conjugated systems, and NMR spectroscopy uses radio waves to analyze nuclear spin transitions and determine atomic connectivity. Together these techniques allow chemists to learn about molecular structures without being able to directly see individual molecules.
Electron Energy Loss Spectroscopy (EELS) involves analyzing the energy distribution of electrons that have undergone inelastic scattering in a transmission electron microscope. The technique provides information about a sample's composition, bonding properties, and local structure from features in the EELS spectrum including peaks corresponding to ionization edges that identify elements and fine structures related to bonding and coordination. However, EELS has limitations in usable sample thickness, especially for heavier elements where thickness must be less than 20 nm.
This document provides an introduction to electron microscopy. It begins with fundamental concepts and then discusses the construction of transmission and scanning electron microscopes. It explains key differences between electron microscopes and optical microscopes, such as electrons having no visible wavelength. The document compares the similarities and differences between EM and LM, such as both having illumination, specimen, and imaging systems, but EM using magnetic lenses. It discusses electron-specimen interactions that EM can detect such as backscattered electrons, secondary electrons, Auger electrons, X-rays, and diffraction patterns. Finally, it covers high resolution EM and examples of discoveries it enabled.
1. Electron microscopy techniques like SEM and TEM use electrons accelerated to high energies to interact with and provide information about samples on the nanometer scale.
2. SEM can be used to provide information on surface topography, crystalline structure, chemical composition and electrical behavior of the top 1um of a sample through detection of signals like secondary electrons, backscattered electrons, and x-rays.
3. Different signals provide different types of information - secondary electrons provide topographic information at high resolution while backscattered electrons provide compositional information and can also provide crystallographic data through electron channeling effects.
X-ray photoelectron spectroscopy (XPS) is a surface-sensitive technique that uses X-rays to eject electrons from a material's surface and measure their kinetic energy to determine the elemental composition and chemical states. Kai Siegbahn developed XPS in the 1950s and won the Nobel Prize for his work. A study used XPS to analyze the surface chemistry of langasite crystals before and after vacuum annealing, finding that higher-temperature annealing reduced the surface concentration of gallium. XPS provides quantitative and chemical state information from the top 10-100 Angstroms of a surface.
Perovskite: introduction, classification, structure of perovskite, method to synthesis, characterization by XRD and UV- vis spectroscopy , lambert beer's law, material properties and advantage and application.
The document discusses X-ray fluorescence (XRF) theory and applications. XRF involves bombarding a sample with X-rays, which causes fluorescent X-rays to be emitted from the sample that are characteristic of its elemental composition. This allows for both qualitative and quantitative elemental analysis. Key advantages of XRF include rapid, nondestructive analysis of major and trace elements in various materials. Common applications include analysis of soils, minerals, metals, and more in fields like geology, archaeology, and environmental analysis.
Similar to concept of Cathodoluminescence and it's application.pptx (20)
LAND USE LAND COVER AND NDVI OF MIRZAPUR DISTRICT, UPRAHUL
This Dissertation explores the particular circumstances of Mirzapur, a region located in the
core of India. Mirzapur, with its varied terrains and abundant biodiversity, offers an optimal
environment for investigating the changes in vegetation cover dynamics. Our study utilizes
advanced technologies such as GIS (Geographic Information Systems) and Remote sensing to
analyze the transformations that have taken place over the course of a decade.
The complex relationship between human activities and the environment has been the focus
of extensive research and worry. As the global community grapples with swift urbanization,
population expansion, and economic progress, the effects on natural ecosystems are becoming
more evident. A crucial element of this impact is the alteration of vegetation cover, which plays a
significant role in maintaining the ecological equilibrium of our planet.Land serves as the foundation for all human activities and provides the necessary materials for
these activities. As the most crucial natural resource, its utilization by humans results in different
'Land uses,' which are determined by both human activities and the physical characteristics of the
land.
The utilization of land is impacted by human needs and environmental factors. In countries
like India, rapid population growth and the emphasis on extensive resource exploitation can lead
to significant land degradation, adversely affecting the region's land cover.
Therefore, human intervention has significantly influenced land use patterns over many
centuries, evolving its structure over time and space. In the present era, these changes have
accelerated due to factors such as agriculture and urbanization. Information regarding land use and
cover is essential for various planning and management tasks related to the Earth's surface,
providing crucial environmental data for scientific, resource management, policy purposes, and
diverse human activities.
Accurate understanding of land use and cover is imperative for the development planning
of any area. Consequently, a wide range of professionals, including earth system scientists, land
and water managers, and urban planners, are interested in obtaining data on land use and cover
changes, conversion trends, and other related patterns. The spatial dimensions of land use and
cover support policymakers and scientists in making well-informed decisions, as alterations in
these patterns indicate shifts in economic and social conditions. Monitoring such changes with the
help of Advanced technologies like Remote Sensing and Geographic Information Systems is
crucial for coordinated efforts across different administrative levels. Advanced technologies like
Remote Sensing and Geographic Information Systems
9
Changes in vegetation cover refer to variations in the distribution, composition, and overall
structure of plant communities across different temporal and spatial scales. These changes can
occur natural.
