3. Summary
Graduate of IIT(M) and Georgia Tech with 9.5 years
industry experience at Maxim Integrated Products,
Texas Instruments and Analog Devices
Analog designer with exposure to PLL, ADC, DAC
and switching-regulator design
Good with tools, scripting (perl/unix) and
documentation
Fast learner, motivated to contribute
4. Work Experience
Jul 2009 – present : Maxim Integrated Products (Phoenix, AZ)
Oct 2005-Apr 2009 : Texas Instruments (Dallas)
- bandgap references, amplifiers, linear-regulators, switching-regulators,
oscillator
Jan 2005 – July 2005 : Analog Devices (Tucson, AZ)
- autozero opamp, current reference, low-power clock-multiplier PLL
Aug 2001 – Dec 2004 : Graduate Research Assistant at Geogia
Tech
- high-speed optoelectronic receiver (TIA + limiting amp)
July 1998 – Mar 2001 : Texas Instruments India
- PLL, pipeline ADC, DAC/SCF, r-string DAC, SAR ADC
5. Block Design Summary
Block Schematic only Working silicon Production Institution(s) Remarks
PLL 1 2 TI-I, ADI Maneatis style
Bandgap 2 1 TI-Dallas 2 precision
designs
Autozero amp 1 1 ADI, TI-Dallas
Sw-cap gain 2 1 TI-I, TI-Dallas 1 involved amp
stage design
Performance 1 TI-Dallas TIA for TS AFE
linear amp
Linear 2 2 1 TI-Dallas
regulator
1 1 TI-Dallas Reuse, no core
changes
Switching
regulator Detailed design
2 Maxim of boost; reuse
of hyst-buck
Voltage buffer 2 2 TI-Dallas
ADC 1 TI-I Recyclic
DAC 1 TI-I R-string
6. Project Detail – Dual Phase Boost
Sept. 2010 to Nov. 2011 with diversions from re-spins of
MAX8989 PA buck and MAX77693 – Maxim’s PMIC in
the Galaxy III
Target application – camera flash-LED driver. Motivation :
2 inductors carrying half the current each carry ¼ the energy
of a single inductor carrying all of the current – results in
significantly lower footprint – 70% smaller than competing
1.5A solution
Design activity influenced all blocks; Lowest minimum-
ON-time boost designed within the group and only one with
a true PWM mode; world’s smallest 2A boost solution
7. Project Detail – Touchscreen AFE
July 2008 – Jan 2009. 90 nm CMOS.
ASIC device with digital owned by customer
Joined team July 2008 to work on new device. Silicon for
current device in eval/debug
Customer – large consumer electronics co.
Initially worked on internal LDO for system oscillator. Did
preliminary design (from scratch). Later ported (in-progress)
a 65 nm design from another group
Soon began work on RX architecture, filter topology and
transimpedance amp (TIA) frontend
8. Project Detail – Touchscreen AFE
• Worked on internal (on-chip cap) LDO for system oscillator
• Designed transimpedance amp frontend for new device
• Drove RCA of LDO high-temp failure
• RCA of LDO transient issue; LDO fixes for new device
• Explained yield loss in RX-SNR test @ 100 kHz for current
device
• Drove RCA of 0.2% of units powerup fail in system
• Identified misc improvements to help area/power
• Misc tasks to support project
9. Project Detail – Touchscreen AFE
• New TIA design supported 4x original frequency
• Lower noise at same power obtained by increasing
VDSATs of active load devices and topological
modification of first stage
• VREF is divided down version of the ANA LDO
voltage. Due to nature of the LDO design, noise
depended on mismatch, and flicker noise was
significant at 100 kHz – explained the loss of yield in
the SNR test at 100 kHz
10. Project Detail – Notebook Charger
• 2Q 2008; Joined project which was significantly behind
schedule
• Took over system oscillator from another resource; found
that resistor area in the circuit could be reduced substantially
• Helped co-worker design a low-offset amp
• Handled entire verification of supervisory blocks and high-
voltage level-shifter
• Key role in top-level simulation efforts
11. Project Detail – GPS PMIC
• 2Q 2007 – 1Q 2008
• Aggressive schedule; reuse of catalog blocks; chip: pwr
mux, battery charger, resistive touchscreen controller,
buck regulators, white LED boost regulator, LDOs
• Complete ownership of buck-regulators (handled import,
verification, minor tweaks, test-plan)
• Designed thermal shutdown circuit (from scratch) and
testmux
