SlideShare a Scribd company logo
1 of 48
Download to read offline
Introduction to
EMI/EMC Challenges
and Their Solution

Dr. Hany Fahmy
HSD Application Expert
Agilent Technologies
Davy Pissort, K.U. Leuven
Charles Jackson, Nvidia
Charlie Shu, Nvidia
Chen Wang, Nvidia
Amolak Badesha, Avago

Copyright © 2012 Agilent Technologies
Current Solution

Put on a bandaid to stop the Bleeding
(radiation..)
•Not optimal
•Does not always work
•Costly

Copper
band-aid

R4N Suppressor
band-aid

Copyright © 2012 Agilent Technologies
Complexity of EMI problem
I/Os can inject Common-mode Noise Or
Power-pins inject Noise into PDN
Badly routed traces generate EMI
High-speed connectors and cables amplify the EMI problems
MINIMIZE I C, PKG ,
AND P C B E M I TO
REDUCE OVERALL
S YSTEM E M I

Connectors

High-speed
PCB

High-speed
IC

* From EM-Scan Measurement of GPU Board
Copyright © 2012 Agilent Technologies
Mechanism of Noise Propagation
(2) Radiation Noise
Noise Source

Noise Source

(1) Conductive Noise

Equipment or
device
exposed to
noise

(3)
Conductive
Noise

Conductive
Noise

Noise Source

Equipment or
device
exposed to
noise

Equipment or
device
exposed to
noise

Copyright © 2012 Agilent Technologies
Different types of Emission
Trace-Emission
I/O-Buffers Injecting
Signal

Power-Pins Injecting
Noise

GND Return-currents & Slots

Common-Mode noise travelling
Copyright
through Connectors© 2012 Agilent Technologies
Introducing the concept of “Virtual-EMI Lab”

O PTIMIZE FOR E M I
DEVELOP EMI
G UIDELINES

VAL I D AT I O N W I T H
M EASUREMENTS

*Full-wave EM Simulation,
What-if Analysis, Root-cause debugging

**Measurements to Isolate the problem
and Correlate with Simulation
Copyright © 2012 Agilent Technologies
Radiated-emission on packages due to
return-path-discontinuity

Copyright © 2012 Agilent Technologies
DDR3 Package Modeling using MOM DC to 20GHz
Data- (DQ-) nets major referencing to GND

Copyright © 2012 Agilent Technologies
Routing of DQ signals from Die-Bumps-Top to
Layer-3 running as Symmetric-SL sandwiched
between GND on Layers 2 & 4
DQ signals on Layer-3 as Symmetric-SL

DQ signals @ Die-Bumps

Copyright © 2012 Agilent Technologies
Moving from Layer-3 to Layer-6 through SignalPTH to pickup the Balls
DQ signals on Layer-6 routed
between GND on layers 5

DQ signals on Layer-3

Copyright © 2012 Agilent Technologies
Impact of GND-PTH stitching: Proximity & #
Original-Package:

Cost-Reduced-Package:

With 15-GND-PTH

with 3-GND-PTH

Copyright © 2012 Agilent Technologies
Comparison of Return-current on GND-L4
Original-Package:

Cost-Reduced-Package:

With 15-GND-PTH

With 3-GND-PTH

Larger NEXT by 10dB
Copyright © 2012 Agilent Technologies
Comparison of eye-diagram @ 1.33GBps
Original-Package:

Cost-Reduced-Package:

With 15-GND-PTH

With 3-GND-PTH

DQ

40ps loss of
margin

+95ps worst Setup-Margin

DQS

DQ

+55ps worst Setup-Margin

DQS

Copyright © 2012 Agilent Technologies
Do Dispersion of GND-Current leads to MoreRadiated Emission? (Movie)

Copyright © 2012 Agilent Technologies
PKG-Antenna-Parameters Comparison of
15-GND-PTH compared to 3-GND-PTH

Antenna-Gain
-19dB  -11dB (+8dB)
Radiated-Power
40-uWatts  220-uWatts
(6x)

Maximum Intensity: 5u-watts/Steradian  40uwatts/Steradian (8X)
Angle of U-max: 160-degrees vs. 140-degrees

Copyright © 2012 Agilent Technologies
Trade-off Low-cost & Performance
Reducing # of GND-Stitches  Medium-2-low-risk for 1.33GB/s operation with +55ps
worst-case Setup-margin but with +8dB Antenna-Gain

Most probably we need to Turn-ON Spread spectrum.

What is the cost of PLL vs. Reduction of GND-Stitch?

Copyright © 2012 Agilent Technologies
Trace Emission
on PCBs due to costreduction
Low-Layer count PCB

CASE:1
Memory emission from
MA/CMD lanes

Copyright © 2012 Agilent Technologies
4-layer PCB with Memory Emission Problem

Problem:
Investigate Emission problem at 1.25 times
the memory clock frequency (1.623 GHz)

Notes:
Address/Command Nets are routed on bottom-layer
Referencing power plane (due to lack of real-estate)

Copyright © 2012 Agilent Technologies
EMI Simulation Methodology
Step-1: Simulate and Visualize Current-density plot*

Method-of-Moments
(Momentum) Simulations
showing current-density
plots and hot-spot regions
on the PCB

Emscan
Measurements

*Using Agilent Momentum Field Solver
Copyright © 2012 Agilent Technologies
EMI Simulation Methodology, Cont’
Step-2: Isolate Problem
Observe hot-spot area closely, and identify root-cause

Root-cause:
There is small λ/8 power-plane patch
that is radiating like patch-antenna

Use the Momentum-uwave EM-engine with Antenna-Gain
parameter to measure the merit of the PCB as non-intended antenna
Develop EMI guidelines along with SI/PI Guidelines using
Antenna-Gain Parameter to compare Layout guidelines

Copyright © 2012 Agilent Technologies
What is the remedy?

Instead of REF MA/CMD to a VddQ Patch on Bottom layer
continue routing on Bottom Layer 3m Chamber at least 16dB Improvement

Copyright © 2012 Agilent Technologies
Trace Emission
on PCBs due to costreduction
Low-Layer count PCB

CASE:2
TMDS Emissions

Copyright © 2012 Agilent Technologies
Problem Statement
TMDS Emission @ 770MHz on 4-layer PCB & Coupling to
Neighbor Ethernet-Card

Copyright © 2012 Agilent Technologies
Which one is better

Copper
band-aid

R4N
Suppressor
band-aid

Copyright © 2012 Agilent Technologies
Copyright © 2012 Agilent Technologies
Copyright © 2012 Agilent Technologies
Is it E-coupling or H-coupling?
With
Metallic
Shield

*Lab data confirms
simulation results

Solution:
Simulation shows that suppression
material is improving EMI emission,
whereas, metallic shied is making it
worse

Choose Suppression material
over metallic shied -> Improve
both cost and performance 

Copyright © 2012 Agilent Technologies
Near-field scan results
R4N
Suppressor
band-aid
Emscan
measurements

Copyright © 2012 Agilent Technologies
Copyright © 2012 Agilent Technologies
Copyright © 2012 Agilent Technologies
What is the Remedy?
Sometimes it is cheaper to dampen the receiver not Emitter
because adding R4N suppression materials is more cost than
using RJ45 shielded connector on the Ethernet-card.

