The document discusses Chroma ATE Inc., a leading supplier of test and measurement instrumentation. It provides an overview of Chroma, describing its founding, markets served, vision, global presence, and investment in R&D. The document then introduces several of Chroma's LED testing solutions, including automated wafer probers, in-line production test systems, and modules for electrical and optical measurement.
Hướng dẫn sử dụng máy đo điện áp Testo 750
https://testostore.vn/san-pham/may-do-dien-ap-testo-750-1/
https://testostore.vn/san-pham/may-do-dien-ap-testo-750-2/
https://testostore.vn/san-pham/may-do-dien-ap-testo-750-3/
https://testostore.vn/danh-muc/do-dien/may-do-dien-ap/
Electrical test equipment for high and low voltage systems. Phasing rods, ammeter for overhead powerlines on
systems up to 36kV. Hubungi PT. Siwali Swantika, Jakarta Office : 021-45850618 atau Surabaya Office : 031-8421264
Electrical Equipment in Medical PracticeNorthwest EMC
Steve Hayes, General Manager of Element Materials Technology, reviews the IEC 60601-1 Series of Medical Equipment Standards.
Learn more at:
http://www.nwemc.com/news/2016/07/07/medical-emc-%E2%80%93-details-of-iec-60601-1-22014-edition-4
Isolation is an integral part of many modern applications from medical to instrumentation to industrial. Most applications require the designer to integrate isolation in the design while improving performance, saving board space, increasing reliability levels, reducing power consumption, and, of course, cutting cost. This session provides an understanding of various isolator technologies, and offers suggestions on how to address such stringent design objectives.
Hướng dẫn sử dụng máy đo điện áp Testo 750
https://testostore.vn/san-pham/may-do-dien-ap-testo-750-1/
https://testostore.vn/san-pham/may-do-dien-ap-testo-750-2/
https://testostore.vn/san-pham/may-do-dien-ap-testo-750-3/
https://testostore.vn/danh-muc/do-dien/may-do-dien-ap/
Electrical test equipment for high and low voltage systems. Phasing rods, ammeter for overhead powerlines on
systems up to 36kV. Hubungi PT. Siwali Swantika, Jakarta Office : 021-45850618 atau Surabaya Office : 031-8421264
Electrical Equipment in Medical PracticeNorthwest EMC
Steve Hayes, General Manager of Element Materials Technology, reviews the IEC 60601-1 Series of Medical Equipment Standards.
Learn more at:
http://www.nwemc.com/news/2016/07/07/medical-emc-%E2%80%93-details-of-iec-60601-1-22014-edition-4
Isolation is an integral part of many modern applications from medical to instrumentation to industrial. Most applications require the designer to integrate isolation in the design while improving performance, saving board space, increasing reliability levels, reducing power consumption, and, of course, cutting cost. This session provides an understanding of various isolator technologies, and offers suggestions on how to address such stringent design objectives.
Product Safety Testing Reduces the Risk of Shock, Fire, ExplosionsSam Davis
Product Safety Testing
Reduces the Risk of
Shock, Fire, Explosions
Dave Lohbeck
as presented to the Central Texas Product Safety Engineering Society (PSES)
Data Teknis Gossen Metrawatt Installation Tester : PROFITEST PRIME | PRIME ACPT. Siwali Swantika
Pemesanan produk, hubungi PT Siwali Swantika melalui WhatsApp, Jakarta : 0811-1519-949 (chat only) | Surabaya : 0811-1519-948 (chat only). Kunjungi website kami di www.siwali.com, untuk detail informasi spesifikasi dan model alat.
Dr. Simon Hindle, Manager of Radio Applications Engineering at Element Materials Technology, covers the most recent updates with the Radio Equipment Directive, or RED. Learn more at http://www.nwemc.com/news/2016/12/09/rtte-vs-the-radio-equipment-directive-red
Hướng dẫn sử dụng máy kiểm tra pin ắc quy Tenmars TM-6002Tenmars Việt Nam
Hướng dẫn sử dụng máy kiểm tra pin ắc quy Tenmars TM-6002
https://tenmars.vn/san-pham/may-kiem-tra-pin-ac-quy-tenmars-tm-6002/
https://tenmars.vn/danh-muc/may-kiem-tra-ac-quy-pin-tenmars/
Pemesanan produk, hubungi PT Siwali Swantika melalui WhatsApp, Jakarta : 0811-1519-949 (chat only) | Surabaya : 0811-1519-948 (chat only). Kunjungi website kami di www.siwali.com, untuk detail informasi spesifikasi dan model alat.
CED CleanLinks Forum Feb. 9, 2012 -- ABB Technology VenturesCEDPrograms
CleanLinks Forums are a partnership between SJF Institute and CED, offering education and practical business advice to cleantech entrepreneurs through moderated discussions, expert panels, and first-person stories from fellow entrepreneurs. Each CleanLinks Forum concludes with a CleanLinks networking reception.
Global energy innovation_ec1000_electro_chemical_battery_analyzers_datasheetAngus Sankaran
GEI EC1000 Handheld ElectroChemical Battery Analyzer -
in
Share
CELScan technology allows for the rapid, multi-frequency scanning of batteries
Available for sales, rent, lease and hire @ http://www.supremetechnology.com.au/product/global-energy-innovation-ec1000-handheld-electrochemical-battery-analyzer.aspx?Id=273&ProductType=
Pacorr Melt Flow Index tester is used for evaluating the flow properties of molten plastics or resins. The Melt flow Index
of thermoplastic materials is defined as the rate of flow (in grams per ten minutes) of extrudates of molten resins through a
jet of a particular length and diameter.
“Conation Technologies” are committed to offer quality control lab equipment like Metallurgical
and Mechanical Testing Machines to our customers with latest and best technologies at affordable prices.
Our product range includes Metallurgical Microscopes, Universal Microscopes, Portable Microscopes,
Stereozooms, Metallurgical Image Analyzer, Image Analyzers for welding analysis, fibre analysis,
clinker analysis etc., Cleanliness (Millipore Filter Paper) Analysis System, Microhardness Testers,Metallurgical Sample Preparation Machines, Mechanical Testing Machines,Jominy End Quench Test set-up, and Special Purpose Machines.
Data Teknis Gossen Metrawatt Insulation Tester METRISO PROPT. Siwali Swantika
Pemesanan produk, hubungi PT Siwali Swantika melalui WhatsApp, Jakarta : 0811-1519-949 (chat only) | Surabaya : 0811-1519-948 (chat only). Kunjungi website kami di www.siwali.com, untuk detail informasi spesifikasi dan model alat.
Product Safety Testing Reduces the Risk of Shock, Fire, ExplosionsSam Davis
Product Safety Testing
Reduces the Risk of
Shock, Fire, Explosions
Dave Lohbeck
as presented to the Central Texas Product Safety Engineering Society (PSES)
Data Teknis Gossen Metrawatt Installation Tester : PROFITEST PRIME | PRIME ACPT. Siwali Swantika
Pemesanan produk, hubungi PT Siwali Swantika melalui WhatsApp, Jakarta : 0811-1519-949 (chat only) | Surabaya : 0811-1519-948 (chat only). Kunjungi website kami di www.siwali.com, untuk detail informasi spesifikasi dan model alat.
Dr. Simon Hindle, Manager of Radio Applications Engineering at Element Materials Technology, covers the most recent updates with the Radio Equipment Directive, or RED. Learn more at http://www.nwemc.com/news/2016/12/09/rtte-vs-the-radio-equipment-directive-red
Hướng dẫn sử dụng máy kiểm tra pin ắc quy Tenmars TM-6002Tenmars Việt Nam
Hướng dẫn sử dụng máy kiểm tra pin ắc quy Tenmars TM-6002
https://tenmars.vn/san-pham/may-kiem-tra-pin-ac-quy-tenmars-tm-6002/
https://tenmars.vn/danh-muc/may-kiem-tra-ac-quy-pin-tenmars/
Pemesanan produk, hubungi PT Siwali Swantika melalui WhatsApp, Jakarta : 0811-1519-949 (chat only) | Surabaya : 0811-1519-948 (chat only). Kunjungi website kami di www.siwali.com, untuk detail informasi spesifikasi dan model alat.