• Eval/debug of silicon; metal fixes
• Key role in top-level simulations
12. Project Detail – GPS PMIC
Buck regulators (Vin 1.8-6.5V, Vout 0.7-3.3V, 6-bit
programmable, 2A max load, 2.2 uH, 4.7-10 uF) were voltage-
mode; efficiency ~87%; considerable digital content
First-pass silicon did not permit system oscillator to be trimmed
because clock was not mux'ed out by the digital. Shipping of
untrimmed units during sampling phase led to
undesirable/upredictable behavior in the field
Buck regulators would delay 384 clock cycles (to allow internal
bias nodes to be ready) before beginning switching activity. This
deterministic delay was used to trim the system oscillator. This
workaround permitted about 800k units to be shipped before 1P1
silicon was available
13. Project Detail – DSC PMIC
• 1Q-2Q 2007
• Cost-reduced (area efficient) version of a production
PMIC for digital still cameras
• Chip contained boost regulator, 1 buck regulator,
backlight LED boost regulator, LDOs, 2 buck-boost
regulators
• Taped out as a test-chip. Only partial silicon
evaluation
• Worked on buck-boost and top-level simulations
14. Project Detail – DSC PMIC
• About 5% of units had an issue with the buck-boost regulators. In
light-load, inductor current would randomly go negative and
Vout would drop and system would reset
• It was found that these units had the PFM-PWM transition point
set very high. At test, units would be trimmed to set this
transition to a value where the problem was not observed. Some
yield loss remained on units that could not be trimmed acceptably
• Was also found that the variation (across units) of this transition
(pre trim) was very wide
• Traced this variation to the Ios of the current-sense amp;
reduced it in the new design
15. Project Detail – Scanner AFE
• 3Q 2006 – 1Q 2007
• Aggressive schedule; process was new to the team
• Chip contained 240 MHz osc for USB2 data rate, 12 bit
ADC (2 MSPS), CDS-PGA interface to CMOS/CCD image
sensor, offset DAC, LVDS, LED driver
• System used bare die – no trim available (issues with both
EEPROM and poly fuse)
• Designed bandgap reference, reference buffer, 1.5V buffer,
pipeline ADC differential reference buffer and CDS-PGA
amp (scaled down for use as pipeline-ADC residue amp)
16. Project Detail – Scanner AFE
• Bandgap reference needed to be fully-isolated. PNP based
topology exists, but better curvature performance available
from an NPN bandgap
• Known fully-isolated NPN bandgap has non-trivial startup –
difficult to sense the NPN current – and some corners
showed oscillations during startup
• Developed new topology to meet requirements
• Designed for statistical variation (no trim)
• Bandgap noise filtered with RC filter; buffers designed for
noise; total integrated noise at ADC reference output (1 uF
caps) was 50 uV rms
17. Project Detail – Scanner AFE
• CDS-PGA amp was a two-stage design due to
required voltage swing
• Design used cascode compensation and barely met
settling requirements but exceeded THD
requirements
• However, power consumption was excessive
• Redesigned prior to tapeout with Miller
compensation by another resource
18. Project Detail – Scanner AFE
• Considerable wafer probing effort after first silicon to
determine cause of bandgap not powering up
• Traced to a software error in mask generation. N-wells of
PMOS devices shared with NPN collectors resulted in
NLDD being applied – which resulted in very large Vth for
these PMOS devices in these few circuits
• Re-tapout with corrected masks gave working silicon
• 100% revenue share for TI during year 1 after Wolfsen failed
to deliver on time
19. Project Detail – Display PMIC
• 4Q 2005 – 2Q 2006; targeted at laser projection display
system; co-designed with customer
• Chip contained switching regs, linear regs, charge pump,
piezo driver, fan controller, RF section – video interface,
XTAL oscillator, low-offset amps, laser drivers
• Designed several blocks from scratch and also did a
feasibility study to ensure laser driver speed could be
attained in the 0.6 um process
• First silicon worked, no issues in blocks designed personally.
