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FT38- 01_5                                                                                                                                 CRITICAL
                                                                                                                                           COMPONENTS
                                                                                                                                           & SUB SYSTEMS


Evaluation of particle shedding and
trace metal extraction from high
purity pumps
Mark R. Litchy, CT Associates, Inc., Minnesota, USA & Reto Schoeb, Levitronix, LLC, Massachusetts, USA


  ABSTRACT
  The production of semiconductor devices continues to be extremely sensitive to particulate and metallic contamination. As
  feature sizes continue to decrease, the need for purity will continue to increase. Various types of pumps are used in bulk chemical
  delivery systems, recirculating etch baths, and other high purity process applications. Many of these pumps shed significant
  quantities of particles that may reduce product yield or impact the performance or lifetime of filters used in the process loop.
  Furthermore, metallic contamination in process chemicals can cause a variety of yield-related issues. This paper evaluates the
  levels of trace metal extraction and particle shedding under different operating conditions using two high purity pump types
  from three manufacturers.


Introduction                                  centrifugal pumps deliver higher flow           dampener – used to reduce pulsations
                                                                                              from the diaphragm pumps – was
                                              rates at lower pressures.
The pumps being used for this study
                                                                                              employed during each pump test (even
(positive displacement pumps from             Particle shedding                               though no pulse dampener was necessary
manufacturers A and B; magnetically
                                              A schematic of the particle shedding            for the magnetically levitated centrifugal
levitated centr ifugal pumps from
                                              test system is presented in Figure 1.           pumps) and was located immediately
manufacturer C) were evaluated for
                                              The pump being evaluated drew water             downstream of the test pump.The desired
particle shedding in ultra pure water
                                              from a filtered circulating loop. A pulse       operating conditions were achieved by
and trace metal extraction in 35%
hydrochloric acid. Three pumps sizes
(low, intermediate, and high capacity)
from each manufacturer were evaluated
for particle shedding over a range of
operating conditions (i.e., varying flow
rates and pressures). Pumps with similar
capacity were tested under common
operating conditions that were chosen
for each group of pumps such that all
pumps in the group could achieve each
test condition. A subset of the pumps was
also evaluated for trace metal extraction
using a dynamic extraction method.
Both surface and bulk contamination
were determined. In addition, the type
and rate of trace metal extraction over
time were determined for each pump.

Experimental procedure
Pumps tested
                                              Figure 1. Particle shedding test system schematic.
Table 1 shows the breakdown of pump
type evaluated in this study. Because
the pumps from manufacturers A and                            TABLE 1: COMPARISON OF THE PUMPS EVALUATED
B are positive displacement pumps, the
                                                Manufacturer     Pump Type                              Pump ID       Capacity
operating curves of these pumps are
                                                A                diaphragm                              A1            low
significantly different from those of the
                                                                                                        A2            intermediate
magnetically levitated centrifugal pumps.
                                                                                                        A3            high
While the flow rate of a centrifugal
pump var ies with system pressure,              B                diaphragm                              B1            low
                                                                                                        B2            intermediate
a positive displacement pump has
                                                                                                        B3            high
relatively constant flow rate regardless of
system pressure. In general, the positive       C                magnetically levitated centrifugal     C1            low
displacement pumps deliver fluid at                                                                     C2            intermediate
                                                                                                        C3            high
lower flow rates and higher pressures,
while the magnetically levitated

                                                                                                                                                   1
                                                                                                        WWW.FABTECH.ORG
FT38- 01_5
      CRITICAL
  COMPONENTS
& SUB SYSTEMS




                 either adjusting the pump rotational speed
                 (magnetically levitated centrifugal pumps)
                 or air pressure (diaphragm pumps) to the
                 pump and the pump outlet pressure with
                 a control valve located downstream of the
                 test pump.
                    A Particle Measuring Systems HSLIS-
                 M50 particle monitor and a Particle
                 Measuring Systems LiQuilaz-S05 liquid
                 particle counter were used to measure
                 particle sizes ranging from 0.05µm to
                 larger than 10µm.
                    Each pump was run under typical
                 operating conditions for a minimum of
                 three days prior to the start of this test
                 program to ensure that any particles
                 being shed were not simply due to the
                 fact that the pump was new. Following
                 this break-in period, quasi steady-state
                 particle shedding from each pump was
                 monitored over a range of operating
                 conditions. A minimum of two hours
                 of data was averaged once particle
                 concentrations had stabilized following
                 each change in operating conditions.
                 Trace metal extraction
                 The pumps were tested for trace metal
                 extraction using the dynamic extraction
                                                                  Figure 2. Trace metal extraction system schematic.
                 test apparatus shown in Figure 2.