Selected to change RJ45 Connector on Ethernet-card to
shielded one to suppress the receiver

Copyright © 2012 Agilent Technologies
PCB Edge Emission
due to Power delivery
Noise

Copyright © 2012 Agilent Technologies
Simulation Challenges in EMI

•System level (source, coupling path, unintentional antenna
•Full wave simulation is often needed
•Time and memory consuming

Copyright © 2012 Agilent Technologies
Combining Measured Icc(t) with FDTD simulations
to study the critical on-board-decaps under the
GPU

Power Delivery Network

Current Probe @ VddQ pins

Drivers

Channel

Receivers

•SSO current is obtained by a combined simulation of the power delivery network
model and the memory IO channel model
Copyright © 2012 Agilent Technologies
Measured Dynamic-current profile Icc(t)

fft
ifft

steady-state frequencies

•Time-domain noise pattern directly imported into FDTD solver

Copyright © 2012 Agilent Technologies
Importing PCB layout of the Memory Channel

Stackup

8 cm

Signal
Ground
Signal

VDD
Ground
VDD

11 cm

board thickness: 1.57mm

Copyright © 2012 Agilent Technologies
SSO Noise Source on Top Layer

Noise sources

IC

Copyright © 2012 Agilent Technologies
Decaps on Bottom Layer

decaps

Copyright © 2012 Agilent Technologies
Far-Field Radiation

at 0.5 GHz

With Decaps

at 1.0 GHz

Without Decaps

With Decaps

Without Decaps

Reduction of 3-4 dB
Copyright © 2012 Agilent Technologies
Current Density

At 0.5 GHz

Without Decaps

At 0.5 GHz

With Decaps

Copyright © 2012 Agilent Technologies
What is the benefit of PCB decaps?
New method to optimize the PCB decaps:
1. Measure or simulate the Dynamic-current profile Icc(t) @ the
VddQ-pins with maximum activity on the memory-channel
2. Import the Icc(t) into FDTD (wide-band-phenomena)
3. Study the critical PCB decaps to mitigate the SSO noise
emission

Copyright © 2012 Agilent Technologies
Connector/Cable
Emission

Copyright © 2012 Agilent Technologies
Board +Connector +Mate

Copyright © 2012 Agilent Technologies
Combining CAD and Board Files

Precise landing of connector fingers on
board signal pad

Copyright © 2012 Agilent Technologies
Near-Field Radiation:
Do we need Shielded Connector? ($0.15 more cost)
Do we need copper-tape under connector?
•Simulated with FDTD-solver
(Agilent EMPro)
•Accelerated on GPU system
•Simulation time ≈ ½ day with
1-GPU card and 2-hrs with
3-GPU cards

Study if improved grounding & shielding of the
connector improves EMI behavior
Copyright © 2012 Agilent Technologies
Improved Grounding of the Connector:
What is the impact of a copper-tape under the
connector
No copper tape

Extra copper tape

Copyright © 2012 Agilent Technologies
Improved Grounding: Far-field impact of CU-tape

Reduction of 5 dB for EMI emission
In direction of chassis

Copyright © 2012 Agilent Technologies
Conclusion
•“Virtual-EMI” Lab is a MUST for Speed-of-Light Product-to-Market
•Radiated/Conducted-Emission:
•Packages Return-Path-Discontinuity driving the need to turn-ON SS

ORDER A TRIAL VERSION
FOR ADS
http://www.agilent.com/find/ee
sof-ads-si-evaluation

• PCBs due to Cost-Reduction 4L-PCBs”

– MA/CMD Emission by referencing to VddQ

– TMDS Emission due to routing on Bottom layer

• SSO Noise Emission by VddQ Current-Profile on PCB Decaps are very
effective
• Emission of Connector+Cables from HDMI common-mode noise

Copyright © 2012 Agilent Technologies

More Related Content

What's hot

Dpf 2011 V2
Dpf 2011 V2Dpf 2011 V2
Dpf 2011 V2warunaf
 
Practical EMC and EMI Control for Engineers and Technicians
Practical EMC and EMI Control for Engineers and TechniciansPractical EMC and EMI Control for Engineers and Technicians
Practical EMC and EMI Control for Engineers and TechniciansLiving Online
 
Signal Integrity - A Crash Course [R Lott]
Signal Integrity - A Crash Course [R Lott]Signal Integrity - A Crash Course [R Lott]
Signal Integrity - A Crash Course [R Lott]Ryan Lott
 
Fiber cable --where to use & why
Fiber cable --where to use & whyFiber cable --where to use & why
Fiber cable --where to use & whyعمر خليل
 
2012 Protection strategy for EOS (IEC 61000-4-5)
2012 Protection strategy for EOS (IEC 61000-4-5)2012 Protection strategy for EOS (IEC 61000-4-5)
2012 Protection strategy for EOS (IEC 61000-4-5)Sofics
 
Webinar Slides: Probing Techniques and Tradeoffs – What to Use and Why
Webinar Slides: Probing Techniques and Tradeoffs – What to Use and WhyWebinar Slides: Probing Techniques and Tradeoffs – What to Use and Why
Webinar Slides: Probing Techniques and Tradeoffs – What to Use and Whyteledynelecroy
 
Fiber otdr testing
Fiber otdr testingFiber otdr testing
Fiber otdr testingbsateeshbsnl
 
Local I/O ESD protection for 28Gbps to 112Gbps SerDes interfaces in advanced ...
Local I/O ESD protection for 28Gbps to 112Gbps SerDes interfaces in advanced ...Local I/O ESD protection for 28Gbps to 112Gbps SerDes interfaces in advanced ...
Local I/O ESD protection for 28Gbps to 112Gbps SerDes interfaces in advanced ...Sofics
 
Essential principles of jitter part 2 the components of jitter
Essential principles of jitter part 2 the components of jitterEssential principles of jitter part 2 the components of jitter
Essential principles of jitter part 2 the components of jitterteledynelecroy
 
SCR-Based ESD Protection Designs for RF ICs
SCR-Based ESD Protection Designs for RF ICsSCR-Based ESD Protection Designs for RF ICs
SCR-Based ESD Protection Designs for RF ICsjournal ijrtem
 
Testing and Troubleshooting Fiber Optic Cables
Testing and Troubleshooting Fiber Optic CablesTesting and Troubleshooting Fiber Optic Cables
Testing and Troubleshooting Fiber Optic CablesLiving Online
 
