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J. Scott Runner
Sr. Director of Design Verification




                    Verification of Wireless SoCs:
                     No Longer in the Dark Ages
Talk Outline



   The Mobile Device Era
   What’s in a highly integrated wireless chipset today?
   Challenges and Opportunities in the Mobile Era
   Traditional Wireless Verification
   Next Generation Wireless Verification
   Summary: Are you ready?




                   “If it isn’t tested, it doesn’t work”

                            Dr. Klein Gilhousen (Qualcomm Co-founder)
                            Dr. Roberto Padovani (Qualcomm CTO)


                                 PAGE 2       QCT QMS Review I Q2 ‘06 | April 12, 2006
Exit: The PC Era, Entering: the Mobile Device Era




              Highly integrated, Highly Heterogeneous, Interoperable

                             PAGE 3      QCT QMS Review I Q2 ‘06 | April 12, 2006
Today’s Highly Integrated Wireless Devices


 WAN Modems
   (CDMA,   Application                                                 RF        PM
  UMTS…)      RISC

  GSM/GPRS
                 GPS
  WLAN/PAN
              3D Graphics
   Modems
    DSP       Hi res Video
                 Audio
   Memory     Peripherals      Multiple processors (multiple RISC, multiple DSP)
                               Multiple processors (multiple RISC, multiple DSP)
                               Many modems (WAN, LAN, PAN)
                               Many modems (WAN, LAN, PAN)
                               Significant multi-media (graphics, video, video)
                               Significant multi-media (graphics, video, video)
                               Many peripherals: wired and wireless: SD, USB, PCIe,…
                               Many peripherals: wired and wireless: SD, USB, PCIe,…
                               Special functions: security, power
                               Special functions: security, power
                               RF, analog mixed signal, digital
                               RF, analog mixed signal, digital
                               A lot of memory
                               A lot of memory
                               SIP (System in Package) or SoC (System on a die)
                               SIP (System in Package) or SoC (System on a die)
                                Concurrency: e.g. modem + GPS + applications + multi-media for
                                 Concurrency: e.g. modem + GPS + applications + multi-media for
                                advanced location basedQ2 ‘06 | April 12, 2006
                                 advanced location based services
                             PAGE 4          QCT QMS Review I services
SW/FW a Significant Part of Wireless Mobile Solutions


                                 • Support multiple OSes
                                 • Millions of lines of SW code
                                      • Comm stack
                                      • Multi-media stack
                                      • Peripheral drivers
                                 • Hard real time, soft real time and non-
                                 real time
                                 • Functionality is increasingly SW
                                 programmable
                                 • Increase in concurrent SW threads in
                                 embedded
                                 • HW-SW interactions must be robust
                                 • Download feature updates may hit
                                 new design functions – how well
                                 tested?
                                 • No longer sufficient for “SW to be
                                 booted”. Extensive HW-SW interaction
                                 verification required.
                                 • Significant SW reuse requirement
                        PAGE 5   QCT QMS Review I Q2 ‘06 | April 12, 2006
Key Challenges & trends of the Mobile Era
 Rich Feature roadmap: Lots of product features in demand
    Many consumers buy new cellphone models every 9-12 months with new features
 Cost is Critical: Highly integrated heterogeneous devices
    Phone + camera + camcorder + music player + PDA + location-based services + push-to-talk + ultra-
    mobile PC
 Power Conscious
    New power reduction schemes have complex functional implications
    Cost is a function of quality (excuse by Philip Crosby)
 Transparent Interoperability critical
    Many communication protocols, on the fly…concurrently
     –   WAN: CDMA2000, UMTS/WCDMA, OFDM, LTE
     –   LAN: WiFi/ OFDM…
     –   PAN/BAN: Bluetooth, USB, UWB, etc.
 Heterogeneous and extremely variable HW architectures to support – higher concurrency
    MCP: Multiple processors/DSPs and HW acceleration. Greatly increasing number of HW and SW
    threads.
     –   Scalable: ability to move task between RISC, DSP, HW
    Increasingly more programmable, yet special purpose (i.e. heterogeneous) HW
    RF/Analog mixed-signal integration
    Non-orthogonal HW (power, security, etc).
    Increased levels of heterogeneous concurrency
     –   Exponential: More threads per functional unit….more units
 Embedded Software complexity growth is even faster than HW
    SIGNIFICANT amount of embedded SW. SW complexity doubles faster than Moore’s Law




