1. The document discusses carrier transport mechanisms in semiconductors including drift, diffusion, and generation-recombination. It explains how mobility, resistivity, and the Einstein relationship relate these concepts.
2. Recombination and generation processes are defined as the annihilation or creation of electron-hole pairs. Various recombination mechanisms such as band-to-band, defect-assisted, and impact ionization are described.
3. Momentum considerations for different carrier transition processes like photon-assisted and phonon-assisted are discussed, noting that photons carry little momentum while phonons carry more momentum.
lecture slide on:
Gibbs free energy and Nernst Equation, Faradaic Processes and Factors Affecting Rates of Electrode Reactions, Potentials and Thermodynamics of Cells, Kinetics of Electrode Reactions, Kinetic controlled reactions,Essentials of Electrode Reactions,BUTLER-VOLMER MODEL FOR THE ONE-STEP, ONE-ELECTRON PROCESS,Current-overpotential curves for the system, Mass Transfer by Migration And Diffusion,MASS-TRANSFER-CONTROLLED REACTIONS,
Vietnam Mushroom Market Growth, Demand and Challenges of the Key Industry Pla...IMARC Group
The Vietnam mushroom market size is projected to exhibit a growth rate (CAGR) of 6.52% during 2024-2032.
More Info:- https://www.imarcgroup.com/vietnam-mushroom-market
lecture slide on:
Gibbs free energy and Nernst Equation, Faradaic Processes and Factors Affecting Rates of Electrode Reactions, Potentials and Thermodynamics of Cells, Kinetics of Electrode Reactions, Kinetic controlled reactions,Essentials of Electrode Reactions,BUTLER-VOLMER MODEL FOR THE ONE-STEP, ONE-ELECTRON PROCESS,Current-overpotential curves for the system, Mass Transfer by Migration And Diffusion,MASS-TRANSFER-CONTROLLED REACTIONS,
Vietnam Mushroom Market Growth, Demand and Challenges of the Key Industry Pla...IMARC Group
The Vietnam mushroom market size is projected to exhibit a growth rate (CAGR) of 6.52% during 2024-2032.
More Info:- https://www.imarcgroup.com/vietnam-mushroom-market
Hotel management involves overseeing all aspects of a hotel's operations to ensure smooth functioning and exceptional guest experiences. This multifaceted role includes tasks such as managing staff, handling reservations, maintaining facilities, overseeing finances, and implementing marketing strategies to attract guests. Effective hotel management requires strong leadership, communication, organizational, and problem-solving skills to navigate the complexities of the hospitality industry and ensure guest satisfaction while maximizing profitability.
Food Processing and Preservation Presentation.pptxdengejnr13
The presentation covers key areas on food processing and preservation highlighting the traditional methods and the current, modern methods applicable worldwide for both small and large scale.
1. Chapter 3. Carrier Action
Carrier Action
Sung June Kim
kimsj@snu.ac.kr
http://nanobio.snu.ac.kr
Chapter 3.
1
2. Chapter 3. Carrier Action
Subject
1. What relation do mobility of electron and resistivity have?
2. Contribution of diffusion of excess carrier in current
3. Carrier injection and carrier action
1. direct gap semiconductor and indirect semiconductor
2. recombination lifetime
3. quasi-Fermi level
4. How does current change while considering diffusion and
recombination ?
2
3. Chapter 3. Carrier Action
Contents
Drift
Diffusion
Generation-Recombination
Equations of State
3
4. Chapter 3. Carrier Action
4
Drift
• Definition-Visualization
Charged-particle motion in response to electric field
An electric field tends to accelerate the +q charged holes in the
direction of the electric field and the –q charged electrons in the
opposite direction
Collisions with impurity atoms and thermally agitated lattice atoms
Repeated periods of acceleration and subsequent decelerating
collisions
Measurable quantities are macroscopic observables that reflect the
average or overall motion of the carriers
The drifting motion is actually superimposed upon the always-
present thermal motion.
