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T.BenilaInt. Journal of Engineering Research and Applications www.ijera.com
ISSN: 2248-9622, Vol. 5, Issue 10, (Part - 3) October 2015, pp.42-48
www.ijera.com 42|P a g e
Synthesis, Electrical and Optical Properties of Nickel Sulphate
Hexa Hydrate Single crystals Doped with L-Arginine
T.Benila*
, S.Perumal**
*
Sivanthi Aditanar College Pillayarpuram,**
Physics Research center, S.T Hindu college, Nagercoil – 629 002,
India.
ABSTRACT
L-Arginine doped Nickel SulphateHexa Hydrate (NSH) single crystalswere grown by slow evaporation
techniquefor different molar concentrations, viz., (0.2 to 1 mole% in steps of 0.2).The grown crystals were
subjected to various studies.XRD data were collected from powder samples of the crystals.ACelectrical
measurementswerecarriedoutatvarioustemperaturesrangingfrom40-750
C. Resultsindicate anincrease
oftheelectricalparameterswiththeincreaseoftemperature.The dielectric value suggests that the L-Arginine doped
NSH single crystal is good for microelectronic application. The UV-Vis-NIR spectral studies were performed to
analyze the optical absorption of the grown crystals in the range 200 – 1100nm. Results obtained were
presented.
Key words:Crystal growth, X-ray diffraction, Electrical and Optical property.
I. INTRODUCTION
Now a days, the Scientists are in search for new
conversion materials for various device applications
and the recent interest is focused on the
development of the new semiorganic materials
with improved properties.Single crystals are
important materialsfor electronic, optical devices and
lasercrystals. The efficient NLO materialshas
resulted in the development of a new class of
materials called semi-organics. These materials
have thepotential for combining the highoptical
nonlinearity and chemicalflexibility of organic
materials withthe thermal stability of inorganic
NLOmaterials.In the present investigation the single
crystal of pure Nickel SulphateHexa Hydrate andL-
Argininedoped Nickel SulphateHexa Hydratewas
grown by slow evaporation method and the harvested
crystals were characterized by X-ray diffraction
studies. The title compound has good dielectric
behavior and the results indicate an increase electrical
parameter viz. ζac, ε r andtanδ with the increase of
temperature. The optical transparency andoptical
constants were assessedemploying UV–visibleNIR
studies in therange of 200–1100nm.Thewide optical
and gap of the grown crystal has beenfound.
II. CRYSTAL GROWTH
The title compound was prepared by dissolving
analargrade Nickel SulphateHexa Hydrate (NSH) by
means of doping it with L-Arginine in different but
definite molecular ratios.We have grown pure and L-
Argininedoped crystals by the slow evaporation
method at room temperature.NSH crystal was doped
with L-Arginine in six NSH:L-Arginine molecular
ratios, viz. 1:0.000, 1:0.002, 1:0.004, 1:0.006, 1:0.008
and 1:0.010.Approximate molar ratio of materials
was taken using digital balance and dissolved in
double distilled water. The solution of pH value 7
was stirred with magnetic stirrer and allowed to
evaporate without disturbance. Optically good quality
NSH single crystals have been grown within a period
of 7 to 14 days. Initially very small crystals appeared
then grew bigger in size.Out off grown crystals, best
crystals were selected for further studies and are
shown in Figure1.
Fig1. Photograph of the grown Pure and Doped NSH
crystals.
III. CHARACTERIZATIONS
The PXRD data were collected from powdered
sample for pure and doped NSH crystals using
diffractrometer. The reflections were indexed.
Analysis of the X-ray peaks was done by available
methods and lattice parameters were determined [1,
2, 3].