Leveraging Generative AI to Drive Nonprofit InnovationTechSoup
In this webinar, participants learned how to utilize Generative AI to streamline operations and elevate member engagement. Amazon Web Service experts provided a customer specific use cases and dived into low/no-code tools that are quick and easy to deploy through Amazon Web Service (AWS.)
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Confiscations, Kotahitanga, Kingitanga, Parliament, Suffrage, Repudiation, Economic Change, Agriculture, Gold Mining, Timber, Flax, Sheep, Dairying,
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ISO/IEC 27001, ISO/IEC 42001, and GDPR: Best Practices for Implementation and...PECB
Denis is a dynamic and results-driven Chief Information Officer (CIO) with a distinguished career spanning information systems analysis and technical project management. With a proven track record of spearheading the design and delivery of cutting-edge Information Management solutions, he has consistently elevated business operations, streamlined reporting functions, and maximized process efficiency.
Certified as an ISO/IEC 27001: Information Security Management Systems (ISMS) Lead Implementer, Data Protection Officer, and Cyber Risks Analyst, Denis brings a heightened focus on data security, privacy, and cyber resilience to every endeavor.
His expertise extends across a diverse spectrum of reporting, database, and web development applications, underpinned by an exceptional grasp of data storage and virtualization technologies. His proficiency in application testing, database administration, and data cleansing ensures seamless execution of complex projects.
What sets Denis apart is his comprehensive understanding of Business and Systems Analysis technologies, honed through involvement in all phases of the Software Development Lifecycle (SDLC). From meticulous requirements gathering to precise analysis, innovative design, rigorous development, thorough testing, and successful implementation, he has consistently delivered exceptional results.
Throughout his career, he has taken on multifaceted roles, from leading technical project management teams to owning solutions that drive operational excellence. His conscientious and proactive approach is unwavering, whether he is working independently or collaboratively within a team. His ability to connect with colleagues on a personal level underscores his commitment to fostering a harmonious and productive workplace environment.
Date: May 29, 2024
Tags: Information Security, ISO/IEC 27001, ISO/IEC 42001, Artificial Intelligence, GDPR
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A Visual Guide to 1 Samuel | A Tale of Two HeartsSteve Thomason
These slides walk through the story of 1 Samuel. Samuel is the last judge of Israel. The people reject God and want a king. Saul is anointed as the first king, but he is not a good king. David, the shepherd boy is anointed and Saul is envious of him. David shows honor while Saul continues to self destruct.
How to Make a Field Mandatory in Odoo 17Celine George
In Odoo, making a field required can be done through both Python code and XML views. When you set the required attribute to True in Python code, it makes the field required across all views where it's used. Conversely, when you set the required attribute in XML views, it makes the field required only in the context of that particular view.
BIOLOGY NATIONAL EXAMINATION COUNCIL (NECO) 2024 PRACTICAL MANUAL.pptx
concept of Cathodoluminescence and it's application.pptx
1. Scanning Electron Microscopy -
Cathodoluminescence (SEM-CL)
A cathodoluminescence detector attached to a
Scanning Electron Microscope (SEM), Field
Emission Microscope (FEM) or an Electron
Microprobe (EPMA) is capable of producing
high-resolution digital cathodoluminescent
(CL) images of luminescent materials. Whether
this CL detector is attached to an SEM, FEM or
EMPA, this mode of acquiring a CL image or CL
spectrum is commonly termed SEM-CL.
2. Fundamental Principles of SEM-CL
• Bombarding the surface of a material with some incident
radiation or particle may result in the emission of
electromagnetic radiation beyond that produced by
thermal black body radiation. This emission can be in the
visible range (400-700 nm), ultraviolet (UV; <400 nm) and
infrared (IR; >700 nm). This general phenomenon is known
as luminescence. The types of luminescence is general
distinguished by the type of incident radiation or particles
and by the kinetics of the emission process. In the latter
case, if the luminescent radiation occurs in <10-8 seconds
after the incoming radiation ceases, it is a luminescent
feature termed fluorescence. If the luminescent radiation
continues to emit for >10-8seconds (and sometimes much
longer) after the incoming radiation ceases, it is a
luminescent feature termed phosphorescence.
3. • Cathodoluminescence (CL) is the emission of photons
of characteristic wavelengths from a material that is
under high-energy electron bombardment. The
electron beam is typically produced in an electron
microprobe (EPMA) or scanning electron microscope
(SEM-CL) or in a cathodoluminesce microscopy
attachment to a petrographic microscope (Optical-CL).