The thermal motion of the carriers is completely random and
therefore averages out to zero, does not contribute to current
5. Chapter 3. Carrier Action
5
• Drift Current
I (current) = the charge per unit time crossing a plane oriented
normal to the direction of flow
(a) Motion of carriers within a biased semiconductor bar; (b) drifting hole
on a microscopic or atomic scale; (c) carrier drift on a macroscopic scale
Thermal motion of carrier
6. Chapter 3. Carrier Action
6
Expanded view of a biased p-type
semiconductor bar of cross-sectional
area A
....... All holes this distance back from the normal plane will
cross the plane in a time
....... All holes in this volume will cross the plane in a time
d d
d
d
v t v
t
v tA t
pv tA
....... Holes crossing the plane in a time
..... Charge crossing the plane in a time
...... Charge crossing the plane per unit time
d
d
t
qpv tA t
qpv A t
7. Chapter 3. Carrier Action
7
P drift d hole drift current
I qpv A
P drift d
qpv
J
The vd is proportional to E at low electric fields, while at high electric
fields vd saturates and becomes independent of E
8. Chapter 3. Carrier Action
8
0
sat
. . . 0
0
d . . .
1/
0
sat
1
v
v
v
E E
E
E
E
where for holes and for electrons, is the constant of
proportionality between vd and E at low to moderate electric fields, and
is the limiting or saturation velocity
sat
v
In the low field limit d 0
v
E
P drift p
q p
J E
N drift n
q n
J E |
, ,
d n N drift d
q v E qnv
J
1
2
0
9. Chapter 3. Carrier Action
9
• Mobility
Mobility is very important parameter in characterizing transport due
to drift
Unit: cm2/Vs
Varies inversely with the amount of scattering
(i) Lattice scattering
(ii) Ionized impurity scattering
Displacement of atoms leads to lattice scattering
The internal field associated with the stationary array of atoms is
already taken into account in
, where is the mean free time and is the
conductivity effective mass
The number of collisions decreases varies inversely with
the amount of scattering
*
/
q m
*
m
*
m
10. Chapter 3. Carrier Action
10
Room temperature carrier mobilities as a function of the dopant
concentration in Si
11. Chapter 3. Carrier Action
11
Temperature dependence
Low doping limit: Decreasing temperature causes an ever-
decreasing thermal agitation of the atoms, which decreases the
lattice scattering
Higher doping: Ionized impurities become more effective in
deflecting the charged carriers as the temperature and hence the
speed of the carriers decreases
12. Chapter 3. Carrier Action
12
Temperature dependence of electron mobility in Si for dopings ranging
from < 1014 cm-3 to 1018 cm-3.
13. Chapter 3. Carrier Action
13
• Resistivity
Resistivity () is defined as the proportionality constant between
the electric field and the total current per unit area
J
E
1
J E E =1/: conductivity
drift N drift P drift n p
( )
q n p
J J J E
n p
1
( )
q n p
n D
1
... type semiconductor
n
q N
p A
1
... type semiconductor
p
q N
14. Chapter 3. Carrier Action
14
Resistivity versus
impurity
concentration at
300 K in Si
15. Chapter 3. Carrier Action
15
• Band Bending
When exists the band
energies become a function of
position
If an energy of precisely EG is
added to break an atom-atom bond,
the created electron and hole
energies would be Ec and Ev,
respectively, and the created carriers
would be effectively motionless
motionless
16. Chapter 3. Carrier Action
16
E-Ec= K.E. of the electrons
Ev-E= K.E. of the holes
The potential energy of a –q charged
particle is
P.E. qV
c ref
P.E. E E
c ref
P.E. E E
c ref
1
( )
V E E
q
dV
dx
E
17. Chapter 3. Carrier Action
17
By definition,
V
E
dV
dx
E
c v i
1 1 1
dE dE dE
q dx q dx q dx
E
In one dimension,
18. Chapter 3. Carrier Action
18
Diffusion
• Definition-Visualization
Diffusion is a process whereby
particles tend to spread out or redistribute
as a result of their random thermal motion,
migrating on a macroscopic scale from
regions of high concentration into region
of low concentration
19. Chapter 3. Carrier Action
19
• Diffusion and Total Currents
Diffusion Currents: The greater the concentration gradient, the
larger the flux
Using Fick’s law,
]
/
[# 2
s
cm
D
F
Diffusion constant
20. Chapter 3. Carrier Action
20
P diff P
N diff N
qD p
qD n
J
J
Total currents
P P drift P diff p P
N N drift N diff n N
drift diffusion
q p qD p
q n qD n
J J J
J J J
E
E
Total particle currents
N P
J J J
s
cm
D /
]
[ 2
+
21. Chapter 3. Carrier Action
21
• Relating Diffusion coefficients/Mobilities
Einstein relationship
Consider a nonuniformly doped semiconductor under equilibrium
Constancy of the Fermi Level: nonuniformly doped n-type
semiconductor as an example / / / 0
F F F
dE dx dE dy dE dz
= 0
22. Chapter 3. Carrier Action
22
To prove that (Under equilibrium, the EF should be continuous.)
