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A 1.2V 10-bit 165MSPS Video ADC 
Hyma B R Joseph .J Vettickatt Shibin P V 
Ramya Nair S R Muhammad Ashik N. A. Roni Vincent 
Ajith Kumar V Jomon Varghese Rajagopal P C 
Analog-VLSI Design Centre, Network Systems and Technologies (P) Ltd 
Technopark, Trivandrum, Kerala, India 
Abstract—A 10-bit 165MSPS ADC design is presented in this paper. It is 
an ultra-low-power, low area design that operates with single 1.2V supply 
voltage for Digital and Analog. This ADC is single-ended and uses time-interleaved 
SAR architecture. It also provides calibration for offset 
correction. 
Keywords— Time-interleaved, Video ADC, SAR. 
I. INTRODUCTION 
The demand for high-speed signal processing 
applications such as high definition Analog front-ends 
requires ADCs which meet the characteristics of low power 
consumption, high resolution and high speed of operation. The 
ADC presented in this paper is a 10-bit SAR based ADC that 
allows to have very low power consumption and sampling rate 
as high as 165MSPS. It occupies low area and operates with 
single supply voltage for Digital and Analog. It also offers 
rail-to-rail input range and doesn’t need any coupling 
capacitor at the input. 
The ADC is designed using Fujitsu 65nm CMOS 
(CS200L) technology with MIM capacitors. It finds 
application in LCD flat panel monitors, Video projectors, 
Plasma display panels, Video capture hardware etc. Table 1 
shows the brief specification of the ADC. 
Parameter 
ADC Specification 
Min Typ Max Unit 
Supply Voltage 1.14 1.2 1.26 V 
Temperature range -40 125 ℃ 
Supply Current 6 13 mA 
Resolution 10 bits 
INL -2 2 LSB 
DNL -1.5 1.5 LSB 
SINAD @ 10MHz 
101010M10MHz 
53 dB 
Layout Area 360000 μm2 
Process Fujitsu 65nm 
Table 1 Specification of the proposed ADC. 
II. TIME-INTERLEAVED ARCHITECTURE 
Typically the high sampling rate ADCs are built using 
either Flash or Pipe-line architecture. But they are usually 
power hungry designs. In this paper we are presenting an 
alternate solution to address the long haunting problem faced 
by the industry. Here instead of Pipe-line or flash architecture 
we opted to use SAR time interleaved architecture which 
scales down with technology and is advantageous in terms of 
area and power consumption. 
Time-Interleaving is a smart technique to achieve an 
overall high sample rate by operating low sample rate ADCs 
in parallel. In a time-interleaved architecture, a system of 
n parallel ADCs are used which alternately take one sample 
(time-interleaved sampling) at a time. Fig. 1 gives the block 
diagram of the proposed time-interleaved ADC. It uses n 
number of 10-bit SAR ADCs in time interleaved fashion. 
Thus each ADC samples data every n-th cycle of the effective 
sample clock. The result is that the sample rate is increased n 
times compared to what each individual ADCs can manage. 
Control logic 
Analog Input 
10 bit 
SARADC 0 
10 bit 
SARADC 1 
10 bit 
SARADC n 
CLOCK @165MHz 
STC 0 
STC 1 
STC n 
STC @ 165MHz 
Calibration 
& output 
selector 
logic 
DB0 <0:9> 
DBn <0:9> 
DB1<0:9> 
EOC0 
EOC1 
EOC n 
DB <0:9> 
DATA @ 165MSPS 
CLOCK STC n STC 1 
Fig 1 Block diagram time-interleaved ADC.
III. SINGLE 10-BIT SAR ADC OPERATION 
For the unit ADC design, SAR architecture is preferred over other co-existing ADC architecture since it is illustrious for minimum power consumption design. The architecture selection is based on having more “digital” sections rather than “analog” sections. SAR ADC meets this requirement, as the comparator is the sole “analog” component in this design, the rest of the modules shrink as the design is implemented in contemporary technologies (low). Due to the digital nature, reduced power supply can be used resulting in further power reduction. The sampling speed required is very high and SAR ADC cannot meet that specification but using the Time- Interleaved approach several low power SAR-ADCs can be placed in parallel to achieve High Sampling rate. Table 2 shows the comparison of various ADC architectures. 
Fig 2 shows the block diagram of a 10-bit SAR ADC. A successive-approximation ADC basically consists of a comparator, Digital to Analog Converter (DAC) and a Successive Approximation Register (SAR). It uses the comparator to successively narrow a range that contains the input voltage. At each successive step, the converter compares the input voltage to the output of the internal DAC which 
Table 2 Comparison of various ADC architectures. 
might represent the midpoint of a selected voltage range. At each step in this process, the approximation is stored in the SAR. The steps are continued until the desired resolution is reached. Thus for a 10-bit SAR ADC digital data is available after 10 clock cycles. Thus an SAR ADC basically implements a binary search algorithm. 
