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Ananth Chellappa

Analog Design Engineer


     Professional Profile
Contents


    Summary

    Work experience

    Project details

    Skills

    Patent Applications

    Education
Summary


    Graduate of IIT(M) and Georgia Tech with 9.5 years
    industry experience at Maxim Integrated Products,
    Texas Instruments and Analog Devices

    Analog designer with exposure to PLL, ADC, DAC
    and switching-regulator design

    Good with tools, scripting (perl/unix) and
    documentation

    Fast learner, motivated to contribute
Work Experience

    Jul 2009 – present : Maxim Integrated Products (Phoenix, AZ)

    Oct 2005-Apr 2009 : Texas Instruments (Dallas)
- bandgap references, amplifiers, linear-regulators, switching-regulators,
    oscillator

    Jan 2005 – July 2005 : Analog Devices (Tucson, AZ)
- autozero opamp, current reference, low-power clock-multiplier PLL

    Aug 2001 – Dec 2004 : Graduate Research Assistant at Geogia
    Tech
- high-speed optoelectronic receiver (TIA + limiting amp)

    July 1998 – Mar 2001 : Texas Instruments India
- PLL, pipeline ADC, DAC/SCF, r-string DAC, SAR ADC
Block Design Summary
Block            Schematic only   Working silicon   Production   Institution(s)    Remarks

PLL              1                                  2            TI-I, ADI         Maneatis style

Bandgap                           2                 1            TI-Dallas         2 precision
                                                                                   designs

Autozero amp     1                1                              ADI, TI-Dallas

Sw-cap gain      2                                  1            TI-I, TI-Dallas   1 involved amp
stage                                                                              design
Performance      1                                               TI-Dallas         TIA for TS AFE
linear amp
Linear           2                2                 1            TI-Dallas
regulator

                                  1                 1            TI-Dallas         Reuse, no core
                                                                                   changes
Switching
regulator                                                                          Detailed design
                                                    2            Maxim             of boost; reuse
                                                                                   of hyst-buck
Voltage buffer                    2                 2            TI-Dallas

ADC              1                                               TI-I              Recyclic

DAC                                                 1            TI-I              R-string
Project Detail – Dual Phase Boost

    Sept. 2010 to Nov. 2011 with diversions from re-spins of
    MAX8989 PA buck and MAX77693 – Maxim’s PMIC in
    the Galaxy III

    Target application – camera flash-LED driver. Motivation :
    2 inductors carrying half the current each carry ¼ the energy
    of a single inductor carrying all of the current – results in
    significantly lower footprint – 70% smaller than competing
    1.5A solution

    Design activity influenced all blocks; Lowest minimum-
    ON-time boost designed within the group and only one with
    a true PWM mode; world’s smallest 2A boost solution
Project Detail – Touchscreen AFE


    July 2008 – Jan 2009. 90 nm CMOS.

    ASIC device with digital owned by customer

    Joined team July 2008 to work on new device. Silicon for
    current device in eval/debug

    Customer – large consumer electronics co.

    Initially worked on internal LDO for system oscillator. Did
    preliminary design (from scratch). Later ported (in-progress)
    a 65 nm design from another group

    Soon began work on RX architecture, filter topology and
    transimpedance amp (TIA) frontend
Project Detail – Touchscreen AFE
• Worked on internal (on-chip cap) LDO for system oscillator
• Designed transimpedance amp frontend for new device
• Drove RCA of LDO high-temp failure
• RCA of LDO transient issue; LDO fixes for new device
• Explained yield loss in RX-SNR test @ 100 kHz for current
  device
• Drove RCA of 0.2% of units powerup fail in system
• Identified misc improvements to help area/power
• Misc tasks to support project
Project Detail – Touchscreen AFE
• New TIA design supported 4x original frequency
• Lower noise at same power obtained by increasing
  VDSATs of active load devices and topological
  modification of first stage
• VREF is divided down version of the ANA LDO
  voltage. Due to nature of the LDO design, noise
  depended on mismatch, and flicker noise was
  significant at 100 kHz – explained the loss of yield in
  the SNR test at 100 kHz
Project Detail – Notebook Charger