Using and OMA to Optimize QAM Optical Transceivers
Using and OMA to Optimize QAM Optical TransceiversUsing and OMA to Optimize QAM Optical Transceivers
Using and OMA to Optimize QAM Optical Transceiversteledynelecroy
 
USB 3.1 Gen 2 Compliance Testing and Debug Webinar
USB 3.1 Gen 2 Compliance Testing and Debug WebinarUSB 3.1 Gen 2 Compliance Testing and Debug Webinar
USB 3.1 Gen 2 Compliance Testing and Debug Webinarteledynelecroy
 
Essentials of jitter part 1 The Time Interval Error: TIE
Essentials of jitter part 1 The Time Interval Error: TIEEssentials of jitter part 1 The Time Interval Error: TIE
Essentials of jitter part 1 The Time Interval Error: TIEteledynelecroy
 
Ideal 3D Stacked Die Test - IEEE Semiconductor Wafer Test Workshop SWTW 2013
Ideal 3D Stacked Die Test - IEEE Semiconductor Wafer Test Workshop SWTW 2013Ideal 3D Stacked Die Test - IEEE Semiconductor Wafer Test Workshop SWTW 2013
Ideal 3D Stacked Die Test - IEEE Semiconductor Wafer Test Workshop SWTW 2013Ira Feldman
 
Optical Fiber Communication Part 3 Optical Digital Receiver
Optical Fiber Communication Part 3 Optical Digital ReceiverOptical Fiber Communication Part 3 Optical Digital Receiver
Optical Fiber Communication Part 3 Optical Digital ReceiverMadhumita Tamhane
 
isoPower®: Isolated DC to DC Converter
isoPower®: Isolated DC to DC ConverterisoPower®: Isolated DC to DC Converter
isoPower®: Isolated DC to DC ConverterAnalog Devices, Inc.
 
Ningbo Junbo Electronic CO.,Ltd
Ningbo Junbo Electronic CO.,LtdNingbo Junbo Electronic CO.,Ltd
Ningbo Junbo Electronic CO.,LtdRubyShen6
 

What's hot (20)

Dpf 2011 V2
Dpf 2011 V2Dpf 2011 V2
Dpf 2011 V2
 
Practical EMC and EMI Control for Engineers and Technicians
Practical EMC and EMI Control for Engineers and TechniciansPractical EMC and EMI Control for Engineers and Technicians
Practical EMC and EMI Control for Engineers and Technicians
 
Signal Integrity - A Crash Course [R Lott]
Signal Integrity - A Crash Course [R Lott]Signal Integrity - A Crash Course [R Lott]
Signal Integrity - A Crash Course [R Lott]
 
Fiber cable --where to use & why
Fiber cable --where to use & whyFiber cable --where to use & why
Fiber cable --where to use & why
 
2012 Protection strategy for EOS (IEC 61000-4-5)
2012 Protection strategy for EOS (IEC 61000-4-5)2012 Protection strategy for EOS (IEC 61000-4-5)
2012 Protection strategy for EOS (IEC 61000-4-5)
 
Webinar Slides: Probing Techniques and Tradeoffs – What to Use and Why
Webinar Slides: Probing Techniques and Tradeoffs – What to Use and WhyWebinar Slides: Probing Techniques and Tradeoffs – What to Use and Why
Webinar Slides: Probing Techniques and Tradeoffs – What to Use and Why
 
Fiber otdr testing
Fiber otdr testingFiber otdr testing
Fiber otdr testing
 
Local I/O ESD protection for 28Gbps to 112Gbps SerDes interfaces in advanced ...
Local I/O ESD protection for 28Gbps to 112Gbps SerDes interfaces in advanced ...Local I/O ESD protection for 28Gbps to 112Gbps SerDes interfaces in advanced ...
Local I/O ESD protection for 28Gbps to 112Gbps SerDes interfaces in advanced ...
 
Essential principles of jitter part 2 the components of jitter
Essential principles of jitter part 2 the components of jitterEssential principles of jitter part 2 the components of jitter
Essential principles of jitter part 2 the components of jitter
 
SCR-Based ESD Protection Designs for RF ICs
SCR-Based ESD Protection Designs for RF ICsSCR-Based ESD Protection Designs for RF ICs
SCR-Based ESD Protection Designs for RF ICs
 
Testing and Troubleshooting Fiber Optic Cables
Testing and Troubleshooting Fiber Optic CablesTesting and Troubleshooting Fiber Optic Cables
Testing and Troubleshooting Fiber Optic Cables
 
Optical receivers
Optical receiversOptical receivers
Optical receivers
 
Using and OMA to Optimize QAM Optical Transceivers
Using and OMA to Optimize QAM Optical TransceiversUsing and OMA to Optimize QAM Optical Transceivers
Using and OMA to Optimize QAM Optical Transceivers
 
Ch17
Ch17Ch17
Ch17
 
USB 3.1 Gen 2 Compliance Testing and Debug Webinar
USB 3.1 Gen 2 Compliance Testing and Debug WebinarUSB 3.1 Gen 2 Compliance Testing and Debug Webinar
USB 3.1 Gen 2 Compliance Testing and Debug Webinar
 
Essentials of jitter part 1 The Time Interval Error: TIE
Essentials of jitter part 1 The Time Interval Error: TIEEssentials of jitter part 1 The Time Interval Error: TIE
Essentials of jitter part 1 The Time Interval Error: TIE
 
Ideal 3D Stacked Die Test - IEEE Semiconductor Wafer Test Workshop SWTW 2013
Ideal 3D Stacked Die Test - IEEE Semiconductor Wafer Test Workshop SWTW 2013Ideal 3D Stacked Die Test - IEEE Semiconductor Wafer Test Workshop SWTW 2013
Ideal 3D Stacked Die Test - IEEE Semiconductor Wafer Test Workshop SWTW 2013
 
Optical Fiber Communication Part 3 Optical Digital Receiver
Optical Fiber Communication Part 3 Optical Digital ReceiverOptical Fiber Communication Part 3 Optical Digital Receiver
Optical Fiber Communication Part 3 Optical Digital Receiver
 
isoPower®: Isolated DC to DC Converter
isoPower®: Isolated DC to DC ConverterisoPower®: Isolated DC to DC Converter
isoPower®: Isolated DC to DC Converter
 
Ningbo Junbo Electronic CO.,Ltd
Ningbo Junbo Electronic CO.,LtdNingbo Junbo Electronic CO.,Ltd
Ningbo Junbo Electronic CO.,Ltd
 

Similar to Introduction to emi hf feb_16_10am

Slow dancing pdn on memory-controller-packages may-10th_2012_hf_last
Slow dancing pdn on memory-controller-packages may-10th_2012_hf_lastSlow dancing pdn on memory-controller-packages may-10th_2012_hf_last
Slow dancing pdn on memory-controller-packages may-10th_2012_hf_lastHany Fahmy
 
