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Backscattering Spectrometry The University of Tennessee, Knoxville         Younes Sina
Rutherford scattering is also sometimes referred to as Coulomb scatteringbecause it relies only upon static electric (Coulomb) forces, and the minimal distance between particles is set only by this potential.  Elastic Backscattering Spectrometry (EBS)                      (non-Rutherford) is used when the incident particle is going so fast that it exceeds the “Coulomb barrier" of the target nucleus, which therefore cannot be treated by Rutherford’s  approximation of a point charge. In this case Schrödinger's equation should be solved to obtain the scattering cross-section.
Chemical identification of the target elements using the kinematic factor. E0 = 2.0 MeV He E1 = 1830 keV 	K = 0.9150 	M2 = 181amu 	Tantalum This is a spectrum of 2.0 MeV alpha particles incident on a thin film of “unknown composition” scattered at 170o.
Scattering Geometry
Mass Resolution
Rutherford Cross Section Unit:   barn/ sr 1 b(barn)=10-24 cm2
Before After Before After
Non-Rutherford cross section L’Ecuyer Eq. for Low energy ion   ECM≈Elab Center-of-mass kinetic energy (keV) Wenzel and Whaling for light ion with MeV energy
Energy
E’
Depth scale Energy loss factor Stopping cross section factor
Examples
Effects of energy loss of ions in solids Atomic density Stopping cross section stopping power  For a compound of AmBn: εAB =mεA+nεB Atomic density Molecular density
Calculate the stopping cross section and stopping power of  2 MeV 4He+ in Al2O3 using Bragg rule Example: εAl= 44x10-15 eVcm2 εO= 35x10-15 eVcm2 From appendix 3: For a compound of AmBn: εAB =mεA+nεB εAl2O3=(2x44+3x35)x10-15 =193x10-15eVcm2
Example:
Depth scale Energy loss factor Stopping cross section factor
Depth resolution Calculate the depth- scattered ion energy differences for 2 MeV 4He+ in Al2O3 θ1=0°and θ2=10° K factor for 4He on Al=0.5525 K factor for 4He on O=0.3625 Example ε at E0,surface Using the surface-energy approximation εAB =mεA+nεB ε at E1
Example We can now calculate the stopping cross section factors Using the molecular density  N Al2O3=2.35x1022 molecules/cm3we find:
Surface spectrum height Energy width per channel stopping cross section factors Surface height of the two elemental peaks in the compound AmBn are given by
Mean energy in thin films Surface Energy Approximation Mean energy of the ions in the film ,Ē(1) E0 E2 E1
Mean energy in thin films For the second iteration, the values of (Nt)i(1) should  be calculated using                                            with         E= Ē(1) then ∆Ei(1) and Ē(2) E0 E2 E1
Example Calculate surface height for 2 MeV 4He+ on Al2O3: Ω=10-3sr E=1keV/channel Q=6.24x1013 incident particles (10μC charge) θ1=0°, θ2=10° (scattering angle=170°) From appendix 6: σRAl=0.2128x10-24  &  σRO=0.0741x10-24  From previous example:
For not too thick film E=Ē(f) E0 E2 E1
Sample analysis Typical experimental operating conditions and parameter ranges used during acquisition of backscattering spectra
Thin-film analysis The peak integration method Integrated peak counts That can be accurately determined from the spectrum Correction factor Dead time ratio Integrated charge deposited on the sample during the run Non Rutherford correction factor solid angle subtended by the detector at the target
Example  an application of the peak integration method of analysis of the two-element thin film E0=3776 keV θ=170˚ θ1=0˚ θ2=10˚ Ω=0.78 msr CBi=(0.99±0.03) E=(3.742±0.005)keV/channel É=(8±3) keV KFe=(170˚)=0.7520 KGd=(170˚)=0.90390 E1= nE+ É Energy intercept
Example  From appendix 6  From Center-of-mass energy
Example  From Trim 1985:
Example  Integrated counts in spectral regions of interest (initial and final channel numbers are listed: Channels (789-918)=103978 cts; (920-960)=49 cts Channels (640-767)=64957 cts; (768-788)=79 cts
Example  From:  E1= nE+ É  and   Ki=Ei1/E0   :   Energy intercept Therefore, element A and B are Gd and Fe, respectively. Note that element A could also be Tb, because KTb=0.9048
Example  Calculation of elemental areal densities,(Nt) Values of Ai are calculated from the integrated counts in the regions of interests In this case, the background correction is almost negligible
Example  The areal densities in the surface-energy approximation,(Nt)SEAi using  E=E0 1 0.998 DTR CBi Ai e Q’ Ω σ
Example  The mean  energy of the 4He ion in the film, Ē(1), is calculated (to first order) using the following equation  For the first-order energy loss, ΔESEAin  ,of the ions in the film:
Example  From the following Eq. we can calculate the areal densities:
Results of an additional iteration of this procedure using the following equations we have: (Note that Feand Gdare evaluated at Ē(1)) Example
Example  The average stoichiometric ratio for this film using the following Eq.:
Example  If the molecular formula for the film is written as GdmFen , then: m=0.209±0.001 and n=0.791±0.001 n+m=1
The value of the physical film thickness: Example  Elemental bulk density
Areal density Integrated peak count Areal density, Nt, as atoms per unit area  Cross section Incident ions Detector solid angle
The average stoichiometric ratio for the compound film AmBn Cross section ratio Ratio of measured integrated peak count
Physical film thickness
My hometown Mahabad, Iran

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RBS

  • 1. Backscattering Spectrometry The University of Tennessee, Knoxville Younes Sina
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  • 6. Rutherford scattering is also sometimes referred to as Coulomb scatteringbecause it relies only upon static electric (Coulomb) forces, and the minimal distance between particles is set only by this potential. Elastic Backscattering Spectrometry (EBS) (non-Rutherford) is used when the incident particle is going so fast that it exceeds the “Coulomb barrier" of the target nucleus, which therefore cannot be treated by Rutherford’s approximation of a point charge. In this case Schrödinger's equation should be solved to obtain the scattering cross-section.