The dielectric constant of the materialcan be
measured using two probemethod. The samples were
RESEARCH ARTICLE OPEN ACCESS
T.BenilaInt. Journal of Engineering Research and Applications www.ijera.com
ISSN: 2248-9622, Vol. 5, Issue 10, (Part - 3) October 2015, pp.42-48
www.ijera.com 43|P a g e
cut andpolished, opposite faces of the crystals were
coated with good qualitygraphite to obtain a good
ohmiccontact with the electrodes. Thecapacitance
and dielectric lossmeasurements were carried out for
various temperatures ranging from400
C to 750
C[4,5,6]
using an Agilent 4284ALCR meter for various
frequencies
20Hz,100Hz,1KHz,10KHz,100KHz,1MHz.
Thedimension of the crystal wasmeasured using a
microscope. Air capacitances werealso measured for
the dimensionsequal to that of the crystals [7, 8, 9].
The UV-Vis-NIR absorption spectra were
recorded in the wavelength range 200-1100nm for all
the six crystals grown by using Double beam
spectrophotometer 2202.
IV. RESULTS AND DISCUSSION
4.1 POWDER XRD
X-ray diffraction studies of solution grown NSH
crystals was carried on XPERT-PRO using X-ray
CuKα radiation (1.54059340) was used. The samples
were scanned in the 2Ɵ range of 100
-700
X-ray
diffract togram is shown in figure2.The technique is
based on observing thescattered intensity when X-
ray beam isincident on a sample. It is a function
ofincident and scattered angle,polarization, and
wavelength or energy[10].The figure2shows
thepowder X-ray diffraction pattern, thepresence of
prominent Bragg’s peak 2Ɵangle confirms the
perfect crystallinestructure.The diffraction data
almost matches with JCPDS data for pure NSH
crystals. Table1 indicates the unit cell parameters
satisfy the condition for Tetragonal system i.e.,
a=b≠c and α=β=γ=900
from the above data and it may
be concluded that the grown crystals of NSH have
tetragonal system with very slight changes in the
peak positions, slight change in the relative
intensities, cell volume and lattice parameters and
these slight changes are due to the doping of L-
Arginine in NHS crystal.
Fig2. Indexed Powder XRD pattern of pure and doped NSH crystal
T.BenilaInt. Journal of Engineering Research and Applications www.ijera.com
ISSN: 2248-9622, Vol. 5, Issue 10, (Part - 3) October 2015, pp.42-48
www.ijera.com 44|P a g e
Table 1 – Calculated Lattice parameter for pure and doped NSH single crystals.
Samples Crystal system
Unit cell parameters
Volume
a=b c
Pure NSH
Tetragonal
6.782 18.266
α=β=γ=900
840.130
OD1(0.2 mole % of L-Arginine doped NSH) 6.770 18.295 838.505
OD2(0.4 mole % of L-Arginine doped NSH) 6.782 18.266 840.130
OD3(0.6 mole % of L-Arginine doped NSH) 6.774 18.122 831.563
OD4(0.8 mole % of L-Arginine doped NSH) 6.746 18.314 833.413
OD5(1 mole % of L-Arginine doped NSH) 6.761 18.307 836.901
4.2 DIELECTRIC STUDIES
The AC electrical conductivity (ζ) was
calculated using the relation.
ζ = ε0 εrω tan δ
Whereε0 is the permittivity of free space
(8.85x10-12
C2
N-1
m-2
) andω is the angular frequency
(ω = 2πf; f is the frequency) [11].
The dielectric constant (εr) of the crystal was
calculated using this relation


r=
Ccrys -Cair1- Cair
Where Acryis the area of the crystaltouching the
electrode and Aairis the area of the electrode. The
dielectric losses were measured for all the grown
crystals by a method adopted by previous authors
[12, 13]. The εr,tanδandζac values obtained in the
present study with different frequencies are shown in
Figures 3-5.The εr, tanδandζac values obtained at
500
C with all the frequencies are provided in Table2.
It has been found that the εr,tanδandζacvalues
increase with the increase in temperature. This is a
normal dielectric behavior.