                                                   PAGE 6            QCT QMS Review I Q2 ‘06 | April 12, 2006
Wireless Verification: The “Dark Ages”
Golden System Vectors
                Spec            Algorithm
                                Algorithm                                             RTL Verification
                                                                                      RTL Verification
    Cfg/
    DF
                                Validation
                                Validation

  System
   Model     Matlab, SystemC/C++/C


    DUV      Input   Expected
                                 Analysis                                                compare
    cfg       Data    Output

                                                                                                   results
                                                       cfg driver   DF driver           Monitor

 Bit accurate system model used for fixed pt
    modeling of algorithm transformation                                        DUV
       • Matlab
       • C++/SystemC                                 Disadvantages:
                                                         • Lack of reactivity
 “system vectors” pre generated as “golden                • Black-box: generally produces 25-75%
    vectors”
                                                          functional coverage
 Played against DUT with simple bit accurate              • Lack of Functional Coverage
    comparison                                            • Interactions: Reactivity for Complex
                                                          Crosses
                                                          • Controllability/ visibility granularity
                                            PAGE 7        • Lack of support for integration verification
                                                              QCT QMS Review I Q2 ‘06 | April 12, 2006
Wireless Verification: The Modern Era
Model Based
                Spec            Algorithm
                                Algorithm                                            RTL Verification
                                                                                     RTL Verification
    Cfg/
    DF
                                Validation
                                Validation
                                                                          wavefrm    algorithm   C/xaction
                                                            Tests         debugger   debugger    debugger

  System
   Model     Matlab, SystemC/C++/C                                     Constraints Assertions
                                                          Generator



    DUV      Input   Expected
    cfg       Data    Output                                            Self-Check
                                                                         Cov mdl        Transactor
                                                                                         compare
                                                                                                             Coverage
                                                                        System Mdl                           Database
                                                                         Reference
                     Analysis                                              Model
                                                    cfg xactor   DF xactor               Monitor             Xaction
                                                                        Watch pts                             Level
                                                                                                               Log
 Bit accurate system model used for fixed pt
    modeling of algorithm transformation                                    DUV
       • Matlab
       • C++/SystemC                              Advantages:
       • Integrated Analysis (not just stand          • Reactive to temporal variations in DUV
       alone)                                         •Tends to foster other verification
 Reuse the model, not system vectors
                                                      enhancements: assertions at different levels
 Spec becomes:
    - model
                                                      of integration & abstraction
    - constraints                                     • Enables achievement of 100% coverage
    - assertions                                      • Support successive integration verification &
                                                      debug
                                         PAGE 8
                                                      • Caveat:Review I Q2 ‘06 | April planned modelling strategy
                                                          QCT QMS
                                                                  Requires 12, 2006
Results: Constraint-based (CB)/Directed Random + ABV Works!

                                                                                                             6K VFE Cumulative Defects




                                        Golden Vectors
Percentage of bugs detected                                                           16

        by Method                                                                     14




                                                               Cumulative CR Count
                                                                                      12

 Control Dominant                                                                     10                                                   CRITICAL
                                                                                                                                           HIGH
                                                                                       8
 Assertions
 Assertions                30%
                           30%                                                                                                             MEDIUM
 Scoreboard Checkers
 Scoreboard Checkers       61%
                           61%                                                         6                                                   LOW

 Linting
 Linting                    4%
                            4%                                                         4

 Other
 Other                      5%
                            5%                                                         2

