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Device Modeling Report




COMPONENTS:THYRISTOR
PART NUMBER:BTH151S-650R
MANUFACTURER: PHILIPS SEMICONDUCTOR




                 Bee Technologies Inc.


  All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
DIODE MODEL
 Pspice model
                                        Model description
  Parameter
       IS         Saturation Current
       N          Emission Coefficient
      RS          Series Resistance
      IKF         High-injection Knee Current
     CJO          Zero-bias Junction Capacitance
       M          Junction Grading Coefficient
       VJ         Junction Potential
     ISR          Recombination Current Saturation Value
      BV          Reverse Breakdown Voltage(a positive value)
     IBV          Reverse Breakdown Current(a positive value)
       TT         Transit Time




          All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
IG-VT Characteristic

Evaluation Circuit




Simulation result




                                                       Simulation




Comparison Table
                             Measurement             Simulation            % Error
         IGT (mA)                 2                    2.0044              0.22000
          VGT (V)                0.6                    0.596             -0.66667

               All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
ITM-VTM Characteristic

Evaluation Circuit




Simulation result




                                                  Simulation




Comparison Table
        At ITM=23A            Measurement            Simulation          % Error
          VTM(V)                  1.4                  1.4286            2.04286


               All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
Holding Characteristic (IH)

Evaluation Circuit




Simulation result




                                                   Simulation




Comparison Table
           VD=12V              Measurement           Simulation           % Error
           IH(mA)                   7                  6.8890            -1.58571

               All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
Switching Time Characteristic

Evaluation Circuit




Simulation result




                                               Simulation




Comparison Table
                           Measurement              Simulation           %Error
         Ton(us)                2                     1.9958            -0.21000
         Toff(us)              70                     68.657            -1.91857


               All Rights Reserved Copyright (c) Bee Technologies Inc. 2004

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SPICE MODEL of BTH151S-650R in SPICE PARK

  • 1. Device Modeling Report COMPONENTS:THYRISTOR PART NUMBER:BTH151S-650R MANUFACTURER: PHILIPS SEMICONDUCTOR Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 2. DIODE MODEL Pspice model Model description Parameter IS Saturation Current N Emission Coefficient RS Series Resistance IKF High-injection Knee Current CJO Zero-bias Junction Capacitance M Junction Grading Coefficient VJ Junction Potential ISR Recombination Current Saturation Value BV Reverse Breakdown Voltage(a positive value) IBV Reverse Breakdown Current(a positive value) TT Transit Time All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 3. IG-VT Characteristic Evaluation Circuit Simulation result Simulation Comparison Table Measurement Simulation % Error IGT (mA) 2 2.0044 0.22000 VGT (V) 0.6 0.596 -0.66667 All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 4. ITM-VTM Characteristic Evaluation Circuit Simulation result Simulation Comparison Table At ITM=23A Measurement Simulation % Error VTM(V) 1.4 1.4286 2.04286 All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 5. Holding Characteristic (IH) Evaluation Circuit Simulation result Simulation Comparison Table VD=12V Measurement Simulation % Error IH(mA) 7 6.8890 -1.58571 All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 6. Switching Time Characteristic Evaluation Circuit Simulation result Simulation Comparison Table Measurement Simulation %Error Ton(us) 2 1.9958 -0.21000 Toff(us) 70 68.657 -1.91857 All Rights Reserved Copyright (c) Bee Technologies Inc. 2004