Fig3.The dielectric constants forpure and doped NSH
T.BenilaInt. Journal of Engineering Research and Applications www.ijera.com
ISSN: 2248-9622, Vol. 5, Issue 10, (Part - 3) October 2015, pp.42-48
www.ijera.com 45|P a g e
Fig4.TheACelectricalconductivities(x10-6
mho/m) forpure and doped NSH crystal
T.BenilaInt. Journal of Engineering Research and Applications www.ijera.com
ISSN: 2248-9622, Vol. 5, Issue 10, (Part - 3) October 2015, pp.42-48
www.ijera.com 46|P a g e
Fig5.Thedielectriclossfactorsforpureand doped NSH crystals
Table 2–Theεr, tanδ and ζac (x10-6
mho/m) values at 500
C for pure and doped NSH.
Samples Parameter
With a frequency of
1KHz 10KHz 100KHz 1MHz
Pure NSH
εr 22.190 27.147 14.324 12.342
Tanδ 0.055 0.085 0.056 0.029
ζac(x10
-6
mho/m) 0.068 1.278 4.442 19.857
NSH+
OD1
εr 88.667 100.568 46.320 33.278
tanδ 0.004 0.059 0.073 0.037
ζac(x10
-6
mho/m) 0.021 3.345 18.690 68.431
NSH+
OD2
εr 37.010 51.476 35.346 94.540
tanδ 0.017 0.068 0.046 0.023
ζac(x10
-6
mho/m) 0.0351 1.937 9.017 120.329
NSH+
OD3
εr 107.092 121.564 78.581 94.838
tanδ 0.038 0.076 0.051 0.029
ζac(x10
-6
mho/m) 0.226 5.157 22.220 152.061
NSH+
OD4
εr 54.451 27.249 34.182 16.060
tanδ 0.055 0.073 0.049 0.026
ζac(x10
-6
mho/m) 0.168 1.099 9.229 23.464
NSH+
OD5
εr 89.223 32.444 78.166 8.303
tanδ 0.043 0.072 0.044 0.041
ζac(x10
-6
mho/m) 0.2147 1.293 18.985 19.072
4.3 UV-Vis-NIR SPECTROSCOPY
The UV-Vis-NIR spectroscopy of the pure and
doped NSH crystals was performed by using
Double Beam Spectrophotometer.The crystals have
a good optical transmission in the entire visible
region and the lower cut off wavelength is
observed. The band gap energies were calculated
and presented in Table3and Figures6-7 showed the
UV absorbance and Taue plots.
The single crystals are mainly used for optical
applications. Thus the study of optical transmission
range of grown crystal is important. The optical
transmission spectrumwas recorded using Double
Beam spectrophotometer in the wavelength region
200 – 1100nm. The UV Vis NIR absorption spectra
areobserved in the present study.Efficient non-
linear optical crystals have an optical transparency
lower cut-off wavelengths between 200-400nm
[14]. The lower cut off region lies in the range 384
nm. The low absorption in thevisible and NIR
regions along with low cut off wavelengths
confirm the suitability of the grown crystals for
NLO applications. The grown crystals has
good transmission in UV as well as in visible
regions.
T.BenilaInt. Journal of Engineering Research and Applications www.ijera.com
ISSN: 2248-9622, Vol. 5, Issue 10, (Part - 3) October 2015, pp.42-48
www.ijera.com 47|P a g e
Table 3 - Results of Band Gap Energy.
Samples Band gap energy Eg(eV)
Pure NSH 5.02
OD1(0.2 mole % of L-Arginine doped NSH) 5.00
OD2(0.4 mole % of L-Arginine doped NSH) 5.42
OD3(0.6 mole % of L-Arginine doped NSH) 5.03
OD4(0.8 mole % of L-Arginine doped NSH) 5.01
OD5(1 mole % of L-Arginine doped NSH) 4.96
Fig6. UV-Vis-NIR spectroscopy of the pure and doped NSH crystals.