CED CleanLinks Forum Feb. 9, 2012 -- ABB Technology VenturesCEDPrograms
CleanLinks Forums are a partnership between SJF Institute and CED, offering education and practical business advice to cleantech entrepreneurs through moderated discussions, expert panels, and first-person stories from fellow entrepreneurs. Each CleanLinks Forum concludes with a CleanLinks networking reception.
Global energy innovation_ec1000_electro_chemical_battery_analyzers_datasheetAngus Sankaran
GEI EC1000 Handheld ElectroChemical Battery Analyzer -
in
Share
CELScan technology allows for the rapid, multi-frequency scanning of batteries
Available for sales, rent, lease and hire @ http://www.supremetechnology.com.au/product/global-energy-innovation-ec1000-handheld-electrochemical-battery-analyzer.aspx?Id=273&ProductType=
Pacorr Melt Flow Index tester is used for evaluating the flow properties of molten plastics or resins. The Melt flow Index
of thermoplastic materials is defined as the rate of flow (in grams per ten minutes) of extrudates of molten resins through a
jet of a particular length and diameter.
“Conation Technologies” are committed to offer quality control lab equipment like Metallurgical
and Mechanical Testing Machines to our customers with latest and best technologies at affordable prices.
Our product range includes Metallurgical Microscopes, Universal Microscopes, Portable Microscopes,
Stereozooms, Metallurgical Image Analyzer, Image Analyzers for welding analysis, fibre analysis,
clinker analysis etc., Cleanliness (Millipore Filter Paper) Analysis System, Microhardness Testers,Metallurgical Sample Preparation Machines, Mechanical Testing Machines,Jominy End Quench Test set-up, and Special Purpose Machines.
Data Teknis Gossen Metrawatt Insulation Tester METRISO PROPT. Siwali Swantika
Pemesanan produk, hubungi PT Siwali Swantika melalui WhatsApp, Jakarta : 0811-1519-949 (chat only) | Surabaya : 0811-1519-948 (chat only). Kunjungi website kami di www.siwali.com, untuk detail informasi spesifikasi dan model alat.
Schneider,
Catalog Thiết Bị Điện Schneider, Catalog Thiết Bị Điện
Catalog Phụ Kiện Schneider, Catalog Phụ Kiện,
Catalog Schneider, Catalog,
https://www.dienhathe.com,
Chi tiết các sản phẩm khác của Schneider tại https://dienhathe.com
Xem thêm các Catalog khác của Schneider tại https://dienhathe.info
Để nhận báo giá sản phẩm Schneider vui lòng gọi: 0907.764.966
Schneider,
Catalog Thiết Bị Điện Schneider, Catalog Thiết Bị Điện,
Catalog Phụ Kiện Schneider, Catalog Phụ Kiện,
Catalog Schneider, Catalog,
http://dienhathe.com,
Chi tiết các sản phẩm khác của Schneider tại https://dienhathe.com
Xem thêm các Catalog khác của Schneider tại https://dienhathe.info
Để nhận báo giá sản phẩm Schneider vui lòng gọi: 0907.764.966
Schneider,
Catalog Thiết Bị Điện Schneider, Catalog Thiết Bị Điện
Catalog Phụ Kiện Schneider, Catalog Phụ Kiện,
Catalog Schneider, Catalog,
https://www.dienhathe.com,
Chi tiết các sản phẩm khác của Schneider tại https://dienhathe.com
Xem thêm các Catalog khác của Schneider tại https://dienhathe.info
Để nhận báo giá sản phẩm Schneider vui lòng gọi: 0907.764.966
CÔNG TY CỔ PHẦN THIẾT BỊ ĐIỆN HOÀNG PHƯƠNG
Địa chỉ: Số 10, ngõ 44, phố Võ Thị Sáu, P.Thanh Nhàn, Q.Hai Bà Trưng, TP. Hà Nội
MST: 0106798886
Điện thoại: 024.3215.1322
Website : Hoangphuongjsc.com
Phone/Zalo : 0944 240 317 / Kinhdoanh1.hpe@gmail.com
Phone/Zalo : 0975 123 698 / Kinhdoanh2.hpe@gmail.com
Phone/Zalo : 0961 008 858 / Kinhdoanh3.hpe@gmail.com
CÔNG TY CỔ PHẦN THIẾT BỊ ĐIỆN HOÀNG PHƯƠNG
Địa chỉ: Số 10, ngõ 44, phố Võ Thị Sáu, P.Thanh Nhàn, Q.Hai Bà Trưng, TP. Hà Nội
MST: 0106798886
Điện thoại: 024.3215.1322
Website : Hoangphuongjsc.com
Phone/Zalo : 0944 240 317 / Kinhdoanh1.hpe@gmail.com
Phone/Zalo : 0975 123 698 / Kinhdoanh2.hpe@gmail.com
Phone/Zalo : 0961 008 858 / Kinhdoanh3.hpe@gmail.com
Buy Off Grid Solar Inverter & MPPT Solar Inverter in India.pptxEnertech UPS
Discover the finest Off-grid solar inverters without battery and MPPT solar inverters equipped with power backup solutions at unbeatable prices in India. Embrace the solar revolution today with Enertech UPS, where cutting-edge technology meets affordability. Harness the power of the sun to fuel your energy needs efficiently and sustainably. Visit our website to explore our range of products and take a step towards a greener, more eco-friendly future.
URL: [https://enertechups.com/product/solar-off-grid-inverter]
(http://www.zealcalibrator.com) We are successfully emerged as leading manufacturer & exporter of Electronic Test & Measuring Instruments. Well recognized for precision and accuracy, these find extensive usage in Electrical, Electronic Industries, Calibration as well as Testing laboratories. Our experience of 15 years also allows us to successfully handling demands of Calibrators, Panel Meters, Power Sources and Testers. Other than this, we also offer Repairing & Calibration Services for Electronic Test and measuring Instruments.
UiPath Test Automation using UiPath Test Suite series, part 3DianaGray10
Welcome to UiPath Test Automation using UiPath Test Suite series part 3. In this session, we will cover desktop automation along with UI automation.
Topics covered:
UI automation Introduction,
UI automation Sample
Desktop automation flow
Pradeep Chinnala, Senior Consultant Automation Developer @WonderBotz and UiPath MVP
Deepak Rai, Automation Practice Lead, Boundaryless Group and UiPath MVP
LF Energy Webinar: Electrical Grid Modelling and Simulation Through PowSyBl -...DanBrown980551
Do you want to learn how to model and simulate an electrical network from scratch in under an hour?
Then welcome to this PowSyBl workshop, hosted by Rte, the French Transmission System Operator (TSO)!
During the webinar, you will discover the PowSyBl ecosystem as well as handle and study an electrical network through an interactive Python notebook.
PowSyBl is an open source project hosted by LF Energy, which offers a comprehensive set of features for electrical grid modelling and simulation. Among other advanced features, PowSyBl provides:
- A fully editable and extendable library for grid component modelling;
- Visualization tools to display your network;
- Grid simulation tools, such as power flows, security analyses (with or without remedial actions) and sensitivity analyses;
The framework is mostly written in Java, with a Python binding so that Python developers can access PowSyBl functionalities as well.
What you will learn during the webinar:
- For beginners: discover PowSyBl's functionalities through a quick general presentation and the notebook, without needing any expert coding skills;
- For advanced developers: master the skills to efficiently apply PowSyBl functionalities to your real-world scenarios.
Smart TV Buyer Insights Survey 2024 by 91mobiles.pdf91mobiles
91mobiles recently conducted a Smart TV Buyer Insights Survey in which we asked over 3,000 respondents about the TV they own, aspects they look at on a new TV, and their TV buying preferences.
Accelerate your Kubernetes clusters with Varnish CachingThijs Feryn
A presentation about the usage and availability of Varnish on Kubernetes. This talk explores the capabilities of Varnish caching and shows how to use the Varnish Helm chart to deploy it to Kubernetes.
This presentation was delivered at K8SUG Singapore. See https://feryn.eu/presentations/accelerate-your-kubernetes-clusters-with-varnish-caching-k8sug-singapore-28-2024 for more details.
The Art of the Pitch: WordPress Relationships and SalesLaura Byrne
Clients don’t know what they don’t know. What web solutions are right for them? How does WordPress come into the picture? How do you make sure you understand scope and timeline? What do you do if sometime changes?