Under thermal equilibrium, there are no charge movements between
two materials,
Also, the rate of electron movement from material 2 to material 1 is in
proportion to
Under equilibrium condition, these terms are equal. So,
f1(E) = f2(E) and EF1 = EF2
That is, dEF /dx = 0.
The rate of electron movement from material 1 to material 2 is in
proportion to
Fig. Junction of two materials in equilibrium
state. Actually, there is no electron movement,
Fermi level should be constant hrough the
entire material.
23. Chapter 3. Carrier Action
23
Under equilibrium conditions
N P N P
0 0
J J J J = J
p P
n N
for nonuniform doping
0 and
or for uniform doping
0
q p qD p
q n qD n
p n
E
E
E
Einstein relationship:
Nondegenerate, nonuniformly doped semiconductor,Under
equilibrium conditions, and focusing on the electrons,
N drift N diff n N 0
dn
J J q n qD
dx
E
i
1 dE
q dx
E F i
( )/
i
E E kT
n n e
&
= -
Electron diffusion current flowing in the +x direction “Built-in”
electric field in the –x direction drift current in the –x
direction
24. Chapter 3. Carrier Action
24
With dEF/dx=0,
F i
( )/
i i
E E kT
n dE
dn q
e n
dx kT dx kT
E
Substituting
n N
( ) ( ) 0
q
qn qn D
kT
E E
N
n
Einstein relationship for electrons
D kT
q
P
p
Einstein relationship for holes
D kT
q
Einstein relationship is valid even under nonequilibrium
Slightly modified forms result for degenerate materials
25. Chapter 3. Carrier Action
25
Recombination-Generation
• Definition-Visualization
When a semiconductor is perturbed an excess or deficit in the
carrier concentrations Recombination-generation
Recombination: a process whereby electrons and holes (carriers)
are annihilated or destroyed
Generation: a process whereby electrons and holes are created
• Band-to-Band Recombination
The direct annihilation of an electron and a hole the production of
a photon (light)
26. Chapter 3. Carrier Action
26
• R-G Center Recombination
R-G centers are lattice defects or impurity atoms (Au)
The most important property of the R-G centers is the introduction
of allowed electronic levels near the center of the band gap (ET)
Two-step process
R-G center recombination (or indirect recombination) typically
releases thermal energy (heat) or, equivalently, produces lattice
vibration
27. Chapter 3. Carrier Action
27
Near-midgap energy levels
introduced by some common
impurities in Si
28. Chapter 3. Carrier Action
28
• Generation Processes
thermal energy > EG direct thermal generation
light with an energy > EG photogeneration
The thermally assisted generation of carriers with R-G centers
29. Chapter 3. Carrier Action
29
Impact ionization
e-h is produced as a results of energy released when a highly
energetic carrier collide with the lattice
High -field regions
30. Chapter 3. Carrier Action
30
• Momentum Considerations
One need be concerned only with the dorminat process
Crystal momentum in addition to energy must be conserved.
