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Transmission Electron Microscopy (TEM) is a powerful imaging technique that uses a high-energy electron beam transmitted through an ultra-thin specimen to generate highly detailed images at the nanometer scale. Unlike light microscopes, TEM can resolve fine structural details inside cells, viruses, and materials, revealing internal morphology, crystallographic information, and even atomic arrangements. In TEM, electrons interact with the sample as they pass through, and the resulting transmitted electrons are focused by electromagnetic lenses to form an image on a screen or digital detector. This method is widely used in materials science, nanotechnology, and biology for ultrastructural analysis and characterization.




