This document summarizes the testing and simulation of a CMOS digital integrated circuit. It includes truth tables, circuit diagrams, timing diagrams, and comparison tables for input/output voltages and propagation delay times between measurement and simulation results. Minor differences within a few percent were observed between measured and simulated values.
Introduction to Multilingual Retrieval Augmented Generation (RAG)
SPICE MODEL of TC7WH02FK in SPICE PARK
1. Device Modeling Report
COMPONENTS : CMOS DIGITAL INTEGRATED CIRCUIT
PART NUMBER : TC7WH02FK
MANUFACTURER : TOSHIBA
Bee Technologies Inc.
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
2. Truth Table
Circuit simulation result
U1:1A 0
U1:1B 0
U1:2A 0
U1:2B 0
Y1 1
Y2 1
0s 0.5us 1.0us
Time
Evaluation circuit
U1
LO
1A VCC
1B 1Y
LO Y1
2Y 2B
Y2 LO
GND 2A LO
R1 V1
TC7WH02
1MEG 5
0
Comparison table
Input Output
%Error
An Bn Yn (Measurement) Yn (Simulation)
L L H H 0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
3. Truth Table
Circuit simulation result
U1:1A 0
U1:1B 1
U1:2A 0
U1:2B 1
Y1 0
Y2 0
0s 0.5us 1.0us
Time
Evaluation circuit
U1
LO
1A VCC
HI 1B 1Y
Y1
2Y 2B HI
Y2
GND 2A LO
R1 V1
TC7WH02
1MEG 5
0
Comparison table
Input Output
%Error
An Bn Yn (Measurement) Yn (Simulation)
L H L L 0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
4. Truth Table
Circuit simulation result
U1:1A 1
U1:1B 0
U1:2A 1
U1:2B 0
Y1 0
Y2 0
0s 0.5us 1.0us
Time
Evaluation circuit
U1
HI 1A VCC
1B 1Y
LO Y1
2Y 2B
Y2 LO
GND 2A HI
R1 V1
TC7WH02
1MEG 5
0
Comparison table
Input Output
%Error
An Bn Yn (Measurement) Yn (Simulation)
H L L L 0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
5. Truth Table
Circuit simulation result
U1:1A 1
U1:1B 1
U1:2A 1
U1:2B 1
Y1 0
Y2 0
0s 0.5us 1.0us
Time
Evaluation circuit
U1
HI 1A VCC
HI 1B 1Y
Y1
2Y 2B HI
Y2
GND 2A HI
R1 V1
TC7WH02
1MEG 5
0
Comparison table
Input Output
%Error
An Bn Yn (Measurement) Yn (Simulation)
H H L L 0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
6. High Level and Low Level Input Voltage
Circuit simulation result
5.0V
Output
2.5V Input
0V
0s 1.0ms 2.0ms 3.0ms 4.0ms
V(R1:1) V(V1:+)
Time
Evaluation circuit
U1
1A VCC
LO
1B 1Y
2Y 2B
GND 2A
V1
V1 = 0 R1 V2
V2 = 5
TC7WH02
TD = 0.5m 1MEG
TR = 0.1m 5
TF = 0.1m
PW = 1m
PER = 2m
0
Comparison table
VCC = 5V Measurement Simulation %Error
Min VIH = (VCC*0.7) (V) 3.5 3.6252 3.577
Min VIL = (VCC*0.3) (V) 1.5 1.4951 -0.327
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
7. High Level and Low Level Output Voltage
Circuit simulation result
5.0V
2.5V
Output
0V
V(R1:1) Input
5.0V
2.5V
SEL>>
0V
0s 5ms 10ms
V(V1:+)
Time
Evaluation circuit
U1
1A VCC
LO
1B 1Y
2Y 2B
GND 2A
V1 V2
V1 = 0 R1
V2 = 4.5
TC7WH02
TD = 0.5m 1MEG 4.5
TR = 3n
TF = 3n
PW = 1m
PER = 2m
0
Comparison table
VCC = 4.5V Measurement Simulation %Error
VOH (V) 4.5 4.4965 -0.078
VOL (V) 0 0 0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005