Fig7. Plot of energy versus (αhυ)2
T.BenilaInt. Journal of Engineering Research and Applications www.ijera.com
ISSN: 2248-9622, Vol. 5, Issue 10, (Part - 3) October 2015, pp.42-48
www.ijera.com 48|P a g e
V. CONCLUSION
Pure anddoped NSH crystals were grown by
slow evaporation method and characterized by
PXRD, conductivity and optical(UV-Vis-NIR)
measurements. The PXRD of spectra confirms the
crystalline perfection of the grown crystals.Lattice
parameters calculated from the XRD pattern of the
pure and doped NSHcrystals and determination of
lattice volume indicate that the impurity molecules
have entered in the crystal matrix of NSH.The
dielectric constants werefound to increase with
increasing temperature. The increase of AC
conductivity with increase of temperature has been
understood as essentially due to temperature
dependence. The UV-Vis-NIR spectral studies
revealed that theband gap of pure NSH was altered
due to doping of L-Arginine. The preset study
indicates that dopantL-Arginine leads to the
discovery of promising lowvalue dielectric
materials.So it is more interesting that doped crystals
are useful in micro electronic industry.
REFERENCES
[1] K.Sangwal
(1996)Prog.Cryst.GrowthandCharact.
[2] H.Lipson, H.Steeple, Interpretation of X-ray
Powder Diffraction Patterns, Macmillan,
New York, 1970.
[3] S. Meenakshisundaram, S. Parthiban, N.
Sarathi, R. Kalavathy, G.
Bhagavannarayana, J. Cryst. Growth 293
(2006) 376-381.
[4] Brice.J.C (1986) Crystal Growth Processes
[John Wiley and Sons, New York]
[5] S. Goma, C.M.Padma, C.K. Mahadevan,
Mater. Lett. 60 (2006) 3701-3705.
[6] N.P. Rajesh, V. Kannan, P.S. Raghavan, P.
Ramasamy, C.W. Lan, Mater. Lett. 52
(2002)326-328.
[7] J.L. Jones, K.W. Paschen, J.B.Nicholson,
J Appl Opt., vol. 2, pp.955–61, 1963
[8] T. Baraniraj and P.Philominanathan, vol.
10, pp.805-815, 2011.
[9] S.E.Joema, S. Perumal, S. Ramalingam, P.
Selvarajan Recent Research in Science and
technology, 20011, 3, 63- 68.
[10] Baur.W.H (1964) ActaCrystallogr.
[11] K.Ambujam, K.Rajarajan, S.Selvakumar,
J.Madhavan, Gulam Mohamed, P.Sagaya
Raj, J.optical Mater, 2007, 29, 657.
[12] P.Selvarajan, N.Joseph John and
C.K.Mahadevan, J. Growth, Structural,
Optics, Mechanical and Dielectric
Characterization of Diammonium Hydrogen
Phosphate (DAHP) Single Crystals, 2011,
10, 1379-1389.
[13] K. Meera, R.Muralidharan, R.Dhanasekaran,
PrapunManyum, P.Ramasamy, J.Crystal
Growth, 2004, 263, 510.
[14] C.Justin Raj, S.Dinakaran, S.Krishnan,
B.Milton Boaz, R.Robert, S.Jerome Das,
J.Optics Common., 2008, 281, 2285.
[15] H.Lipson, H.Steeple, Interpretation of X-ray
Powder Diffraction Patterns, Macmillan,
New York, 1970.
[16] D. Jayalakshmi, and J. Kumar, Crys.t
Res. Technol. vol. 41, pp.37–40, 2006.
[17] Byrappa.K and Ohachi.T. (2002) Crystal
Growth Technology [Springer Verlag,
Berlin]
[18] M. Meena, C.K. Mahadevan, Cryst. Res.
Technol. 43 (2008) 166-172.
[19] S.Radhika, C.M.Padma, A.JeyaRajendran,
S.Ramalingam, T.ChithambaraThanu,
J.Thermal, Optical, Mechanical and
Electrical Proprieties of novel NLO active
Glycine Potassium Sulphate single crystals.,
Der PharamaChonca, 2012, 4(5), 2014-2023.
[20] S.Senguptaand S.P. Sengupta(1992) Bull.
Mater.Sci.15, 333.