                                                                                       0
 Dataflow Dominant




                                                                                     De 04




                                                                                     De 5
                                                                                     Ap 4




                                                                                     Ap 5




                                                                                     Ap 6
                                                                                     Ju 4


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                                                                                     Ju 5


                                                                                      O 5




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                                                                                     Au 4




                                                                                     Au 5




                                                                                           06
                                                                                     Fe 3




                                                                                     Fe 4




                                                                                     Fe 5
                                                                                           0




                                                                                           0




                                                                                          -0



                                                                                           0
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                                                                                           0
                                                                                        r-0




                                                                                        r-0




                                                                                        r-0
                                                                                           0




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                                                                                           0
                                                                                           0




                                                                                           0
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                                                                                        c-




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                                                                                       ct




                                                                                       ct
 Assertions                20%




                                                                                     De
 Assertions                20%

                                        HVL Constraint-based
 Scoreboard Checkers
 Scoreboard Checkers       72%
                           72%                                                                               7K VFE Cumulative Defects
 Linting
 Linting                    3%
                            3%
 Other
 Other                      5%
                            5%                                                         20
                                                                                       18
                                                                                            Less than ½ the time to stabilize
                                                                                       16
                                                               Cumulative CR Count


Significant reduction in post silicon                                                  14
                                                                                                                                           CRITICAL
                                                                                       12
defects                                                                                10
                                                                                                                                           HIGH
                                                                                                                                           MEDIUM
                                                                                       8
Faster time to stability                                                               6
                                                                                                                                           LOW


Increased predictability                                                               4
                                                                                       2
                                                                                       0
                                                                                             4




                                                                                                                                    5
                                                                                            05




                                                                                                                                   06
                                                                                            05
                                                                                             5




                                                                                                                                    6
                                                                                            05




                                                                                                                                   06
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                                   PAGE 9                                                       QCT QMS Review I Q2 ‘06 | April 12, 2006
Verification of RF/AMS – Digital (“Big D/Little a”)
PMIC
            SSBI                                                           padring
                                       Digital
                                                                           UARTs/
                                                                           UIMs
                    CLK Out                                                                       Behavioral
       CLK Gen                                                                                    Model/
                                                                             Camif                Monitor
                                 SSBI                                       Interface

                                                                              USB
                                 PLL
        Rx/Tx SSBI                                         ARM926EJ

                                                                            UXMC                Memory
     Quad                       Tx DAC
     Mod
                                                                              SD                 SD
        Wideband                        CDMA/GPS                            Interface            Model
         Stereo                         Processors
         Codec
        A/D                                      QDSP4000
                                                                                                   Testplan
                                                                                                   Testplan
   High Linearity
      A/D                       Rx Buff
                                                                         Connectivity
                                                                         Connectivity
                                                                           Mode Select
                                Driver                                                                Config
                                                                           Interface withMode Select
                                                                            Match with the pin list of the digital die
                                                                             Match Ext the pin list of the digital die
                                                                                                      Model
Analog/RF
                                                  General
                                                  Purpose
                                                  Interface
                                                                            Ability to toggle all the interconnections
                                                                                                      JTAG interconnections
                                                                            Interface to toggle all the
                                                                             Ability Digital Test Bus Model
                                                                              JTAG

                                                                            Validate polarities
                                                                            Validate polarities
                                                   GPIO
                                                                         Interactivity
                                                                         Interactivity
                                                   Model                    Point-to-point
                                                                            Point-to-point
                                                                            End-to-end (chain)
                                                                            End-to-end (chain)
                                                                            Full mission mode
                                                                            Full mission mode
                               RF/                                          Concurrency
                                                                            Concurrency
             RF/              analog              Digital
                                                                         Systems Scenarios
                                                                         Systems Scenarios
             AMS                                  (MSM)                     All functional and structural configurations
                                                                            All functional and structural configurations
             Flow             Digital              Flow                     Support other components for common modes of
                                                                            Support other components for common modes of
                              I/F Mdl                                       operation
                                                                            operation
                                                               PAGE 10      MultipleReview I Q2 ‘06 | Aprilchains
                                                                            Multiple concurrent chains
                                                                              QCT QMS concurrent 12, 2006
Implications of Power Management on Verification