• The nature of CL in a material is a complex function of
composition, lattice structure and superimposed strain
or damage on the structure of the material. Different
minerals exhibit fluorescent or phosphorescent kinetic
behavior which can have an effect on the quality of the
CL images, depending on the manner in which the
image is obtained.
4. Theory
• Solid-state band theory provides a way to explain the
luminescence phenomenon. An insulating solid
material (such as quartz or calcite) can be visualized as
having a valence band and a conduction band with an
intervening band gap (forbidden gap).
• If a crystal is bombarded by electrons with sufficient
energy, electrons from the lower-energy valence band
are promoted to the higher-energy conduction band.
When the energetic electrons attempt to return to the
ground state valence band, they may be temporarily
trapped (on the scale of microseconds) by intrinsic
(structural defects) and/or extrinsic (impurities) traps.
5. • If the energy lost when the electrons vacate
the traps is emitted is in the appropriate
energy/wavelength range, luminescence will
result. Most of the photons fall in the visible
portion of the electromagnetic spectrum
(wavelengths of 400-700 nm) with some
falling in the ultraviolet (UV) and infrared (IR)
portions of the electromagnetic spectrum.
6.
7. SEM-CL Instrumentation
• The SEM-CL operates in the same manner as a hot-
cathode CL attachment to an optical system i.e.
electrons are generated with a heated filament and
accelerated to an anode. However, in SEM-CL there
is a column under high vacuum (<10-5 Torr) in
which:
• the electrons are accelerated toward the anode
under potential differences generally of 1-30 kV
• the sample current can range from 1 pa to 10 nA
• the electrons can be focused to a narrow beam (5
nm to 1 µm) that is capable of producing a CL
response on a small area of the sample.
8. • Generally, the electron beam is rastered across a larger
area of the sample and the CL response is recorded with
digital images from the CL detector. The CL images can be
obtained over a range of magnifications (10-10,000x), but
the lowest magnification is constrained by the specific
configuration of the CL detector system. The image
acquisition procedure varies depending on the information
that is sought. The image acquisition procedures include:
• Total CL (gray level image) for the entire spectral range
(~200-800 nm) - commonly used for general textural and
chemical-zoning features.
• Collection of three consecutive gray-level images using a
red then green then blue series of color filters. A "true-
color" image is reconstructed from the separate R-G-B
images via an image processing program such as
Photoshop.
• Simultaneous collection of a "live" color image with an
array detector system such as the Gatan Chroma-CL system.
9. With the addition of a spectrophotometer it is
possible to collect a scan of the wavelength vs.
relative intensity of the CL of a given material.
One of the considerations that affects the quality of
SEM-CL images is the existence
of phosphorescence phenomena in some
important CL-active minerals.
Consequently, as the electron beam rasters across a
sample the phosphorescent minerals continue to
emit light resulting in a streaking effect on the
image. The minerals calcite, dolomite and apatite
exhibit this phosphorescence phenomenon.
10. Applications
The distribution of the CL in a material gives fundamental insights into such
processes as crystal growth, replacement, deformation and provenance.
These applications include:
• investigations of cementation and diagenesis processes in sedimentary
rocks
• provenance of clastic material in sedimentary and metasedimentary rocks
• details of internal structures of fossils
• growth/dissolution features in igneous and metamorphic minerals
• deformation mechanisms in metamorphic rocks.
• discrimination of different generations of the same mineral as a result of
differences in trace amounts of activator elements. For example, a
sandstone may include a variety of quartz grains from different source
areas, multiple generations of quartz cements, and a cross-cutting quartz
vein–all of which have different CL signals. These differences in
luminescence could not otherwise be detected by SEI imaging, BSE
imaging (due to the grains having the same mean atomic number, Z) or
EDS analysis (trace elements below detection limits, ca. 0.1 wt%).
11. Sandstone sample from unknown formation, A few
spots (such as in the light-blue grain at the bottom) are
filled with quartz, mostly macros are calcite filled.
Secondary electron image of the
same field of view
12. Strengths of SEM-CL
Strengths of acquisition of CL images with the
SEM-CL relative to the Optical-CL include:
• Better spatial resolution
• Improved current control
• Generation of a color CL image of the sample
with the appropriate filters or detectors
• Examination of UV or IR CL responses beyond
those obtained with Optical-CL.
13. Limitations:
• Necessary to have an electron beam
instrument i.e. SEM, FEM or EMPA
• Machine time is generally more expensive
• Conductive coating required on the sample
• Nonlinear absorption of the RGB filters and
challenges in proper color reintegration
• Problems of phorphorescence of important
CL-emitting minerals such as carbonate
minerals and apatite.