The momentum of an electron in an energy band can assume only
certain quantized values.
where k is a parameter proportional to the electron momentum
32. Chapter 3. Carrier Action
32
Photons, being massless entities,
carry very little momentum, and a
photon-assisted transition is
essentially vertical on the E-k plot
The thermal energy associated with lattice
vibrations (phonons) is very small (in the 10-
50 meV range), whereas the phonon
momentum is comparatively large. A phonon-
assisted transition is essentially horizontal on
the E-k plot. The emission of a photon must
be accompanied by the emission or
absorption of a phonon.
Photons: light
Phonons: lattice vibration quanta
33. Chapter 3. Carrier Action
33
• R-G Statistics
It is the time rate of change in the carrier concentrations (n/t, p
t) that must be specified
B-to-B recombination is totally negligible compared to R-G center
recombination in Si
Even in direct materials, the R-G center mechanism is often the
dominant process.
34. Chapter 3. Carrier Action
34
• Indirect Thermal Recombination-Generation
n0, p0 …. carrier concentrations when equilibrium conditions
prevail
n, p ……. carrier concentrations under arbitrary conditions
n=n-n0 … deviations in the carrier concentrations from their
equilibrium values
p=p-p0 …
NT ………. number of R-G centers/cm3
material
type
p
a
in
p
p
p
n
material
type
n
an
in
n
n
n
p
implies
injection
level
low
0
0
0
0
,
,
35. Chapter 3. Carrier Action
35
A specific example of ND=1014 cm-3 Si subject to a perturbation
where n= p=109 cm-3
Although the majority carrier concentration remains essentially
unperturbed under low-level injection, the minority carrier
concentration can increase by many orders of magnitude.
excess
carrier
p
p
p
p
cm
N
n
p
n
n
n
n
cm
N
n
D
i
D
0
3
6
2
0
0
0
3
14
0
10
/
10
36. Chapter 3. Carrier Action
36
p T
R
p
c N p
t
The greater the number of filled R-G centers, the greater the
probability of a hole annihilating transition and the faster the rate of
recombination
Under equilibrium, essentially all of the R-G centers are filled with
electrons because EF>>ET
With , electrons always vastly outnumber holes and
rapidly fill R-G levels that become vacant # of filled centers during
the relaxation NT
The number of hole-annihilating transitions should increase almost
linearly with the number of holes
Introducing a proportionality constant, cp,
0
n
p
T
R
N
t
p
37. Chapter 3. Carrier Action
37
Generateion rate: p/t|G depends only on # of empty R-G centers
The recombination and generation rates must precisely balance under
equilibrium conditions, or p/t|G = p/t|G-equilibrium=- p/t|R-equilibrium , so
p T 0
G
p
c N p
t
p T 0
i thermal R G
R G
( )
p p p
c N p p
t t t
p T
i thermal
R G
or for holes in an type material
p
c N p n
t
n T
i thermal
R G
for electrons in a type material
n
c N n p
t
The net rate
An analogous set of arguments yields
um
equiliburi
G
G t
p
t
p
38. Chapter 3. Carrier Action
38
cn and cp are referred to as the capture coefficients
cpNT and cnNT must have units of 1/time
p n
p T n T
1 1
c N c N
i thermal
p
R G
for holes in an type material
p p
n
t
i thermal
n
R G
for electrons in a type material
n n
p
t
These are the excess minority carrier life times.
39. Chapter 3. Carrier Action
39
Equations of State
• Continuity Equations
Carrier action – whether it be drift, diffusion, indirect or direct
thermal recombination, indirect or direct generation, or some other
type of carrier action – gives rise to a change in the carrier
concentrations with time
Let’s combine all the mechanisms
thermal other processes
drift diff
R-G (light, etc.)
thermal other processes
drift diff
R-G (light, etc.)