Testing Power Electronics-por-eng-Rev000.pptx
Testing Power Electronics-por-eng-Rev000.pptxTesting Power Electronics-por-eng-Rev000.pptx
Testing Power Electronics-por-eng-Rev000.pptxvendasilimitadas
 
Distinguishing Performance of 60-GHz Micro strip Patch Antenna for Different ...
Distinguishing Performance of 60-GHz Micro strip Patch Antenna for Different ...Distinguishing Performance of 60-GHz Micro strip Patch Antenna for Different ...
Distinguishing Performance of 60-GHz Micro strip Patch Antenna for Different ...Mohammad Kamrul Hasan
 
RF to IF Mixers by IDT: Low-power Downconversion Mixers with Zero-Distortion
RF to IF Mixers by IDT: Low-power Downconversion Mixers with Zero-DistortionRF to IF Mixers by IDT: Low-power Downconversion Mixers with Zero-Distortion
RF to IF Mixers by IDT: Low-power Downconversion Mixers with Zero-DistortionIntegrated Device Technology
 
Circuit Board Layout Techniques - www.circuitsinc.tk
Circuit Board Layout Techniques - www.circuitsinc.tkCircuit Board Layout Techniques - www.circuitsinc.tk
Circuit Board Layout Techniques - www.circuitsinc.tkCircuitsAdmin
 
Webinar Slides: Probing in Power Electronics - What to use and why
Webinar Slides:  Probing in Power Electronics - What to use and whyWebinar Slides:  Probing in Power Electronics - What to use and why
Webinar Slides: Probing in Power Electronics - What to use and whyHilary Lustig
 
Webinar Slides: Probing in Power Electronics - What to use and why
Webinar Slides:  Probing in Power Electronics - What to use and whyWebinar Slides:  Probing in Power Electronics - What to use and why
Webinar Slides: Probing in Power Electronics - What to use and whyteledynelecroy
 
2019 Local I/O ESD protection for 28Gbps to 112Gbps SerDes interfaces in adva...
2019 Local I/O ESD protection for 28Gbps to 112Gbps SerDes interfaces in adva...2019 Local I/O ESD protection for 28Gbps to 112Gbps SerDes interfaces in adva...
2019 Local I/O ESD protection for 28Gbps to 112Gbps SerDes interfaces in adva...Sofics
 
3 Watt and 5 Watt Power LED Emitters
3 Watt and 5 Watt Power LED Emitters3 Watt and 5 Watt Power LED Emitters
3 Watt and 5 Watt Power LED EmittersPremier Farnell
 
Andrew E15Z01P13
Andrew E15Z01P13Andrew E15Z01P13
Andrew E15Z01P13savomir
 
2012_11_Taconic PIM_english
2012_11_Taconic PIM_english2012_11_Taconic PIM_english
2012_11_Taconic PIM_englishManfred Huschka
 
Andrew ETD819HS12UB
Andrew ETD819HS12UBAndrew ETD819HS12UB
Andrew ETD819HS12UBsavomir
 
Webinar: High Voltage Fiber Optic (HVFO) Probe for Small Signal Floating Meas...
Webinar: High Voltage Fiber Optic (HVFO) Probe for Small Signal Floating Meas...Webinar: High Voltage Fiber Optic (HVFO) Probe for Small Signal Floating Meas...
Webinar: High Voltage Fiber Optic (HVFO) Probe for Small Signal Floating Meas...teledynelecroy
 
Dpf 2011 V2
Dpf 2011 V2Dpf 2011 V2
Dpf 2011 V2warunaf
 
N5AC 2014-10-11 Pacificon SDR Advances
N5AC 2014-10-11 Pacificon SDR AdvancesN5AC 2014-10-11 Pacificon SDR Advances
N5AC 2014-10-11 Pacificon SDR AdvancesN5AC
 
EE673+F14+T2+Project1+Final+Pres+r3rg
EE673+F14+T2+Project1+Final+Pres+r3rgEE673+F14+T2+Project1+Final+Pres+r3rg
EE673+F14+T2+Project1+Final+Pres+r3rgAshikur Rahman
 
xDSL, DSLAM & CO
xDSL, DSLAM & COxDSL, DSLAM & CO
xDSL, DSLAM & COMarc Seeger
 

Similar to Introduction to emi hf feb_16_10am (20)

Slow dancing pdn on memory-controller-packages may-10th_2012_hf_last
Slow dancing pdn on memory-controller-packages may-10th_2012_hf_lastSlow dancing pdn on memory-controller-packages may-10th_2012_hf_last
Slow dancing pdn on memory-controller-packages may-10th_2012_hf_last
 
Testing Power Electronics-por-eng-Rev000.pptx
Testing Power Electronics-por-eng-Rev000.pptxTesting Power Electronics-por-eng-Rev000.pptx
Testing Power Electronics-por-eng-Rev000.pptx
 
Distinguishing Performance of 60-GHz Micro strip Patch Antenna for Different ...
Distinguishing Performance of 60-GHz Micro strip Patch Antenna for Different ...Distinguishing Performance of 60-GHz Micro strip Patch Antenna for Different ...
Distinguishing Performance of 60-GHz Micro strip Patch Antenna for Different ...
 
RF to IF Mixers by IDT: Low-power Downconversion Mixers with Zero-Distortion
RF to IF Mixers by IDT: Low-power Downconversion Mixers with Zero-DistortionRF to IF Mixers by IDT: Low-power Downconversion Mixers with Zero-Distortion
RF to IF Mixers by IDT: Low-power Downconversion Mixers with Zero-Distortion
 
SinkPAD Technology
SinkPAD TechnologySinkPAD Technology
SinkPAD Technology
 
Circuit Board Layout Techniques - www.circuitsinc.tk
Circuit Board Layout Techniques - www.circuitsinc.tkCircuit Board Layout Techniques - www.circuitsinc.tk
Circuit Board Layout Techniques - www.circuitsinc.tk
 
Webinar Slides: Probing in Power Electronics - What to use and why
Webinar Slides:  Probing in Power Electronics - What to use and whyWebinar Slides:  Probing in Power Electronics - What to use and why
Webinar Slides: Probing in Power Electronics - What to use and why
 
Webinar Slides: Probing in Power Electronics - What to use and why
Webinar Slides:  Probing in Power Electronics - What to use and whyWebinar Slides:  Probing in Power Electronics - What to use and why
Webinar Slides: Probing in Power Electronics - What to use and why
 
2019 Local I/O ESD protection for 28Gbps to 112Gbps SerDes interfaces in adva...
2019 Local I/O ESD protection for 28Gbps to 112Gbps SerDes interfaces in adva...2019 Local I/O ESD protection for 28Gbps to 112Gbps SerDes interfaces in adva...
2019 Local I/O ESD protection for 28Gbps to 112Gbps SerDes interfaces in adva...
 