All these questions and more will be explored as we talk about matching clients’ needs with what your agency offers without pulling teeth or pulling your hair out. Practical tips, and strategies for successful relationship building that leads to closing the deal.
Epistemic Interaction - tuning interfaces to provide information for AI supportAlan Dix
Paper presented at SYNERGY workshop at AVI 2024, Genoa, Italy. 3rd June 2024
https://alandix.com/academic/papers/synergy2024-epistemic/
As machine learning integrates deeper into human-computer interactions, the concept of epistemic interaction emerges, aiming to refine these interactions to enhance system adaptability. This approach encourages minor, intentional adjustments in user behaviour to enrich the data available for system learning. This paper introduces epistemic interaction within the context of human-system communication, illustrating how deliberate interaction design can improve system understanding and adaptation. Through concrete examples, we demonstrate the potential of epistemic interaction to significantly advance human-computer interaction by leveraging intuitive human communication strategies to inform system design and functionality, offering a novel pathway for enriching user-system engagements.
UiPath Test Automation using UiPath Test Suite series, part 4DianaGray10
Welcome to UiPath Test Automation using UiPath Test Suite series part 4. In this session, we will cover Test Manager overview along with SAP heatmap.
The UiPath Test Manager overview with SAP heatmap webinar offers a concise yet comprehensive exploration of the role of a Test Manager within SAP environments, coupled with the utilization of heatmaps for effective testing strategies.
Participants will gain insights into the responsibilities, challenges, and best practices associated with test management in SAP projects. Additionally, the webinar delves into the significance of heatmaps as a visual aid for identifying testing priorities, areas of risk, and resource allocation within SAP landscapes. Through this session, attendees can expect to enhance their understanding of test management principles while learning practical approaches to optimize testing processes in SAP environments using heatmap visualization techniques
What will you get from this session?
1. Insights into SAP testing best practices
2. Heatmap utilization for testing
3. Optimization of testing processes
4. Demo
Topics covered:
Execution from the test manager
Orchestrator execution result
Defect reporting
SAP heatmap example with demo
Speaker:
Deepak Rai, Automation Practice Lead, Boundaryless Group and UiPath MVP
Kubernetes & AI - Beauty and the Beast !?! @KCD Istanbul 2024Tobias Schneck
As AI technology is pushing into IT I was wondering myself, as an “infrastructure container kubernetes guy”, how get this fancy AI technology get managed from an infrastructure operational view? Is it possible to apply our lovely cloud native principals as well? What benefit’s both technologies could bring to each other?
Let me take this questions and provide you a short journey through existing deployment models and use cases for AI software. On practical examples, we discuss what cloud/on-premise strategy we may need for applying it to our own infrastructure to get it to work from an enterprise perspective. I want to give an overview about infrastructure requirements and technologies, what could be beneficial or limiting your AI use cases in an enterprise environment. An interactive Demo will give you some insides, what approaches I got already working for real.
GDG Cloud Southlake #33: Boule & Rebala: Effective AppSec in SDLC using Deplo...James Anderson
Effective Application Security in Software Delivery lifecycle using Deployment Firewall and DBOM
The modern software delivery process (or the CI/CD process) includes many tools, distributed teams, open-source code, and cloud platforms. Constant focus on speed to release software to market, along with the traditional slow and manual security checks has caused gaps in continuous security as an important piece in the software supply chain. Today organizations feel more susceptible to external and internal cyber threats due to the vast attack surface in their applications supply chain and the lack of end-to-end governance and risk management.
The software team must secure its software delivery process to avoid vulnerability and security breaches. This needs to be achieved with existing tool chains and without extensive rework of the delivery processes. This talk will present strategies and techniques for providing visibility into the true risk of the existing vulnerabilities, preventing the introduction of security issues in the software, resolving vulnerabilities in production environments quickly, and capturing the deployment bill of materials (DBOM).
Speakers:
Bob Boule
Robert Boule is a technology enthusiast with PASSION for technology and making things work along with a knack for helping others understand how things work. He comes with around 20 years of solution engineering experience in application security, software continuous delivery, and SaaS platforms. He is known for his dynamic presentations in CI/CD and application security integrated in software delivery lifecycle.
Gopinath Rebala
Gopinath Rebala is the CTO of OpsMx, where he has overall responsibility for the machine learning and data processing architectures for Secure Software Delivery. Gopi also has a strong connection with our customers, leading design and architecture for strategic implementations. Gopi is a frequent speaker and well-known leader in continuous delivery and integrating security into software delivery.
Transcript: Selling digital books in 2024: Insights from industry leaders - T...BookNet Canada
The publishing industry has been selling digital audiobooks and ebooks for over a decade and has found its groove. What’s changed? What has stayed the same? Where do we go from here? Join a group of leading sales peers from across the industry for a conversation about the lessons learned since the popularization of digital books, best practices, digital book supply chain management, and more.
Link to video recording: https://bnctechforum.ca/sessions/selling-digital-books-in-2024-insights-from-industry-leaders/
Presented by BookNet Canada on May 28, 2024, with support from the Department of Canadian Heritage.
Dev Dives: Train smarter, not harder – active learning and UiPath LLMs for do...UiPathCommunity
💥 Speed, accuracy, and scaling – discover the superpowers of GenAI in action with UiPath Document Understanding and Communications Mining™:
See how to accelerate model training and optimize model performance with active learning
Learn about the latest enhancements to out-of-the-box document processing – with little to no training required
Get an exclusive demo of the new family of UiPath LLMs – GenAI models specialized for processing different types of documents and messages
This is a hands-on session specifically designed for automation developers and AI enthusiasts seeking to enhance their knowledge in leveraging the latest intelligent document processing capabilities offered by UiPath.
Speakers:
👨🏫 Andras Palfi, Senior Product Manager, UiPath
👩🏫 Lenka Dulovicova, Product Program Manager, UiPath
2. www.chromaate.com
All specifications are subject to change without notice. Please visit our website for the most up to date specifications.2
LED / Lighting Test Solution
Founded in 1984, Chroma ATE Inc. is a world leading supplier of
precision Test and Measurement Instrumentation, Automated Test
Systems, Manufacturing Execution Systems and Turnkey Test and
Automation Solutions marketed globally under the brand name
"Chroma".
Significant markets Chroma serves include LED, photovoltaic,
Li-battery, electric vehicle, semiconductor/IC, optical device,
flat panel display, video and color, power electronics, passive
component, electrical safety, and thermoelectric test, as well as
automated optical inspection and manufacturing execution systems.
Chroma's vision is to develop globally leading products as a world-
class enterprise. To achieve this, Chroma devotes a significant
amount of investment and resources in research and development
in order to produce exceptional products of precision, reliability and
valuable unique test solutions for technology industries. To sustain
as a world-class enterprise, Chroma nurtures its brand as one of
innovation, continuous improvement, and globalization ensuring its
leading technology and integration capabilities in optics, mechanics,
electronics, thermal control and software provide competitive
advantages and future growth for the company.
Chroma has branch offices in Europe, the United States, Japan and
mainland China chartered to deliver innovative technologies with
high value-added service to satisfy our global customers' demands.
LED Luminaire
LED ModuleLED PackageLED Wafer/Chip
High Speed LED Bulb
In-line Test System
(Fully automation with pre-burn)
LED Lighting In-line Test System
(For Production)
High Speed LED Tube
In-line Test System
LED Burn-in
Tester
TEC Controller
and Platform
ESD Test System
LED Electrical
Test Module
LED (Flip Chip)
Total Power Test System
LED Mapping
Probe Tester
Double sided Wafer
Inspection System
LED Lighting Test System
(For Laboratory)
LED Light Bar
Test System
LED Light Bar
Electrical Test System
LED Driver
ATS
3. 3
The Chroma 58212-C features an automated LED wafer/chip probe tester, delivering fast and accurate
LED measurements with test times less than 125ms *1.
The system can be modified to support different LED structures including Lateral, Vertical, and Flip
Chip designs. Integrated scanners provide autonomous wafer mapping to guarantee precision
testing. The patented probe head prevents device scratches and ensures solid contact with every LED.