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  • 12. Chemical identification of the target elements using the kinematic factor. E0 = 2.0 MeV He E1 = 1830 keV K = 0.9150 M2 = 181amu Tantalum This is a spectrum of 2.0 MeV alpha particles incident on a thin film of “unknown composition” scattered at 170o.
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  • 22. Rutherford Cross Section Unit: barn/ sr 1 b(barn)=10-24 cm2
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  • 26. Non-Rutherford cross section L’Ecuyer Eq. for Low energy ion ECM≈Elab Center-of-mass kinetic energy (keV) Wenzel and Whaling for light ion with MeV energy
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  • 37. E’
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  • 39. Depth scale Energy loss factor Stopping cross section factor
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  • 42. Effects of energy loss of ions in solids Atomic density Stopping cross section stopping power For a compound of AmBn: εAB =mεA+nεB Atomic density Molecular density
  • 43. Calculate the stopping cross section and stopping power of 2 MeV 4He+ in Al2O3 using Bragg rule Example: εAl= 44x10-15 eVcm2 εO= 35x10-15 eVcm2 From appendix 3: For a compound of AmBn: εAB =mεA+nεB εAl2O3=(2x44+3x35)x10-15 =193x10-15eVcm2
  • 45. Depth scale Energy loss factor Stopping cross section factor
  • 46. Depth resolution Calculate the depth- scattered ion energy differences for 2 MeV 4He+ in Al2O3 θ1=0°and θ2=10° K factor for 4He on Al=0.5525 K factor for 4He on O=0.3625 Example ε at E0,surface Using the surface-energy approximation εAB =mεA+nεB ε at E1
  • 47. Example We can now calculate the stopping cross section factors Using the molecular density N Al2O3=2.35x1022 molecules/cm3we find:
  • 48. Surface spectrum height Energy width per channel stopping cross section factors Surface height of the two elemental peaks in the compound AmBn are given by
  • 49. Mean energy in thin films Surface Energy Approximation Mean energy of the ions in the film ,Ē(1) E0 E2 E1
  • 50. Mean energy in thin films For the second iteration, the values of (Nt)i(1) should be calculated using with E= Ē(1) then ∆Ei(1) and Ē(2) E0 E2 E1
  • 51. Example Calculate surface height for 2 MeV 4He+ on Al2O3: Ω=10-3sr E=1keV/channel Q=6.24x1013 incident particles (10μC charge) θ1=0°, θ2=10° (scattering angle=170°) From appendix 6: σRAl=0.2128x10-24 & σRO=0.0741x10-24 From previous example:
  • 52. For not too thick film E=Ē(f) E0 E2 E1
  • 53. Sample analysis Typical experimental operating conditions and parameter ranges used during acquisition of backscattering spectra
  • 54. Thin-film analysis The peak integration method Integrated peak counts That can be accurately determined from the spectrum Correction factor Dead time ratio Integrated charge deposited on the sample during the run Non Rutherford correction factor solid angle subtended by the detector at the target
  • 55. Example an application of the peak integration method of analysis of the two-element thin film E0=3776 keV θ=170˚ θ1=0˚ θ2=10˚ Ω=0.78 msr CBi=(0.99±0.03) E=(3.742±0.005)keV/channel É=(8±3) keV KFe=(170˚)=0.7520 KGd=(170˚)=0.90390 E1= nE+ É Energy intercept
  • 56. Example From appendix 6 From Center-of-mass energy
  • 57. Example From Trim 1985:
  • 58. Example Integrated counts in spectral regions of interest (initial and final channel numbers are listed: Channels (789-918)=103978 cts; (920-960)=49 cts Channels (640-767)=64957 cts; (768-788)=79 cts
  • 59. Example From: E1= nE+ É and Ki=Ei1/E0 : Energy intercept Therefore, element A and B are Gd and Fe, respectively. Note that element A could also be Tb, because KTb=0.9048
  • 60. Example Calculation of elemental areal densities,(Nt) Values of Ai are calculated from the integrated counts in the regions of interests In this case, the background correction is almost negligible
  • 61. Example The areal densities in the surface-energy approximation,(Nt)SEAi using E=E0 1 0.998 DTR CBi Ai e Q’ Ω σ
  • 62. Example The mean energy of the 4He ion in the film, Ē(1), is calculated (to first order) using the following equation For the first-order energy loss, ΔESEAin ,of the ions in the film:
  • 63. Example From the following Eq. we can calculate the areal densities:
  • 64. Results of an additional iteration of this procedure using the following equations we have: (Note that Feand Gdare evaluated at Ē(1)) Example
  • 65. Example The average stoichiometric ratio for this film using the following Eq.:
  • 66. Example If the molecular formula for the film is written as GdmFen , then: m=0.209±0.001 and n=0.791±0.001 n+m=1
  • 67. The value of the physical film thickness: Example Elemental bulk density
  • 68. Areal density Integrated peak count Areal density, Nt, as atoms per unit area Cross section Incident ions Detector solid angle
  • 69. The average stoichiometric ratio for the compound film AmBn Cross section ratio Ratio of measured integrated peak count