However, project was put on hold after customer was
acquired by Motorola
20. Project Detail – Display PMIC
• Designed bandgap reference to be low noise (~600 uA IQQ);
bandgap buffer, reference current generator, 2 linear
regulators (1.2V and 3.0V) – also low noise
• Linear regs used internal zero compensation. Error amps
were bipolar input-pair to eliminate flicker noise
• Designed <50 uV Vos autozero opamp for use in green laser
temp stabilization loop using topology similar to OPA335.
Starting point was OPA333 which uses chopper stabilization.
Made substantial modifications to input and output stages,
but topology was preserved
• Also designed supply-monitor block (from scratch), testmux
(reuse, customization), I/O buffers (reuse, verification) and
laid out IREF block
21. Project Detail – ADI Internship
• Targeted <10 uV Vos, achieved ~20 uV worst case, classic
autozero scheme. Explored a scheme intended to give a low-
noise AZ amp, later proved invalid
• Designed a temperature insensitive current reference by
imposing VPTAT upon a resistor with 3333 ppm TC made
using the POLY and NWELL resistors
• Designed a simple low-power (~20 uA) PLL clock-
multiplier using the Maneatis scheme without which the chip
would have uncoupled oscillators
• All blocks at schematic only – no silicon
22. Georgia Tech Research
• Goal was to design an optoelectronic receiver with acceptable
BER at 10 Gbps with 10 uA p2p signal current from a
photodiode using a 0.18 um CMOS process without inductors
• Concept was to use resistive degeneration to get an inductive
peaking effect to improve bandwidth
• Individually laid out and submitted one 0.5 um CMOS chip
with legacy receivers and demonstrated 400 Mbps performance
in the lab
• Receiver was a transimpedance amp (TIA) which converted
the single-ended photodiode current into a differential voltage,
followed by low-gain high-BW stages and a 50 ohm driver (to
the BERT)
23. Project Detail - TFP7403
• Flat panel display timing device (3Q 2000 – 1Q 2001)
• Designed input and output PLLs (VCO/PFD/etc already available) per
the Maneatis scheme (JSSC '96)
• Charge-pump current is ratioed to the VCO cell current and loop-filter
buffer size is ratioed to the VCO cell size. This gives loop bandwidth
to reference frequency to be independent of process and also constant
damping factor
• Design involves picking these ratios for optimal bandwidth and
acceptable phase margin
• Macromodeling done to speed up simulations, linear modeling done to
estimate phase margin, added additional passive filtering to reduce
reference spur
• Later, ported VCO to a new process
24. Project Detail - AIC12
• 16-bit 26 KSPS Delta Sigma Analog Interface
Circuit in 0.35 um CMOS (1H 2000)
• Delta Sigma modulator output was 4 level. DAC +
SCF was a fully-differential single-opamp ckt that
implemented a simple switched-cap filter and DAC
(split sampling caps)
• Also worked on an 8 ohm speaker driver during
early phase of the project
25. Project Detail – Recyclic ADC
• Designed a 14-bit recyclic ADC reusing components
from the TLV1562 (1.5bit/stg pipeline ADC)
• Changed gain-stage to Steven-Lewis style (input
sampled on feedback cap also – so that feedback
factor is 1/2 instead of 1/3 – higher loop bandwidth
• Designed error-correction logic
• Recyclic ADC is basically a single-stage pipeline
ADC – so the latency is similar to a SAR
26. Project Detail – DSC AFE TLV977
• Designed (reuse, modifications for speed) resistor-
string DACs for use in offset cancellation loop
• Did complete hookup of the 12-bit 18 MSPS pipeline
ADC. HDL coding, synthesis and autolayout of the
error-correction logic
• Modeled the ADC in VHDL and later modeled the
full chip in VHDL to verify top-level hookup
• TI-India, 1999
27. Project Detail – THS8133 and Remix
• THS8133 – 10-bit 80 MSPS current-steering DAC.