3 Watt and 5 Watt Power LED Emitters
3 Watt and 5 Watt Power LED Emitters3 Watt and 5 Watt Power LED Emitters
3 Watt and 5 Watt Power LED Emitters
 
Andrew E15Z01P13
Andrew E15Z01P13Andrew E15Z01P13
Andrew E15Z01P13
 
2012_11_Taconic PIM_english
2012_11_Taconic PIM_english2012_11_Taconic PIM_english
2012_11_Taconic PIM_english
 
Andrew ETD819HS12UB
Andrew ETD819HS12UBAndrew ETD819HS12UB
Andrew ETD819HS12UB
 
lm380.pdf
lm380.pdflm380.pdf
lm380.pdf
 
Webinar: High Voltage Fiber Optic (HVFO) Probe for Small Signal Floating Meas...
Webinar: High Voltage Fiber Optic (HVFO) Probe for Small Signal Floating Meas...Webinar: High Voltage Fiber Optic (HVFO) Probe for Small Signal Floating Meas...
Webinar: High Voltage Fiber Optic (HVFO) Probe for Small Signal Floating Meas...
 
Dpf 2011 V2
Dpf 2011 V2Dpf 2011 V2
Dpf 2011 V2
 
N5AC 2014-10-11 Pacificon SDR Advances
N5AC 2014-10-11 Pacificon SDR AdvancesN5AC 2014-10-11 Pacificon SDR Advances
N5AC 2014-10-11 Pacificon SDR Advances
 
EE673+F14+T2+Project1+Final+Pres+r3rg
EE673+F14+T2+Project1+Final+Pres+r3rgEE673+F14+T2+Project1+Final+Pres+r3rg
EE673+F14+T2+Project1+Final+Pres+r3rg
 
3 g basics
3 g basics3 g basics
3 g basics
 
xDSL, DSLAM & CO
xDSL, DSLAM & COxDSL, DSLAM & CO
xDSL, DSLAM & CO
 

More from Hany Fahmy

SLI flex cable_analysis
SLI flex cable_analysisSLI flex cable_analysis
SLI flex cable_analysisHany Fahmy
 
Dual stacked connector may-13th_2008
Dual stacked connector may-13th_2008Dual stacked connector may-13th_2008
Dual stacked connector may-13th_2008Hany Fahmy
 
White paper pi 11012011
White paper pi 11012011White paper pi 11012011
White paper pi 11012011Hany Fahmy
 
Web cast-a day-in_the_life_of_a_hsd_nov_5th_2012_final_al_hamdu_ll_allah__hsd...
Web cast-a day-in_the_life_of_a_hsd_nov_5th_2012_final_al_hamdu_ll_allah__hsd...Web cast-a day-in_the_life_of_a_hsd_nov_5th_2012_final_al_hamdu_ll_allah__hsd...
Web cast-a day-in_the_life_of_a_hsd_nov_5th_2012_final_al_hamdu_ll_allah__hsd...Hany Fahmy
 
Ddr3 impact of_gnd_pth_stitches_package_routing_guidelines_may_30th_2011_rev1...
Ddr3 impact of_gnd_pth_stitches_package_routing_guidelines_may_30th_2011_rev1...Ddr3 impact of_gnd_pth_stitches_package_routing_guidelines_may_30th_2011_rev1...
Ddr3 impact of_gnd_pth_stitches_package_routing_guidelines_may_30th_2011_rev1...Hany Fahmy
 
Backplane hsd meeting_may_8th_2012_sharable
Backplane hsd meeting_may_8th_2012_sharableBackplane hsd meeting_may_8th_2012_sharable
Backplane hsd meeting_may_8th_2012_sharableHany Fahmy
 
12 wp5 slides_authors_dp_dec_26_2012
12 wp5 slides_authors_dp_dec_26_201212 wp5 slides_authors_dp_dec_26_2012
12 wp5 slides_authors_dp_dec_26_2012Hany Fahmy
 

More from Hany Fahmy (7)

SLI flex cable_analysis
SLI flex cable_analysisSLI flex cable_analysis
SLI flex cable_analysis
 
Dual stacked connector may-13th_2008
Dual stacked connector may-13th_2008Dual stacked connector may-13th_2008
Dual stacked connector may-13th_2008
 
White paper pi 11012011
White paper pi 11012011White paper pi 11012011
White paper pi 11012011
 
Web cast-a day-in_the_life_of_a_hsd_nov_5th_2012_final_al_hamdu_ll_allah__hsd...
Web cast-a day-in_the_life_of_a_hsd_nov_5th_2012_final_al_hamdu_ll_allah__hsd...Web cast-a day-in_the_life_of_a_hsd_nov_5th_2012_final_al_hamdu_ll_allah__hsd...
Web cast-a day-in_the_life_of_a_hsd_nov_5th_2012_final_al_hamdu_ll_allah__hsd...
 
Ddr3 impact of_gnd_pth_stitches_package_routing_guidelines_may_30th_2011_rev1...
Ddr3 impact of_gnd_pth_stitches_package_routing_guidelines_may_30th_2011_rev1...Ddr3 impact of_gnd_pth_stitches_package_routing_guidelines_may_30th_2011_rev1...
Ddr3 impact of_gnd_pth_stitches_package_routing_guidelines_may_30th_2011_rev1...
 
Backplane hsd meeting_may_8th_2012_sharable
Backplane hsd meeting_may_8th_2012_sharableBackplane hsd meeting_may_8th_2012_sharable
Backplane hsd meeting_may_8th_2012_sharable
 
12 wp5 slides_authors_dp_dec_26_2012
12 wp5 slides_authors_dp_dec_26_201212 wp5 slides_authors_dp_dec_26_2012
12 wp5 slides_authors_dp_dec_26_2012
 

Recently uploaded

Install Stable Diffusion in windows machine
Install Stable Diffusion in windows machineInstall Stable Diffusion in windows machine
Install Stable Diffusion in windows machinePadma Pradeep
 
New from BookNet Canada for 2024: BNC CataList - Tech Forum 2024
New from BookNet Canada for 2024: BNC CataList - Tech Forum 2024New from BookNet Canada for 2024: BNC CataList - Tech Forum 2024
New from BookNet Canada for 2024: BNC CataList - Tech Forum 2024BookNet Canada
 
My Hashitalk Indonesia April 2024 Presentation
My Hashitalk Indonesia April 2024 PresentationMy Hashitalk Indonesia April 2024 Presentation
My Hashitalk Indonesia April 2024 PresentationRidwan Fadjar
 
Unraveling Multimodality with Large Language Models.pdf
Unraveling Multimodality with Large Language Models.pdfUnraveling Multimodality with Large Language Models.pdf
Unraveling Multimodality with Large Language Models.pdfAlex Barbosa Coqueiro
 