                                                                    Medium




                                        Courtesy: Cadence Design Automation public white paper



     Complex power management techniques: dynamic voltage and
     frequency scaling, multi-Vt, head/foot switches, multiple voltage
     islands…etc are increasing design and verification complexity
     Interactions between functionality and physical power management not
     always obvious and require new methodologies
     Effects have “analogish” look to them (continuous voltage)
     HW-SW power interactions must be considered as well



                             PAGE 11     QCT QMS Review I Q2 ‘06 | April 12, 2006
Summary: Are You Ready?
 The Mobile Era presents many challenges and opportunities for DV engineers
    Convergence of communications (WAN, LAN, PAN), multimedia, peripherals (wired and
    wireless), processors, SoC/SIP
    Hybrid technologies: RF, AMS, logic, memory
    Multiple challenges to deal with
    – Power, security
 Looks familiar?
    Confluence of domains and problems from processor, networking and other applications
    Requires advances in design & verification methods
 Key Trends
    Integration
    Heterogeneity
    Interoperability of different things
    Concurrency
 Know what you are verifying!
    Learn domains
    Domains have similarities
    Depth and breadth



                                       PAGE 12   QCT QMS Review I Q2 ‘06 | April 12, 2006
Roberto Padovani's (QCOM CTO) favorite quote:
        “If it isn’t tested, it doesn’t work”
                   Dr. Klein Gilhousen (Qualcomm Co-founder)



                                              Thank you!

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Verification of Wireless SoCs: No Longer in the Dark Ages