• 2Q 2008; Joined project which was significantly behind
  schedule
• Took over system oscillator from another resource; found
  that resistor area in the circuit could be reduced substantially
• Helped co-worker design a low-offset amp
• Handled entire verification of supervisory blocks and high-
  voltage level-shifter
• Key role in top-level simulation efforts
Project Detail – GPS PMIC
•   2Q 2007 – 1Q 2008
•   Aggressive schedule; reuse of catalog blocks; chip: pwr
    mux, battery charger, resistive touchscreen controller,
    buck regulators, white LED boost regulator, LDOs
•   Complete ownership of buck-regulators (handled import,
    verification, minor tweaks, test-plan)
•   Designed thermal shutdown circuit (from scratch) and
    testmux
•   Eval/debug of silicon; metal fixes
•   Key role in top-level simulations
Project Detail – GPS PMIC


    Buck regulators (Vin 1.8-6.5V, Vout 0.7-3.3V, 6-bit
    programmable, 2A max load, 2.2 uH, 4.7-10 uF) were voltage-
    mode; efficiency ~87%; considerable digital content

    First-pass silicon did not permit system oscillator to be trimmed
    because clock was not mux'ed out by the digital. Shipping of
    untrimmed units during sampling phase led to
    undesirable/upredictable behavior in the field

    Buck regulators would delay 384 clock cycles (to allow internal
    bias nodes to be ready) before beginning switching activity. This
    deterministic delay was used to trim the system oscillator. This
    workaround permitted about 800k units to be shipped before 1P1
    silicon was available
Project Detail – DSC PMIC
• 1Q-2Q 2007
• Cost-reduced (area efficient) version of a production
  PMIC for digital still cameras
• Chip contained boost regulator, 1 buck regulator,
  backlight LED boost regulator, LDOs, 2 buck-boost
  regulators
• Taped out as a test-chip. Only partial silicon
  evaluation
• Worked on buck-boost and top-level simulations
Project Detail – DSC PMIC
• About 5% of units had an issue with the buck-boost regulators. In
  light-load, inductor current would randomly go negative and
  Vout would drop and system would reset
• It was found that these units had the PFM-PWM transition point
  set very high. At test, units would be trimmed to set this
  transition to a value where the problem was not observed. Some
  yield loss remained on units that could not be trimmed acceptably
• Was also found that the variation (across units) of this transition
  (pre trim) was very wide
• Traced this variation to the Ios of the current-sense amp;
  reduced it in the new design
Project Detail – Scanner AFE
• 3Q 2006 – 1Q 2007
• Aggressive schedule; process was new to the team
• Chip contained 240 MHz osc for USB2 data rate, 12 bit
  ADC (2 MSPS), CDS-PGA interface to CMOS/CCD image
  sensor, offset DAC, LVDS, LED driver
• System used bare die – no trim available (issues with both
  EEPROM and poly fuse)
• Designed bandgap reference, reference buffer, 1.5V buffer,
  pipeline ADC differential reference buffer and CDS-PGA
  amp (scaled down for use as pipeline-ADC residue amp)
Project Detail – Scanner AFE
• Bandgap reference needed to be fully-isolated. PNP based
  topology exists, but better curvature performance available
  from an NPN bandgap
• Known fully-isolated NPN bandgap has non-trivial startup –
  difficult to sense the NPN current – and some corners
  showed oscillations during startup
• Developed new topology to meet requirements
• Designed for statistical variation (no trim)
• Bandgap noise filtered with RC filter; buffers designed for
  noise; total integrated noise at ADC reference output (1 uF
  caps) was 50 uV rms
Project Detail – Scanner AFE

• CDS-PGA amp was a two-stage design due to
  required voltage swing
• Design used cascode compensation and barely met
  settling requirements but exceeded THD
  requirements
• However, power consumption was excessive
• Redesigned prior to tapeout with Miller
  compensation by another resource
Project Detail – Scanner AFE