WordPress Websites for Engineers: Elevate Your Brand
WordPress Websites for Engineers: Elevate Your BrandWordPress Websites for Engineers: Elevate Your Brand
WordPress Websites for Engineers: Elevate Your Brandgvaughan
 
Scanning the Internet for External Cloud Exposures via SSL Certs
Scanning the Internet for External Cloud Exposures via SSL CertsScanning the Internet for External Cloud Exposures via SSL Certs
Scanning the Internet for External Cloud Exposures via SSL CertsRizwan Syed
 
"Subclassing and Composition – A Pythonic Tour of Trade-Offs", Hynek Schlawack
"Subclassing and Composition – A Pythonic Tour of Trade-Offs", Hynek Schlawack"Subclassing and Composition – A Pythonic Tour of Trade-Offs", Hynek Schlawack
"Subclassing and Composition – A Pythonic Tour of Trade-Offs", Hynek SchlawackFwdays
 
Are Multi-Cloud and Serverless Good or Bad?
Are Multi-Cloud and Serverless Good or Bad?Are Multi-Cloud and Serverless Good or Bad?
Are Multi-Cloud and Serverless Good or Bad?Mattias Andersson
 
Connect Wave/ connectwave Pitch Deck Presentation
Connect Wave/ connectwave Pitch Deck PresentationConnect Wave/ connectwave Pitch Deck Presentation
Connect Wave/ connectwave Pitch Deck PresentationSlibray Presentation
 
Search Engine Optimization SEO PDF for 2024.pdf
Search Engine Optimization SEO PDF for 2024.pdfSearch Engine Optimization SEO PDF for 2024.pdf
Search Engine Optimization SEO PDF for 2024.pdfRankYa
 
Kotlin Multiplatform & Compose Multiplatform - Starter kit for pragmatics
Kotlin Multiplatform & Compose Multiplatform - Starter kit for pragmaticsKotlin Multiplatform & Compose Multiplatform - Starter kit for pragmatics
Kotlin Multiplatform & Compose Multiplatform - Starter kit for pragmaticscarlostorres15106
 
Integration and Automation in Practice: CI/CD in Mule Integration and Automat...
Integration and Automation in Practice: CI/CD in Mule Integration and Automat...Integration and Automation in Practice: CI/CD in Mule Integration and Automat...
Integration and Automation in Practice: CI/CD in Mule Integration and Automat...Patryk Bandurski
 
What's New in Teams Calling, Meetings and Devices March 2024
What's New in Teams Calling, Meetings and Devices March 2024What's New in Teams Calling, Meetings and Devices March 2024
What's New in Teams Calling, Meetings and Devices March 2024Stephanie Beckett
 
Transcript: New from BookNet Canada for 2024: BNC CataList - Tech Forum 2024
Transcript: New from BookNet Canada for 2024: BNC CataList - Tech Forum 2024Transcript: New from BookNet Canada for 2024: BNC CataList - Tech Forum 2024
Transcript: New from BookNet Canada for 2024: BNC CataList - Tech Forum 2024BookNet Canada
 
Beyond Boundaries: Leveraging No-Code Solutions for Industry Innovation
Beyond Boundaries: Leveraging No-Code Solutions for Industry InnovationBeyond Boundaries: Leveraging No-Code Solutions for Industry Innovation
Beyond Boundaries: Leveraging No-Code Solutions for Industry InnovationSafe Software
 
Streamlining Python Development: A Guide to a Modern Project Setup
Streamlining Python Development: A Guide to a Modern Project SetupStreamlining Python Development: A Guide to a Modern Project Setup
Streamlining Python Development: A Guide to a Modern Project SetupFlorian Wilhelm
 
Powerpoint exploring the locations used in television show Time Clash
Powerpoint exploring the locations used in television show Time ClashPowerpoint exploring the locations used in television show Time Clash
Powerpoint exploring the locations used in television show Time Clashcharlottematthew16
 
Gen AI in Business - Global Trends Report 2024.pdf
Gen AI in Business - Global Trends Report 2024.pdfGen AI in Business - Global Trends Report 2024.pdf
Gen AI in Business - Global Trends Report 2024.pdfAddepto
 
Advanced Test Driven-Development @ php[tek] 2024
Advanced Test Driven-Development @ php[tek] 2024Advanced Test Driven-Development @ php[tek] 2024
Advanced Test Driven-Development @ php[tek] 2024Scott Keck-Warren
 

Recently uploaded (20)

Install Stable Diffusion in windows machine
Install Stable Diffusion in windows machineInstall Stable Diffusion in windows machine
Install Stable Diffusion in windows machine
 
New from BookNet Canada for 2024: BNC CataList - Tech Forum 2024
New from BookNet Canada for 2024: BNC CataList - Tech Forum 2024New from BookNet Canada for 2024: BNC CataList - Tech Forum 2024
New from BookNet Canada for 2024: BNC CataList - Tech Forum 2024
 
My Hashitalk Indonesia April 2024 Presentation
My Hashitalk Indonesia April 2024 PresentationMy Hashitalk Indonesia April 2024 Presentation
My Hashitalk Indonesia April 2024 Presentation
 
Unraveling Multimodality with Large Language Models.pdf
Unraveling Multimodality with Large Language Models.pdfUnraveling Multimodality with Large Language Models.pdf
Unraveling Multimodality with Large Language Models.pdf
 
WordPress Websites for Engineers: Elevate Your Brand
WordPress Websites for Engineers: Elevate Your BrandWordPress Websites for Engineers: Elevate Your Brand
WordPress Websites for Engineers: Elevate Your Brand
 
Scanning the Internet for External Cloud Exposures via SSL Certs
Scanning the Internet for External Cloud Exposures via SSL CertsScanning the Internet for External Cloud Exposures via SSL Certs
Scanning the Internet for External Cloud Exposures via SSL Certs
 
"Subclassing and Composition – A Pythonic Tour of Trade-Offs", Hynek Schlawack
"Subclassing and Composition – A Pythonic Tour of Trade-Offs", Hynek Schlawack"Subclassing and Composition – A Pythonic Tour of Trade-Offs", Hynek Schlawack
"Subclassing and Composition – A Pythonic Tour of Trade-Offs", Hynek Schlawack
 
Are Multi-Cloud and Serverless Good or Bad?
Are Multi-Cloud and Serverless Good or Bad?Are Multi-Cloud and Serverless Good or Bad?
Are Multi-Cloud and Serverless Good or Bad?
 