  • 1. J. Scott Runner Sr. Director of Design Verification Verification of Wireless SoCs: No Longer in the Dark Ages
  • 2. Talk Outline The Mobile Device Era What’s in a highly integrated wireless chipset today? Challenges and Opportunities in the Mobile Era Traditional Wireless Verification Next Generation Wireless Verification Summary: Are you ready? “If it isn’t tested, it doesn’t work” Dr. Klein Gilhousen (Qualcomm Co-founder) Dr. Roberto Padovani (Qualcomm CTO) PAGE 2 QCT QMS Review I Q2 ‘06 | April 12, 2006
  • 3. Exit: The PC Era, Entering: the Mobile Device Era Highly integrated, Highly Heterogeneous, Interoperable PAGE 3 QCT QMS Review I Q2 ‘06 | April 12, 2006
  • 4. Today’s Highly Integrated Wireless Devices WAN Modems (CDMA, Application RF PM UMTS…) RISC GSM/GPRS GPS WLAN/PAN 3D Graphics Modems DSP Hi res Video Audio Memory Peripherals Multiple processors (multiple RISC, multiple DSP) Multiple processors (multiple RISC, multiple DSP) Many modems (WAN, LAN, PAN) Many modems (WAN, LAN, PAN) Significant multi-media (graphics, video, video) Significant multi-media (graphics, video, video) Many peripherals: wired and wireless: SD, USB, PCIe,… Many peripherals: wired and wireless: SD, USB, PCIe,… Special functions: security, power Special functions: security, power RF, analog mixed signal, digital RF, analog mixed signal, digital A lot of memory A lot of memory SIP (System in Package) or SoC (System on a die) SIP (System in Package) or SoC (System on a die) Concurrency: e.g. modem + GPS + applications + multi-media for Concurrency: e.g. modem + GPS + applications + multi-media for advanced location basedQ2 ‘06 | April 12, 2006 advanced location based services PAGE 4 QCT QMS Review I services
  • 5. SW/FW a Significant Part of Wireless Mobile Solutions • Support multiple OSes • Millions of lines of SW code • Comm stack • Multi-media stack • Peripheral drivers • Hard real time, soft real time and non- real time • Functionality is increasingly SW programmable • Increase in concurrent SW threads in embedded • HW-SW interactions must be robust • Download feature updates may hit new design functions – how well tested? • No longer sufficient for “SW to be booted”. Extensive HW-SW interaction verification required. • Significant SW reuse requirement PAGE 5 QCT QMS Review I Q2 ‘06 | April 12, 2006
  • 6. Key Challenges & trends of the Mobile Era Rich Feature roadmap: Lots of product features in demand Many consumers buy new cellphone models every 9-12 months with new features Cost is Critical: Highly integrated heterogeneous devices Phone + camera + camcorder + music player + PDA + location-based services + push-to-talk + ultra- mobile PC Power Conscious New power reduction schemes have complex functional implications Cost is a function of quality (excuse by Philip Crosby) Transparent Interoperability critical Many communication protocols, on the fly…concurrently – WAN: CDMA2000, UMTS/WCDMA, OFDM, LTE – LAN: WiFi/ OFDM… – PAN/BAN: Bluetooth, USB, UWB, etc. Heterogeneous and extremely variable HW architectures to support – higher concurrency MCP: Multiple processors/DSPs and HW acceleration. Greatly increasing number of HW and SW threads. – Scalable: ability to move task between RISC, DSP, HW Increasingly more programmable, yet special purpose (i.e. heterogeneous) HW RF/Analog mixed-signal integration Non-orthogonal HW (power, security, etc). Increased levels of heterogeneous concurrency – Exponential: More threads per functional unit….more units Embedded Software complexity growth is even faster than HW SIGNIFICANT amount of embedded SW. SW complexity doubles faster than Moore’s Law PAGE 6 QCT QMS Review I Q2 ‘06 | April 12, 2006
  • 7. Wireless Verification: The “Dark Ages” Golden System Vectors Spec Algorithm Algorithm RTL Verification RTL Verification Cfg/ DF Validation Validation System Model Matlab, SystemC/C++/C DUV Input Expected Analysis compare cfg Data Output results cfg driver DF driver Monitor Bit accurate system model used for fixed pt modeling of algorithm transformation DUV • Matlab • C++/SystemC Disadvantages: • Lack of reactivity “system vectors” pre generated as “golden • Black-box: generally produces 25-75% vectors” functional coverage Played against DUT with simple bit accurate • Lack of Functional Coverage comparison • Interactions: Reactivity for Complex Crosses • Controllability/ visibility granularity PAGE 7 • Lack of support for integration verification QCT QMS Review I Q2 ‘06 | April 12, 2006
