This document summarizes several types of profile monitors used at Fermilab, including proportional wire chambers from the 1970s, segmented wire ionization chambers (SWICs) from the 1980s, and fiber profile monitors prototyped in 2007. SWICs function by ionizing gas with a charged particle beam, creating electrons that travel to a high voltage plane and produce a signal on sense wires. SEMs (secondary emission monitors) also measure induced current on wires but operate at higher vacuum using the secondary emission principle. The document provides specifications and operating principles for SWICs and SEMs, and includes examples of profile data measured by these devices.