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MarSurf




                    MarSurf WS 1
High-precision, non-contact measurement of surface texture
      using the principle of white-light interferometry

                             Measuring times of only a few seconds
                             • Saves time and money
                             Compact and simple design
                             • Saves money through low-cost entry and saves space in your
                               inspection room or production environment
                             Accurate results
                             • Thanks to 0.1 nm (.004 μin) vertical resolution
                             • Thanks to compact, reliable design
                             • Thanks to tried-and-tested evaluation software from Mahr
                             MarSurf WS 1 gives you a competitive edge
                             • Innovation in optical surface metrology
                             • Excellent vibration absorption (patent pending)
                             • Very small sensor dimensions
                             • Can be used in the workshop and laboratory
-




    MarSurf. WS 1 White-light Sensor Measuring Station

                                                                                Principle: White-light interferometry
    Description

    High-precision, non-contact measurement of surface texture

    Nowadays, the properties of surface topographies are increasingly
    influenced by new processing methods and new materials.                                                                        Camera

    The traditional profile stylus method is often not adequate to
    characterize the functional behavior of surfaces. Three-dimensional
    recording and evaluation are required. Soft and thin-walled materi-
    als also require non-contact measurement.
    Moreover, ever higher levels of surface quality are being achieved,
    greatly increasing the requirements placed on measuring systems in
    terms of resolution and measuring accuracy.

    The MarSurf WS 1 satisfies all these requirements:
    • Vertical resolution 0.1 nm (.004 μin)                                                                                        Lens
    • Three-dimensional measurement and evaluation in only a few                        Condenser lens
      seconds
    • Compact measuring station configuration for the workshop and                                                                 Beam splitter
      laboratory
    • MarSurf XT 20 software                                                        Light source
    • Topographical evaluation software on the fully standardized and
      powerful MarWin software platform

                                                                                   Piezo
                                                                                   positioner                                      Mirau objective




    Mode of Operation

    The MarSurf WS 1 is an optical surface sensor which operates on
    the basis of white-light interferometry. This technology enables
    rapid, high-precision recording of surface topography on a wide
    range of materials.

    The design is similar to that of a traditional interferometer, but uses   Interferograms at various scan depths
    white light instead of coherent light. White light has a short
    coherence length and therefore shows excellent properties for
    measuring surface topographies. In contrast to traditional
    interferometry, height information can be clearly assigned in the
    case of height steps in the test specimen.

    The area of the surface to be measured is displayed on a CCD
    camera. The surface area and a high-precision reference surface are
    imaged on the same scale by the interference objectives used
    (Mirau objectives) via a beam splitter so that the images of the           Z = 1 μm                                 Z = 2 μm
    sample and reference are superimposed to obtain an interferogram
    on the camera.

    During measurement, the Mirau objective is moved in small steps in
    Z direction using a piezo positioner. The resultant interferograms are
    recorded as image stacks, evaluated and converted into height
    data.



                                                                               Z = 3 μm                                 Z = 4 μm
+




MarSurf. WS 1 White-light Sensor Measuring Station - Applications




Measuring a silicon blank                        Measuring a wafer section                              Measuring the honing texture in a bushing that
                                                                                                        has been split open




Applications

The MarSurf WS 1 can be used both in precision inspection
rooms and production environments. Other optical measuring
principles quickly reach their limits when measuring various types of
surfaces. Some cannot handle high surface reflectiveness while
others cannot measure rough surfaces properly if, indeed, at all.
The MarSurf WS 1 and its innovative measuring signal evaluation
enables analysis of both reflective and rough workpieces. For
example, the high vertical resolution allows you to measure the
surface roughness of optical components such as lenses or mirrors
with sub-μm accuracy. You are also able to measure the texture of
micromechanical components. The material involved is irrelevant
here. Glass, paper, varnish, metal, plastic, coatings and liquids can
be measured.
The MarSurf XT 20 topography software is a powerful evaluation
tool with a wide range of functions. Thanks to the standardized
MarWin software platform, you are also able to enjoy the benefits            Example of a paper surface. Topographical evaluation with 3D parameters
of the tried-and-tested MarSurf XC 20 contour software.
                                                                             Example of a surface diagram




Benefits of This New System

•   Compact sensor
•   New illumination concept
•   Power supply via USB
•   High image rate, i.e. short measuring times
•   Sub-nanometer height resolution
•   Measuring time (incl. evaluation, typically 20 to 30 s)
•   Modular concept
•   Exchangeable illumination and imaging optical path
•   Evaluation with standardized MarWin topography software
MarWin. Topographical Software




 Example of an electric component with sectional view and                   The operator will have no problems in finding his/her way round
 contour evaluation                                                         the standardized Mahr user interface of the MarWin software
                                                                            concept.
 The MarWin topographical software opens up a wide range of
 evaluation options. The software is very easy to operate.