  • 8. Wireless Verification: The Modern Era Model Based Spec Algorithm Algorithm RTL Verification RTL Verification Cfg/ DF Validation Validation wavefrm algorithm C/xaction Tests debugger debugger debugger System Model Matlab, SystemC/C++/C Constraints Assertions Generator DUV Input Expected cfg Data Output Self-Check Cov mdl Transactor compare Coverage System Mdl Database Reference Analysis Model cfg xactor DF xactor Monitor Xaction Watch pts Level Log Bit accurate system model used for fixed pt modeling of algorithm transformation DUV • Matlab • C++/SystemC Advantages: • Integrated Analysis (not just stand • Reactive to temporal variations in DUV alone) •Tends to foster other verification Reuse the model, not system vectors enhancements: assertions at different levels Spec becomes: - model of integration & abstraction - constraints • Enables achievement of 100% coverage - assertions • Support successive integration verification & debug PAGE 8 • Caveat:Review I Q2 ‘06 | April planned modelling strategy QCT QMS Requires 12, 2006
  • 9. Results: Constraint-based (CB)/Directed Random + ABV Works! 6K VFE Cumulative Defects Golden Vectors Percentage of bugs detected 16 by Method 14 Cumulative CR Count 12 Control Dominant 10 CRITICAL HIGH 8 Assertions Assertions 30% 30% MEDIUM Scoreboard Checkers Scoreboard Checkers 61% 61% 6 LOW Linting Linting 4% 4% 4 Other Other 5% 5% 2 0 Dataflow Dominant De 04 De 5 Ap 4 Ap 5 Ap 6 Ju 4 O 4 Ju 5 O 5 Ju 6 Au 4 Au 5 06 Fe 3 Fe 4 Fe 5 0 0 -0 0 0 0 r-0 r-0 r-0 0 0 0 0 0 - b- b- b- g- g- c- n- n- n- c- c- ct ct Assertions 20% De Assertions 20% HVL Constraint-based Scoreboard Checkers Scoreboard Checkers 72% 72% 7K VFE Cumulative Defects Linting Linting 3% 3% Other Other 5% 5% 20 18 Less than ½ the time to stabilize 16 Cumulative CR Count Significant reduction in post silicon 14 CRITICAL 12 defects 10 HIGH MEDIUM 8 Faster time to stability 6 LOW Increased predictability 4 2 0 4 5 05 06 05 5 6 05 06 04 05 -0 -0 r-0 r-0 b- b- g- c- c- n- n- ct ct Ap Ap Fe Fe Au De De Ju Ju O O PAGE 9 QCT QMS Review I Q2 ‘06 | April 12, 2006
  • 10. Verification of RF/AMS – Digital (“Big D/Little a”) PMIC SSBI padring Digital UARTs/ UIMs CLK Out Behavioral CLK Gen Model/ Camif Monitor SSBI Interface USB PLL Rx/Tx SSBI ARM926EJ UXMC Memory Quad Tx DAC Mod SD SD Wideband CDMA/GPS Interface Model Stereo Processors Codec A/D QDSP4000 Testplan Testplan High Linearity A/D Rx Buff Connectivity Connectivity Mode Select Driver Config Interface withMode Select Match with the pin list of the digital die Match Ext the pin list of the digital die Model Analog/RF General Purpose Interface Ability to toggle all the interconnections JTAG interconnections Interface to toggle all the Ability Digital Test Bus Model JTAG Validate polarities Validate polarities GPIO Interactivity Interactivity Model Point-to-point Point-to-point End-to-end (chain) End-to-end (chain) Full mission mode Full mission mode RF/ Concurrency Concurrency RF/ analog Digital Systems Scenarios Systems Scenarios AMS (MSM) All functional and structural configurations All functional and structural configurations Flow Digital Flow Support other components for common modes of Support other components for common modes of I/F Mdl operation operation PAGE 10 MultipleReview I Q2 ‘06 | Aprilchains Multiple concurrent chains QCT QMS concurrent 12, 2006
  • 11. Implications of Power Management on Verification Medium Courtesy: Cadence Design Automation public white paper Complex power management techniques: dynamic voltage and frequency scaling, multi-Vt, head/foot switches, multiple voltage islands…etc are increasing design and verification complexity Interactions between functionality and physical power management not always obvious and require new methodologies Effects have “analogish” look to them (continuous voltage) HW-SW power interactions must be considered as well PAGE 11 QCT QMS Review I Q2 ‘06 | April 12, 2006
  • 12. Summary: Are You Ready? The Mobile Era presents many challenges and opportunities for DV engineers Convergence of communications (WAN, LAN, PAN), multimedia, peripherals (wired and wireless), processors, SoC/SIP Hybrid technologies: RF, AMS, logic, memory Multiple challenges to deal with – Power, security Looks familiar? Confluence of domains and problems from processor, networking and other applications Requires advances in design & verification methods Key Trends Integration Heterogeneity Interoperability of different things Concurrency Know what you are verifying! Learn domains Domains have similarities Depth and breadth PAGE 12 QCT QMS Review I Q2 ‘06 | April 12, 2006
  • 13. Roberto Padovani's (QCOM CTO) favorite quote: “If it isn’t tested, it doesn’t work” Dr. Klein Gilhousen (Qualcomm Co-founder) Thank you!