Connect Wave/ connectwave Pitch Deck Presentation
Connect Wave/ connectwave Pitch Deck PresentationConnect Wave/ connectwave Pitch Deck Presentation
Connect Wave/ connectwave Pitch Deck Presentation
 
Search Engine Optimization SEO PDF for 2024.pdf
Search Engine Optimization SEO PDF for 2024.pdfSearch Engine Optimization SEO PDF for 2024.pdf
Search Engine Optimization SEO PDF for 2024.pdf
 
Kotlin Multiplatform & Compose Multiplatform - Starter kit for pragmatics
Kotlin Multiplatform & Compose Multiplatform - Starter kit for pragmaticsKotlin Multiplatform & Compose Multiplatform - Starter kit for pragmatics
Kotlin Multiplatform & Compose Multiplatform - Starter kit for pragmatics
 
Integration and Automation in Practice: CI/CD in Mule Integration and Automat...
Integration and Automation in Practice: CI/CD in Mule Integration and Automat...Integration and Automation in Practice: CI/CD in Mule Integration and Automat...
Integration and Automation in Practice: CI/CD in Mule Integration and Automat...
 
What's New in Teams Calling, Meetings and Devices March 2024
What's New in Teams Calling, Meetings and Devices March 2024What's New in Teams Calling, Meetings and Devices March 2024
What's New in Teams Calling, Meetings and Devices March 2024
 
Transcript: New from BookNet Canada for 2024: BNC CataList - Tech Forum 2024
Transcript: New from BookNet Canada for 2024: BNC CataList - Tech Forum 2024Transcript: New from BookNet Canada for 2024: BNC CataList - Tech Forum 2024
Transcript: New from BookNet Canada for 2024: BNC CataList - Tech Forum 2024
 
Beyond Boundaries: Leveraging No-Code Solutions for Industry Innovation
Beyond Boundaries: Leveraging No-Code Solutions for Industry InnovationBeyond Boundaries: Leveraging No-Code Solutions for Industry Innovation
Beyond Boundaries: Leveraging No-Code Solutions for Industry Innovation
 
Streamlining Python Development: A Guide to a Modern Project Setup
Streamlining Python Development: A Guide to a Modern Project SetupStreamlining Python Development: A Guide to a Modern Project Setup
Streamlining Python Development: A Guide to a Modern Project Setup
 
DMCC Future of Trade Web3 - Special Edition
DMCC Future of Trade Web3 - Special EditionDMCC Future of Trade Web3 - Special Edition
DMCC Future of Trade Web3 - Special Edition
 
Powerpoint exploring the locations used in television show Time Clash
Powerpoint exploring the locations used in television show Time ClashPowerpoint exploring the locations used in television show Time Clash
Powerpoint exploring the locations used in television show Time Clash
 
Gen AI in Business - Global Trends Report 2024.pdf
Gen AI in Business - Global Trends Report 2024.pdfGen AI in Business - Global Trends Report 2024.pdf
Gen AI in Business - Global Trends Report 2024.pdf
 
Advanced Test Driven-Development @ php[tek] 2024
Advanced Test Driven-Development @ php[tek] 2024Advanced Test Driven-Development @ php[tek] 2024
Advanced Test Driven-Development @ php[tek] 2024
 

