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NanoOptoMetrics (NOM) develops optical profilometer technology for non-contact, non-destructive 3D surface measurement. NOM profilometers have two configurations - small field of view microscope-based systems from 0.5 to 10 mm, and large aperture systems from 10 to 300 mm. The large aperture systems can uniquely measure complex topography over large areas with feature heights up to 100 mm, filling a gap in the market. NOM technology offers high resolution from 0.5 μm to 300 μm, fast acquisition times from 1 to 150 seconds, and is tolerant to vibration without additional isolation. Applications include measurement of steps, roughness, films, and discontinuous surfaces across industries.
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- Minds
- Spectra
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- Garmin
- Topcon
- Horizon
- Sokkia
SERVICE / PERBAIKAN DAN KALIBRASI MACAM-MACAM ALAT UKUR
HARGA MENARIK / COMPETITIVE
Catatan : Price List akan dikirim sesuai permintaan
Mems (Detail Presentation)
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Kantor Pusat :
Tangerang Selatan
Nusaloka Sektor XIV,5
Jln. Bangka Blok N2 No 03
BSD City – Serpong
Kantor Cabang :
-Surabaya
-Makassar
-Balikpapan
- Batam
-Palembang
-Cikarang
-Semarang
-Manado
-Jakarta
-Tangerang Selatan
“BAGI ANDA YANG BERADA DI DEKAT KANTOR PUSAT MAUPUN CABANG KAMI, KAMI MELAYANI SYSTEM ANTAR JEMPUT, DAN JANGAN KHAWATIR BAGI ANDA YANG BERADA DILUAR KOTA, KAMI SIAP MELAYANI VIA EXPEDISI SESUAI DENGAN YANG ANDA INGINKAN”
Introduction of SG-A CMOS Image Sensor Tester
Introduction of SG-A CMOS Image Sensor Tester
Original link：https://enlitechnology.com/home/products/image-sensor/sg-a/
*About Enlitech
Enlitech was founded in March 2009.
The core technologies include artificial light source and spectrum analyzing technique.Enlitech’s four main product markets include image sensor testing solutions, advanced photoelectric detector testing systems, quantum efficiency test solutions, and various light simulators.
Our popular products are QER and SS-X solar simulator. If you are interested, please visit the official website to understand more!
https://enlitechnology.com/
แค๊ตตาล็อก หัวโพรบ Renishaw omp400
หัว Probe ที่เหมาะกับงานแมชชีนขนาดกลาง OMP400
เหมาะกับงานวัดแม่พิมพ์ที่มีรูปทรงลักษณะเป็น 3D หรือ Contour
รวมไปถึงการวัดงานบนเครื่อง 5 แกน ด้วยเทคโนโลยี RENGAGE
strain gauge technology ทำให้มีค่าความแม่นยำสูงถึง 0.25 um
สนใจติดต่อ 02-3704900 / 096-6466419
แอดไลน์ @ptsc
email : marketing@ptsc.co.th
www.ptsc.co.th
2008 tech Instrumentation in Precision Metrology
This document discusses instrumentation for precision metrology, focusing on needs in the flat panel display industry. It outlines approaches for reducing metrology errors, and provides examples of using new metrology tools in industry. Specifically, it describes using enhanced atomic force microscopy and interferometry to precisely measure microstructures in light guides, brightness enhancement films, and other components at the nanometer scale needed for advances in displays.
App136 en thickness-measurement-calender
The document discusses thickness measurement on the calender during tire manufacturing. Rubber is applied to fabric by calender rolling to create a uniform layer for high quality tires. Laser-based optical sensors called optoNCDT are positioned above and below the coated fabric web to measure thickness as it exits the calender, as measurement is not possible on the rolls themselves. The sensors provide non-contact, high-precision measurement of the structured, black rubber coating and are protected from high temperatures by cooled housing.
Pon OtdRs Sun Ot7000
The SUN-OT7000 PON OTDR is a portable, lightweight instrument used to test fiber optic networks. It can measure fiber characteristics like length, loss, and splices. It identifies faults or breaks in fiber. It has a high resolution and short dead zone, making it suitable for testing short fibers. Auto measurement and analysis functions simplify testing and improve efficiency. It can test through splitters for PON networks.
Aquadopp acoustic doppler technology
Designed for a multitude of applications from coasts to rivers, the Profiler is a small, lightweight & cost-effective solution for shallow water (<100 m). Deploy it on the bottom, on a buoy or on a mooring line. Aquadopp is complete including all parts required for a self-contained deployment with internal batteries & a datalogger. Additional configurations are available.
App131 en profile-sensor-tire-measurement-test-rig
The document describes a laser profile sensor called scanCONTROL 2800 that is used to quickly and non-contact inspect tires on a test rig for bulges, indentations, and other defects. The sensor can scan tires at up to 2000 profiles per second, significantly faster than previous point sensors, allowing full tire inspections in under one second. The scanCONTROL uses a line laser and CMOS sensor to acquire multiple measurement points across the laser line, providing high resolution profiles of the entire tire surface rather than single points. This allows it to detect even small defects and differentiate patterns and logos from issues.
Gmt 102 Total Station
GMT 102 Electronic Total Station or total station is a high speed total station which makes surveying easier.
Surgical System Based on Manufacturing Tecnologies
Author: Mitsuishi, M.
Presentation for the Biomedical & Mechatronics Workshop
Forum UTokyo USP, 2013
Topcon gm 100 gm-101 gm-102 gm-103 gm-105
Rega
SALES
WA/TLP 085211828148
E. infoindosurta@yahoo.co.id
PT. Alat Ukur Indosurta bergerak di bidang penjualan, penyewaan dan service kalibrasi alat-alat survey. Kami hadir lebih luas dan lebih dekat untuk melayani kebutuhan pengukuran anda di bidang konstruksi, telekomunikasi, kehutanan, pertambangan, kelautan, dll.