Fig 2 Single ADC Block diagram 
To achieve best compromise on performance and size, a combination of resistor strings and weighted capacitors are used to digitize the input voltage level. In a 10-bit resolution of the ADC, the 10 bit SAR forms the core logic of unit ADC, it decides the configuration of DAC based on the comparison result from the comparator. The macro operates at 1.2v supply. The RDAC and CDAC together forms the DAC section of unit ADC.The driver is used to drive the switches within CDAC.The decoder decodes the code for the RDAC coming from the digital section and drives the RDAC section accordingly. The higher 5 bits are converted by the capacitor network and the lower 5 bits by resistor string. Special techniques are adopted to enhance the performance of the unit ADC and there by increase the speed for the unit SAR ADC. 
In the proposed design we employ n ADCs in a time interleaved fashion, in such a way that, effectively we can obtain ADC output in each clock cycle. 
IV. CONTROL LOGIC 
The external STC (Start Conversion) signal will be divided into n internal STC’s using control digital logic to trigger unit ADC operation. This block is made dependent to RST (Reset) and XPD (power down) signals, so that during power down or reset operation whole n ADC’c will be disabled 
V. OUTPUT SELECTION LOGIC 
Individual Data outs [0:9] of unit ADCs will be available on each clock cycle. Correct data corresponding to each ADC will be routed to output using Output selection logic. Here the EOC (End of Conversion) signal generation also takes place. 
VI. CALIBRATION OPERATION 
As the ADC is basically targeting video application, bottom level signal variants are of at most importance. In
order to incorporate a perfect signal conversion operation at 
low voltage levels (which represent black variants in a video 
signal) the ADC is equipped with a custom offset correction 
mechanism. 
The fully custom calibration technique can compensate 
for negative as well as positive offset errors. This smart 
technique keeps this ADC in a competent position in the 
analog video front end arena. Another important feature of 
this custom compensation technique is its ability to 
compensate for ADC mismatches due to temperature variation 
in real operating conditions. 
Calibration operation is based on a robust algorithm 
which takes care of all the conditions which may lead to errors 
in ADC operation due to offset or temperature variation. 
Temperature variation effects are monitored by a reference 
ADC which is positioned in a manner to accommodate the 
temperature change effects of all the operating ADCs. 
The calibration process operates in the background to 
normal ADC operation and monitor for periodic variations on 
ADC offset due to temperature, process and supply 
fluctuations. Periodic calibration is done based on the 
calibration cycle which is defined internally by the calibration 
system. 
The calibration operation happen at every calibration 
cycle and the ADC output gets updated with the trailing signal 
of calibration cycle. 
Error accumulated due to temperature variation is 
calibrated periodically at calibration cycle. In analog 
correction, the correction factor is used to select the required 
offset voltage to the respective ADCs. In digital correction, 
the calibrated ADC output is derived by applying the 
correction factor to the actual ADC output. 
Calibration operation can be bypassed by applying an 
active high external asynchronous signal on CALBYP 
(Calibration Bypass) pin. Valid data is made available at the 
ADC output at the rising edge of EOC. 
VII. SIMULATION RESULT 
Two ADC macros have been incorporated in the TEG 
chip - 165MSPS ADC & 130MSPS ADC as shown in Fig 
6 .The switching between two ADC’s are decided by the 
Mode control pin which is further controlled by power down 
signals of two ADC’s. ADC’s characteristics such as 
INL/DNL (Fig 5), SINAD, ENOB (Fig 3 and Fig 4) 
simulation result is listed in Table.1. 
-70.426 -70.420 -71.060 
-77.381 
-120 
-100 
-80 
-60 
-40 
-20 
0 
0 5 10 15 20 25 30 35 40 45 50 55 60 65 70 75 80 
Frequency (MHz) 
Level (dB) 
Fig 3 FFT Result with Fin =10MHz. 
0 
128 
256 
384 
512 
640 
768 
896 
1024 
0 0.1 0.2 0.3 0.4 P0o.5int 0.6 0.7 0.8 0.9 1 
OUTPUT CODE 
Fig 4 Output Waveform result With Fin = 10MHz 
INL/DNL Curve(TYP_165MHz) 
-1.00 
-0.80 
-0.60 
-0.40 
-0.20 
0.00 
0.20 
0.40 
0.60 
0.80 
1.00 
0 15 510 764 1019 
Digital Output Code 
LSB 
INL 
DNL 
Fig 5 INL/DNL Graph @ Typical 1.2V 165MSPS
Fig 6 TEG chip Layout 
Special care was taken while doing the macro layout. The CLK tree, STC routing was provided symmetrically to all n ADCs to avoid unwanted switching and delay issues between ADC which inturn can affect overall system performance. 
