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LSI testing is not just technology, but also it is a part of company management strategies. For example, some companies may use low cost ATE and develop BIST / BOST to make testing cost lower. Other companies may use high-end mixed-signal ATEs as well as its associated services & know how. Fast time-to-market & no BIST can make profits much more than testing cost.
It also depends on applications of the DUT; for automotive application ICs, reliability and safety are very important and sufficient testing is required. For consumer electronics, low cost testing is very important because the price of LSI itself is very cheap.
The figure of merit for LSI testing may be Test quality / Test cost. However, even in automotive application cases, test cost reduction is very important as well as test quality. The concept of cost makes LSI testing technology clear.
In this panel, several possible LSI testing methods in terms of test cost reduction will be discussed.
The panelists can be divided into two groups:
If they believe there is more cost to cut, answer where to cut (e.g. burn-in cost) and why they believe today's technologies support such cost cutting
If they believe there is no more cost to cut, explain why that is the case (e.g. we have seen the limit of cost reduction in test flow in actual data).
The panelist may take a position of e.g., automotive or consumer applications of ICs, testing flow & technology (BIST or BOST, w/ adaptive test or w/o), usage of state of art EDA tools and ATE or usage of conventional tools and equipment, large or small volume of ICs.