                  Figure 3. PSDs measured downstream of the low capacity pumps at selected operating conditions.


    2            SEMICONDUC T O R F A B T E C H – 3 8 TH E D I T I O N
FT38- 01_5                                                                                                                  CRITICAL
                                                                                                                            COMPONENTS
                                                                                                                            & SUB SYSTEMS




Figure 4. PSDs measured downstream of the intermediate capacity pumps at selected operating conditions.




Figure 5. PSDs measured downstream of the high capacity pumps at selected operating conditions.


                                                                                                                                    3
                                                                                                          WWW.FABTECH.ORG
FT38- 01_5
      CRITICAL
  COMPONENTS
& SUB SYSTEMS




                 This method allows measurement
                 o f b o t h s u rf ace contamination,
                 which is removed within a few
                 minutes of exposure to chemical,
                 and contamination from the bulk
                 mater ial. The total contamination
                 extracted from the component is
                 the sum of the surface and bulk
                 contamination. Since the contaminants
                 are measured over time, the rate of
                 extraction may also be determined [1].
                 High purity 35% HCl was used as
                 the extractant during each test. The
                 test pumps were operated during the
                 test to ensure that the acid was well
                 mixed in each system. Prior to each
                 test, a background sample was taken;
                 subsequent samples were taken at time
                 intervals evenly spaced on a logarithmic
                 scale from a sample port located in the
                 circulation loop. The chemical samples
                 were analyzed for 37 metallic elements,
                 while the results of these analyses were         Figure 6. Surface, bulk, and total contamination measured during five pump tests.
                 converted to cumulative mass extracted.
                                                                 channel, ≥ 0.05µm. The detection limit           centrifugal pumps and the other pumps
                 Results and discussion                          of the M50 particle counter is believed          at larger particle sizes and smaller
                                                                 to be ~0.07-0.08µm, rather than 0.05µm.          differences at smaller particle sizes.
                 Particle shedding                               This is not due to the fact that the M50            Table 2 presents a comparison of
                 An example of the quasi steady-state            was not calibrated, but because how the          the particle shedding results presented
                 par ticle concentrations measured               manufacturer defines the sensitivity at          in Figures 3-5. The ratios of the
                 downstream of each pump is presented            0.05µm.                                          particle concentrations downstream
                 for selected operating conditions in               The magnetically levitated centrifugal        of positive displacement pumps to the
                 Figures 3, 4, and 5. System background          (C1-C3) pumps consistently shed the              particle concentrations downstream of
                 particle concentrations are also included.      fewest particles of the pumps tested,            comparably sized centrifugal pumps are
                 Each graph presents the cumulative              regardless of operating conditions.              presented for two particle size channels,
                 particle size distr ibution (PSD) at            Furthermore, the particle concentrations         ≥ 0.1µm and ≥ 0.5µm. The geometric
                 common operating conditions (flow               measured downstream of the centrifugal           mean and geometric standard deviation
                 rate and pump outlet pressure) denoted          pumps were often close to (within a              (GSD) are presented rather than
                 above each graph. The results from both         factor of 5) the system background               arithmetic mean since the concentration
                 particle counters were combined and             concentrations.                                  ratios appear to be lognor mally
                 presented in each graph.                           Typically, the slopes of the PSDs             distr ibuted rather than nor mally
                    The PSDs presented were linear               measured downstream of the centrifugal           distributed. Pumps from manufacturers
                 when plotted on a log-log scale, which          pumps were steeper than the other                A and B typically shed approximately
                 is typical of particle shedding from            pumps and were similar to the slope of           5-30 times as many particles ≥ 0.1µm as
                 components in liquids [2]. A linear             the background PSD. The steeper slopes           a comparable centrifugal pump, and 40-
                 regression through each set of data is          measured during the centrifugal pump             275 times as many particles ≥ 0.5µm.
                 also included in each graph. The PSDs           tests resulted in much larger differences           Operating conditions had little
                 tend to flatten out at the smallest size        in particle concentrations between the           overall effect on particle concentrations