[21] S. Perumal and C.K. Mahadevan, Physica B
367 (2005) 172-181.
[22] V. Regina Delcy, V.S. John, S.
Perumal.Indian Journal of Applied Research,
(2015) Vol.pp.461-634.

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Optical and Electrical Properties of L-Arginine Doped Nickel Sulphate Hexa Hydrate Crystals

  • 1. T.BenilaInt. Journal of Engineering Research and Applications www.ijera.com ISSN: 2248-9622, Vol. 5, Issue 10, (Part - 3) October 2015, pp.42-48 www.ijera.com 42|P a g e Synthesis, Electrical and Optical Properties of Nickel Sulphate Hexa Hydrate Single crystals Doped with L-Arginine T.Benila* , S.Perumal** * Sivanthi Aditanar College Pillayarpuram,** Physics Research center, S.T Hindu college, Nagercoil – 629 002, India. ABSTRACT L-Arginine doped Nickel SulphateHexa Hydrate (NSH) single crystalswere grown by slow evaporation techniquefor different molar concentrations, viz., (0.2 to 1 mole% in steps of 0.2).The grown crystals were subjected to various studies.XRD data were collected from powder samples of the crystals.ACelectrical measurementswerecarriedoutatvarioustemperaturesrangingfrom40-750 C. Resultsindicate anincrease oftheelectricalparameterswiththeincreaseoftemperature.The dielectric value suggests that the L-Arginine doped NSH single crystal is good for microelectronic application. The UV-Vis-NIR spectral studies were performed to analyze the optical absorption of the grown crystals in the range 200 – 1100nm. Results obtained were presented. Key words:Crystal growth, X-ray diffraction, Electrical and Optical property. I. INTRODUCTION Now a days, the Scientists are in search for new conversion materials for various device applications and the recent interest is focused on the development of the new semiorganic materials with improved properties.Single crystals are important materialsfor electronic, optical devices and lasercrystals. The efficient NLO materialshas resulted in the development of a new class of materials called semi-organics. These materials have thepotential for combining the highoptical nonlinearity and chemicalflexibility of organic materials withthe thermal stability of inorganic NLOmaterials.In the present investigation the single crystal of pure Nickel SulphateHexa Hydrate andL- Argininedoped Nickel SulphateHexa Hydratewas grown by slow evaporation method and the harvested crystals were characterized by X-ray diffraction studies. The title compound has good dielectric behavior and the results indicate an increase electrical parameter viz. ζac, ε r andtanδ with the increase of temperature. The optical transparency andoptical constants were assessedemploying UV–visibleNIR studies in therange of 200–1100nm.Thewide optical and gap of the grown crystal has beenfound. II. CRYSTAL GROWTH The title compound was prepared by dissolving analargrade Nickel SulphateHexa Hydrate (NSH) by means of doping it with L-Arginine in different but definite molecular ratios.We have grown pure and L- Argininedoped crystals by the slow evaporation method at room temperature.NSH crystal was doped with L-Arginine in six NSH:L-Arginine molecular ratios, viz. 1:0.000, 1:0.002, 1:0.004, 1:0.006, 1:0.008 and 1:0.010.Approximate molar ratio of materials was taken using digital balance and dissolved in double distilled water. The solution of pH value 7 was stirred with magnetic stirrer and allowed to