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Device Modeling Report



COMPONENTS: Silicon Carbide Schottky Diode
PART NUMBER: CSD20060D
MANUFACTURER: Cree, Inc.
REMARK: Professional Model




                Bee Technologies Inc.



  All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
PSpice model
                                      Model description
 parameter
     IS         Saturation Current
     N          Emission Coefficient
     RS         Series Resistance
    IKF         High-injection Knee Current
    CJO         Zero-bias Junction Capacitance
     M          Junction Grading Coefficient
     VJ         Junction Potential
    ISR         Recombination Current Saturation Value
     BV         Reverse Breakdown Voltage(a positive value)
    IBV         Reverse Breakdown Current(a positive value)
     TT         Transit Time
    EG          Energy-band Gap




               All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
Forward Current Characteristic

Circuit Simulation Result


                     20A




                     15A




                     10A




                      5A




                      0A
                           0V                1.0V                 2.0V                  3.0V
                                I(R1)
                                                         V_V1




Evaluation Circuit


                                              R1
                                                                  PIN1

                                              0.01m               PIN2       CASE

                                                                  PIN3
                                    V1                U1
                           0Vdc                       CSD20060D

                                                                         0          0




                                         0




                     All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
Comparison Graph

Circuit Simulation Result




Simulation Result

                                              VF(V)
            IF(A)                                                             Error(%)
                             Measurement               Simulation
                    0.1              0.890                      0.893               0.336
                    0.2              0.915                      0.916               0.109
                    0.5              0.960                      0.955              -0.524
                      1              1.000                      1.000               0.000
                      2              1.070                      1.066              -0.375
                      5              1.250                      1.240              -0.806
                     10              1.500                      1.510               0.662
                     20              2.050                      2.030              -0.985




                    All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
Junction Capacitance Characteristic

Circuit Simulation Result




                     300p




                     200p




                     100p




                        0
                        5.0V       10V                                 100V          300V
                               I(V2)/(600V/1us)
                                              V(N00016)




Evaluation Circuit


                                      0Vdc     V2


                                                                PIN1

                         V2 = 600     V1                        PIN2          CASE
                         V1 = 0
                         TD = 0                                 PIN3
                         TR = 1us                   U1
                         TF = 10ns                  CSD20060D
                         PW = 50us
                         PER = 10us



                                           0




                     All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
Comparison Graph

Circuit Simulation Result




Simulation Result

                                               Cj (pF)
             VR(V)                                                            Error(%)
                               Measurement               Simulation
                       5              288.000                 289.000               0.346
                      10              238.000                 235.000              -1.277
                      20              181.000                 182.000               0.549
                      50              124.000                 123.888              -0.090
                     100               92.000                  91.500              -0.546
                     200               67.000                  67.000               0.000
                     300               57.000                  56.000              -1.786




                    All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
Reverse Characteristic

Circuit Simulation Result



                     200uA




                     150uA




                     100uA




                      50uA




                        0A
                             0V     100V     200V     300V   400V         500V    600V
                                  I(R1)
                                                         V_V1




Evaluation Circuit


                                              R1


                                              0.01m                PIN1

                                                                   PIN2          CASE
                                    V1
                          0Vdc                                     PIN3
                                                       U1
                                                       CSD20060D




                                         0




                     All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
Comparison Graph

Circuit Simulation Result




Simulation Result

                                           VR(V)
              IR(uA)                                                        Error(%)
                                Measurement      Simulation
                        1             405.000         403.000                      -0.496
                        2             426.000         430.000                       0.930
                        5             480.000         476.000                      -0.840
                       10             511.000         510.000                      -0.196
                       20             545.000         547.000                       0.366
                       50             602.000         601.584                      -0.069
                      100             646.000         645.844                      -0.024
                      200             696.000         695.000                      -0.144




                    All Rights Reserved Copyright (C) Bee Technologies Inc. 2005

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SPICE MODEL of CSD20060D (Professional Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: Silicon Carbide Schottky Diode PART NUMBER: CSD20060D MANUFACTURER: Cree, Inc. REMARK: Professional Model Bee Technologies Inc. All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
  • 2. PSpice model Model description parameter IS Saturation Current N Emission Coefficient RS Series Resistance IKF High-injection Knee Current CJO Zero-bias Junction Capacitance M Junction Grading Coefficient VJ Junction Potential ISR Recombination Current Saturation Value BV Reverse Breakdown Voltage(a positive value) IBV Reverse Breakdown Current(a positive value) TT Transit Time EG Energy-band Gap All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
  • 3. Forward Current Characteristic Circuit Simulation Result 20A 15A 10A 5A 0A 0V 1.0V 2.0V 3.0V I(R1) V_V1 Evaluation Circuit R1 PIN1 0.01m PIN2 CASE PIN3 V1 U1 0Vdc CSD20060D 0 0 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
  • 4. Comparison Graph Circuit Simulation Result Simulation Result VF(V) IF(A) Error(%) Measurement Simulation 0.1 0.890 0.893 0.336 0.2 0.915 0.916 0.109 0.5 0.960 0.955 -0.524 1 1.000 1.000 0.000 2 1.070 1.066 -0.375 5 1.250 1.240 -0.806 10 1.500 1.510 0.662 20 2.050 2.030 -0.985 All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
  • 5. Junction Capacitance Characteristic Circuit Simulation Result 300p 200p 100p 0 5.0V 10V 100V 300V I(V2)/(600V/1us) V(N00016) Evaluation Circuit 0Vdc V2 PIN1 V2 = 600 V1 PIN2 CASE V1 = 0 TD = 0 PIN3 TR = 1us U1 TF = 10ns CSD20060D PW = 50us PER = 10us 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
  • 6. Comparison Graph Circuit Simulation Result Simulation Result Cj (pF) VR(V) Error(%) Measurement Simulation 5 288.000 289.000 0.346 10 238.000 235.000 -1.277 20 181.000 182.000 0.549 50 124.000 123.888 -0.090 100 92.000 91.500 -0.546 200 67.000 67.000 0.000 300 57.000 56.000 -1.786 All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
  • 7. Reverse Characteristic Circuit Simulation Result 200uA 150uA 100uA 50uA 0A 0V 100V 200V 300V 400V 500V 600V I(R1) V_V1 Evaluation Circuit R1 0.01m PIN1 PIN2 CASE V1 0Vdc PIN3 U1 CSD20060D 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
  • 8. Comparison Graph Circuit Simulation Result Simulation Result VR(V) IR(uA) Error(%) Measurement Simulation 1 405.000 403.000 -0.496 2 426.000 430.000 0.930 5 480.000 476.000 -0.840 10 511.000 510.000 -0.196 20 545.000 547.000 0.366 50 602.000 601.584 -0.069 100 646.000 645.844 -0.024 200 696.000 695.000 -0.144 All Rights Reserved Copyright (C) Bee Technologies Inc. 2005