                                         TABLE 2: COMPARISON OF THE PUMP MEAN PARTICLE CONCENTRATION RATIOS

                                                                 Geometric Mean and GSD of the Concentration Ratios of Pumps from
                                                               Manufacturers A and B to the Comparable Sized Pump from Manufacturer C
                                                                         ≥ 0.l µm                                              ≥ 0.5 µm
                      Pump
                   Manufacturer        Pump ID             Geometric Mean                    GSD                 Geometric Mean                 GSD
                          A                A1                      17                         1.6                        115                     1.4
                                           A2                      18                         1.8                        133                     1.5
                                           A3                       6                         1.4                         72                     1.7
                          B                B1                      23                         1.9                         48                     1.7
                                           B2                       7                         3.1                         40                     3.5
                                           B3                      32                         2.0                        277                     2.4



    4            SEMICONDUC T O R F A B T E C H – 3 8 TH E D I T I O N
FT38- 01_5                                                                                                                                               CRITICAL
                                                                                                                                                         COMPONENTS
                                                                                                                                                         & SUB SYSTEMS




Figure 7. Mass extracted from the bulk material of five pumps
                                                                          Figure 8. Mass extraction rates from five pumps at selected times.
over time.

                                               Summary
downstream of the pumps [3]. Pump                                                                      The metallic extraction from all
outlet pressure had a greater effect on                                                             of the pumps was considered to be
                                               Particle shedding from nine high
particle concentrations than flow rate,                                                             relatively low. The magnetically levitated
                                               pur ity pumps from three different
with particle concentrations typically                                                              centrifugal pumps had lower surface,
                                               manufacturers was measured under
remaining the same or increasing with                                                               bulk, and total metallic contamination
                                               typical operating conditions. The three
increasing outlet pressure. Meanwhile,                                                              than the other pumps (although two of
                                               magnetically levitated centr ifugal
flow rate had a minimal effect on                                                                   these pumps were considerably smaller
                                               pumps shed the fewest particles of
par ticle concentrations at most                                                                    than the other pumps). The rates of
                                               the nine pumps evaluated, regardless
operating conditions tested; as a result,                                                           extraction were lowest for the C1 and
                                               of operating conditions. The particle
the number of particles shed typically                                                              C2 magnetically levitated centrifugal
                                               concentrations measured downstream
increased linearly with increasing flow                                                             pumps, while extraction rates from A3,
                                               of the centrifugal pumps were often
rate. Under some operating conditions,                                                              B3, and C3 pumps were similar.
                                               ver y close to system backg round
particle concentrations increased with         concentrations. The slopes of the PSDs
increasing flow rate. Differences among        downstream of the centrifugal pumps                    REFERENCES
the pumps were similar under all               were steeper than the other pumps
operating conditions.                                                                               [1] Grant, D.C., Lemke, T., Duepner, G.,
                                               and similar to the slope of the system
                                                                                                        Wilkes, D. & Powell, N. 1996, J. Inst.
                                               background. As a result, the difference
Trace metal extraction
                                                                                                        Env. Sci., 39(2), pp. 29-37.
                                               in particle concentrations increased
Figure 6 compares the surface, bulk,
                                               as particle size increased. Operating                [2] Grant, D.C. & Schmidt, W.R. 1987,
and total metallic contamination
                                               conditions had little overall effect on                  J. Env. Sci., 30(3), pp. 28-30.
extracted from each pump tested.
                                               particle concentrations downstream
All of the pumps showed relatively                                                                  [3] Litchy, M.R. & Schoeb, R. 2008,
                                               of the pumps. Particle shedding from
slow extraction with the total mass                                                                     Ultra Pure Fluid and Wafer Cleaning
                                               the two types of positive displacement
extracted varying from 1 to 13µg. The                                                                   Conference, February 13, 2008,
                                               pumps were often similar.
three pumps supplied by manufacturer                                                                    Santa Clara, CA.
C showed the lowest level of surface
                                                 ABOUT THE AUTHORS
contamination; however, surf ace
contamination is less important than           Mark Litchy works as a Research Engineer for CT      technology. He has 18 years of experience in
extraction rate as it can be removed           Associates, Inc., a contract research, development   bearingless motor technology, and has authored
by pre-extracting a component prior            and testing services company for contamination       or co-authored 34 patents. A graduate of the
to its use.                                    control, particle measurement and control,           ETH Zurich in Switzerland, he has an M.S. degree
   Figure 7 shows the mass extracted
                                               filtration, permeation and chemical engineering.     in electrical engineering and a Ph.D. in technical
from the bulk material of each pump
                                               He has more than 12 years of experience in           science.
over time for all measured elements.
                                               particle measurement and control in high purity
Since theory predicts that the extraction
                                               liquid chemicals and gases and CMP slurry
data can be fit by a power law equation,                                                              ENQUIRIES
the data should follow a straight line         characterization. He is the author or co-author
                                                                                                    Mark Litchy – CT Associates, Inc.
when plotted on a log-log scale [1].           of more than 30 publications and presentations.
                                                                                                    7121 Shady Oak Road
The rate of trace metal extraction can         He has an M.S. degree in mechanical engineering
                                                                                                    Eden Prairie
be determined from the slope of these          from the University of Minnesota (Minneapolis,
                                                                                                    MN 55344
data. The mass extraction rates for each       MN) and a B.S. degree in physics from St. John’s
                                                                                                    USA
pump at selected times are presented in        University (Collegeville, MN).
Figure 8. The rates of extraction were
lowest for the C1 and C2 centrifugal                                                                Tel: +1 (952) 470 0166
                                               Reto Schoeb is the CEO and founding member of
pumps. Extraction rates from A3, B3,                                                                Email: mark@ctassociatesinc.com
                                               Levitronix GmbH, a pioneer in bearingless pump
and C3 pumps were similar.