n n n n n
t t t t t
p p p p p
t t t t t
40. Chapter 3. Carrier Action
40
processes
other
G
R
thermal
P
processes
other
G
R
thermal
N
P
Pz
Py
Px
diff
drift
N
Nz
Ny
Nx
diff
drift
t
p
t
p
J
q
t
p
t
n
t
n
J
q
t
n
J
q
z
J
y
J
x
J
q
t
p
t
p
J
q
z
J
y
J
x
J
q
t
n
t
n
1
1
1
)
(
1
1
)
(
1
41. Chapter 3. Carrier Action
x
x
x
J
x
J
q
t
p p
p
x
x
x
n
)
(
)
(
1
t
p
x
t
x
p
x
q
q
v
p
x
J
q
1
t
x
v
42. Chapter 3. Carrier Action
42
• Minority Carrier Diffusion Equations
Simplifying assumptions:
(1) One-dimensional
(2) The analysis is limited or restricted to minority carriers
(3) .—no drift current term- so it is called Diffusion Equations.
(4) The equilibrium minority carrier concentrations are not a
function of position
(5) Low level injection
(6) Indirect thermal R-G is the dominant thermal R-G mechanism
(7) There are no “other processes”, except possibly
photogeneration
0
E
0 0 0 0
( ), ( )
n n x p p x
N
N
1 1 J
q q x
J
N n N N
n n
J q n qD qD
x x
E
43. Chapter 3. Carrier Action
43
0
n n n
0
n
n n n
x x x x
2
N N 2
1 n
D
q x
J
With low level injection,
thermal
n
R-G
n n
t
L
other
processes
n
G
t
GL=0 without illumination
44. Chapter 3. Carrier Action
44
The equilibrium electron concentration is never a function of time
0
n
n n n
t t t t
2
p p p
N L
2
n
2
n n n
P L
2
p
n n n
D G
t x
p p p
D G
t x
Minority carrier
diffusion equations
45. Chapter 3. Carrier Action
45
No concentration gradient or no diffusion current
2 2
2 2
0 0
p n
N P
n p
D D
x x
No drift current or no further simplification
0
E
No thermal R-G
0 0
p n
n p
n p
No light
L 0
G
• Simplifications and Solutions
0 0
p n
n p
t t
Steady state
46. Chapter 3. Carrier Action
is set equal to zero.
L
G
L
P
n
n
P
n
G
p
x
p
D
t
p
2
2
L
P
n
n
G
p
dt
p
d
P
t
n
n e
p
t
p
/
)
0
(
)
(
Therefore, the solution is
48. Chapter 3. Carrier Action
2
p p p
N L
2
n
2
n n n
P L
2
p
n n n
D G
t x
p p p
D G
t x
49. Chapter 3. Carrier Action
Sample Problem No.1 : A uniformly donor-doped silicon wafer
maintained at room temperature is suddenly illuminated with light at
time t=0. Assuming , , and a light-
induced creation of electrons and holes per
throughout the semiconductor, determine for .
3
15
/
10 cm
ND sec
10 6
P
17
10 sec
3
cm
)
(t
pn
0
t
Solution :
Step1 – Si, T=300K, , and
at all points inside the semiconductor.
Step2 -
with uniform doping, the
equilibrium and values are the same
everywhere throughout the semiconductor.
3
15
/
10 cm
ND sec
/
10 3
17
cm
GL
3
15
0
3
10
/
10
,
,
/
10 cm
N
n
n
N
cm
n D
i
D
i
3
5
2
0 /
10
/ cm
N
n
p D
i
50. Chapter 3. Carrier Action
Step3 – Prior to t=0, equilibrium conditions prevail and
illumination -> increase.
excess carrier number ↑ -> thermal recombination rate ↑
∴ light generation and thermal recombination rates must
balance under steady state conditions, we can even state
or
if low-level injection prevails.
Step4 –
the boundary condition
0
n
p
n
p
P
n
L t
p
G
/
)
(
P
L
n
n G
p
t
p
max
|
)
(
3
15
0
3
11
max
| /
10
/
10 cm
n
cm
G
p P
L
n
L
P
n
n
P
n
G
p
x
p
D
t
p
2
2
0
|
)
( 0
t
n t
p
51. Chapter 3. Carrier Action
is not function of position, the diffusion equation becomes an
ordinary differential equation and simplifies to
The general solution is
Applying the boundary condition yields
and
n
p
L
P
n
n
G
p
dt
p
d
P
t
P
L
n Ae
G
t
p
/
)
(
P
L
G
A
solution
)
1
(
)
( /
P
t
P
L
n e
G
t
p
52. Chapter 3. Carrier Action
Step5 – A plot of the solution equation is shown below.