• Considerable wafer probing effort after first silicon to
  determine cause of bandgap not powering up
• Traced to a software error in mask generation. N-wells of
  PMOS devices shared with NPN collectors resulted in
  NLDD being applied – which resulted in very large Vth for
  these PMOS devices in these few circuits
• Re-tapout with corrected masks gave working silicon
• 100% revenue share for TI during year 1 after Wolfsen failed
  to deliver on time
Project Detail – Display PMIC
• 4Q 2005 – 2Q 2006; targeted at laser projection display
  system; co-designed with customer
• Chip contained switching regs, linear regs, charge pump,
  piezo driver, fan controller, RF section – video interface,
  XTAL oscillator, low-offset amps, laser drivers
• Designed several blocks from scratch and also did a
  feasibility study to ensure laser driver speed could be
  attained in the 0.6 um process
• First silicon worked, no issues in blocks designed personally.
  However, project was put on hold after customer was
  acquired by Motorola
Project Detail – Display PMIC
• Designed bandgap reference to be low noise (~600 uA IQQ);
  bandgap buffer, reference current generator, 2 linear
  regulators (1.2V and 3.0V) – also low noise
• Linear regs used internal zero compensation. Error amps
  were bipolar input-pair to eliminate flicker noise
• Designed <50 uV Vos autozero opamp for use in green laser
  temp stabilization loop using topology similar to OPA335.
  Starting point was OPA333 which uses chopper stabilization.
  Made substantial modifications to input and output stages,
  but topology was preserved
• Also designed supply-monitor block (from scratch), testmux
  (reuse, customization), I/O buffers (reuse, verification) and
  laid out IREF block
Project Detail – ADI Internship
• Targeted <10 uV Vos, achieved ~20 uV worst case, classic
  autozero scheme. Explored a scheme intended to give a low-
  noise AZ amp, later proved invalid
• Designed a temperature insensitive current reference by
  imposing VPTAT upon a resistor with 3333 ppm TC made
  using the POLY and NWELL resistors
• Designed a simple low-power (~20 uA) PLL clock-
  multiplier using the Maneatis scheme without which the chip
  would have uncoupled oscillators
• All blocks at schematic only – no silicon
Georgia Tech Research
• Goal was to design an optoelectronic receiver with acceptable
  BER at 10 Gbps with 10 uA p2p signal current from a
  photodiode using a 0.18 um CMOS process without inductors
• Concept was to use resistive degeneration to get an inductive
  peaking effect to improve bandwidth
• Individually laid out and submitted one 0.5 um CMOS chip
  with legacy receivers and demonstrated 400 Mbps performance
  in the lab
• Receiver was a transimpedance amp (TIA) which converted
  the single-ended photodiode current into a differential voltage,
  followed by low-gain high-BW stages and a 50 ohm driver (to
  the BERT)
Project Detail - TFP7403
• Flat panel display timing device (3Q 2000 – 1Q 2001)
• Designed input and output PLLs (VCO/PFD/etc already available) per
  the Maneatis scheme (JSSC '96)
• Charge-pump current is ratioed to the VCO cell current and loop-filter
  buffer size is ratioed to the VCO cell size. This gives loop bandwidth
  to reference frequency to be independent of process and also constant
  damping factor
• Design involves picking these ratios for optimal bandwidth and
  acceptable phase margin
• Macromodeling done to speed up simulations, linear modeling done to
  estimate phase margin, added additional passive filtering to reduce
  reference spur
• Later, ported VCO to a new process
Project Detail - AIC12

• 16-bit 26 KSPS Delta Sigma Analog Interface
  Circuit in 0.35 um CMOS (1H 2000)
• Delta Sigma modulator output was 4 level. DAC +
  SCF was a fully-differential single-opamp ckt that
  implemented a simple switched-cap filter and DAC
  (split sampling caps)
• Also worked on an 8 ohm speaker driver during
  early phase of the project
Project Detail – Recyclic ADC

• Designed a 14-bit recyclic ADC reusing components
  from the TLV1562 (1.5bit/stg pipeline ADC)
• Changed gain-stage to Steven-Lewis style (input
  sampled on feedback cap also – so that feedback
  factor is 1/2 instead of 1/3 – higher loop bandwidth
• Designed error-correction logic
• Recyclic ADC is basically a single-stage pipeline
  ADC – so the latency is similar to a SAR
Project Detail – DSC AFE TLV977

