SPICE MODEL of C4D20120D LTspice Model (Professional Model) in SPICE PARK. English Version is http://www.spicepark.net. Japanese Version is http://www.spicepark.com by Bee Technologies.

1. Device Modeling Report
COMPONENTS: Silicon Carbide Schottky Diode
PART NUMBER: C4D20120D
MANUFACTURER: CREE
REMARK: Professional Model
Bee Technologies Inc.
All Rights Reserved Copyright (C) Bee Technologies Inc. 2012
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2. DIODE MODEL PARAMETERS
Spice model
Model description
parameter
IS Saturation Current
N Emission Coefficient
RS Series Resistance
IKF High-injection Knee Current
CJO Zero-bias Junction Capacitance
M Junction Grading Coefficient
VJ Junction Potential
ISR Recombination Current Saturation Value
BV Reverse Breakdown Voltage(a positive value)
IBV Reverse Breakdown Current(a positive value)
TT Transit Time
EG Energy-band Gap
All Rights Reserved Copyright (C) Bee Technologies Inc. 2012
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3. Forward Current Characteristics
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2012
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4. Comparison Graph
Circuit Simulation result
Comparison table
VF (V)
IF (A) %Error
Measurement Simulation
0.1 0.855 0.862 0.82
0.2 0.897 0.886 -1.23
0.5 0.925 0.927 0.22
1 0.970 0.972 0.21
2 1.045 1.044 -0.10
5 1.233 1.226 -0.57
10 1.497 1.506 0.60
20 2.050 2.047 -0.15
All Rights Reserved Copyright (C) Bee Technologies Inc. 2012
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5. Reverse Current Characteristics
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2012
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6. Comparison Graph
Circuit Simulation result
Comparison table
IR (uA)
VR (V) %Error
Measurement Simulation
1200 5.000E+00 4.773E+00 -4.53
1300 1.239E+01 1.299E+01 4.88
1400 3.500E+01 3.537E+01 1.06
1500 9.500E+01 9.628E+01 1.35
1570 2.000E+02 1.941E+02 -2.96
1575 7.000E+02 7.000E+02 0.00
All Rights Reserved Copyright (C) Bee Technologies Inc. 2012
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7. Total Capacitance Characteristics
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2012
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8. Comparison Graph
Circuit Simulation result
Comparison table
CT (pF)
VR (V) %Error
Measurement Simulation
0.2 730.000 730.848 0.12
0.5 663.000 663.358 0.05
1 583.000 584.437 0.25
2 486.000 487.400 0.29
5 355.000 355.188 0.05
10 270.000 268.372 -0.60
20 199.000 198.668 -0.17
50 130.000 131.241 0.95
100 95.000 95.308 0.32
200 69.000 69.039 0.06
500 44.000 44.992 2.25
1000 34.000 32.531 -4.32
All Rights Reserved Copyright (C) Bee Technologies Inc. 2012
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