VIII. CONCLUSIONS 
In this paper a 10-bit 165MSPS time-interleaved SAR ADC with low power consumption is presented. The custom calibration technique enables the successful compensation of the offset and temperature variation errors. Time-Interleaving enabled the SAR ADC to have high sample rate. 
The high frequency operation and offset compensation techniques make this ADC suitable for video front end application in high definition display. Fig 7 shows the Evaluation board set up of VADC macro. 
Fig 7 Evaluation board set-up 
IX. REFERENCES 
[1] Behzad Razavi, Design of Analog CMOS Integrated Circuit. 
[2] Samer Medawar1, Peter Händel12, Niclas Björsell2, Magnus Jansson1, ADC Characterization By Dynamic Integral Nonlinearity 
[3] Nicholas “Nick” Gray, ABCs of ADCs - Rev 3, June 2006 
[4] Sara Qazi, “Study of Time-Interleaved SAR ADC and Implementation of Comparator for High Definition Video ADC in 65nm CMOS Process” 
[5] Zwei-Mei Lee, Cheng-Yeh Wang, and Jieh-Tsorng Wu, “A CMOS 15- Bit 125-MS/s Time-Interleaved ADC with Digital Background Calibration” 
[6] Tsung-Heng Tsai, Paul J. Hurst, and Stephen H. Lewis, “Time- Interleaved Analog-to-Digital Converters for Digital Communications” 
[7] Rob Reeder, Mark Looney, Jim Hand “Pushing the State of the Art with Multichannel A/D Converters” 
[8] Jens Sauerbrey,Doris SRoland Theweschmitt-Landsiedel, "A 0.5V, 1μW Successive Approximation ADC" 
[9] Jipeng Li,"A 1.8-V 67-mW 10-bit 100-MS/s Pipelined ADC Using Time-Shifted CDS Technique" 
[10] Christian Vogel and Gernot Kubin, "analysis and compensation of nonlinearity mismatches in time-interleaved adc arrays" 
[11] James Catt, "Generating Precision Clocks for Time-Interleaved ADCs" 
[12] Simon M. Louwsma, Ed J.M. van Tuijl, Maarten Vertregt* and Bram Nauta, "A 1.35 GS/s, 10b, 175 mW Time-Interleaved AD Converter in 0.13 μm CMOS"

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10-bit 165MSPS Video ADC Uses Time-Interleaved SAR Architecture

  • 1. A 1.2V 10-bit 165MSPS Video ADC Hyma B R Joseph .J Vettickatt Shibin P V Ramya Nair S R Muhammad Ashik N. A. Roni Vincent Ajith Kumar V Jomon Varghese Rajagopal P C Analog-VLSI Design Centre, Network Systems and Technologies (P) Ltd Technopark, Trivandrum, Kerala, India Abstract—A 10-bit 165MSPS ADC design is presented in this paper. It is an ultra-low-power, low area design that operates with single 1.2V supply voltage for Digital and Analog. This ADC is single-ended and uses time-interleaved SAR architecture. It also provides calibration for offset correction. Keywords— Time-interleaved, Video ADC, SAR. I. INTRODUCTION The demand for high-speed signal processing applications such as high definition Analog front-ends requires ADCs which meet the characteristics of low power consumption, high resolution and high speed of operation. The ADC presented in this paper is a 10-bit SAR based ADC that allows to have very low power consumption and sampling rate as high as 165MSPS. It occupies low area and operates with single supply voltage for Digital and Analog. It also offers rail-to-rail input range and doesn’t need any coupling capacitor at the input. The ADC is designed using Fujitsu 65nm CMOS (CS200L) technology with MIM capacitors. It finds application in LCD flat panel monitors, Video projectors, Plasma display panels, Video capture hardware etc. Table 1 shows the brief specification of the ADC. Parameter ADC Specification Min Typ Max Unit Supply Voltage 1.14 1.2 1.26 V Temperature range -40 125 ℃ Supply Current 6 13 mA Resolution 10 bits INL -2 2 LSB DNL -1.5 1.5 LSB SINAD @ 10MHz 101010M10MHz 53 dB Layout Area 360000 μm2 Process Fujitsu 65nm Table 1 Specification of the proposed ADC. II. TIME-INTERLEAVED ARCHITECTURE Typically the high sampling rate ADCs are built using either Flash or Pipe-line architecture. But they are usually power hungry designs. In this paper we are presenting an alternate solution to address the long haunting problem faced by the industry. Here instead of Pipe-line or flash architecture we opted to use SAR time interleaved architecture which scales down with technology and is advantageous in terms of area and power consumption. Time-Interleaving is a smart technique to achieve an overall high sample rate by operating low sample rate ADCs in parallel. In a time-interleaved architecture, a system of n parallel ADCs are used which alternately take one sample (time-interleaved sampling) at a time. Fig. 1 gives the block diagram of the proposed time-interleaved ADC. It uses n number of 10-bit SAR ADCs in time interleaved fashion. Thus each ADC samples data every n-th cycle of the effective sample clock. The result is that the sample rate is increased n times compared to what each individual ADCs can manage. Control logic Analog Input 10 bit SARADC 0 10 bit SARADC 1 10 bit SARADC n CLOCK @165MHz STC 0 STC 1 STC n STC @ 165MHz Calibration & output selector logic DB0 <0:9> DBn <0:9> DB1<0:9> EOC0 EOC1 EOC n DB <0:9> DATA @ 165MSPS CLOCK STC n STC 1 Fig 1 Block diagram time-interleaved ADC.
