Oneida Research Services offers surface analysis techniques to include, Scanning Electron Microscopy (SEM), Backscattered Electron Imaging etc.

1. Why Surface Analysis is important?
Surface Analysis Techniques:
Micro Fourier Transform Infrared Spectroscopy: (FTIR) This technique is useful for identifying
functional groups of small spot size organic contaminants found on surfaces.
Scanning Auger Microanalysis:
Provides elemental information from the top atomic layers of conductor and semiconductor
surfaces. In combination with Argon milling, an elemental profile of the surface can be plotted,
determining variations in elemental compositions with depth.

2. Material Characterizations and Identification Techniques
° Scanning Electron Microscopy (SEM)
° Backscattered Electron Imaging (BSEI)
° Energy Dispersive X-ray Microanalysis
° Fourier Transform Infrared Spectroscopy (FTIR)
° X-ray Diffraction
° Ion Chromatography
° Organic Mass Spectrometry (GC/MS)
About Author:
ORS Labs offers a wide range of analytical techniques for material evaluation, process
monitoring and failure analysis. Our laboratory staff has in-depth expertise in electronic
components and modules, PCBs, metals, gases, organics and inorganics. Our scientific staff will
recommend the analytical technique that will best meet your requirements.
Address:
8282 Halsey Road
Whitesboro, NY 13492
Phone: (315) 736-5480 ext. 2202 (Deborah Delluomo)
Fax: (315) 736-9321
http://www.orslabs.com