   MarSurf WS 1. Technical Data

 Objectives                                                  10× (Mirau)                               20× (Mirau)
 Measuring field size                                        1.6 mm × 1.2 mm (.063 in × .047 in) 0.8 mm × 0.6 mm (.031 in × .024 in)
 Working distance                                            3.6 mm (.142 in)                          3.6 mm (.142 in)
 Lateral sampling interval                                   2.5 μm (98 μin)                           1.25 μm (49 μin)
 Vertical resolution                                         0.1 nm (.004 μin)
 Measuring range (vertical)                                  100 μm (.004 in) (optionally up to 400 μm / .016 in)
 Measuring speed                                             1.5 μm/s to 15 μm/s (60 μin/s to 600 μin/s)
 Number of pixels of camera                                  658 × 494
 Residual noise Rz during measurement on optical flat        2 nm (.079 μin)
 Dimensions of measuring head L × W × H                      201 mm × 63 mm × 157 mm (7.9 in × 2.5 in × 6.2 in)
 Dimensions of measuring station with ST-G
 L×W×H                                                       500 mm × 300 mm × 415 mm (19.7 in × 11.8 in × 16.3 in)
 Weight of measuring head                                    1.3 kg (2.87 lbs)
 Operating temperature                                       5 °C to 40 °C (41 °F to 104 °F)
 Recommended operating temperature                           20 °C ± 2 °C (68 °F ± 2 K)
                                                                                                                                                    3758519-15.03.2006




Mahr GmbH Göttingen                                                         © by Mahr GmbH, Göttingen
Postfach 1853, D-37008 Göttingen; Brauweg 38, D-37073 Göttingen; Phone:     We reserve the right to make changes to our products, especially due
+495 51-707 30, Fax +49 551-710 21;                                         to technical improvements and further developments.
E-mail: info@mahr.com                                                       All illustrations and technical data are therefore without guarantee.