Chroma's unique design acquires and analyzes optical data such as the dominant wave length,
peak wavelength, and CCT. Additionally, it provides essential electrical data such as forward voltage,
leakage current, and reverse breakdown voltage, all in one test step.
The 58212-C includes a user-friendly graphical interface and advanced logic algorithms to
significantly increase production efficiency. Comprehensive statistical reports and analysis tools allow
for easy control and mass production management.
Note *1 : Test condition: under 300um sample pitch, 5 electrical test parameters and 1 optical
parameter. Due to differences in LED characteristics, the measurement results may vary.
Key Features
☑ High speed and accuracy
☑ Lateral, vertical, and flip chip
☑ Wide power test range (up to 200V/2A)
☑ Up to 8 inch wafers
☑ Chroma® Huge Photo Detector
☑ Unique edge sensor
☑ Patented probe head
☑ Robust Z-Axis stage
☑ Wafer mapping algorithm
☑ External light shielding enclosure
☑ Analysis tools and statistical reports
Test Items
☑ Electrical parameters:
- Forward Voltage Measurement (Vf )
- Reverse Breakdown Voltage
Measurement (Vrb)
- Reverse Leakage Current (Ir)
- SCR detection
☑ Optical parameters:
- Optical power (mw, lm, mcd)
- Dominant Wavelength (Wd)
- Peak Wavelength (Wp)
- Full Width at Half Maximum (FWHM)
- CIExy - CCT - CRI
LED Mapping Probe Tester
Model 58212-C
Note *2: Test condition is under point of sensing
SPECIFICATIONS
Model 58212-C
Application
Test Area ψ8 inch wafer
Supported Device
(Chuck is device selected)
Chip on wafer : 2", 4", 6", 8"
Chip on tape : 2", 4", 6"
Chuck Type Lateral type, Vertical type, and Flip Chip type (Select one of them)
Die Size 7 ~ 120 mil
Pad Size ≧ 70μm
Electrical Parameter Measurements
Power Range ≦ 20W
Voltage
Source Range ±10V / ±100V / ±200V
Source Accuracy 0.05% + 0.03%F.S. / 0.05% + 0.03%F.S. / 0.05% + 0.03%F.S. *2
Measure Range ±10V / ±100V / ±200V
Measure Accuracy 0.03% + 0.02%F.S. / 0.03% + 0.02%F.S. / 0.03% + 0.02%F.S. *2
Current
Source Range ±20uA / ±500uA / ±20mA / ±500mA / ±2A
Source Accuracy
0.08% + 0.06%F.S. / 0.08% + 0.05%F.S. / 0.08% + 0.05%F.S. /
0.3% + 0.1%F.S. / 0.3% + 0.3%F.S *2
Measure Range ±20uA / ±500uA / ±20mA / ±500mA / ±2A
Measure Accuracy
0.06% + 0.04%F.S. / 0.06% + 0.03%F.S. / 0.06% + 0.03%F.S. /
0.25% + 0.1%F.S. / 0.25% + 0.3%F.S. *2
Optical Measurements
Spectrometer
Wavelength Rang 350 ~ 780 nm
CIExy Repeatability ±0.0015
Wp Repeatability ±0.5 nm
Wd Repeatability
(380~780nm)
±0.3 nm
Optical Power Repeatability ±1%
Operation
Environment
Temperature 20˚ ~ 30˚
Humidity 40% ~ 70%
Facility Requirements
Machine Dimensions 1480mm x 1160mm x 1505mm
Power Requirement Single phase, 220VAC ±10%, 50/60Hz, 20A
Input Air -0.2 Mpa / ψ6 mm
Weight 750 kg
LED I-V curve
Reverse Voltage
Forward Voltage
"Knee"
Forward
Current
Reverse
Current
Hardwares
☑ Automatic LED wafer/Chip prober
☑ Electrical test module
☑ Optical test module
☑ Optional ESD test module
4. www.chromaate.com
All specifications are subject to change without notice. Please visit our website for the most up to date specifications.4
Chroma 58154 series ESD (Electrostatic Discharge) Test Systems are PXI/PCI
controlled module to simulate electrostatic discharge pulse during electronic device
testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD
STM5.2-1999-Machine Model. The user friendly software offers programmable and
flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity,
ESD pulse interval in a sequence, and automatic testing function.
The 58154 series includes a control module and a pulse output external box. High
voltage power supply unit (PSU) and pulse shaping circuits provide the ESD STM
standards compliant pulse waveform.
The 58154 series offer a flexible and total ESD test solution to customers.
Furthermore, the ESD pulse is generally applied to the device under test before
measuring device electric parameters and the 58154 series can be perfectly
integrated with Chroma 58173 and 58173-FC to provide a total solution in
production line.
ESD Test System
Model 58154 Series
Machine Model waveform Human Body Model waveformTraditional way -
3 HBM pulses within 362 ms
New Function and improvement -
3 HBM pulses within 80 ms
ESD Test on LED chip
HBM 500V
HBM 1KV
HBM 2KV
80ms
HBM 500V
HBM 1KV HBM 1.5KV
362ms
SPECIFICATIONS
Model 58154 58154-B 58154-C
Parameter Value
ESD Mode Machine Model / Human body model
Pulse Voltage
Machine model: 50V to 400V ± 5V
Human body model: 500V to 4KV ± 20V
Machine model: 100V to 800V ± 10V
Human body model: 250V to 6KV ± 30V
Machine model: 100V to 800V ± 10V
Human body model: 250V to 8KV ± 30V
ESD Specification *1 *2 Machine model reference on STM5.2-2012 ; Human body model reference on JESD22-ALL5C
Pulse Interval 20 ms to 1 s (User definable)
Pulse Repetition Single or multiple
Pulse Polarity Positive or negative (software control)
AC Input 100 to 240V, 47 to 63 Hz
Dimensions 434.6mm(W) x 97.7mm(H) x 306.8mm(D) 434.6mm(W) x 97.7mm(H) x 450mm(D)
Weight 12 kg
Pattern No. : I311648, I398655, ZL 2009 2 0148342.2
Pattern Name : Discharge and remote feedback integrated testing system
Note*1 : The test condition is under output terminal of equipment
Note*2 : The accuracy of Chroma 58154 may vary in customer's setup conditions. To fix this problem, ESD tester needs to be tuned the value of the impedance
to minimized waveform distortion, or customers provide their setup information in advance and Chroma tunes ESD testers before shipment to fit customer's
test method.
Key Features
☑ Two modes ESD pulse generation : human body mode and machine mode
☑ Programmable auto test : pulse delay, cycle and polarity are programmable
☑ Resolution (58154) : 5V per-step for machine model, 20V per-step for human body mode
☑ Resolution (58154-B) : 10V per-step for machine model, 20V per-step for machine mode, 30V per-step for human body mode
☑ Resolution (58154-C) : 10V per-step for machine model, 30V per-step for human body mode
☑ Diversity control interface : PCI DIO card
☑ Up to 8000V (58154-C)
5. 5
58173-T LED Test System focuses on LED Wafer/Chip Characteristics Analysis and
provides optimized test performance. Its test items include a variety of voltage/
current output measurement, optical power measurement, and spectrum analysis. On
measurement, several electrical and optical characteristics analysis can be achieved at a
time within 25 ms, and its electrical measurement supports high-voltage LED and high-
brightness LED applications.
On system integration, 58173-T can easily integrate various Probers and Handlers for
wafer probing and chip sorting. In addition, optional Switch Module allows Test System
to perform multi-channel and multi-chip measurements.