Kantor Pusat :
Tangerang Selatan
Nusaloka Sektor XIV,5
Jln. Bangka Blok N2 No 03
BSD City – Serpong
Kantor Cabang :
-Surabaya
-Makassar
-Balikpapan
- Batam
-Palembang
-Cikarang
-Semarang
-Manado
-Jakarta
-Tangerang Selatan
“BAGI ANDA YANG BERADA DI DEKAT KANTOR PUSAT MAUPUN CABANG KAMI, KAMI MELAYANI SYSTEM ANTAR JEMPUT, DAN JANGAN KHAWATIR BAGI ANDA YANG BERADA DILUAR KOTA, KAMI SIAP MELAYANI VIA EXPEDISI SESUAI DENGAN YANG ANDA INGINKAN”
SLM Microscope
This is a new product of Actoprobe LLC: Scanning Laser Confocal Microscope. I designed and built the microscope to investigate the defects and laser burn patterns on the mirror and LBO crystal surfaces. The microscope can also be used for bio-imaging.
Pdf Spesifikasi Total Station Topcon GM 100 Series
The GM-100 series document provides specifications for Topcon total station models GM-101, GM-102, GM-103, and GM-105. Key features include angle and distance measurement accuracy ranging from 0.5 to 5 arc-seconds and 1 to 5mm + 2ppm, a measuring range up to 6,000m in prism mode and 1,000m in reflectorless mode, internal memory of 50,000 points and support for up to 32GB USB storage, and a battery life of up to 28 hours. The GM series is suitable for construction, surveying, and GIS applications with onboard software and a design focused on durability, long battery life, and high accuracy even in challenging
Similar to NOM_specifications (20)
App153 en thickness-measurement-black-rubber-strip-building-industry
App153 en thickness-measurement-black-rubber-strip-building-industry
Brosur Total Station Sokkia IM 100 Versi Indonesia
Brosur Total Station Sokkia IM 100 Versi Indonesia
App131 en profile-sensor-tire-measurement-test-rig
App131 en profile-sensor-tire-measurement-test-rig
Surgical System Based on Manufacturing Tecnologies
Surgical System Based on Manufacturing Tecnologies
Pdf Spesifikasi Total Station Topcon GM 100 Series
Pdf Spesifikasi Total Station Topcon GM 100 Series
NOM_specifications
- 1. SIA “NanoOptoMetrics” Registration no.: 50103739091 VAT no.: LV50103739091 Legal address: Katoļu iela 35-1, Riga, LV-1003, Latvia 1 Nanooptometrics (NOM) optical profilometer technology SPECIFICATIONS System Measuring Principle Optical Imaging Profilometry (2D, 3D, non-contact, non-destructive) Measurement technique Broad-band (white light) interferometry Measurement modes Scanning /Phase-Shifting Maximum Aperture Size 100mm (4”) available 200mm (8”)/300mm (12”) possible Camera resolution Up to 12 Megapixels Mounting Options Horizontal and Vertical Performance Step height std. repeatability λ/1’000 Step height reproducibility λ/700 Lateral Resolution 0.5 μm – 300 μm (depends on the FOV and camera/lens resolution) Z-feature height capacity Up to 100 mm Surface Height Resolution λ/1’000 Vertical Scan Speed Up to 50 µm/sec Data acquisition & processing time 1-150 sec. (depends on camera resolution) for the phase-shifting mode 0.2-30 sec. per μm for the scanning mode Digitization 8-12 bits NOM profilometer configuration and industry-unique features NOM Profilometer Configuration Field of View(FOV) NOM Industry-Unique Capabilities Concise Statement Competitors Evaluated Small FOV (Microscope-based) 0.5 mm to 10 mm (competitors typically <15 mm) - Fizeau interferometer and plane beam illumination enable better capability to measure deep or high aspect ratio structures - Tolerant to vibration w/o vibro- isolating table NOM has industry-unique measurement capability for deep trench and high aspect ratio stuctures, and built-in vibration isolation algorithm. Bruker, Zygo, Taylor-Hobson, Nikon, Leica Large FOV (Large aperture) 10 mm to 300 mm (competitors typically 100 mm and greater) - 100 mm feature height capacity - Step height and complex topography - Discontinuous surfaces - Optical thickness of films and plates - Surface waviness measurement NOM is only company that combines large FOV with capability to measure complex and discontinuous surface topography with feature heights up to 100 mm. 4D Technology, Zygo, KLA- Tencor NOM profilometer capabilities Step Height and Complex Topography Measurement Roughness / Optical form measurement Discontinuous Surface Measurement No Sample Size / Weight Limitation Measurement of optical thicknesses of films and plates Integration into Production Line Tolerant to Vibration Distance measurement Selectivity along the line of sight
- 2. SIA “NanoOptoMetrics” Registration no.: 50103739091 VAT no.: LV50103739091 Legal address: Katoļu iela 35-1, Riga, LV-1003, Latvia 2 NOM profilometer limitations a) The limitation of maximum tilt of a measured surface appears if the measured surface is smooth i.e. it reflects the probing radiation without scattering it. The maximum tilt is in inverse proportion to lateral resolution. For example, it is 1 degree for 14 μm lateral resolution and 10 degrees for 1.4 μm lateral resolution. b) The limitation of optical thickness of measured layers: the NOM Profilometer can measure multi-layer structures (each layer can be measured independently) if optical thicknesses of these layers are not less than 10 μm. c) Reflectivity of measured surfaces from 0,1 to 100%.