3. The control gap Company Test Programs database Rev 2.0.52 Acceptance Alignment Install – Rev 2.0.49 ? Fabless in Israel Subcon in Asia
4. The control gap Do we actually have 99.9% fault coverage in Production? Scan Test 98% coverage Func. Test 1.99% coverage On Total: 99.9% coverage DUT design Test Plan Production 99.9% Test development Test Development
5. So, we have like 99.9% coverage, but now the test engineer is alone on the tester !
6. Mask failures Remove tests The control gap The weakest point in quality chain is debug Before debug After “ debug ”
7. The bigger picture - challenges Product Start Tape Out 1st Silicon Product Ready Product Ship ProductEnd Start TP End TP Maintain TP Consolidate TP Debug TP Fill TP Test Program planning Debug TP Pre-silicon Debug Manage Program Releases to Production Get Visibility of Changes Multiple Engineers developing one Program Multiple Engineers debugging one Program Add and Remove Tests (at different locations?)
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10. Meeting the Challenges Enforce company methodology Product Start Tape Out 1st Silicon Product Ready Product Ship ProductEnd Start TP End TP Maintain TP Consolidate TP Debug TP Fill TP Test Program planning (A skeleton) Analyse And extract A skeleton Mature TP Skeleton TP
13. Meeting the Challenges Managing Collaborative work ProductEnd Analyse Smart Merge Product Start Tape Out 1st Silicon Product Ready Product Ship Start TP End TP Maintain TP Consolidate TP Debug TP Fill TP Multiple Engineers developing one Program Multiple Engineers debugging one Program Add and Remove Tests (at different locations?) Split TP Merge TP
14. Meeting the Challenges Managing test usage - Releases Product Start Tape Out 1st Silicon Product Ready Product Ship ProductEnd Start TP End TP Maintain TP Consolidate TP Debug TP Fill TP Add and Remove Tests (at different locations?) Get Visibility of Changes "Golden" Program/Rules Report Analyse
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19. Meeting the Challenges Pre-silicon Debug Product Start Tape Out 1st Silicon Product Ready Product Ship ProductEnd Start TP End TP Maintain TP Consolidate TP Debug TP Fill TP Debug TP Pre-silicon Debug Neutral Database (STIL) DUT Model Simulation TestBench
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Editor's Notes
Current situation – and problem description: In the current process, a very controlled process is built to achieve a very high fault coverage for any new design. The ATPG and functional tests are required to achieve a 99+% coverage. However, after the set off patterns is created, management assumes that this set of tests is fully implemented in production. In reality the weakest point in the quality chain is the test engineer sitting at the test floor debugging the test program with all the pressure from management on his back. This poor test engineer is pushed to release the test program ASAP as the silicon is already available and customers are waiting for it. So, the test engineer may mask some failures or remove some tests from the test program in order to get it done sooner.
the test engineer may mask some failures or remove some tests from the test program in order to get it done sooner.
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