evaporate without disturbance. Optically good quality NSH single crystals have been grown within a period of 7 to 14 days. Initially very small crystals appeared then grew bigger in size.Out off grown crystals, best crystals were selected for further studies and are shown in Figure1. Fig1. Photograph of the grown Pure and Doped NSH crystals. III. CHARACTERIZATIONS The PXRD data were collected from powdered sample for pure and doped NSH crystals using diffractrometer. The reflections were indexed. Analysis of the X-ray peaks was done by available methods and lattice parameters were determined [1, 2, 3]. The dielectric constant of the materialcan be measured using two probemethod. The samples were RESEARCH ARTICLE OPEN ACCESS
  • 2. T.BenilaInt. Journal of Engineering Research and Applications www.ijera.com ISSN: 2248-9622, Vol. 5, Issue 10, (Part - 3) October 2015, pp.42-48 www.ijera.com 43|P a g e cut andpolished, opposite faces of the crystals were coated with good qualitygraphite to obtain a good ohmiccontact with the electrodes. Thecapacitance and dielectric lossmeasurements were carried out for various temperatures ranging from400 C to 750 C[4,5,6] using an Agilent 4284ALCR meter for various frequencies 20Hz,100Hz,1KHz,10KHz,100KHz,1MHz. Thedimension of the crystal wasmeasured using a microscope. Air capacitances werealso measured for the dimensionsequal to that of the crystals [7, 8, 9]. The UV-Vis-NIR absorption spectra were recorded in the wavelength range 200-1100nm for all the six crystals grown by using Double beam spectrophotometer 2202. IV. RESULTS AND DISCUSSION 4.1 POWDER XRD X-ray diffraction studies of solution grown NSH crystals was carried on XPERT-PRO using X-ray CuKα radiation (1.54059340) was used. The samples were scanned in the 2Ɵ range of 100 -700 X-ray diffract togram is shown in figure2.The technique is based on observing thescattered intensity when X- ray beam isincident on a sample. It is a function ofincident and scattered angle,polarization, and wavelength or energy[10].The figure2shows thepowder X-ray diffraction pattern, thepresence of prominent Bragg’s peak 2Ɵangle confirms the perfect crystallinestructure.The diffraction data almost matches with JCPDS data for pure NSH crystals. Table1 indicates the unit cell parameters satisfy the condition for Tetragonal system i.e., a=b≠c and α=β=γ=900 from the above data and it may be concluded that the grown crystals of NSH have tetragonal system with very slight changes in the peak positions, slight change in the relative intensities, cell volume and lattice parameters and these slight changes are due to the doping of L- Arginine in NHS crystal. Fig2. Indexed Powder XRD pattern of pure and doped NSH crystal
  • 3. T.BenilaInt. Journal of Engineering Research and Applications www.ijera.com ISSN: 2248-9622, Vol. 5, Issue 10, (Part - 3) October 2015, pp.42-48 www.ijera.com 44|P a g e Table 1 – Calculated Lattice parameter for pure and doped NSH single crystals. Samples Crystal system Unit cell parameters Volume a=b c Pure NSH Tetragonal 6.782 18.266 α=β=γ=900 840.130 OD1(0.2 mole % of L-Arginine doped NSH) 6.770 18.295 838.505 OD2(0.4 mole % of L-Arginine doped NSH) 6.782 18.266 840.130 OD3(0.6 mole % of L-Arginine doped NSH) 6.774 18.122 831.563 OD4(0.8 mole % of L-Arginine doped NSH) 6.746 18.314 833.413 OD5(1 mole % of L-Arginine doped NSH) 