Key Features
☑ High test speed: complete whole test within 25ms (selected test items)
☑ Super statble of temperature variation
☑ Support high voltage and high power LED test requirement
☑ Support multi-die test (option)
☑ Support ESD test (option)
LED Total Power Test System
Model 58173-T
SPECIFICATIONS
Model 58173-T
Parameters
Electiral Test Items
Forward Voltage(Vf), Reverse Leakage Current (Ir), Reverse
Breakdown Voltage (Vrb), SCR
Optical Test Items
Luminous Intensity (mcd), Lumen (lm), Radiant power (mw),
Dominant Wavelength (Wd), Peak Wavelength (Wp), FWHM,
CIE Chromaticity, CCT, CRI
Electrical Parameter Measurements
Power Range ≦ 20W, as figure 1 shows
Voltage
Source Range ±10V / ±100V / ±200V
Source Accuracy 0.05% + 0.03%F.S. / 0.05% + 0.03%F.S. / 0.05% + 0.03%F.S. *1
Measurement Range ±10V / ±100V / ±200V
Measurement Accuracy 0.03% + 0.02%F.S. / 0.03% + 0.02%F.S. /0.03% + 0.02%F.S. *1
Current
Source Range ±20uA / ±500uA / ±20mA / ±500mA / ±2°
Source Accuracy
0.08% + 0.06%F.S. / 0.08% + 0.05%F.S. / 0.08% + 0.05%F.S. /
0.3% + 0.1%F.S. / 0.3% + 0.3%F.S *1
Measurement Range ±20uA / ±500uA / ±20mA / ±500mA / ±2°
Measurement Accuracy
0.06% + 0.04%F.S. / 0.06% + 0.03%F.S. / 0.06% + 0.03%F.S. /
0.25% + 0.1%F.S. / 0.25% + 0.3%F.S. *1
Optical Measurements
Spectrometer
Wavelength Rang 350 ~ 780 nm
Detector Pixels 2048 pixels
Pixel Resolution 0.318 nm
Optical Resolution 2.067 nm (FWHM)
CIExy Repeatability ±0.0015
Wp Repeatability ±0.5 nm
Wd
(380~780nm)
Repeatability ±0.2 nm
Radiant Flux
(mW)
Repeatability ±1%
Operation
Environment
Temperature 20° ~ 30°
Humidity 40% ~ 70%
Facility Requirements
Power Requirement 800 VA
Dimensions (W x D x H)
58221: 486 mm x 462 mm x 110 mm
58241: 486 mm x 475 mm x 110 mm
IPC: 426 mm x 451 mm x 177 mm
Weight 35kg
Note *1: Test condition is under point of sensing
Real-Time Production Information
Flexible Editable Test Parameters
Powerful Report File Editing
6. www.chromaate.com
All specifications are subject to change without notice. Please visit our website for the most up to date specifications.6
Chroma 58173-FC is specifically designed for flip-chip LED, in which the probing
surface is opposite to the light emitting surface, thus having a no-interference
optical path while still having stable probing is the key factor to make an accurate
measurement.
The 58173-FC's transparent chuck design (figure 1) features in no vacuum holes
within the testing area, ensuring no interference along the optical path for all chips,
and providing a solid stage for probing, thus it makes the measurement much more
accurate.
The 58173-FC also applies Chroma's innovative total power measurement method
(figure2), which collects more LED partial flux than the conventional probers, and
that also improves the speed and accuracy significantly. Benefited from Chroma's
innovative unique optical and mechanical design, most of the LED output radiant
flux are received by a wide photo detector. Other optical parameters, such as
dominant wavelength, peak wavelength, CCT, etc. are measured by Chroma's
spectrometer.
In addition, Chroma58173-FC is equipped with a wide-range electrical source and
meter, so that Chroma 58173-FC not only fits your requirements today, but also
foresees and provides the solution for your next generation requirements.
Key Features
☑ Unique vacuum-hole-free chuck design
☑ Wide LED electrical test range (200V/2A)
☑ Support LED SCR characteristic detect function
☑ Chroma Huge Photo Detector (Measurement Angle=148°)
☑ Unique edge sensor design to provide stable probing
☑ Robust chip position scanning algorithm, suitable for various DUT forms
☑ Light shield design to block other light interference
☑ Comprehensive analysis tool and statistic report for mass production
Hardwares
☑ Semi-automatic prober for flip-chip LED
☑ Electrical test module
☑ Optical test module
☑ Optional ESD test module
Test items
☑ Electrical parameters: forward voltage, reverse breakdown voltage,
reverse leakage current, etc.
☑ SCR characteristic detection
☑ Total optical power, total flux
☑ Wavelength related: dominant wavelength, peak wavelength, FWHM, etc.
LED Flip Chip Total Power Test System
Model 58173-FC
Figure 1 - Chuck with no vacuum holes that
makes the measurement more accurate.
Figure 2 - Chroma's Innovative Method of LED Flip
Chip Total Flux Measurement by Huge Photo Detector
No vacuum hole design in transparent chuck
Glass Chuck
θ ≧148°
Flip Chip
Chroma Huge Photo Detector
7. 7
Powerful Scanning Algorithm
User-friendly on screen pin adjustment
Wide voltage/current test range
+2A
+10V +100V +200V-10V
+500mA
+120mA
-500mA
-2A
-120mA
-200V
-100V
V
I
SPECIFICATIONS
Model 58173-FC
Application
Die Size 7~120mil
Pad Size ≧70μm
Ring Size 5.3 inch For Extended Ring / 7.3 inch For Extended Ring
Maximum Optical Receiving Angle 144°*1
Electrical Parameter Measurements
PowerRange ≦ 20W, as figure shows
Voltage
Range 10V / 100V / 200V
Source Accuracy 0.05% + 0.03%F.S / 0.05% + 0.03%F.S / 0.05% + 0.03%F.S *2
Measure Accuracy 0.03% + 0.02%F.S / 0.03% + 0.02%F.S / 0.03% + 0.02%F.S *2
Current
Range 20μA / 500μA / 20mA / 500mA / 2A
Source Accuracy 0.08% + 0.06%F.S / 0.08% + 0.05%F.S / 0.08% + 0.05%F.S / 0.3% + 0.1%F.S / 0.3% + 0.3%F.S *2
Measure Accuracy 0.06% + 0.04%F.S / 0.06% + 0.03%F.S / 0.06% + 0.03%F.S / 0.3% + 0.1%F.S / 0.3% + 0.3%F.S *2
SCR Test Function Yes
Wavelength / Color Measurements
Spectrometer
Detector Type 2048 Pixels
Wavelength range 380~780nm
Pixel Resolution 0.32 nm
Radiant Flux
repeatability (mW)
Range 3W Max.
Repeatability ±3%
Wp Repeatability ±1 nm
Wd Repeatability ±0.3 nm
Operation Environment
Temperature 20° ~ 30°
Humidity 40% ~ 70%
Mechanical Specifications
Glass Chuck Size 5.3 inch For Extended Ring / 7.3 inch For Extended Ring
Scan CCD Resolution 1024X768 Pixel
θaxis ±15°
Dimension 970 (L) × 970 (W) × 2250 (H) mm
Weight 580 kg
Power Input 220V
Note *1 : LED dies distribution diameter after extention has to be smaller than 5"
Note *2 : Test condition is under point of sensing
8. www.chromaate.com
All specifications are subject to change without notice. Please visit our website for the most up to date specifications.8
Chroma 58173 comes with an unique design and a whole new method for LED total
power measurement. In bare wafer/chip LED test production, due to the existence of
probing mechanism, total flux is derived from partial flux measurement in LED epitaxy
industry (Figure 1). However, the conventional method encounters problems and issues
in measurement accuracy, S/N ratio, measurement speed, etc. All of these are serious
concerns in production line.
Chroma has developed a high speed and high accuracy measurement method for LED total
power/flux (Figure 2). This innovative test method may collect most of the optical power
emitted from LED, much more than the conventional one. Thus applying this test method
may improve the measurement accuracy dramatically and significantly. Benefited from
Chroma's innovative unique optical and mechanical design, most of the LED output radiant
flux are received by a wide photo detector. Other optical parameters, such as dominant
wavelength, peak wavelength, CCT, etc. are measured by Chroma's spectrometer.
In addition, the 58173 is equipped with a wide-range electrical source and meter, so that
the 58173 not only fits your requirements today, but also foresees and provides the solution
for next generation requirements.
Key Features
☑ Wide LED electrical test range (200V/2A)
☑ Support LED SCR characteristic detect function
☑ Chroma Huge Photo Detector (Measurement Angle=144°)
☑ Unique edge sensor design to provide stable probing
☑ Robust chip position scanning algorithm, suitable for various DUT forms
☑ Light shield design to block other light interference
☑ Comprehensive analysis tool and statistic report for mass production
Hardwares
☑ Semi-automatic LED wafer/chips prober
☑ Electrical test module
☑ Optical test module
☑ Optional ESD test module
Test items
☑ Electrical parameters : forward voltage, reverse breakdown voltage,
reverse leakage current, etc.
