introducing a charge multiplexing technique that can branch out at a rate of 2^n , where n is the number of connecting leads. Fabricated on n-doped GaAs/AlGaAs wafer, this technique can lead to 256 outputs being controlled by 20 connectors
2. Outline
• Quantum MUX
• Double charge locking in two-way MUX
• Attempts of adding a top gate
• Polyimide
• Three-way MUX
• Split gate test
3. Quantum Multiplexer
• Path selector [1]
• Single input quantum device with
many tunable outputs
Source: Al-Taie et al, APL 102, 243102 (2013)
[1] Debashis D.2010. Basic electronics. India: Dorling Kindersley Pvt Ltd. Pg 557
4. Quantum multiplexer
• Ward et al - measurement of multiple quantum devices in a single
chip using Si/Ge QDs [2]
• Al-Taie et al – 256 split gates on a single GaAs/AlGaAs chip [3]
• Hornibrook et al – Frequency multiplexing → read spin qubits [4]
[2] D. R. Ward, D. E. Savage, M. G. Lagally, S. N. Coppersmith and M. A. Eriksson, Appl. Phys. Lett. 102, 213107 (2013)
[3] H. Al-Taie, L. W. Smith, B. Xu, P. See, J. P. Griffiths, H. E. Beere, G. A. C. Jones, D. A. Ritchie, M. J. Kelly, & C. G. Smith, APL
102, 243102 (2013)
[4] J. M. Hornibrook, J. I. Colless, A. C. Mahoney, X. G. Croot, S. Blanvillain, H. Lu,A. C. Gossard, and D. J. Reillyy,
arXiv1312.5064 (2013)
5. Advantages
• 1 cooldown , many measurements [3]
• Automated measurements → save time & £ £
• Same environment
6. Two –way charge locking MUX
- Output proliferation of 2n
- Locking occurs by pinching off quantum wires (QW)
2DEG under
Mesa/QW
Gold lead
neg. bias
High e- density No e-
7. Locking processes for a four output 2-wayMUX
Router
Mesa
Mesa
Skeleton
Device Mesa
Detection
Credits: Dr Reuben Puddy
8. Locking processes for a four output MUX
Router
Mesa
Mesa
Skeleton
Device Mesa
Detection
Polyimide insulator (Shield the 2DEG from elec. potential)
20. Findings
• Curing with gates: 275 oC +N2 (For Polyimde)
≥350oC
• Leaks if Tcure is low
Collaboration with Yousun
21. Findings
• Polyimide can be removed :
- Set gas dial to ‘1’
- High Power
- Variable ashing rates,
600nm in 4, 300s ashes
Microwave asher
Credits: Joanna Waldie
22. Brown stains (only seen
after gold deposition)
~50nm
Postulate:
Burnt residue
Possible Solution:
Low power, Progressively
short ashing times
23. Three-way MUX
Credits: Prof Charles Smith Modified by: Dr Reuben Puddy
Vpinch for leads ≠ Vpinch for
split gates
mesa
Ohmic
contact
Gold
leads
Polyimide
insulator
35. Why Vpinch differs with polarity?
• VSD (DC bias) steps up energy levels at source
• Gate bias → Barrier
• Polarity of VSD affects size of Vg – VSD energy gap
VSD
Potential /V
Vg
Ei
Ei+1
EF EF
Ej
Ej+1
Position/μm
Credits: Dr Reuben Puddy
36. Why Vpinch differs with VSD polarity?
• Larger difference in potential → higher barrier
VSD = -0.5
Potential /V
Vg = -1
EF EF
Ej
Ej+1
Position/μm
VSD = +0.5
EF
‘
negative axis
37. Conclusion
• Pinch off voltage is dependent on L of split gate and VSD
• Adding split gates enable triple addressing
• Gate contacts undergo chemical changes at high T >300 oC
• Polyimide can be (almost) removed using a microwave asher
38. References
• [1] Debashis D.2010. Basic electronics. India: Dorling Kindersley Pvt Ltd. Pg 557
• [2] D. R. Ward, D. E. Savage, M. G. Lagally, S. N. Coppersmith and M. A. Eriksson.2013. Integration
of on-chip field-effect transistor switches with dopantless Si/SiGe quantum dots for high-
throughput testing. [e-journal] Appl. Phys. Lett. 102, 213107 (2013)
• [3] H. Al-Taie, L. W. Smith, B. Xu, P. See, J. P. Griffiths, H. E. Beere, G. A. C. Jones, D. A. Ritchie, M. J.
Kelly, & C. G. Smith.2013. Cryogenic on-chip multiplexer for the study of quantum transport tin
256 split gate devices. [e-journal] APL 102, 243102 (2013)
• [4] J. M. Hornibrook, J. I. Colless, A. C. Mahoney, X. G. Croot, S. Blanvillain, H. Lu,A. C. Gossard, and
D. J. Reillyy.2013. Frequency Multiplexing for readout of Spin Qubits.[e-journal] arXiv1312.5064
(2013)
• [5] M. J. Iqbal, J. P. de. Jong, D. Reuter, A. D. Wieck and C. H. van der Wal.2013. Split-gate quantum
point contacts with tunable channel length. [e-journal] J. Appl. Phys. 113, 024507 (2013)