Note that, starts from zero at t=0 and eventually
saturates at after a few .
)
(t
pn
P
L
G P
53. Chapter 3. Carrier Action
Epilogue – Light output from the stroboscope can be modeled to first
order by the pulse train pictured below.
54. Chapter 3. Carrier Action
)
1
(
)
( / P
t
P
L
n e
G
t
p
The upper equation approximately describes the carrier build-up
during a light pulse.
However, the stroboscope light pulses have a duration of
compared to a minority carrier lifetime of .
With , one sees only the very first portion of the Fig.
3.25 transient before the light is turned off and the semiconductor is
allowed to decay back to equilibrium.
The light-off expression derivation closely parallels the light-
on sample problem solution.
Exceptions -> at the beginning of the light-off = at the end
of the light-on.
sec
1
on
t
sec
150
P
1
/
P
on
t
)
(t
pn
n
p
n
p
55. Chapter 3. Carrier Action
55
Sample problem 2: As shown below, the x=0 end of a uniformly
doped semi-infinite bar of silicon with ND=1015 cm-3 is illuminated so
as to create pn0=1010 cm-3 excess holes at x=0. The wavelength of
the illumination is such that no light penetrates into the interior (x>0)
of the bar. Determine pn(x).
56. Chapter 3. Carrier Action
56
Solution: at x=0, pn(0)= pn0= 1010 cm-3 , and pn 0 as x
The light first creates excess carriers right at x=0
GL=0 for x>0
Diffusion and recombination
As the diffusing holes move into the bar their numbers are reduced
by recombination
Under steady state conditions it is reasonable to expect an excess
distribution of holes near x=0, with pn(x) monotonically decreasing
from pn0 at x=0 to pn0= 0 as x
Can we ignore the drift current? E 0 ? Yes
because 1>Excess hole pile-up is very small , here
2> Also the majority carriers redistribute in such a way to partly
cancel the minority carrier charge. Thus use of diffusion eq. is justified.
)
( max i
n n
p
57. Chapter 3. Carrier Action
57
The general solution
P P
/ /
n ( ) x L x L
p x Ae Be
p p p
L D
where
exp(x/Lp) as x 0
B
With x=0,
n0
A p
P
/
n n0
( ) solution
x L
p x p e
2
n n
p 2
p
0 for 0
d p p
D x
dx
n
0
x
p
n0
n 0 n 0
x x
p p p
So---Under steady state conditions with GL=0 for x > 0
58. Chapter 3. Carrier Action
58
N N n
L D
LP and LN represent the average distance minority carriers can
diffuse into a sea of majority carriers before being annihilated
The average position of the excess minority carriers inside the
semiconductor bar is
n n P
0 0
( ) ( )
x x p x dx p x dx L
Supplemental Concepts
• Diffusion Lengths
minority carrier diffusion lengths
P P p
L D
59. Chapter 3. Carrier Action
59
• Quasi-Fermi Levels
Quasi-Fermi levels are energy levels used to specify the carrier
concentrations under nonequilibrium conditions
The convenience of being able to deduce the carrier
concentrations by inspection from the energy band diagram is
extended to nonequilibrium conditions through the use of quasi-Fermi
levels by introducing FN and FP
60. Chapter 3. Carrier Action
60
Equilibrium conditions Nonequilibrium conditions
N i
i P
( )/
N i
( )/
P i
or ln
or ln
F E kT
i
i
E F kT
i
i
n
n n e F E kT
n
p
p n e F E kT
n
11 -3 11 -3 15 -3
0
10 cm , 10 cm , 10 cm
n L p
p G p p p n
3
15
0 10
cm
n
n