Presentation delivered at Semicon West 2010 TechSite on Test Optimization Across Multiple Enterprises

1. Test Operations Optimization
& Adaptive Test Proliferation
Debbora Ahlgren
14th-July-2010
TechSite

2. Industry Transformation
Industry Transformation
Vertically Integrated Horizontal Structure
Assembly & Test (SATs)
Fabless Design Houses
Customer Fulfillment
3rd Party Designers
Foundry Players
EDA Players
Assembly & Test
Backend Production
Competition
Economics
Productization
Standardization
Talent Access
Silicon Design Market Access
IP & Process Development
Test Optimization Software
Test Optimization
Design Tools Software is
Off Shoring
supporting the
Si Technology & Manufacturing
transformation of Vertically Integrated Companies
the industry
structure

3. An Industry in Transition
2003-07 2008-11 2012+
Chipmakers need to keep pace
with technology & focus on design
Increasing Complexity
~$1,300M
~$600M-
~$310M- $900M
400M
65nm 45-32nm 22-12nm ~$4.5B-
~$3.5B- $6.0B
~$2.5B-
…while the costs of manufacturing $4.0B
$3.0B
& R&D continue to grow
90-65nm 45-32nm 22-12nm

4. Evolution of Testing Innovation
100%
90% Data & Statistics
80% Analysis & Modeling
Automation & Modeling
70%
Quality & Reliability
60%
DFT, DFM & EDA Intrinsic Defects/Faults
50%
Yield Yield
40%
EDA
30% Mechanical Contacting
Cost / Parallelism
20%
Interface& I/O
Integration & Packaging
10%
Device Characteristics
0%
2001 2003 2005 2007 2009 2011 2013
Source: ITRS
7/20/2010 4
OptimalTest Confidential

5. An Evolved Fabless Manufacturing Model – 2009
Source: Jim Clifford, QCT, 2009
A Networked EcoSystem

6. Adaptive Test “Building Blocks” – ITRS TWG
Data
Various sources … may be real time, historical or feed-forward, &
structured to feed decision “engine” (algorithms)
Data Structure & Control Path
Deliver targeted data to the analysis engine & decisions to the action
point
Decision Algorithms
Models to automatically adjust test … based on input data
Analysis Engine(s)
Executes “rules”/algorithms on the data … based on product
parameters. May be separate or embedded in test program or
station controller software
Station Controller
To communicate with or run the analysis engine and take action

7. linked
reports
OPTIMAL EST
T
Database

8. Email Notification
includes:
Specific Lot
Information
Rule Information
Alert Information
Link to OT-PORTAL
TI/OT Confidential 7/20/2010 8

9. – Illustrating the Problem
in the eMail Alert
eMail links to the “live” OT-
Portal view of the Rule that
has been triggered:
5% S2S Yield Variation
TI/OT Confidential 7/20/2010 9

10. Examples
– Product Engineer's View
Multiple layouts Wide variety of
accessible via tabs "widgets" with
all relevant KPI's
Highlight
equipment
outliers

11. - Application Interface
Drilldown –
presented data
is “actionable”,
allowing the
user to interact
and perform a
“drilldown”
into a deeper
level of
information

12. Engineering Productivity
Adaptive TTR Analysis and Simulation
Adaptive TTR implementation without recompiling test programs
Process-related
signature identified
by OT tools
Wafer Map
recompiled from ~40
lots of final test data
displayed as a single
wafer

13. Integrated Fabless Model
Off-line & Near Time At the Design the SAT O Box
At T
Center Tester
APPLICATIONS
Handler
Prober
TTR & Outlier
OT-Portal OT-Rules2
Simulation
O Proxy
Real Time T
Tester
ALGORITHMS ALGORITHMS
Real-Time Real-Time
Product Outlier Equipment Real-Time Adaptive Outlier
SPC Detection SPC Product SPC TTR Detection O Proxy
T
Tester
NEAR-TIME PLATFORM REAL-TIME PLATFORM
Test Applications OT-Proxy
OT-Post OT-Box OT-Proxy
Database Server Server Tester
ENTERPRISE TEST IT INFRASTRUCTURE
TP-DB MAP-DB eMail Workflow MES STDF DB

14. Global Operations Model
Off-line & Near Time Real Time
APPLICATIONS APPLICATIONS O Box
T
Tester
TTR & Outlier OT-Control Handler
OT-Portal OT-Rules2 OT-Rules2
Simulation Room Prober
ALGORITHMS ALGORITHMS
Real-Time Real-Time O Proxy
Product Outlier Equipment Real-Time T
Adaptive Outlier
SPC Detection SPC Product SPC TTR Detection Tester
NEAR-TIME PLATFORM REAL-TIME PLATFORM
Test Applications OT-Proxy O Proxy
OT-Post OT-Box OT-Proxy T
Database Server Server
Tester
ENTERPRISE TEST IT INFRASTRUCTURE
TP-DB MAP-DB eMail Workflow MES STDF DB
Tester

15. Increase Production Yield
Improve Production Yield
Speed Time to Entitled Yield
Increase Product
Reliability
Increase Product Reliability
1-4% Optimize Overall
Equipment Efficiency
Optimize Overall Equipment Efficiency (OEE)
Through Outlier Detection Speed Time to Actionable Data
20-50% 10-20%
MEASURABLE
Improve Product & RESULTS Reduce Test Times
Testing Quality Advanced Adaptive Test for TTR and/or
Increase Product & Testing Quality Improve Capital Utilization
10-30%
Reduce Customer Returns
50-75%

16. THANK YOU!