Introduction to emi hf feb_16_10am

  • 1. Introduction to EMI/EMC Challenges and Their Solution Dr. Hany Fahmy HSD Application Expert Agilent Technologies Davy Pissort, K.U. Leuven Charles Jackson, Nvidia Charlie Shu, Nvidia Chen Wang, Nvidia Amolak Badesha, Avago Copyright © 2012 Agilent Technologies
  • 2. Current Solution Put on a bandaid to stop the Bleeding (radiation..) •Not optimal •Does not always work •Costly Copper band-aid R4N Suppressor band-aid Copyright © 2012 Agilent Technologies
  • 3. Complexity of EMI problem I/Os can inject Common-mode Noise Or Power-pins inject Noise into PDN Badly routed traces generate EMI High-speed connectors and cables amplify the EMI problems MINIMIZE I C, PKG , AND P C B E M I TO REDUCE OVERALL S YSTEM E M I Connectors High-speed PCB High-speed IC * From EM-Scan Measurement of GPU Board Copyright © 2012 Agilent Technologies
  • 4. Mechanism of Noise Propagation (2) Radiation Noise Noise Source Noise Source (1) Conductive Noise Equipment or device exposed to noise (3) Conductive Noise Conductive Noise Noise Source Equipment or device exposed to noise Equipment or device exposed to noise Copyright © 2012 Agilent Technologies
  • 5. Different types of Emission Trace-Emission I/O-Buffers Injecting Signal Power-Pins Injecting Noise GND Return-currents & Slots Common-Mode noise travelling Copyright through Connectors© 2012 Agilent Technologies
  • 6. Introducing the concept of “Virtual-EMI Lab” O PTIMIZE FOR E M I DEVELOP EMI G UIDELINES VAL I D AT I O N W I T H M EASUREMENTS *Full-wave EM Simulation, What-if Analysis, Root-cause debugging **Measurements to Isolate the problem and Correlate with Simulation Copyright © 2012 Agilent Technologies
  • 7. Radiated-emission on packages due to return-path-discontinuity Copyright © 2012 Agilent Technologies
  • 8. DDR3 Package Modeling using MOM DC to 20GHz Data- (DQ-) nets major referencing to GND Copyright © 2012 Agilent Technologies
  • 9. Routing of DQ signals from Die-Bumps-Top to Layer-3 running as Symmetric-SL sandwiched between GND on Layers 2 & 4 DQ signals on Layer-3 as Symmetric-SL DQ signals @ Die-Bumps Copyright © 2012 Agilent Technologies
  • 10. Moving from Layer-3 to Layer-6 through SignalPTH to pickup the Balls DQ signals on Layer-6 routed between GND on layers 5 DQ signals on Layer-3 Copyright © 2012 Agilent Technologies
  • 11. Impact of GND-PTH stitching: Proximity & # Original-Package: Cost-Reduced-Package: With 15-GND-PTH with 3-GND-PTH Copyright © 2012 Agilent Technologies
  • 12. Comparison of Return-current on GND-L4 Original-Package: Cost-Reduced-Package: With 15-GND-PTH With 3-GND-PTH Larger NEXT by 10dB Copyright © 2012 Agilent Technologies
  • 13. Comparison of eye-diagram @ 1.33GBps Original-Package: Cost-Reduced-Package: With 15-GND-PTH With 3-GND-PTH DQ 40ps loss of margin +95ps worst Setup-Margin DQS DQ +55ps worst Setup-Margin DQS Copyright © 2012 Agilent Technologies
  • 14. Do Dispersion of GND-Current leads to MoreRadiated Emission? (Movie) Copyright © 2012 Agilent Technologies
  • 15. PKG-Antenna-Parameters Comparison of 15-GND-PTH compared to 3-GND-PTH Antenna-Gain -19dB  -11dB (+8dB) Radiated-Power 40-uWatts  220-uWatts (6x) Maximum Intensity: 5u-watts/Steradian  40uwatts/Steradian (8X) Angle of U-max: 160-degrees vs. 140-degrees Copyright © 2012 Agilent Technologies
  • 16. Trade-off Low-cost & Performance Reducing # of GND-Stitches  Medium-2-low-risk for 1.33GB/s operation with +55ps worst-case Setup-margin but with +8dB Antenna-Gain Most probably we need to Turn-ON Spread spectrum. What is the cost of PLL vs. Reduction of GND-Stitch? Copyright © 2012 Agilent Technologies
  • 17. Trace Emission on PCBs due to costreduction Low-Layer count PCB CASE:1 Memory emission from MA/CMD lanes Copyright © 2012 Agilent Technologies
  • 18. 4-layer PCB with Memory Emission Problem Problem: Investigate Emission problem at 1.25 times the memory clock frequency (1.623 GHz) Notes: Address/Command Nets are routed on bottom-layer Referencing power plane (due to lack of real-estate) Copyright © 2012 Agilent Technologies
  • 19. EMI Simulation Methodology Step-1: Simulate and Visualize Current-density plot* Method-of-Moments (Momentum) Simulations showing current-density plots and hot-spot regions on the PCB Emscan Measurements *Using Agilent Momentum Field Solver Copyright © 2012 Agilent Technologies
  • 20. EMI Simulation Methodology, Cont’ Step-2: Isolate Problem Observe hot-spot area closely, and identify root-cause Root-cause: There is small λ/8 power-plane patch that is radiating like patch-antenna Use the Momentum-uwave EM-engine with Antenna-Gain parameter to measure the merit of the PCB as non-intended antenna Develop EMI guidelines along with SI/PI Guidelines using Antenna-Gain Parameter to compare Layout guidelines Copyright © 2012 Agilent Technologies
  • 21. What is the remedy? Instead of REF MA/CMD to a VddQ Patch on Bottom layer continue routing on Bottom Layer 3m Chamber at least 16dB Improvement Copyright © 2012 Agilent Technologies
  • 22. Trace Emission on PCBs due to costreduction Low-Layer count PCB CASE:2 TMDS Emissions Copyright © 2012 Agilent Technologies
  • 23. Problem Statement TMDS Emission @ 770MHz on 4-layer PCB & Coupling to Neighbor Ethernet-Card Copyright © 2012 Agilent Technologies
  • 24. Which one is better Copper band-aid R4N Suppressor band-aid Copyright © 2012 Agilent Technologies
  • 25. Copyright © 2012 Agilent Technologies
  • 26. Copyright © 2012 Agilent Technologies
  • 27. Is it E-coupling or H-coupling? With Metallic Shield *Lab data confirms simulation results Solution: Simulation shows that suppression material is improving EMI emission, whereas, metallic shied is making it worse Choose Suppression material over metallic shied -> Improve both cost and performance  Copyright © 2012 Agilent Technologies
  • 29. Copyright © 2012 Agilent Technologies
  • 30. Copyright © 2012 Agilent Technologies
  • 31. What is the Remedy? Sometimes it is cheaper to dampen the receiver not Emitter because adding R4N suppression materials is more cost than using RJ45 shielded connector on the Ethernet-card. Selected to change RJ45 Connector on Ethernet-card to shielded one to suppress the receiver Copyright © 2012 Agilent Technologies
  • 32. PCB Edge Emission due to Power delivery Noise Copyright © 2012 Agilent Technologies
  • 33. Simulation Challenges in EMI •System level (source, coupling path, unintentional antenna •Full wave simulation is often needed •Time and memory consuming Copyright © 2012 Agilent Technologies
  • 34. Combining Measured Icc(t) with FDTD simulations to study the critical on-board-decaps under the GPU Power Delivery Network Current Probe @ VddQ pins Drivers Channel Receivers •SSO current is obtained by a combined simulation of the power delivery network model and the memory IO channel model Copyright © 2012 Agilent Technologies
  • 35. Measured Dynamic-current profile Icc(t) fft ifft steady-state frequencies •Time-domain noise pattern directly imported into FDTD solver Copyright © 2012 Agilent Technologies
  • 36. Importing PCB layout of the Memory Channel Stackup 8 cm Signal Ground Signal VDD Ground VDD 11 cm board thickness: 1.57mm Copyright © 2012 Agilent Technologies
  • 37. SSO Noise Source on Top Layer Noise sources IC Copyright © 2012 Agilent Technologies
  • 38. Decaps on Bottom Layer decaps Copyright © 2012 Agilent Technologies
  • 39. Far-Field Radiation at 0.5 GHz With Decaps at 1.0 GHz Without Decaps With Decaps Without Decaps Reduction of 3-4 dB Copyright © 2012 Agilent Technologies
  • 40. Current Density At 0.5 GHz Without Decaps At 0.5 GHz With Decaps Copyright © 2012 Agilent Technologies
  • 41. What is the benefit of PCB decaps? New method to optimize the PCB decaps: 1. Measure or simulate the Dynamic-current profile Icc(t) @ the VddQ-pins with maximum activity on the memory-channel 2. Import the Icc(t) into FDTD (wide-band-phenomena) 3. Study the critical PCB decaps to mitigate the SSO noise emission Copyright © 2012 Agilent Technologies
  • 43. Board +Connector +Mate Copyright © 2012 Agilent Technologies
  • 44. Combining CAD and Board Files Precise landing of connector fingers on board signal pad Copyright © 2012 Agilent Technologies
  • 45. Near-Field Radiation: Do we need Shielded Connector? ($0.15 more cost) Do we need copper-tape under connector? •Simulated with FDTD-solver (Agilent EMPro) •Accelerated on GPU system •Simulation time ≈ ½ day with 1-GPU card and 2-hrs with 3-GPU cards Study if improved grounding & shielding of the connector improves EMI behavior Copyright © 2012 Agilent Technologies
  • 46. Improved Grounding of the Connector: What is the impact of a copper-tape under the connector No copper tape Extra copper tape Copyright © 2012 Agilent Technologies
  • 47. Improved Grounding: Far-field impact of CU-tape Reduction of 5 dB for EMI emission In direction of chassis Copyright © 2012 Agilent Technologies
  • 48. Conclusion •“Virtual-EMI” Lab is a MUST for Speed-of-Light Product-to-Market •Radiated/Conducted-Emission: •Packages Return-Path-Discontinuity driving the need to turn-ON SS ORDER A TRIAL VERSION FOR ADS http://www.agilent.com/find/ee sof-ads-si-evaluation • PCBs due to Cost-Reduction 4L-PCBs” – MA/CMD Emission by referencing to VddQ – TMDS Emission due to routing on Bottom layer • SSO Noise Emission by VddQ Current-Profile on PCB Decaps are very effective • Emission of Connector+Cables from HDMI common-mode noise Copyright © 2012 Agilent Technologies