  • 2. III. SINGLE 10-BIT SAR ADC OPERATION For the unit ADC design, SAR architecture is preferred over other co-existing ADC architecture since it is illustrious for minimum power consumption design. The architecture selection is based on having more “digital” sections rather than “analog” sections. SAR ADC meets this requirement, as the comparator is the sole “analog” component in this design, the rest of the modules shrink as the design is implemented in contemporary technologies (low). Due to the digital nature, reduced power supply can be used resulting in further power reduction. The sampling speed required is very high and SAR ADC cannot meet that specification but using the Time- Interleaved approach several low power SAR-ADCs can be placed in parallel to achieve High Sampling rate. Table 2 shows the comparison of various ADC architectures. Fig 2 shows the block diagram of a 10-bit SAR ADC. A successive-approximation ADC basically consists of a comparator, Digital to Analog Converter (DAC) and a Successive Approximation Register (SAR). It uses the comparator to successively narrow a range that contains the input voltage. At each successive step, the converter compares the input voltage to the output of the internal DAC which Table 2 Comparison of various ADC architectures. might represent the midpoint of a selected voltage range. At each step in this process, the approximation is stored in the SAR. The steps are continued until the desired resolution is reached. Thus for a 10-bit SAR ADC digital data is available after 10 clock cycles. Thus an SAR ADC basically implements a binary search algorithm. Fig 2 Single ADC Block diagram To achieve best compromise on performance and size, a combination of resistor strings and weighted capacitors are used to digitize the input voltage level. In a 10-bit resolution of the ADC, the 10 bit SAR forms the core logic of unit ADC, it decides the configuration of DAC based on the comparison result from the comparator. The macro operates at 1.2v supply. The RDAC and CDAC together forms the DAC section of unit ADC.The driver is used to drive the switches within CDAC.The decoder decodes the code for the RDAC coming from the digital section and drives the RDAC section accordingly. The higher 5 bits are converted by the capacitor network and the lower 5 bits by resistor string. Special techniques are adopted to enhance the performance of the unit ADC and there by increase the speed for the unit SAR ADC. In the proposed design we employ n ADCs in a time interleaved fashion, in such a way that, effectively we can obtain ADC output in each clock cycle. IV. CONTROL LOGIC The external STC (Start Conversion) signal will be divided into n internal STC’s using control digital logic to trigger unit ADC operation. This block is made dependent to RST (Reset) and XPD (power down) signals, so that during power down or reset operation whole n ADC’c will be disabled V. OUTPUT SELECTION LOGIC Individual Data outs [0:9] of unit ADCs will be available on each clock cycle. Correct data corresponding to each ADC will be routed to output using Output selection logic. Here the EOC (End of Conversion) signal generation also takes place. VI. CALIBRATION OPERATION As the ADC is basically targeting video application, bottom level signal variants are of at most importance. In
  • 3. order to incorporate a perfect signal conversion operation at low voltage levels (which represent black variants in a video signal) the ADC is equipped with a custom offset correction mechanism. The fully custom calibration technique can compensate for negative as well as positive offset errors. This smart technique keeps this ADC in a competent position in the analog video front end arena. Another important feature of this custom compensation technique is its ability to compensate for ADC mismatches due to temperature variation in real operating conditions. Calibration operation is based on a robust algorithm which takes care of all the conditions which may lead to errors in ADC operation due to offset or temperature