                                                                                                                                                                 5
                                                                                                                   WWW.FABTECH.ORG

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Evaluation of particle shedding and trace metal extraction from high purity pumps

  • 1. FT38- 01_5 CRITICAL COMPONENTS & SUB SYSTEMS Evaluation of particle shedding and trace metal extraction from high purity pumps Mark R. Litchy, CT Associates, Inc., Minnesota, USA & Reto Schoeb, Levitronix, LLC, Massachusetts, USA ABSTRACT The production of semiconductor devices continues to be extremely sensitive to particulate and metallic contamination. As feature sizes continue to decrease, the need for purity will continue to increase. Various types of pumps are used in bulk chemical delivery systems, recirculating etch baths, and other high purity process applications. Many of these pumps shed significant quantities of particles that may reduce product yield or impact the performance or lifetime of filters used in the process loop. Furthermore, metallic contamination in process chemicals can cause a variety of yield-related issues. This paper evaluates the levels of trace metal extraction and particle shedding under different operating conditions using two high purity pump types from three manufacturers. Introduction centrifugal pumps deliver higher flow dampener – used to reduce pulsations from the diaphragm pumps – was rates at lower pressures. The pumps being used for this study employed during each pump test (even (positive displacement pumps from Particle shedding though no pulse dampener was necessary manufacturers A and B; magnetically A schematic of the particle shedding for the magnetically levitated centrifugal levitated centr ifugal pumps from test system is presented in Figure 1. pumps) and was located immediately manufacturer C) were evaluated for The pump being evaluated drew water downstream of the test pump.The desired particle shedding in ultra pure water from a filtered circulating loop. A pulse operating conditions were achieved by and trace metal extraction in 35% hydrochloric acid. Three pumps sizes (low, intermediate, and high capacity) from each manufacturer were evaluated for particle shedding over a range of operating conditions (i.e., varying flow rates and pressures). Pumps with similar capacity were tested under common operating conditions that were chosen for each group of pumps such that all pumps in the group could achieve each test condition. A subset of the pumps was also evaluated for trace metal extraction using a dynamic extraction method. Both surface and bulk contamination were determined. In addition, the type and rate of trace metal extraction over time were determined for each pump. Experimental procedure Pumps tested Figure 1. Particle shedding test system schematic. Table 1 shows the breakdown of pump type evaluated in this study. Because the pumps from manufacturers A and TABLE 1: COMPARISON OF THE PUMPS EVALUATED B are positive displacement pumps, the Manufacturer Pump Type Pump ID Capacity operating curves of these pumps are A diaphragm A1 low significantly different from those of the A2 intermediate magnetically levitated centrifugal pumps. A3 high While the flow rate of a centrifugal pump var ies with system pressure, B diaphragm B1 low B2 intermediate a positive displacement pump has B3 high relatively constant flow rate regardless of system pressure. In general, the positive C magnetically levitated centrifugal C1 low displacement pumps deliver fluid at C2 intermediate C3 high lower flow rates and higher pressures, while the magnetically levitated 1 WWW.FABTECH.ORG
  • 2. FT38- 01_5 CRITICAL COMPONENTS & SUB SYSTEMS either adjusting the pump rotational speed (magnetically levitated centrifugal pumps) or air pressure (diaphragm pumps) to the pump and the pump outlet pressure with a control valve located downstream of the test pump. A Particle Measuring Systems HSLIS- M50 particle monitor and a Particle Measuring Systems LiQuilaz-S05 liquid particle counter were used to measure particle sizes ranging from 0.05µm to larger than 10µm. Each pump was run under typical operating conditions for a minimum of three days prior to the start of this test program to ensure that any particles being shed were not simply due to the fact that the pump was new. Following this break-in period, quasi steady-state particle shedding from each pump was monitored over a range of operating conditions. A minimum of two hours of data was averaged once particle concentrations had stabilized following each change in operating conditions. Trace metal extraction The pumps were tested for trace metal extraction using the dynamic extraction Figure 2. Trace metal extraction system schematic. test apparatus shown in Figure 2. Figure 3. PSDs measured downstream of the low capacity pumps at selected operating conditions. 2 SEMICONDUC T O R F A B T E C H – 3 8 TH E D I T I O N