• Designed (reuse, modifications for speed) resistor-
  string DACs for use in offset cancellation loop
• Did complete hookup of the 12-bit 18 MSPS pipeline
  ADC. HDL coding, synthesis and autolayout of the
  error-correction logic
• Modeled the ADC in VHDL and later modeled the
  full chip in VHDL to verify top-level hookup
• TI-India, 1999
Project Detail – THS8133 and Remix

•   THS8133 – 10-bit 80 MSPS current-steering DAC.
    Coded the digital interface in VHDL (1998)
•   Remix – 10-bit 6 MSPS SAR ADC testchip –
    coded/synthesized/autolayed out digital interface
    (1998)
Skills/Strengths
•   Analog circuit design
•   Analog sub-system (PLL/ADC/DAC/etc) design
    for moderate performance
•   Analysis – circuits and root-cause
•   Tradeoffs – area/power/speed/noise
•   Scripting – perl/shell/skill
•   Veriloga modeling / macro-modeling
•   Tools
Patents

    Fully-isolated bandgap reference
•   Method of sensing PTAT current in a fully-isolated bandgap-reference
•   Fully-isolated temperature-threshold detector
•   Low-voltage bias generator not requiring compensation capacitance (pending)
•   Low-voltage, low-area bandgap-referenced power-on-reset circuit
•
Backup
Project Detail – Touchscreen AFE

• In October, focus shifted completely to debug and RTP of
  current device; new development put on hold
• LDO failure at high-temp was due to use of a 1 nA current
  to generate a delay in transitioning to full-strength during
  startup to limit inrush current. 1 nA current was vulnerable to
  leakage
• Conceived and implemented bench tests to collect data
  supporting the hypothesis and give the customer confidence
  in the root-cause explanation of this issue which was gating
  RTP. Interfaced with modeling team to get true worst-case
  model for leakage. Also developed the metal fix for the issue
Project Detail – Touchscreen AFE

• Worked on LDO transient issue debug (RCA of large spike
  on LDO_DIG output when waking up from sleep mode) –
  explained by asymmetric charge/discharge strength of stage
  driving pass device. Not a showstopper; addressed on new
  device design with a parallel fast-mode that detected and
  corrected the situation with about 1 uA additional IQQ
  overhead
• For new design, also achieved the strength transition delay
  without use of a tiny current and without area overhead by
  eliminating a binary-2-therm trim decoder
Project Detail – Touchscreen AFE
• Last minute issue gating RTP was a low-rate (0.2% of units)
  powerup failure in the system
• Aggravated at low temp (failing unit would pass at high
  temp). As temp increased, unit would pass and DIG LDO
  voltage ramp rate was not deterministic
• Explained observations based on fact that hysteresis was not
  used in implementing the powerup threshold (no noise
  immunity) (comparison of bandgap with Vbe)
• Statistics of the fail explained by showing the level-shifter
  powerup value (with VDDIN absent (DIG LDO)) was HI
  only 80% of the time (mismatch), and required trim input to
  the bandgap reference for the fail
Project Detail – Touchscreen AFE
•   Developed spreadsheets that helped RX architecture
    definition
•   Extensive perl/shell scripting developed to mimic a test
    prescribed by the customer to generate a large number of
    datasets from transient simulation (with transient noise) to
    validate architecture
•   Identified opportunities to save power in the design by
    improving RX components (VMID buffer in the SAR
    ADC, antialias filter amp (class AB o/p stage systematic
    mismatch))
•   Also found a way to save area in the HF Osc trim DAC by
    sharing nwells in the cross-coupled latches
Fully-Isolated Design


    Definition – no node in the circuit (with the
    exception of supply and GND) is permitted to touch
    the (noisy) substrate

    When the process provides a vertical NPN with high
    beta, usually the collector is an n-well – which
    touches the substrate

    Therefore, a bandgap reference topology such as the
    Brokaw bandgap, in which the collectors of the
    NPNs are used in the circuit, is not permitted
Trajectory at Texas Instruments (Dallas)


    Hired into Custom Mixed Signal group in Oct 2005

    Moved to High Performance Analog (HPA) group in
    July 2008 (project had been outsourced to HPA by
    ASIC)