Coded the digital interface in VHDL (1998)
• Remix – 10-bit 6 MSPS SAR ADC testchip –
coded/synthesized/autolayed out digital interface
(1998)
28. Skills/Strengths
• Analog circuit design
• Analog sub-system (PLL/ADC/DAC/etc) design
for moderate performance
• Analysis – circuits and root-cause
• Tradeoffs – area/power/speed/noise
• Scripting – perl/shell/skill
• Veriloga modeling / macro-modeling
• Tools
29. Patents
Fully-isolated bandgap reference
• Method of sensing PTAT current in a fully-isolated bandgap-reference
• Fully-isolated temperature-threshold detector
• Low-voltage bias generator not requiring compensation capacitance (pending)
• Low-voltage, low-area bandgap-referenced power-on-reset circuit
•
31. Project Detail – Touchscreen AFE
• In October, focus shifted completely to debug and RTP of
current device; new development put on hold
• LDO failure at high-temp was due to use of a 1 nA current
to generate a delay in transitioning to full-strength during
startup to limit inrush current. 1 nA current was vulnerable to
leakage
• Conceived and implemented bench tests to collect data
supporting the hypothesis and give the customer confidence
in the root-cause explanation of this issue which was gating
RTP. Interfaced with modeling team to get true worst-case
model for leakage. Also developed the metal fix for the issue
32. Project Detail – Touchscreen AFE
• Worked on LDO transient issue debug (RCA of large spike
on LDO_DIG output when waking up from sleep mode) –
explained by asymmetric charge/discharge strength of stage
driving pass device. Not a showstopper; addressed on new
device design with a parallel fast-mode that detected and
corrected the situation with about 1 uA additional IQQ
overhead
• For new design, also achieved the strength transition delay
without use of a tiny current and without area overhead by
eliminating a binary-2-therm trim decoder
33. Project Detail – Touchscreen AFE
• Last minute issue gating RTP was a low-rate (0.2% of units)
powerup failure in the system
• Aggravated at low temp (failing unit would pass at high
temp). As temp increased, unit would pass and DIG LDO
voltage ramp rate was not deterministic
• Explained observations based on fact that hysteresis was not
used in implementing the powerup threshold (no noise
immunity) (comparison of bandgap with Vbe)
• Statistics of the fail explained by showing the level-shifter
powerup value (with VDDIN absent (DIG LDO)) was HI
only 80% of the time (mismatch), and required trim input to
the bandgap reference for the fail
34. Project Detail – Touchscreen AFE
• Developed spreadsheets that helped RX architecture
definition
• Extensive perl/shell scripting developed to mimic a test
prescribed by the customer to generate a large number of
datasets from transient simulation (with transient noise) to
validate architecture
• Identified opportunities to save power in the design by
improving RX components (VMID buffer in the SAR
ADC, antialias filter amp (class AB o/p stage systematic
mismatch))
• Also found a way to save area in the HF Osc trim DAC by
sharing nwells in the cross-coupled latches
35. Fully-Isolated Design
Definition – no node in the circuit (with the
exception of supply and GND) is permitted to touch
the (noisy) substrate
When the process provides a vertical NPN with high
beta, usually the collector is an n-well – which
touches the substrate
Therefore, a bandgap reference topology such as the
Brokaw bandgap, in which the collectors of the
NPNs are used in the circuit, is not permitted
36. Trajectory at Texas Instruments (Dallas)
Hired into Custom Mixed Signal group in Oct 2005
Moved to High Performance Analog (HPA) group in
July 2008 (project had been outsourced to HPA by
ASIC)
DSPS-R&D begins taking over project in November
2008
Restructuring in Dec 2008 led to resources working
on the project being moved to ASIC
Majority of project team affected by RIF in 2009