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Device Modeling Report




COMPONENTS:THYRISTOR
PART NUMBER:2N5061
MANUFACTURER: ON SEMICONDUCTOR




                 Bee Technologies Inc.


  All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
DIODE MODEL
 Pspice model
                                        Model description
  Parameter
       IS         Saturation Current
       N          Emission Coefficient
      RS          Series Resistance
      IKF         High-injection Knee Current
     CJO          Zero-bias Junction Capacitance
       M          Junction Grading Coefficient
       VJ         Junction Potential
     ISR          Recombination Current Saturation Value
      BV          Reverse Breakdown Voltage(a positive value)
     IBV          Reverse Breakdown Current(a positive value)
       TT         Transit Time




          All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
IG-VT Characteristic

Evaluation Circuit




Simulation result




                                                                Simulation




Comparison Table
                               Measurement           Simulation            % Error
           IGT (uA)             200(max)               199.048            -0.47600
            VGT (V)              0.8(max)             0.792363            -0.95463

               All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
ITM-VTM Characteristic

Evaluation Circuit




Simulation result




                                   Simulation




Comparison Table
        At ITM=1.2            Measurement            Simulation           % Error
         VTM(V)                 1.7(max)               1.6970            -0.17647


               All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
Holding Characteristic (IH)

Evaluation Circuit


                                           RL

                              A
                                           325



                    Rg            U6
                          G       2N5061         VOFF = 0    VAK
                                                 VAMPL = 7
    V1 = 0          1k                           FREQ = 50
    V2 = 5V                   K
    TD = 5ms
    TR = 1us     V1
    TF = 1us
    PW = 1ms
    PER = 20ms
                              0



Simulation result




                                                               Simulation




Comparison Table
             VD=7V                Measurement                  Simulation        % Error
             IH(mA)                 5(max)                       4.7542         -4.91600

                 All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
Switching Time Characteristic

Evaluation Circuit




Simulation result




                                                    Simulation




Comparison Table
                             Measurement             Simulation           %Error
          Ton(us)                 3                    3.0158             0.52667
          Toff(us)               10                    10.033             0.33000


               All Rights Reserved Copyright (c) Bee Technologies Inc. 2004

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SPICE MODEL of 2N5061 in SPICE PARK

  • 1. Device Modeling Report COMPONENTS:THYRISTOR PART NUMBER:2N5061 MANUFACTURER: ON SEMICONDUCTOR Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 2. DIODE MODEL Pspice model Model description Parameter IS Saturation Current N Emission Coefficient RS Series Resistance IKF High-injection Knee Current CJO Zero-bias Junction Capacitance M Junction Grading Coefficient VJ Junction Potential ISR Recombination Current Saturation Value BV Reverse Breakdown Voltage(a positive value) IBV Reverse Breakdown Current(a positive value) TT Transit Time All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 3. IG-VT Characteristic Evaluation Circuit Simulation result Simulation Comparison Table Measurement Simulation % Error IGT (uA) 200(max) 199.048 -0.47600 VGT (V) 0.8(max) 0.792363 -0.95463 All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 4. ITM-VTM Characteristic Evaluation Circuit Simulation result Simulation Comparison Table At ITM=1.2 Measurement Simulation % Error VTM(V) 1.7(max) 1.6970 -0.17647 All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 5. Holding Characteristic (IH) Evaluation Circuit RL A 325 Rg U6 G 2N5061 VOFF = 0 VAK VAMPL = 7 V1 = 0 1k FREQ = 50 V2 = 5V K TD = 5ms TR = 1us V1 TF = 1us PW = 1ms PER = 20ms 0 Simulation result Simulation Comparison Table VD=7V Measurement Simulation % Error IH(mA) 5(max) 4.7542 -4.91600 All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 6. Switching Time Characteristic Evaluation Circuit Simulation result Simulation Comparison Table Measurement Simulation %Error Ton(us) 3 3.0158 0.52667 Toff(us) 10 10.033 0.33000 All Rights Reserved Copyright (c) Bee Technologies Inc. 2004