This slide is for the keynote speech in JaSST Hokkaido 2020. It analysis problems of Softhouses, Japanese software companies, and proposes how to transform softhouses to good companies.
This slide is for the keynote speech in JaSST Hokkaido 2020. It analysis problems of Softhouses, Japanese software companies, and proposes how to transform softhouses to good companies.
This presentation shows how to do frontloading in software development in fundamental level, also called shift-left technique or W model. The main topic is software trap analysis / software failure mode analysis, a method of root cause analysis of (part of) software FMEA, which extracts patterns of bugs.
This presentation shows how to do frontloading in software development in fundamental level, also called shift-left technique or W model. The main topic is software trap analysis / software failure mode analysis, a method of root cause analysis of (part of) software FMEA, which extracts patterns of bugs.
Eric Ries at Startup Lessons Learned sllconf 2011 - Japanese TranslationKenji Hiranabe
Japanese translation of Eric Ries Keynote at Startup Lessons Learned sllconf 2011 - Japanese Translation
http://www.slideshare.net/startuplessonslearned/eric-ries-sllconf-keynote-state-of-the-lean-startup-movement
Translated by Yuki Sekiguchi and Kenji Hiranabe
Throw away the map and let's go with the help of your compass.
Agile Tour Osaka 2012 ( http://bit.ly/Tm3MNc )発表資料です。若手エンジニアとサービス開発を通して考えてきた「なぜ?」。その探求の旅の紹介です。
Demystifying quality management for large scale manufacturing in modern contextYasuharu Nishi
Slides for ConTEST online 2021.
This presentation introduces you, software tester, the mindsets of TQM (Total Quality Management) in modern software testing context.
Viewpoint-based Test Requirement Analysis Modelingand Test Architectural D...Yasuharu Nishi
This material introduces a test engineering methodology, called VSTeP, which includes test requirement analysis phase and test architecture design phase. VSTeP shifts you to focus on properly abstract test viewpoints from too detail test conditions.