6.761 18.307 836.901 4.2 DIELECTRIC STUDIES The AC electrical conductivity (ζ) was calculated using the relation. ζ = ε0 εrω tan δ Whereε0 is the permittivity of free space (8.85x10-12 C2 N-1 m-2 ) andω is the angular frequency (ω = 2πf; f is the frequency) [11]. The dielectric constant (εr) of the crystal was calculated using this relation   r= Ccrys -Cair1- Cair Where Acryis the area of the crystaltouching the electrode and Aairis the area of the electrode. The dielectric losses were measured for all the grown crystals by a method adopted by previous authors [12, 13]. The εr,tanδandζac values obtained in the present study with different frequencies are shown in Figures 3-5.The εr, tanδandζac values obtained at 500 C with all the frequencies are provided in Table2. It has been found that the εr,tanδandζacvalues increase with the increase in temperature. This is a normal dielectric behavior. Fig3.The dielectric constants forpure and doped NSH
  • 4. T.BenilaInt. Journal of Engineering Research and Applications www.ijera.com ISSN: 2248-9622, Vol. 5, Issue 10, (Part - 3) October 2015, pp.42-48 www.ijera.com 45|P a g e Fig4.TheACelectricalconductivities(x10-6 mho/m) forpure and doped NSH crystal
  • 5. T.BenilaInt. Journal of Engineering Research and Applications www.ijera.com ISSN: 2248-9622, Vol. 5, Issue 10, (Part - 3) October 2015, pp.42-48 www.ijera.com 46|P a g e Fig5.Thedielectriclossfactorsforpureand doped NSH crystals Table 2–Theεr, tanδ and ζac (x10-6 mho/m) values at 500 C for pure and doped NSH. Samples Parameter With a frequency of 1KHz 10KHz 100KHz 1MHz Pure NSH εr 22.190 27.147 14.324 12.342 Tanδ 0.055 0.085 0.056 0.029 ζac(x10 -6 mho/m) 0.068 1.278 4.442 19.857 NSH+ OD1 εr 88.667 100.568 46.320 33.278 tanδ 0.004 0.059 0.073 0.037 ζac(x10 -6 mho/m) 0.021 3.345 18.690 68.431 NSH+ OD2 εr 37.010 51.476 35.346 94.540 tanδ 0.017 0.068 0.046 0.023 ζac(x10 -6 mho/m) 0.0351 1.937 9.017 120.329 NSH+ OD3 εr 107.092 121.564 78.581 94.838 tanδ 0.038 0.076 0.051 0.029 ζac(x10 -6 mho/m) 0.226 5.157 22.220 152.061 NSH+ OD4 εr 54.451 27.249 34.182 16.060 tanδ 0.055 0.073 0.049 0.026 ζac(x10 -6 mho/m) 0.168 1.099 9.229 23.464 NSH+ OD5 εr 89.223 32.444 78.166 8.303 tanδ 0.043 0.072 0.044 0.041 ζac(x10 -6 mho/m) 0.2147 1.293 18.985 19.072 4.3 UV-Vis-NIR SPECTROSCOPY The UV-Vis-NIR spectroscopy of the pure and doped NSH crystals was performed by using Double Beam Spectrophotometer.The crystals have a good optical transmission in the entire visible region and the lower cut off wavelength is observed. The band gap energies were calculated and presented in Table3and Figures6-7 showed the UV absorbance and Taue plots. The single crystals are mainly used for optical applications. Thus the study of optical transmission range of grown crystal is important. The optical transmission spectrumwas recorded using Double Beam spectrophotometer in the wavelength region 200 – 1100nm. The UV Vis NIR absorption spectra areobserved in the present study.Efficient non- linear optical crystals have an optical transparency lower cut-off wavelengths between 200-400nm [14]. The lower cut off region lies in the range 384 nm. The low absorption in thevisible and NIR regions along with low cut off wavelengths confirm the suitability of the grown crystals for NLO applications. The grown crystals has good transmission in UV as well as in visible regions.