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Mar Surf Ws 1 Flyer

  • 1. MarSurf MarSurf WS 1 High-precision, non-contact measurement of surface texture using the principle of white-light interferometry Measuring times of only a few seconds • Saves time and money Compact and simple design • Saves money through low-cost entry and saves space in your inspection room or production environment Accurate results • Thanks to 0.1 nm (.004 μin) vertical resolution • Thanks to compact, reliable design • Thanks to tried-and-tested evaluation software from Mahr MarSurf WS 1 gives you a competitive edge • Innovation in optical surface metrology • Excellent vibration absorption (patent pending) • Very small sensor dimensions • Can be used in the workshop and laboratory
  • 2. - MarSurf. WS 1 White-light Sensor Measuring Station Principle: White-light interferometry Description High-precision, non-contact measurement of surface texture Nowadays, the properties of surface topographies are increasingly influenced by new processing methods and new materials. Camera The traditional profile stylus method is often not adequate to characterize the functional behavior of surfaces. Three-dimensional recording and evaluation are required. Soft and thin-walled materi- als also require non-contact measurement. Moreover, ever higher levels of surface quality are being achieved, greatly increasing the requirements placed on measuring systems in terms of resolution and measuring accuracy. The MarSurf WS 1 satisfies all these requirements: • Vertical resolution 0.1 nm (.004 μin) Lens • Three-dimensional measurement and evaluation in only a few Condenser lens seconds • Compact measuring station configuration for the workshop and Beam splitter laboratory • MarSurf XT 20 software Light source • Topographical evaluation software on the fully standardized and powerful MarWin software platform Piezo positioner Mirau objective Mode of Operation The MarSurf WS 1 is an optical surface sensor which operates on the basis of white-light interferometry. This technology enables rapid, high-precision recording of surface topography on a wide range of materials. The design is similar to that of a traditional interferometer, but uses Interferograms at various scan depths white light instead of coherent light. White light has a short coherence length and therefore shows excellent properties for measuring surface topographies. In contrast to traditional interferometry, height information can be clearly assigned in the case of height steps in the test specimen. The area of the surface to be measured is displayed on a CCD camera. The surface area and a high-precision reference surface are imaged on the same scale by the interference objectives used (Mirau objectives) via a beam splitter so that the images of the Z = 1 μm Z = 2 μm sample and reference are superimposed to obtain an interferogram on the camera. During measurement, the Mirau objective is moved in small steps in Z direction using a piezo positioner. The resultant interferograms are recorded as image stacks, evaluated and converted into height data. Z = 3 μm Z = 4 μm
  • 3. + MarSurf. WS 1 White-light Sensor Measuring Station - Applications Measuring a silicon blank Measuring a wafer section Measuring the honing texture in a bushing that has been split open Applications The MarSurf WS 1 can be used both in precision inspection rooms and production environments. Other optical measuring principles quickly reach their limits when measuring various types of surfaces. Some cannot handle high surface reflectiveness while others cannot measure rough surfaces properly if, indeed, at all. The MarSurf WS 1 and its innovative measuring signal evaluation enables analysis of both reflective and rough workpieces. For example, the high vertical resolution allows you to measure the surface roughness of optical components such as lenses or mirrors with sub-μm accuracy. You are also able to measure the texture of micromechanical components. The material involved is irrelevant here. Glass, paper, varnish, metal, plastic, coatings and liquids can be measured. The MarSurf XT 20 topography software is a powerful evaluation tool with a wide range of functions. Thanks to the standardized MarWin software platform, you are also able to enjoy the benefits Example of a paper surface. Topographical evaluation with 3D parameters of the tried-and-tested MarSurf XC 20 contour software. Example of a surface diagram Benefits of This New System • Compact sensor • New illumination concept • Power supply via USB • High image rate, i.e. short measuring times • Sub-nanometer height resolution • Measuring time (incl. evaluation, typically 20 to 30 s) • Modular concept • Exchangeable illumination and imaging optical path • Evaluation with standardized MarWin topography software
  • 4. MarWin. Topographical Software Example of an electric component with sectional view and The operator will have no problems in finding his/her way round contour evaluation the standardized Mahr user interface of the MarWin software concept. The MarWin topographical software opens up a wide range of evaluation options. The software is very easy to operate. MarSurf WS 1. Technical Data Objectives 10× (Mirau) 20× (Mirau) Measuring field size 1.6 mm × 1.2 mm (.063 in × .047 in) 0.8 mm × 0.6 mm (.031 in × .024 in) Working distance 3.6 mm (.142 in) 3.6 mm (.142 in) Lateral sampling interval 2.5 μm (98 μin) 1.25 μm (49 μin) Vertical resolution 0.1 nm (.004 μin) Measuring range (vertical) 100 μm (.004 in) (optionally up to 400 μm / .016 in) Measuring speed 1.5 μm/s to 15 μm/s (60 μin/s to 600 μin/s) Number of pixels of camera 658 × 494 Residual noise Rz during measurement on optical flat 2 nm (.079 μin) Dimensions of measuring head L × W × H 201 mm × 63 mm × 157 mm (7.9 in × 2.5 in × 6.2 in) Dimensions of measuring station with ST-G L×W×H 500 mm × 300 mm × 415 mm (19.7 in × 11.8 in × 16.3 in) Weight of measuring head 1.3 kg (2.87 lbs) Operating temperature 5 °C to 40 °C (41 °F to 104 °F) Recommended operating temperature 20 °C ± 2 °C (68 °F ± 2 K) 3758519-15.03.2006 Mahr GmbH Göttingen © by Mahr GmbH, Göttingen Postfach 1853, D-37008 Göttingen; Brauweg 38, D-37073 Göttingen; Phone: We reserve the right to make changes to our products, especially due +495 51-707 30, Fax +49 551-710 21; to technical improvements and further developments. E-mail: info@mahr.com All illustrations and technical data are therefore without guarantee.