    DSPS-R&D begins taking over project in November
    2008

    Restructuring in Dec 2008 led to resources working
    on the project being moved to ASIC

    Majority of project team affected by RIF in 2009

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isscc2017 28_7isscc2017 28_7
isscc2017 28_7
 
A 0.7V 12b 160MS/s 12.8fJ/convstep Pipelined-SAR ADC in 28nm CMOS with Digita...
A 0.7V 12b 160MS/s 12.8fJ/convstep Pipelined-SAR ADC in 28nm CMOS with Digita...A 0.7V 12b 160MS/s 12.8fJ/convstep Pipelined-SAR ADC in 28nm CMOS with Digita...
A 0.7V 12b 160MS/s 12.8fJ/convstep Pipelined-SAR ADC in 28nm CMOS with Digita...
 
Low-Power Design and Verification
Low-Power Design and VerificationLow-Power Design and Verification
Low-Power Design and Verification
 

Profile

  • 1. Ananth Chellappa Analog Design Engineer Professional Profile
  • 2. Contents  Summary  Work experience  Project details  Skills  Patent Applications  Education
  • 3. Summary  Graduate of IIT(M) and Georgia Tech with 9.5 years industry experience at Maxim Integrated Products, Texas Instruments and Analog Devices  Analog designer with exposure to PLL, ADC, DAC and switching-regulator design  Good with tools, scripting (perl/unix) and documentation  Fast learner, motivated to contribute
  • 4. Work Experience  Jul 2009 – present : Maxim Integrated Products (Phoenix, AZ)  Oct 2005-Apr 2009 : Texas Instruments (Dallas) - bandgap references, amplifiers, linear-regulators, switching-regulators, oscillator  Jan 2005 – July 2005 : Analog Devices (Tucson, AZ) - autozero opamp, current reference, low-power clock-multiplier PLL  Aug 2001 – Dec 2004 : Graduate Research Assistant at Geogia Tech - high-speed optoelectronic receiver (TIA + limiting amp)  July 1998 – Mar 2001 : Texas Instruments India - PLL, pipeline ADC, DAC/SCF, r-string DAC, SAR ADC
  • 5. Block Design Summary Block Schematic only Working silicon Production Institution(s) Remarks PLL 1 2 TI-I, ADI Maneatis style Bandgap 2 1 TI-Dallas 2 precision designs Autozero amp 1 1 ADI, TI-Dallas Sw-cap gain 2 1 TI-I, TI-Dallas 1 involved amp stage design Performance 1 TI-Dallas TIA for TS AFE linear amp Linear 2 2 1 TI-Dallas regulator 1 1 TI-Dallas Reuse, no core changes Switching regulator Detailed design 2 Maxim of boost; reuse of hyst-buck Voltage buffer 2 2 TI-Dallas ADC 1 TI-I Recyclic DAC 1 TI-I R-string
  • 6. Project Detail – Dual Phase Boost  Sept. 2010 to Nov. 2011 with diversions from re-spins of MAX8989 PA buck and MAX77693 – Maxim’s PMIC in the Galaxy III  Target application – camera flash-LED driver. Motivation : 2 inductors carrying half the current each carry ¼ the energy of a single inductor carrying all of the current – results in significantly lower footprint – 70% smaller than competing 1.5A solution  Design activity influenced all blocks; Lowest minimum- ON-time boost designed within the group and only one with a true PWM mode; world’s smallest 2A boost solution
  • 7. Project Detail – Touchscreen AFE  July 2008 – Jan 2009. 90 nm CMOS.  ASIC device with digital owned by customer  Joined team July 2008 to work on new device. Silicon for current device in eval/debug  Customer – large consumer electronics co.  Initially worked on internal LDO for system oscillator. Did preliminary design (from scratch). Later ported (in-progress) a 65 nm design from another group  Soon began work on RX architecture, filter topology and transimpedance amp (TIA) frontend
  • 8. Project Detail – Touchscreen AFE • Worked on internal (on-chip cap) LDO for system oscillator • Designed transimpedance amp frontend for new device • Drove RCA of LDO high-temp failure • RCA of LDO transient issue; LDO fixes for new device • Explained yield loss in RX-SNR test @ 100 kHz for current device • Drove RCA of 0.2% of units powerup fail in system • Identified misc improvements to help area/power • Misc tasks to support project
  • 9. Project Detail – Touchscreen AFE • New TIA design supported 4x original frequency • Lower noise at same power obtained by increasing VDSATs of active load devices and topological modification of first stage • VREF is divided down version of the ANA LDO voltage. Due to nature of the LDO design, noise depended on mismatch, and flicker noise was significant at 100 kHz – explained the loss of yield in the SNR test at 100 kHz