☑ SCR characteristic detection
☑ Total optical power, total flux
☑ Wavelength related : dominant wavelength, peak wavelength, FWHM, etc.
LED Total Power Test System
Model 58173
LED Stage
Photo Meter Auxiliary LED
Baffle
50mm
D
Chip
LED Stage
θ ≧144°
Chip
Chroma Huge Photo Detector
Figure 3 - Conventional Method of LED Wafer/chip
Total Flux Measurement by Integrating Sphere
Figure 1 - Chroma's Innovative Method of LED Total
Flux Measurement by Huge Photo Detector
Figure 2 - Conventional Method of LED Wafer/chip
Total Flux Measurement by Microscope Module
LED Stage
Chip
V(λ) Detector
Microscope
Optional Optical Modules
Standard Optical Module
9. 9
Chroma®
Huge Photo Detector
Integrating Shere Wide voltage/current test range
+2A
+10V +100V +200V-10V
+500mA
+120mA
-500mA
-2A
-120mA
-200V
-100V
V
I
SPECIFICATIONS
Model 58173
Application
Die Size 7~120mil
Pad Size ≧70μm
Maximum Optical Receiving Angle 144°
Electrical Parameter Measurements
PowerRange ≦ 20W, as figure shows
Voltage
Range 10V / 100V / 200V
Source Accuracy 0.05% + 0.03%F.S / 0.05% + 0.03%F.S / 0.05% + 0.03%F.S *1
Measure Accuracy 0.03% + 0.02%F.S / 0.03% + 0.02%F.S / 0.03% + 0.02%F.S *1
Current
Range 20μA / 500μA / 20mA / 500mA / 2A
Source Accuracy 0.08% + 0.06%F.S / 0.08% + 0.05%F.S / 0.08% + 0.05%F.S / 0.3% + 0.1%F.S / 0.3% + 0.3%F.S *1
Measure Accuracy 0.06% + 0.04%F.S / 0.06% + 0.03%F.S / 0.06% + 0.03%F.S / 0.3% + 0.1%F.S / 0.3% + 0.3%F.S *1
SCR Test Function Yes
Wavelength / Color Measurements
Spectrometer
Detector Type 2048 Pixels
Wavelength range 380~780nm
Pixel Resolution 0.32 nm
Radiant Flux
repeatability (mW)
Range 3W Max.
Repeatability ±3%
Wp Repeatability ±1 nm
Wd Repeatability ±0.3 nm
Operation Environment
Temperature 20° ~ 30°
Humidity 40% ~ 70%
Mechanical Specifications
Scan CCD Resolution 1024X768 Pixel
θaxis ±15°
Dimension 970 (L) × 970 (W) × 2250 (H)mm
Weight 580kg
Power Input 220V
Note *1: Test condition is under point of sensing
10. www.chromaate.com
All specifications are subject to change without notice. Please visit our website for the most up to date specifications.10
Chroma 58221-200-2 is a module specially designed to test the electrical
features of LED in full range. It has all functions required for testing the
LED electrical features. The 58221-200-2 supplies high accuracy current
source up to ±200V/±120mA for High voltage (HV) and up to ±10V/±2A
for High Power (HP). Besides the standalone operation the 58222-200-
2 is featured in, the USB interface and other integrated design can also be
applied for synchronous measurement.
Key Features
☑ Focuses on LED test application
☑ Cover High Voltage (HV) and High Power (HP) LED test requirement
☑ Build-in hardware sequencer
☑ Build-in program memory and data memory
☑ Support LED SCR characteristic detect function
Test items
☑ Forward voltage (Vf)
☑ Reverse breakdown voltage (Vrb) Leakage (Ir)
☑ LIV
☑ I-V characterization
LED Electrical Test Module
Model 58221-200-2
+2A
+10V +100V +200V-10V
+500mA
+120mA
-500mA
-2A
-120mA
-200V -100V V
I
H.V. H.P.
Wide voltage/current test range
SPECIFICATIONS
Model 58221-200-2
Current Source Accuracy
Range Programming Resolution
Source Accuracy
23℃±5℃
±(Reading + Range)
Default Measurement
Resolution
Measurement Accuracy
23℃±5℃
±(Reading + Range)
±20μA 1nA 0.05% + 0.04% 1nA 0.05% + 0.04%
±500μA 50nA 0.05% + 0.04% 50nA 0.05% + 0.04%
±20mA 1μA 0.05% + 0.04% 1μA 0.05% + 0.04%
±500mA 50μA 0.08% + 0.04% 50μA 0.08% + 0.04%
±2A 100μA
0.05% + 0.1% (≥0.1A range)
0.1% + 0.3% (<0.1A range)
100μA
0.05% + 0.1% (≥0.1A range)
0.08% + 0.1% (<0.1A range)
Voltage Source Accuracy
Range Programming Resolution
Source Accuracy
23℃±5℃
±(Reading + Range)
Default Measurement
Resolution
Measurement Accuracy
23℃±5℃
±(Reading + Range)
±10V 1mV 0.03% + 0.02% 1mV 0.03% + 0.02%
±100V 10mV 0.03% + 0.02% 10mV 0.03% + 0.02%
±200V 10mV 0.03% + 0.02% 10mV 0.03% + 0.02%
General Specification
Interface USB/Stand alone
Trigger Available
RAM (16 bits) 16M
Operatoin Environment 0℃~5℃ (32℉~122℉) ; Humidity : < 70% R.H. Non-condensing
Max. Power Consumption (VA) 120VA
Dimensions (WxHxD) 432x110x432 mm
Weight (kg) 10
11. 11
Chroma 58266 is a LED Burn-in Tester that each channel can offer a constant current
up to 500mA but also has 0~400V voltage measurement function. For product
application, various programmable power supplies can be applied for multi-channel
constant current output and voltage measurement. The user can integrate several
power supplies based on the demands of channels and current for multi-channel test.
Key Features
☑ Flexible channels output: 32/64/128 channels
☑ Each channel can offer up to 500mA /400V
☑ Each channel can parallel connection for
high current requirement. Ex: 2-ch: 1A, 4-ch: 2A
☑ High accuracy of current output and voltage
measurement
System Architecture
☑ DUT: single LED, LED array, LED light bar or
LED module
☑ Support channels: 64 ch
☑ Force Current: Max. 500mA per-channel
☑ Support parallel connection: Ex: 2-ch: 1A
☑ Voltage measurement: Max. 400V
LED Burn-in Tester
Model 58266
System Controller
IPC
DUTsDC Source
Chroma 62000P/62000H Seires
64ch Current Source Regulator
Chroma 58222-64
64 ch 64 pcs
64 ch
64 ch
64 pcs
64 pcs
CONFIGURATION
Programmable
DC Power Supply
LED Burn-in Tester
Force Measure
I range V Range
Model 62012P-40-12
40V/120A/1200W
Model 58266
500mA 30V
400mA 35V
Model 62012P-100-50
100V/50A/1200W
Model 58266
500mA 32V
170mA 95V
Model 62024P-80-60
80V/60A/2400W
Model 58266
500mA 70V
440mA 75V
Model 62024P-100-50
100V/50A/2400W
Model 58266
500mA 70V
350mA 95V
Model 62024P-600-8
600V/8A/2400W
Model 58266
110mA 300V
80mA 400V
Model 62050P-100-100
100V/100A/5000W
Model 58266 500mA 95V
Model 62050H-450 450V/34A/15KW (380V/3Φ4W) Model 58266 500mA 400V
SPECIFICATIONS
Model 58266
Voltage Accuracy (23℃±5℃)
Range 0~4V 0~40V 0~400V
Default Measurement Resolution 1mV 10mV 100mV
Measure Accuracy ±(%rdg. + offset) 0.2%+5mV 0.2%+50mV 0.3%+500mV
Current Accuracy (23℃±5℃)
Range 10μA 1mA 100mA 500mA
Programming Resolution 5nA 500nA 50μA 200μA
Source Accuracy ±(%rdg. + offset) 0.1%+20nA 0.1%+300nA 0.1%+200μA 0.2%+1mA
Temperature Coefficient 10~18℃ & 28~50℃ ; ±(0.5 × accuracy specification)/℃
Max. Voltage Difference of all Channel 10V @ 500mA ; 50V @ 100mA ; 100V @ 50mA
Operation Environment Temperature : 10~50℃ ; Humidity : 10~70%RH
Storage Environment Temperature : -20~70℃ ; Humidity : 5~95%RH
0~4V 0~40V 0~400V
1mV 10mV 100mV
0.2%+5mV 0.2%+50mV 0.3%+500mV
12. www.chromaate.com
All specifications are subject to change without notice. Please visit our website for the most up to date specifications.12
Chroma 58182 LED Light Bar Test System is a fully automatic test
system able to measure the top-view/side-view light bar uniformity
composed of white light or RGB LED. With image recognition function,
it can accurately capture the location of LED and identify the center of
LED under the measurement. With automatic mechanical and optical
measurement function, the 58182 can perform extremely accurate
optical and electrical measurement.
