This document summarizes several experiments measuring out-of-equilibrium transport in oxide materials. It focuses on measurements using conducting atomic force microscopy (AFM) and electrostatic force microscopy (EFM) to study the metal-insulator transition in vanadium dioxide (VO2) thin films at the nanoscale. In conducting AFM mode, current switching was observed in local I-V curves, indicating a transition between metallic and insulating states. EFM detected random telegraphic noise in VO2 at room temperature, suggesting many-body effects are involved in the transition absent Joule heating effects.