  • 10. Project Detail – Notebook Charger • 2Q 2008; Joined project which was significantly behind schedule • Took over system oscillator from another resource; found that resistor area in the circuit could be reduced substantially • Helped co-worker design a low-offset amp • Handled entire verification of supervisory blocks and high- voltage level-shifter • Key role in top-level simulation efforts
  • 11. Project Detail – GPS PMIC • 2Q 2007 – 1Q 2008 • Aggressive schedule; reuse of catalog blocks; chip: pwr mux, battery charger, resistive touchscreen controller, buck regulators, white LED boost regulator, LDOs • Complete ownership of buck-regulators (handled import, verification, minor tweaks, test-plan) • Designed thermal shutdown circuit (from scratch) and testmux • Eval/debug of silicon; metal fixes • Key role in top-level simulations
  • 12. Project Detail – GPS PMIC  Buck regulators (Vin 1.8-6.5V, Vout 0.7-3.3V, 6-bit programmable, 2A max load, 2.2 uH, 4.7-10 uF) were voltage- mode; efficiency ~87%; considerable digital content  First-pass silicon did not permit system oscillator to be trimmed because clock was not mux'ed out by the digital. Shipping of untrimmed units during sampling phase led to undesirable/upredictable behavior in the field  Buck regulators would delay 384 clock cycles (to allow internal bias nodes to be ready) before beginning switching activity. This deterministic delay was used to trim the system oscillator. This workaround permitted about 800k units to be shipped before 1P1 silicon was available
  • 13. Project Detail – DSC PMIC • 1Q-2Q 2007 • Cost-reduced (area efficient) version of a production PMIC for digital still cameras • Chip contained boost regulator, 1 buck regulator, backlight LED boost regulator, LDOs, 2 buck-boost regulators • Taped out as a test-chip. Only partial silicon evaluation • Worked on buck-boost and top-level simulations
  • 14. Project Detail – DSC PMIC • About 5% of units had an issue with the buck-boost regulators. In light-load, inductor current would randomly go negative and Vout would drop and system would reset • It was found that these units had the PFM-PWM transition point set very high. At test, units would be trimmed to set this transition to a value where the problem was not observed. Some yield loss remained on units that could not be trimmed acceptably • Was also found that the variation (across units) of this transition (pre trim) was very wide • Traced this variation to the Ios of the current-sense amp; reduced it in the new design
  • 15. Project Detail – Scanner AFE • 3Q 2006 – 1Q 2007 • Aggressive schedule; process was new to the team • Chip contained 240 MHz osc for USB2 data rate, 12 bit ADC (2 MSPS), CDS-PGA interface to CMOS/CCD image sensor, offset DAC, LVDS, LED driver • System used bare die – no trim available (issues with both EEPROM and poly fuse) • Designed bandgap reference, reference buffer, 1.5V buffer, pipeline ADC differential reference buffer and CDS-PGA amp (scaled down for use as pipeline-ADC residue amp)
  • 16. Project Detail – Scanner AFE • Bandgap reference needed to be fully-isolated. PNP based topology exists, but better curvature performance available from an NPN bandgap • Known fully-isolated NPN bandgap has non-trivial startup – difficult to sense the NPN current – and some corners showed oscillations during startup • Developed new topology to meet requirements • Designed for statistical variation (no trim) • Bandgap noise filtered with RC filter; buffers designed for noise; total integrated noise at ADC reference output (1 uF caps) was 50 uV rms
  • 17. Project Detail – Scanner AFE • CDS-PGA amp was a two-stage design due to required voltage swing • Design used cascode compensation and barely met settling requirements but exceeded THD requirements • However, power consumption was excessive • Redesigned prior to tapeout with Miller compensation by another resource
  • 18. Project Detail – Scanner AFE • Considerable wafer probing effort after first silicon to determine cause of bandgap not powering up • Traced to a software error in mask generation. N-wells of PMOS devices shared with NPN collectors resulted in NLDD being applied – which resulted in very large Vth for these PMOS devices in these few circuits • Re-tapout with corrected masks gave working silicon • 100% revenue share for TI during year 1 after Wolfsen failed to deliver on time
