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Renice NFA100 NandFlash Test Platform
Accurate and Fast Nand flash Screening
Shenzhen Renice Technology Co., Ltd
Test Tray
Layer1
Layer2
Layer3
Layer4
Layer5
Layer6
Layer7
Layer8
Layer9
Layer10
Chamber
Pile up the probe board and press
Power BOX
Contorol BOX
Press Unit
S f
• Supports 3D NAND with newest
process, 1x nm and 25nm, 34nm,
56nm Nand.
• Supports SLC,MLC,TLC,eMLC.
•Supports 8-bit and 16-bit
Asynchronous Nand.
•Supports Aynchronous, Toggle Flash.
•Supports regular NAND from Micron,
Toshiba, Samsung, Intel, Sandisk and
Hynix.
•Supports Nand with TSOP48, BGA63,
BGA100, BGA132, BGA152
packagage.
•Custom and develop unconventional
and self-defined packaged Nand。
• Test customer’s self-developed BCH ECC or LDPC
intensity.
•Test Read Retry.
•Test NAND Flash at varying voltage.
•Test of physical destroy over NAND Flash.
02 HW Structure Introduction
The hardware structure have two options: semi-automatic and fully automatic.
For applications, such as military special function chip analysis and screening, semi-
automatic operation equipment might be enough. For high-efficiency and high-volume
screening applications, it might need fully automated operation structure.
NFA100 HW Structure
• Main board and BGA/TOSP board
• All Nand flash are put into the High-Low
temperature chamber.
• The test host is outside the High-Low
temperature chamber.
• Equipped with mechanical arm for
automated loading or unloading of NAND
Flash.
Test Result Display
• Colors "Red, Blue, Green and Yellow" shows
different result.
• For fully automatic equipment, the equipment
will be automatically classified according to
different colors.
Test Script automatically generated
• The clients needs to fill in the
corresponding parameters of the
Nand Flash when subscribing to
the tests.
• The system automatically
generates test scripts.
• If special tests requirement,
clients can custom the test script.
Software of test Script
03 Functions/Tests
Supports Threshold Voltage Distribution tests
Supports 4 types of ECC capacity tests
Supports various pattern & custom
• Embedded with multiple
mainstream test patterns.
• Custom patterns according to
tests requirement.
• Support pattern's bit Flip test.
Supports tests to any page
Supports All flash manufacturer's Nand Flash
Supports Factory Bad Block Management
Supports sending any command to any address
Page&Block real performance assessment
Page&Block real performance assessment
Supports error distribution analysis
bit error's statistic analysis
Supports Program Disturb Test
Supports ReadRetry Test
Supports RBER&UBER Analyze
• Accurately evaluate RBER.
• Accurately evaluate UBER under 4 types of
ECC test conditions.
• Accurately evaluate UBER and RBER under
different P/E cycle.
• Output and analyze the evaluation result.
Supports operation to P/E cycle in the setting pattern
Supports Script andAPI
• NFA100 provides Script, allowing
clients more flexibly to custom test
modes.
• Supports API, allow clients customing
tests interface.
THANKSW bs :wwwrenice-tech.com
: sales@renice-tech.com

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Renice Nand Flash Analyzer NFA100 introduction

  • 1. Renice NFA100 NandFlash Test Platform Accurate and Fast Nand flash Screening Shenzhen Renice Technology Co., Ltd Test Tray Layer1 Layer2 Layer3 Layer4 Layer5 Layer6 Layer7 Layer8 Layer9 Layer10 Chamber Pile up the probe board and press Power BOX Contorol BOX Press Unit
  • 2. S f • Supports 3D NAND with newest process, 1x nm and 25nm, 34nm, 56nm Nand. • Supports SLC,MLC,TLC,eMLC. •Supports 8-bit and 16-bit Asynchronous Nand. •Supports Aynchronous, Toggle Flash. •Supports regular NAND from Micron, Toshiba, Samsung, Intel, Sandisk and Hynix. •Supports Nand with TSOP48, BGA63, BGA100, BGA132, BGA152 packagage. •Custom and develop unconventional and self-defined packaged Nand。 • Test customer’s self-developed BCH ECC or LDPC intensity. •Test Read Retry. •Test NAND Flash at varying voltage. •Test of physical destroy over NAND Flash.
  • 3. 02 HW Structure Introduction The hardware structure have two options: semi-automatic and fully automatic. For applications, such as military special function chip analysis and screening, semi- automatic operation equipment might be enough. For high-efficiency and high-volume screening applications, it might need fully automated operation structure.
  • 4. NFA100 HW Structure • Main board and BGA/TOSP board • All Nand flash are put into the High-Low temperature chamber. • The test host is outside the High-Low temperature chamber. • Equipped with mechanical arm for automated loading or unloading of NAND Flash.
  • 5. Test Result Display • Colors "Red, Blue, Green and Yellow" shows different result. • For fully automatic equipment, the equipment will be automatically classified according to different colors.
  • 6. Test Script automatically generated • The clients needs to fill in the corresponding parameters of the Nand Flash when subscribing to the tests. • The system automatically generates test scripts. • If special tests requirement, clients can custom the test script.
  • 9. Supports Threshold Voltage Distribution tests
  • 10. Supports 4 types of ECC capacity tests
  • 11. Supports various pattern & custom • Embedded with multiple mainstream test patterns. • Custom patterns according to tests requirement. • Support pattern's bit Flip test.
  • 12. Supports tests to any page
  • 13. Supports All flash manufacturer's Nand Flash
  • 14. Supports Factory Bad Block Management
  • 15. Supports sending any command to any address
  • 22. Supports RBER&UBER Analyze • Accurately evaluate RBER. • Accurately evaluate UBER under 4 types of ECC test conditions. • Accurately evaluate UBER and RBER under different P/E cycle. • Output and analyze the evaluation result.
  • 23. Supports operation to P/E cycle in the setting pattern
  • 24. Supports Script andAPI • NFA100 provides Script, allowing clients more flexibly to custom test modes. • Supports API, allow clients customing tests interface.
  • 25. THANKSW bs :wwwrenice-tech.com : sales@renice-tech.com