  • 3. FT38- 01_5 CRITICAL COMPONENTS & SUB SYSTEMS Figure 4. PSDs measured downstream of the intermediate capacity pumps at selected operating conditions. Figure 5. PSDs measured downstream of the high capacity pumps at selected operating conditions. 3 WWW.FABTECH.ORG
  • 4. FT38- 01_5 CRITICAL COMPONENTS & SUB SYSTEMS This method allows measurement o f b o t h s u rf ace contamination, which is removed within a few minutes of exposure to chemical, and contamination from the bulk mater ial. The total contamination extracted from the component is the sum of the surface and bulk contamination. Since the contaminants are measured over time, the rate of extraction may also be determined [1]. High purity 35% HCl was used as the extractant during each test. The test pumps were operated during the test to ensure that the acid was well mixed in each system. Prior to each test, a background sample was taken; subsequent samples were taken at time intervals evenly spaced on a logarithmic scale from a sample port located in the circulation loop. The chemical samples were analyzed for 37 metallic elements, while the results of these analyses were Figure 6. Surface, bulk, and total contamination measured during five pump tests. converted to cumulative mass extracted. channel, ≥ 0.05µm. The detection limit centrifugal pumps and the other pumps Results and discussion of the M50 particle counter is believed at larger particle sizes and smaller to be ~0.07-0.08µm, rather than 0.05µm. differences at smaller particle sizes. Particle shedding This is not due to the fact that the M50 Table 2 presents a comparison of An example of the quasi steady-state was not calibrated, but because how the the particle shedding results presented par ticle concentrations measured manufacturer defines the sensitivity at in Figures 3-5. The ratios of the downstream of each pump is presented 0.05µm. particle concentrations downstream for selected operating conditions in The magnetically levitated centrifugal of positive displacement pumps to the Figures 3, 4, and 5. System background (C1-C3) pumps consistently shed the particle concentrations downstream of particle concentrations are also included. fewest particles of the pumps tested, comparably sized centrifugal pumps are Each graph presents the cumulative regardless of operating conditions. presented for two particle size channels, particle size distr ibution (PSD) at Furthermore, the particle concentrations ≥ 0.1µm and ≥ 0.5µm. The geometric common operating conditions (flow measured downstream of the centrifugal mean and geometric standard deviation rate and pump outlet pressure) denoted pumps were often close to (within a (GSD) are presented rather than above each graph. The results from both factor of 5) the system background arithmetic mean since the concentration particle counters were combined and concentrations. ratios appear to be lognor mally presented in each graph. Typically, the slopes of the PSDs distr ibuted rather than nor mally The PSDs presented were linear measured downstream of the centrifugal distributed. Pumps from manufacturers when plotted on a log-log scale, which pumps were steeper than the other A and B typically shed approximately is typical of particle shedding from pumps and were similar to the slope of 5-30 times as many particles ≥ 0.1µm as components in liquids [2]. A linear the background PSD. The steeper slopes a comparable centrifugal pump, and 40- regression through each set of data is measured during the centrifugal pump 275 times as many particles ≥ 0.5µm. also included in each graph. The PSDs tests resulted in much larger differences Operating conditions had little tend to flatten out at the smallest size in particle concentrations between the overall effect on particle concentrations TABLE 2: COMPARISON OF THE PUMP MEAN PARTICLE CONCENTRATION RATIOS Geometric Mean and GSD of the Concentration Ratios of Pumps from Manufacturers A and B to the Comparable Sized Pump from Manufacturer C ≥ 0.l µm ≥ 0.5 µm Pump Manufacturer Pump ID Geometric Mean GSD Geometric Mean GSD A A1 17 1.6 115 1.4 A2 18 1.8 133 1.5 A3 6 1.4 72 1.7 B B1 23 1.9 48 1.7 B2 7 3.1 40 3.5 B3 32 2.0 277 2.4 4 SEMICONDUC T O R F A B T E C H – 3 8 TH E D I T I O N
