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Device Modeling Report




COMPONENTS:THYRISTOR
PART NUMBER:MCR218-2FP
MANUFACTURER: MOTOROLA SEMICONDUCTOR




                 Bee Technologies Inc.


  All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
DIODE MODEL
 Pspice model
                                        Model description
  Parameter
       IS         Saturation Current
       N          Emission Coefficient
      RS          Series Resistance
      IKF         High-injection Knee Current
     CJO          Zero-bias Junction Capacitance
       M          Junction Grading Coefficient
       VJ         Junction Potential
     ISR          Recombination Current Saturation Value
      BV          Reverse Breakdown Voltage(a positive value)
     IBV          Reverse Breakdown Current(a positive value)
       TT         Transit Time




          All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
IG-VT Characteristic

Evaluation Circuit




Simulation result




                                                              Simulation




Comparison Table
                               Measurement           Simulation            % Error
           IGT (mA)                 10                 10.005              0.05000
            VGT (V)              1.5(max)              1.4630             -2.46667

               All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
ITM-VTM Characteristic

Evaluation Circuit




Simulation result




                                                        Simulation




Comparison Table
         At ITM=16A          Measurement           Simulation            % Error
           VTM(V)              1.8(max)              1.7911             -0.49444


               All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
Holding Characteristic (IH)

Evaluation Circuit




Simulation result




                                                          Simulation




Comparison Table
           VD=12V            Measurement          Simulation            % Error
           IH(mA)                16                 15.878             -0.76250

               All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
Switching Time Characteristic

Evaluation Circuit




Simulation result




                                                 Simulation




Comparison Table
                            Measurement             Simulation            %Error
          Ton(us)               1.5                   1.4981             -0.12667
          Toff(us)              15                    15.131              0.87333


               All Rights Reserved Copyright (c) Bee Technologies Inc. 2004

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SPICE MODEL of MCR218-2FP in SPICE PARK

  • 1. Device Modeling Report COMPONENTS:THYRISTOR PART NUMBER:MCR218-2FP MANUFACTURER: MOTOROLA SEMICONDUCTOR Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 2. DIODE MODEL Pspice model Model description Parameter IS Saturation Current N Emission Coefficient RS Series Resistance IKF High-injection Knee Current CJO Zero-bias Junction Capacitance M Junction Grading Coefficient VJ Junction Potential ISR Recombination Current Saturation Value BV Reverse Breakdown Voltage(a positive value) IBV Reverse Breakdown Current(a positive value) TT Transit Time All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 3. IG-VT Characteristic Evaluation Circuit Simulation result Simulation Comparison Table Measurement Simulation % Error IGT (mA) 10 10.005 0.05000 VGT (V) 1.5(max) 1.4630 -2.46667 All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 4. ITM-VTM Characteristic Evaluation Circuit Simulation result Simulation Comparison Table At ITM=16A Measurement Simulation % Error VTM(V) 1.8(max) 1.7911 -0.49444 All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 5. Holding Characteristic (IH) Evaluation Circuit Simulation result Simulation Comparison Table VD=12V Measurement Simulation % Error IH(mA) 16 15.878 -0.76250 All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 6. Switching Time Characteristic Evaluation Circuit Simulation result Simulation Comparison Table Measurement Simulation %Error Ton(us) 1.5 1.4981 -0.12667 Toff(us) 15 15.131 0.87333 All Rights Reserved Copyright (c) Bee Technologies Inc. 2004