  • 6. T.BenilaInt. Journal of Engineering Research and Applications www.ijera.com ISSN: 2248-9622, Vol. 5, Issue 10, (Part - 3) October 2015, pp.42-48 www.ijera.com 47|P a g e Table 3 - Results of Band Gap Energy. Samples Band gap energy Eg(eV) Pure NSH 5.02 OD1(0.2 mole % of L-Arginine doped NSH) 5.00 OD2(0.4 mole % of L-Arginine doped NSH) 5.42 OD3(0.6 mole % of L-Arginine doped NSH) 5.03 OD4(0.8 mole % of L-Arginine doped NSH) 5.01 OD5(1 mole % of L-Arginine doped NSH) 4.96 Fig6. UV-Vis-NIR spectroscopy of the pure and doped NSH crystals. Fig7. Plot of energy versus (αhυ)2
  • 7. T.BenilaInt. Journal of Engineering Research and Applications www.ijera.com ISSN: 2248-9622, Vol. 5, Issue 10, (Part - 3) October 2015, pp.42-48 www.ijera.com 48|P a g e V. CONCLUSION Pure anddoped NSH crystals were grown by slow evaporation method and characterized by PXRD, conductivity and optical(UV-Vis-NIR) measurements. The PXRD of spectra confirms the crystalline perfection of the grown crystals.Lattice parameters calculated from the XRD pattern of the pure and doped NSHcrystals and determination of lattice volume indicate that the impurity molecules have entered in the crystal matrix of NSH.The dielectric constants werefound to increase with increasing temperature. The increase of AC conductivity with increase of temperature has been understood as essentially due to temperature dependence. The UV-Vis-NIR spectral studies revealed that theband gap of pure NSH was altered due to doping of L-Arginine. The preset study indicates that dopantL-Arginine leads to the discovery of promising lowvalue dielectric materials.So it is more interesting that doped crystals are useful in micro electronic industry. REFERENCES [1] K.Sangwal (1996)Prog.Cryst.GrowthandCharact. [2] H.Lipson, H.Steeple, Interpretation of X-ray Powder Diffraction Patterns, Macmillan, New York, 1970. [3] S. Meenakshisundaram, S. Parthiban, N. Sarathi, R. Kalavathy, G. Bhagavannarayana, J. Cryst. Growth 293 (2006) 376-381. [4] Brice.J.C (1986) Crystal Growth Processes [John Wiley and Sons, New York] [5] S. Goma, C.M.Padma, C.K. Mahadevan, Mater. Lett. 60 (2006) 3701-3705. [6] N.P. Rajesh, V. Kannan, P.S. Raghavan, P. Ramasamy, C.W. Lan, Mater. Lett. 52 (2002)326-328. [7] J.L. Jones, K.W. Paschen, J.B.Nicholson, J Appl Opt., vol. 2, pp.955–61, 1963 [8] T. Baraniraj and P.Philominanathan, vol. 10, pp.805-815, 2011. [9] S.E.Joema, S. Perumal, S. Ramalingam, P. Selvarajan Recent Research in Science and technology, 20011, 3, 63- 68. [10] Baur.W.H (1964) ActaCrystallogr. [11] K.Ambujam, K.Rajarajan, S.Selvakumar, J.Madhavan, Gulam Mohamed, P.Sagaya Raj, J.optical Mater, 2007, 29, 657. [12] P.Selvarajan, N.Joseph John and C.K.Mahadevan, J. Growth, Structural, Optics, Mechanical and Dielectric Characterization of Diammonium Hydrogen Phosphate (DAHP) Single Crystals, 2011, 10, 1379-1389. [13] K. Meera, R.Muralidharan, R.Dhanasekaran, PrapunManyum, P.Ramasamy, J.Crystal Growth, 2004, 263, 510. [14] C.Justin Raj, S.Dinakaran, S.Krishnan, B.Milton Boaz, R.Robert, S.Jerome Das, J.Optics Common., 2008, 281, 2285. [15] H.Lipson, H.Steeple, Interpretation of X-ray Powder Diffraction Patterns, Macmillan, New York, 1970. [16] D. Jayalakshmi, and J. Kumar, Crys.t Res. Technol. vol. 41, pp.37–40, 2006. [17] Byrappa.K and Ohachi.T. (2002) Crystal Growth Technology [Springer Verlag, Berlin] [18] M. Meena, C.K. Mahadevan, Cryst. Res. Technol. 43 (2008) 166-172. [19] S.Radhika, C.M.Padma, A.JeyaRajendran, S.Ramalingam, T.ChithambaraThanu, J.Thermal, Optical, Mechanical and Electrical Proprieties of novel NLO active Glycine Potassium Sulphate single crystals., Der PharamaChonca, 2012, 4(5), 2014-2023. [20] S.Senguptaand S.P. Sengupta(1992) Bull. Mater.Sci.15, 333. [21] S. Perumal and C.K. Mahadevan, Physica B 367 (2005) 172-181. [22] V. Regina Delcy, V.S. John, S. Perumal.Indian Journal of Applied Research, (2015) Vol.pp.461-634.