  • 5. FT38- 01_5 CRITICAL COMPONENTS & SUB SYSTEMS Figure 7. Mass extracted from the bulk material of five pumps Figure 8. Mass extraction rates from five pumps at selected times. over time. Summary downstream of the pumps [3]. Pump The metallic extraction from all outlet pressure had a greater effect on of the pumps was considered to be Particle shedding from nine high particle concentrations than flow rate, relatively low. The magnetically levitated pur ity pumps from three different with particle concentrations typically centrifugal pumps had lower surface, manufacturers was measured under remaining the same or increasing with bulk, and total metallic contamination typical operating conditions. The three increasing outlet pressure. Meanwhile, than the other pumps (although two of magnetically levitated centr ifugal flow rate had a minimal effect on these pumps were considerably smaller pumps shed the fewest particles of par ticle concentrations at most than the other pumps). The rates of the nine pumps evaluated, regardless operating conditions tested; as a result, extraction were lowest for the C1 and of operating conditions. The particle the number of particles shed typically C2 magnetically levitated centrifugal concentrations measured downstream increased linearly with increasing flow pumps, while extraction rates from A3, of the centrifugal pumps were often rate. Under some operating conditions, B3, and C3 pumps were similar. ver y close to system backg round particle concentrations increased with concentrations. The slopes of the PSDs increasing flow rate. Differences among downstream of the centrifugal pumps REFERENCES the pumps were similar under all were steeper than the other pumps operating conditions. [1] Grant, D.C., Lemke, T., Duepner, G., and similar to the slope of the system Wilkes, D. & Powell, N. 1996, J. Inst. background. As a result, the difference Trace metal extraction Env. Sci., 39(2), pp. 29-37. in particle concentrations increased Figure 6 compares the surface, bulk, as particle size increased. Operating [2] Grant, D.C. & Schmidt, W.R. 1987, and total metallic contamination conditions had little overall effect on J. Env. Sci., 30(3), pp. 28-30. extracted from each pump tested. particle concentrations downstream All of the pumps showed relatively [3] Litchy, M.R. & Schoeb, R. 2008, of the pumps. Particle shedding from slow extraction with the total mass Ultra Pure Fluid and Wafer Cleaning the two types of positive displacement extracted varying from 1 to 13µg. The Conference, February 13, 2008, pumps were often similar. three pumps supplied by manufacturer Santa Clara, CA. C showed the lowest level of surface ABOUT THE AUTHORS contamination; however, surf ace contamination is less important than Mark Litchy works as a Research Engineer for CT technology. He has 18 years of experience in extraction rate as it can be removed Associates, Inc., a contract research, development bearingless motor technology, and has authored by pre-extracting a component prior and testing services company for contamination or co-authored 34 patents. A graduate of the to its use. control, particle measurement and control, ETH Zurich in Switzerland, he has an M.S. degree Figure 7 shows the mass extracted filtration, permeation and chemical engineering. in electrical engineering and a Ph.D. in technical from the bulk material of each pump He has more than 12 years of experience in science. over time for all measured elements. particle measurement and control in high purity Since theory predicts that the extraction liquid chemicals and gases and CMP slurry data can be fit by a power law equation, ENQUIRIES the data should follow a straight line characterization. He is the author or co-author Mark Litchy – CT Associates, Inc. when plotted on a log-log scale [1]. of more than 30 publications and presentations. 7121 Shady Oak Road The rate of trace metal extraction can He has an M.S. degree in mechanical engineering Eden Prairie be determined from the slope of these from the University of Minnesota (Minneapolis, MN 55344 data. The mass extraction rates for each MN) and a B.S. degree in physics from St. John’s USA pump at selected times are presented in University (Collegeville, MN). Figure 8. The rates of extraction were lowest for the C1 and C2 centrifugal Tel: +1 (952) 470 0166 Reto Schoeb is the CEO and founding member of pumps. Extraction rates from A3, B3, Email: mark@ctassociatesinc.com Levitronix GmbH, a pioneer in bearingless pump and C3 pumps were similar. 5 WWW.FABTECH.ORG