The 58182 integrates image recognition function, automatic
mechanical and optical measurement. It can not only improve the yield
rate by sifting out the defect products, but also reduce the product
verification time and development cost. In addition, the 58182 has a
flexible measurement platform to adapt different type of top-view /
side-view LED light bar measurement, and friendly user interface to
reduce user's learning time. Consequently, the 58182 is the best choice
for testing top-view/side-view light bar.
Key Features
☑ Measure the top-view/side-view light bar uniformity
composed of white light
☑ Equipped with image recognition function to
capture the LED location accurately
☑ Excellent optical performance
☑ ESD damaged sorting function
☑ FPC/PCB light bar adaptability
LED Light Bar Test System
Model 58182
CIE127 Condition B measurement ModuleCIE127 Partial Flux Measurement Module
SPECIFICATIONS
Model 58182
Optical Module CIE 127 condition B optical tube or Partial flux measurement module
Average Intenstive (mcd)
Range 100~10000mcd
Accuracy ±5%
Repeatability ±2%
CIE x, y
Accuracy ±0.004
Repeatability ±0.002
Spectrumeter
Wavelength Range 380~780nm
Optical resolution 2nm
A/D 16 bits
Light Bar length 600mm
Offer Channels 20 X 12 Ch
Power Supply
Voltage 0~200V 0~60V 0~300V
Current 10uA~5mA 1mA~2A 40mA~2A
Voltage accuracy 0.3%+0.1%F.S 0.01%+10mV 0.05%+0.05%F.S
Current accuracy 0.3%+0.1%F.S 0.01%+1mA 0.03%+40mA
Data output
Format Excel (*.csv)
Output items mcd, CIEx, CIEy
XY moving range 600x250mm
Dimension 1300 (D) × 2360 (W) × 1815 (H)mm
13. 13
Chroma 58183 is a PC base test system for LED light bar electrical test.
In hardware design, Chroma 58183 not only offers a accurately current
(10uA~5mA) to test LED electrical features but also can integrate an extra high
power supply for high current test. Otherwise, Chroma 58183 offers multi-
channels test function. It is widely used in many application. In LED light bar
manufactory, 58183 can test more 10 pieces Light bar at the one time. In LED
backlight manufactory, 58183 can test 4 pieces LED backlight via a 4 channels
control box. To sum up, 58183 is a very strong and powerful tool for LED light
bar and LED backlight manufactories.
Key Features
☑ Integrating customer's extened power supply
☑ PC base design
☑ Support multi- channels test
☑ Using general DUT adapter to offer test application widely
☑ Software support authority managerment
LED Light Bar Electrical Test System
Model 58183
SPECIFICATIONS
Model 58183
System specifications
Power supply
Output voltage 1~200V
Output current 10µA~5mA *1
Program Accuracy
Voltage Range 1~200V
Voatage Accuracy ±0.3% ±0.2% FS
Current Range 100µA / 5mA
Current Compliance ±5% ±0.2% FS
Applicative Type Top / Side-view LED light bar
Dimension (D x W x H) IPC 418 x 330 x 175 , RelayBox 430 x 276 x 102 mm
Weight 18 Kg( IPC 13Kg, RelayBox 5Kg)
Electrical measurement specifications
Testing condition 2 wires
Voltage
Accruacy (1~200V) ±0.3% ±0.2% FS
Resolution 50mV
RelayBox specifications(Not in live wire)
Ch1~24 Ch25~32
Switch voltage 200VDC 300VDC
Carry current 300mA 600mA
Life expectancy of mechanical 106
106
Power IN
IPC 110 / 220V,50~60Hz, 7 /3.5A
RelayBox 110 / 220V,50~60Hz,2A
Others
General purpose relay 32 Channels
Operation environment Temperature:10~40℃ ; Humidity:10%~70%
Note*1 : Specifications not contain AUX Power, need to check relaybox loss if use AUX Power.
14. www.chromaate.com
All specifications are subject to change without notice. Please visit our website for the most up to date specifications.14
Chroma 58158 LED Lighting Test System, compliances the AC LED Device National Standard, has
integrated Chroma's Power Electronics Test Equipment - Programmable AC Power Source and Digital
Power Meter to offer users a real AC environment for measuring AC LED.
Furthermore, the 58158 also integrates Chroma DC Power Supplies with the flexible optical test platform
which equips with integrating sphere, photo detector, and etc.. Users can measure optical and electrical
parameters of AC/DC LED through a friendly softtware interface.
Key Features
☑ Simulate the real AC test condition and environment
☑ Integrate AC, DC, and optical features test to one platform
☑ Support DC test for AC LED
☑ Support dual-optical test module in one platform (Integrating sphere or average intensity) (optional)
☑ Support AC /DC LIV analysis
☑ Offer standard light source for calibration
LED Lighting Test System (For Laboratory)
Optional Integrating Spheres
For Laboratory Test
Model 58158
15. 15
ORDERING INFORMATION
Integrating sphere 50cm 1m 2m
Luminaire small lamp, bulb, MR-16 middle lamp, 2 feet T8/T5 tube large lamp, 4 feet T8/T5 tube, street light
Application laboratory laboratory laboratory
Note : Customization for 3m integrating sphere
Notes *1: 20 inch Integrating Sphere Notes *2 : The unit under test is 10W halogen lamp
Notes *3 : The PF spec. applies only when the signals are higher then 50% of the selected voltage and
current ranges
SPECIFICATIONS (50 cm Integrating Sphere)
Model 58158
Measurement Items
Optical Measurement Items Lumens (lm), CIE(x,y)), CIE(u',v'), CCT, CRI
Electrical Measurement Items
Frequency, Real power P, power factor PF,
THD (Option), Vf (Option)
Optical Measurement
Photo
Detector
Wavelength Range 380~780nm
Lumens Range *1 <5,000 lm (>5K lm optional)
Spectrometer
Detector Type 2048 Pixels Linear CCD array (optional)
Optical Fiber Connector SMA 905
Lumen accuracy ±5%
CIExy accuracy ±0.004
Lumen Repeatability *2 ±0.5%
CIExy Repeatability *2 ±0.005
Electrical AC Source
Output Rating-AC 500VA
Voltage
Range/Phase 150V/300V/Auto
Accuracy 0.2%+0.2%F.S.
Resolution 0.1V
Line Regulation 0.10%
Load Regulation 0.20%
Max.Current / Phase
RMS 4A/2A (150V/300V)
peak 24A/12A (150V/300V)
DC Measurement (Optional)
DC Power
Supply
Output Voltage 0~64V (> 64V optional)
Output Current 0~3A (> 3A Optional)
Ripple and Noise 1400 uVrms & 14 mVp-p / < 1mA
Line Regulation 0.01% +4mV / 0.01% + 300μA
Load Regulation < 6mV / 0.01% + 300μA
Program Accuracy 0.02% + 10mV / 0.01%+1mA
Read back Accuracy 0.02% + 10mV / 0.01%+1mA
Others
Dimension (H x W x D) 1081 x 532 x 700 mm
Weight 100k g
Power Consumption 300 W
Operating 100~240V VAC 50/60HZ
Software Support DC Source
Chroma 6200P-300-8, Chroma 11200 (650V), Chroma 11200 (800V), Keithley 24XX Series
Electrical AC Meter
Power
Range (W) 1.5W~1KW (Model 66201) ; 1.5W~10KW (Model 66202)
Power Factor Accuracy *3 0.006+(0.003/PF)KHz
Harmonic Range 2~50 order
16. www.chromaate.com
All specifications are subject to change without notice. Please visit our website for the most up to date specifications.16
The design concept of Chroma LED high speed
measurement module is to combine several large size
detectors and add up the luminous flux obtained by
each detector to calculate the total flux of LED light.