  • 19. Project Detail – Display PMIC • 4Q 2005 – 2Q 2006; targeted at laser projection display system; co-designed with customer • Chip contained switching regs, linear regs, charge pump, piezo driver, fan controller, RF section – video interface, XTAL oscillator, low-offset amps, laser drivers • Designed several blocks from scratch and also did a feasibility study to ensure laser driver speed could be attained in the 0.6 um process • First silicon worked, no issues in blocks designed personally. However, project was put on hold after customer was acquired by Motorola
  • 20. Project Detail – Display PMIC • Designed bandgap reference to be low noise (~600 uA IQQ); bandgap buffer, reference current generator, 2 linear regulators (1.2V and 3.0V) – also low noise • Linear regs used internal zero compensation. Error amps were bipolar input-pair to eliminate flicker noise • Designed <50 uV Vos autozero opamp for use in green laser temp stabilization loop using topology similar to OPA335. Starting point was OPA333 which uses chopper stabilization. Made substantial modifications to input and output stages, but topology was preserved • Also designed supply-monitor block (from scratch), testmux (reuse, customization), I/O buffers (reuse, verification) and laid out IREF block
  • 21. Project Detail – ADI Internship • Targeted <10 uV Vos, achieved ~20 uV worst case, classic autozero scheme. Explored a scheme intended to give a low- noise AZ amp, later proved invalid • Designed a temperature insensitive current reference by imposing VPTAT upon a resistor with 3333 ppm TC made using the POLY and NWELL resistors • Designed a simple low-power (~20 uA) PLL clock- multiplier using the Maneatis scheme without which the chip would have uncoupled oscillators • All blocks at schematic only – no silicon
  • 22. Georgia Tech Research • Goal was to design an optoelectronic receiver with acceptable BER at 10 Gbps with 10 uA p2p signal current from a photodiode using a 0.18 um CMOS process without inductors • Concept was to use resistive degeneration to get an inductive peaking effect to improve bandwidth • Individually laid out and submitted one 0.5 um CMOS chip with legacy receivers and demonstrated 400 Mbps performance in the lab • Receiver was a transimpedance amp (TIA) which converted the single-ended photodiode current into a differential voltage, followed by low-gain high-BW stages and a 50 ohm driver (to the BERT)
  • 23. Project Detail - TFP7403 • Flat panel display timing device (3Q 2000 – 1Q 2001) • Designed input and output PLLs (VCO/PFD/etc already available) per the Maneatis scheme (JSSC '96) • Charge-pump current is ratioed to the VCO cell current and loop-filter buffer size is ratioed to the VCO cell size. This gives loop bandwidth to reference frequency to be independent of process and also constant damping factor • Design involves picking these ratios for optimal bandwidth and acceptable phase margin • Macromodeling done to speed up simulations, linear modeling done to estimate phase margin, added additional passive filtering to reduce reference spur • Later, ported VCO to a new process
  • 24. Project Detail - AIC12 • 16-bit 26 KSPS Delta Sigma Analog Interface Circuit in 0.35 um CMOS (1H 2000) • Delta Sigma modulator output was 4 level. DAC + SCF was a fully-differential single-opamp ckt that implemented a simple switched-cap filter and DAC (split sampling caps) • Also worked on an 8 ohm speaker driver during early phase of the project
  • 25. Project Detail – Recyclic ADC • Designed a 14-bit recyclic ADC reusing components from the TLV1562 (1.5bit/stg pipeline ADC) • Changed gain-stage to Steven-Lewis style (input sampled on feedback cap also – so that feedback factor is 1/2 instead of 1/3 – higher loop bandwidth • Designed error-correction logic • Recyclic ADC is basically a single-stage pipeline ADC – so the latency is similar to a SAR
