Low cost New technology High performance
Cogent ATE ™
Analog and Mixed-Signal Test System
Easy and Affordable Multi-Site Testing
Cogent ATE’s Leopard A Series Analog and Mixed-Signal Test System represents a
transformational change in the testing of analog and mixed-signal ICs, a high-volume and
cost-sensitive segment of semiconductor market where the test cost has become a
growing percentage and sometimes the most significant part of the overall cost of
manufacturing the device. Cogent ATE’s Leopard A Series Power Management Test
System will give our customers, Integrated Device Manufacturers (IDM), fables
semiconductor companies and Outsourced Assembly and Test (OSAT) significant cost
advantage over their competitions.
Cogent ATE’s strategy to reduce the cost-of-test is simple; higher throughput at a lower
price. We achieved higher throughputs with practical quad-site wafer and final testing
using Cogent ATE’s Floating Test Sites™ System Architecture. We designed our test
system for low cost by using the latest electronics and by incorporating our proprietary
embedded IP core technology, Tester-on-a-chip™, in our hardware.
Power MOSFET Floating Quad-Site Testing™ is Real and Guaranteed
Operational Amplifiers True parallel testing of up to 4 device-under-test (DUT) sites is not only real but also
Linear Regulators affordable with Cogent ATE’s Leopard Series Analog and Mixed-Signal Test System. For
LDO Regulators our targeted device markets, quad-sites parallel testing is most economical and practical
solution for both wafer and final tests. Turret based handlers, a popular choice for
discrete and power management devices are capable of quad-site testing. “Massive Parallel
wafer testing is often unrealistic given the cost and technical issues in the interface
technology, i.e. probe card.
We have achieved the lowest cost-of-test to date for the Discrete Power Semiconductor
and Power Management IC markets by making Floating Quad-Site Testing™ a compelling
alternative to the non-floating single or dual site testers from our competitions. We intend
to maintain this leadership by continuously improving test performance and lowering
Cogent ATE Series
Reliable and Repeatable Test Results by Design
Reliable and repeatable multi-site testing requires floating resources with independent ground
True parallel multi-site testing
connections to avoid interference commonly associated with a common ground pathway.
with Floating Quad-Site Testing
architecture Cogent ATE’s Floating Test Sites™ (FTS) System Architecture provides electrical separation
between individual test sites in automatic test equipment (ATE) by providing floating resources with
Scale from Single to Multi-Site independent ground connections for each individual device under test (DUT) sites. This feature allows
Testing automatically with Auto each device’s test results to remain isolated from the test results of other adjacent sites. This leads to
Test Replication better test accuracies and fewer false rejects due to device-to-device interference errors.
48 Analog Channels and 32 In Automatic Test Equipment (ATE), the best path is the shortest path. All resources reside in the
Digital Channels in a single test test head. An included full-featured manipulator then that brings the test head as close to the
head Device-Under-Test （DUT）as possible for both wafer level and final test configurations.
Standard full feature Guaranteed Multi-Site Testing
manipulator for wafer level and Cogent ATE’s Automatic Test Replication™ (ATR) Technology allows a test solution to be scaled
final test from single to multi-site with ease, i.e. with a click of button and without any risk. This technology
eliminates the long and tedious routine of copying a single site test program, modifying it for
SBC Industrial PC, Telescope multi-site testing and then debugging the new test program. Since all of our analog and digital
mounting for Monitor and resource boards are Floating Quad-Site Testing™ ready, which means that the success of
conversion from single to multi-site testing will not be left to chance, i.e. the skills of the test
Keyboard on the manipulator
engineer or the availability of floating resources. Our multi-site test solution are guaranteed to work
for a compact and ergonomic
since each individual test sites are running on identical sets of hardware that are electrically isolated
test cell from each other.
Wide Range of Target Devices
By choosing from a wide range of resources, the Leopard A Series can test devices from several
high-volume IC markets, such op-amps, MOSFETs, Power Management Devices, ADC, DAC and
page 2 Cogent ATE Systems Corporation | Room 705, No.8 Dongdaqiao Road,Chaoyang District,Beijing,China | Tel: +86(10)59000102 | Fax:+86(10)58850677 | www.CogentATE.com
Cogent ATE Series
Higher Throughputs and Lower Capital Cost Templates for individual devices test are created
We have achieved significant cost advantages over the automatically, allowing the user to focus on high-level
traditional ATE vendors by using the latest electronics function calls to program devices and provide a
and by incorporating our proprietary embedded IP core means to build family generic templates without
technology, Tester-on-a-chip™, in our hardware. subsequent code changes .This environment
Cogent ATE’s Tester-on-a-chip™ (ToC) is a collection provides the best features of template-driven
of intellectual property (IP) cores that have been adapted programming and the fine control of procedural
by Cogent ATE to add Automatic Test Equipment compiled commands.
(ATE) related functions such as timing accuracy,
Arbitrary Waveform Generator (AWG), memory control,
Digital Signal Processing (DSP) analysis, high-speed I/O
capability, and jitter compliance.
With the inclusion of a full-feature manipulator, Leopard
A Series achieves close to zero footprint with most
handlers and probers. Our choice of a Single Board
Easy ATE™ to provide a graphical representation of
Computer (SBC) based Industrial PC and the inclusion
the hardware and give the user full control over
of Monitor and Keyboard mounts on the manipulator
device and instrument conditions.
creates a compact and ergonomic test cell friendly to
both engineers and operators.
Powerful program editor.
Friendly Software for both IC design and Production
Leopard A Series test system software Easy ATE™ has
several industry-first features that are very useful for the
debug and characterization of power ICs. In most ATEs
a simple voltage force and current sense scenario may
damage the ATE if the sensed current is large. Some
ATEs try to dissipate the sense current with large heat
sink. Cogent ATE’s patented technology allows the
Data analysis and map-making.
Power IC designer to observe a static sense a current as
large as 2 Amp and 50 Volt.
page 3 Cogent ATE Systems Corporation | Room 705, No.8 Dongdaqiao Road,Chaoyang District,Beijing,China | Tel: +86(10)59000102 | Fax:+86(10)58850677 | www.CogentATE.com