variation. Temperature variation effects are monitored by a reference ADC which is positioned in a manner to accommodate the temperature change effects of all the operating ADCs. The calibration process operates in the background to normal ADC operation and monitor for periodic variations on ADC offset due to temperature, process and supply fluctuations. Periodic calibration is done based on the calibration cycle which is defined internally by the calibration system. The calibration operation happen at every calibration cycle and the ADC output gets updated with the trailing signal of calibration cycle. Error accumulated due to temperature variation is calibrated periodically at calibration cycle. In analog correction, the correction factor is used to select the required offset voltage to the respective ADCs. In digital correction, the calibrated ADC output is derived by applying the correction factor to the actual ADC output. Calibration operation can be bypassed by applying an active high external asynchronous signal on CALBYP (Calibration Bypass) pin. Valid data is made available at the ADC output at the rising edge of EOC. VII. SIMULATION RESULT Two ADC macros have been incorporated in the TEG chip - 165MSPS ADC & 130MSPS ADC as shown in Fig 6 .The switching between two ADC’s are decided by the Mode control pin which is further controlled by power down signals of two ADC’s. ADC’s characteristics such as INL/DNL (Fig 5), SINAD, ENOB (Fig 3 and Fig 4) simulation result is listed in Table.1. -70.426 -70.420 -71.060 -77.381 -120 -100 -80 -60 -40 -20 0 0 5 10 15 20 25 30 35 40 45 50 55 60 65 70 75 80 Frequency (MHz) Level (dB) Fig 3 FFT Result with Fin =10MHz. 0 128 256 384 512 640 768 896 1024 0 0.1 0.2 0.3 0.4 P0o.5int 0.6 0.7 0.8 0.9 1 OUTPUT CODE Fig 4 Output Waveform result With Fin = 10MHz INL/DNL Curve(TYP_165MHz) -1.00 -0.80 -0.60 -0.40 -0.20 0.00 0.20 0.40 0.60 0.80 1.00 0 15 510 764 1019 Digital Output Code LSB INL DNL Fig 5 INL/DNL Graph @ Typical 1.2V 165MSPS
  • 4. Fig 6 TEG chip Layout Special care was taken while doing the macro layout. The CLK tree, STC routing was provided symmetrically to all n ADCs to avoid unwanted switching and delay issues between ADC which inturn can affect overall system performance. VIII. CONCLUSIONS In this paper a 10-bit 165MSPS time-interleaved SAR ADC with low power consumption is presented. The custom calibration technique enables the successful compensation of the offset and temperature variation errors. Time-Interleaving enabled the SAR ADC to have high sample rate. The high frequency operation and offset compensation techniques make this ADC suitable for video front end application in high definition display. Fig 7 shows the Evaluation board set up of VADC macro. Fig 7 Evaluation board set-up IX. REFERENCES [1] Behzad Razavi, Design of Analog CMOS Integrated Circuit. [2] Samer Medawar1, Peter Händel12, Niclas Björsell2, Magnus Jansson1, ADC Characterization By Dynamic Integral Nonlinearity [3] Nicholas “Nick” Gray, ABCs of ADCs - Rev 3, June 2006 [4] Sara Qazi, “Study of Time-Interleaved SAR ADC and Implementation of Comparator for High Definition Video ADC in 65nm CMOS Process” [5] Zwei-Mei Lee, Cheng-Yeh Wang, and Jieh-Tsorng Wu, “A CMOS 15- Bit 125-MS/s Time-Interleaved ADC with Digital Background Calibration” [6] Tsung-Heng Tsai, Paul J. Hurst, and Stephen H. Lewis, “Time- Interleaved Analog-to-Digital Converters for Digital Communications” [7] Rob Reeder, Mark Looney, Jim Hand “Pushing the State of the Art with Multichannel A/D Converters” [8] Jens Sauerbrey,Doris SRoland Theweschmitt-Landsiedel, "A 0.5V, 1μW Successive Approximation ADC" [9] Jipeng Li,"A 1.8-V 67-mW 10-bit 100-MS/s Pipelined ADC Using Time-Shifted CDS Technique" [10] Christian Vogel and Gernot Kubin, "analysis and compensation of nonlinearity mismatches in time-interleaved adc arrays" [11] James Catt, "Generating Precision Clocks for Time-Interleaved ADCs" [12] Simon M. Louwsma, Ed J.M. van Tuijl, Maarten Vertregt* and Bram Nauta, "A 1.35 GS/s, 10b, 175 mW Time-Interleaved AD Converter in 0.13 μm CMOS"