This design not only overcomes the shortcoming of
previous inconvenient measurement for total flux by
conventional integrating sphere, it also implements
the inline test on production line. Chroma is able to
provide the customer a fully automatic production line
that covers both quality and productivity.
Key Features
☑ Mass production application: LED lamp,
LED bulb, LED bar, LED streetlight, and
other luminaries
☑ Less error comparing to integrating sphere
measurement
☑ High speed test and flicker measurement
☑ Provide standard light source for calibration
which is international standard traceable
☑ Thermal control fixture adaptable (option)
Test Items
☑ Optical power characteristics :
Lm, lm/w, LED operating frequency (Flicker)
☑ Color characteristics :
CIExy, Duv, CIEu'v', CCT, CRI
☑ Power characteristics :
AC mode : Power Factor (PF), Irms, Vrms, THD
DC mode : Forward voltage
LED Lighting In-line Test System (For Production)
Model 58158-SC
Solar cell 1
Solar cell 2
Solar cell 3
Optical Fibers
Optical Fibers
Solar cell 4
Solar cell 5
120̊
Solar Cell Modules
Solar Cell Module for JEL 801 LED TubeSolar Cell Module for Omnidirectional lamp
135°
Instruments
17. 17
Power Analysis :
lm, lm/W, PF, Power
LED Spectrum Analysis :
CCT, CRI, Duv
THD Analysis
Flicker Analysis Flicker Analysis
Analysis Tools
Notes *1 : The unit under test is 10W halogen lamp
Notes *2 : The PF spec. applies only when the signals are higher then 50% of the selected voltage and current ranges
SPECIFICATIONS
Model 58158 -SC
Measurement Items
Optical Measurement Items Lumens (lm), CIE(x,y)), CIE(u',v'), CCT, CRI
Electrical Measurement Items
Frequency, Real power P, power factor PF,
THD (Option), Vf (Option)
Optical Measurement
Photo Detector
Wavelength Range 380~780nm
Lumens Range <5,000 lm (>5K lm optional)
Spectrometer
Detector Type 2048 Pixels Linear CCD array
Optical Fiber Connector SMA 905
Lumen measurement Repeatability ±0.5%
CIExy Repeatability *1 ±0.005
CCT Repeatability ±5K
CRI Repeatability ±1
Electrical AC Source
Output Rating-AC 500VA
Voltage
Range/Phase 150V/300V/Auto
Accuracy 0.2%+0.2%F.S.
Resolution 0.1V
Line Regulation 0.10%
Load Regulation 0.20%
Max.Current / Phase
RMS 4A/2A (150V/300V)
peak 24A/12A (150V/300V)
DC Measurement (Optional)
DC Power Supply
Output Voltage 0~64V (> 64V optional)
Output Current 0~3A (> 3A Optional)
Ripple and Noise 1400 uVrms & 14 mVp-p / < 1mA
Line Regulation 0.01% +4mV / 0.01% + 300μA
Load Regulation < 6mV / 0.01% + 300μA
Program Accuracy 0.02% + 10mV / 0.01%+1mA
Read back Accuracy 0.02% + 10mV / 0.01%+1mA
Others
Dimension (H x W x D) 1081 x 532 x 700 mm
Weight 100k g
Power Consumption 300 W
Operating 100~240V VAC 50/60HZ
Software Support DC Source
Chroma 58221-200-2, Chroma 6200P-300-8, Chroma 11200 (650V), Chroma 11200 (800V), Keithley 24XX Series
Electrical AC Meter
Power
Range (W) 1.5W~1KW (Model 66201) ; 1.5W~10KW (Model 66202)
Power Factor Accuracy *2 0.006+(0.003/PF)KHz
Harmonic Range 2~50 order
18. www.chromaate.com
All specifications are subject to change without notice. Please visit our website for the most up to date specifications.18
Chroma 5102 is a LED Bulb Automation Test Line. It adopts unique
and innovative technologies that use Mono-Crystalline Silicon Solar
Cell as photodetectors and distribute them around LED Bulb. Based
on photoelectric conversion principle of solar cell, and solar panel's
relatively large area at lower cost, Chroma 5102 significantly reduced
not only the size of the measurement equipment, but also greatly
enhance the test speed. Loading and unloading each LED bulb can
be completed in five seconds. Chroma 5102 shows great performance
of test speed at one LED bulb per 6 seconds, including the time for
photoelectric test.
In addition, Chroma 5102 works with optional modules to enhance
testing and production. To test LED bulbs in steady state, user may
purchase Pre-Burn Module. For directive LED bulbs, user can purchase
Center Beam Test Module. To print label or logo on LED bulbs, user
may purchase optional laser equipment for printing.
Key Features
☑ Over 10K pcs throughput per day
☑ Test LED bulb in steady state
☑ Omni-directional LED bulb light spatial distribution
measurement
☑ Suport Flicker Measurement
High Speed LED Bulb In-line Test System
Model 5102
SPECIFICATIONS
Model 5102
Applicable Tester
Tester 58158-SC LED lighting test system
Test Capability Refer to Model 58158-SC specification
Suitable LED Lamps
Applicable Lamp
Directional lamp, Non-directional lamp and Omni-
directional lamp
Applicable Base Medium Screw (E27)
Change Kit Pick and Place module (Lamp orientation) ; E27 to GU10
Optional Work Station
Open/ short test module
High capacity Pre-burn module
(468 PCS Medium Screw socket)
Center Beam test module (For Directional lamp)
Laser printing module holder
Handler Index Time 5 sec/per-lamp (excluding lamp test time)
Lamp Tray
Weight Net weight : 1.8 kg
Capacity A19 Lamp : 28 pcs
Sorting Bin
Pass Bin 2 trays
Fail Bin 1 tray
System Facility
Requirement
Dimensions ( W x D x H)
Main line : 5190 mm x 1800 mm x 2400 mm
Pre-burn module : 2346 mm x 2063 mm x 1514 mm
Power Requirement AC Φ220V, Max 50A
Air Requriement
Main line : Air pressure 6kg/cm2
Pre-burn module : Φ10 inch tube, 46m3
/min air flow rate
Loading / Unloading to Pre-burn Oven
Loading to Tray
Optical Testing
Pre-burn
19. 19
Chroma 5104 LED Tube Automation Test Line adopts unique and innovative
technologies that use Mono-Srystalline Silicon Solar Cell as photodetectors and
distribute them around LED tube. Based on photoelectric conversion principle
of solar cell, and solar cell's relatively large area at lower cost, Chroma 5104
significantly reduced not only the size of the measurement equipment, but also
greatly enhance the test speed. Loading and unloading each LED tube can be
completed in five seconds.
Chroma 5104 shows great performance of test speed at one LED tube per 6
seconds, including the time for photoelectric test.
Key Features
☑ Over 10K pcs throughput per day
☑ Support a variety of LED tube measurement
☑ Support JEL801 Light Intensity Distribution Measurement
☑ Suport Flicker Measurement
High Speed LED Tube In-line Test System
Model 5104
Optical Testing
Binning
Unloading
Loading
SPECIFICATIONS
Model 5104
Applicable Tester
Tester 58158-SC LED lighting test system
Test Capability Refer to Model 58158-SC specification
Suitable LED Lamps
Applicable Lamp 2 ft, 4 ft, 5 ft LED T5 / T8 / T10 non-glass tube
Applicable Base
Standard : Bi-pin G13
Optional : Gx16t-5, G5
Change Kit
Gx16t-5 socket for JEL standard
G5 socket for T5 tube
Optional Function
Flicker test
Mix bin detection for 4 ft LED tube
Barcode reader
Handler Index Time 5 sec / per-lamp (excluding lamp test time)
System Facility
Requirement
Dimension ( W x D x H) 2050 mm x 2270 mm x 1972 mm
Power Requirement AC Φ220V, Max 20A
Air Requriement 20.5Mpa, 360L/min, Φ10 mm