Analyze the structural and spectroscopic properties of nanostructured GaN: ZnO Solid solution. For this, we used techniques like X-Ray Diffraction (XRD) for phase identification and analyzing the crystalline structure of the material, Diffuse Reflectance Spectroscopy (DRS) for measuring the characteristic reflectance spectrum which contains information about the optical properties and structure of the sample being measured. The characterizations conducted showed the incorporation of Ga and N ions in ZnO framework and a resulting modification in bandgap.