  • 26. Project Detail – DSC AFE TLV977 • Designed (reuse, modifications for speed) resistor- string DACs for use in offset cancellation loop • Did complete hookup of the 12-bit 18 MSPS pipeline ADC. HDL coding, synthesis and autolayout of the error-correction logic • Modeled the ADC in VHDL and later modeled the full chip in VHDL to verify top-level hookup • TI-India, 1999
  • 27. Project Detail – THS8133 and Remix • THS8133 – 10-bit 80 MSPS current-steering DAC. Coded the digital interface in VHDL (1998) • Remix – 10-bit 6 MSPS SAR ADC testchip – coded/synthesized/autolayed out digital interface (1998)
  • 28. Skills/Strengths • Analog circuit design • Analog sub-system (PLL/ADC/DAC/etc) design for moderate performance • Analysis – circuits and root-cause • Tradeoffs – area/power/speed/noise • Scripting – perl/shell/skill • Veriloga modeling / macro-modeling • Tools
  • 29. Patents Fully-isolated bandgap reference • Method of sensing PTAT current in a fully-isolated bandgap-reference • Fully-isolated temperature-threshold detector • Low-voltage bias generator not requiring compensation capacitance (pending) • Low-voltage, low-area bandgap-referenced power-on-reset circuit •
  • 31. Project Detail – Touchscreen AFE • In October, focus shifted completely to debug and RTP of current device; new development put on hold • LDO failure at high-temp was due to use of a 1 nA current to generate a delay in transitioning to full-strength during startup to limit inrush current. 1 nA current was vulnerable to leakage • Conceived and implemented bench tests to collect data supporting the hypothesis and give the customer confidence in the root-cause explanation of this issue which was gating RTP. Interfaced with modeling team to get true worst-case model for leakage. Also developed the metal fix for the issue
  • 32. Project Detail – Touchscreen AFE • Worked on LDO transient issue debug (RCA of large spike on LDO_DIG output when waking up from sleep mode) – explained by asymmetric charge/discharge strength of stage driving pass device. Not a showstopper; addressed on new device design with a parallel fast-mode that detected and corrected the situation with about 1 uA additional IQQ overhead • For new design, also achieved the strength transition delay without use of a tiny current and without area overhead by eliminating a binary-2-therm trim decoder
  • 33. Project Detail – Touchscreen AFE • Last minute issue gating RTP was a low-rate (0.2% of units) powerup failure in the system • Aggravated at low temp (failing unit would pass at high temp). As temp increased, unit would pass and DIG LDO voltage ramp rate was not deterministic • Explained observations based on fact that hysteresis was not used in implementing the powerup threshold (no noise immunity) (comparison of bandgap with Vbe) • Statistics of the fail explained by showing the level-shifter powerup value (with VDDIN absent (DIG LDO)) was HI only 80% of the time (mismatch), and required trim input to the bandgap reference for the fail
  • 34. Project Detail – Touchscreen AFE • Developed spreadsheets that helped RX architecture definition • Extensive perl/shell scripting developed to mimic a test prescribed by the customer to generate a large number of datasets from transient simulation (with transient noise) to validate architecture • Identified opportunities to save power in the design by improving RX components (VMID buffer in the SAR ADC, antialias filter amp (class AB o/p stage systematic mismatch)) • Also found a way to save area in the HF Osc trim DAC by sharing nwells in the cross-coupled latches
  • 35. Fully-Isolated Design  Definition – no node in the circuit (with the exception of supply and GND) is permitted to touch the (noisy) substrate  When the process provides a vertical NPN with high beta, usually the collector is an n-well – which touches the substrate  Therefore, a bandgap reference topology such as the Brokaw bandgap, in which the collectors of the NPNs are used in the circuit, is not permitted
  • 36. Trajectory at Texas Instruments (Dallas)  Hired into Custom Mixed Signal group in Oct 2005  Moved to High Performance Analog (HPA) group in July 2008 (project had been outsourced to HPA by ASIC)  DSPS-R&D begins taking over project in November 2008  Restructuring in Dec 2008 led to resources working on the project being moved to ASIC  Majority of project team affected by RIF in 2009