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1. Reliability Analysis of ICs
Submitted By: Shubham Singh
(Burn-In Mechanism)

2. Burn-In
• Burn-In described as an effective means for screening out defects
contributing to infant mortality.
• This screening typically combines electrical stresses with temperature
over a short period of time in order to activate temperature
dependent and voltage dependent failure mechanisms in a relatively
short time.
• It is one of the most widely used engineering method for removing
weak devices from a standard population which usually consists of
various engineering systems composed of device, parts or
components.

3. Problem with burn-In
• One of the major problems associated with the burn-In is the
determination of exactly how long in the burn-In the process should
continue, balancing appropriately the needs of reliability and the total
costs.

4. Burn-In Procedure

5. Levels of Burn-In
Three Levels of Burn-In
• Component Level Burn-In
• Subsystem Level Burn-In
• System Level Burn-In
Burn-In Policies at this Level

6. Types of Burn-In
1. Static Burn-In
2. Dynamic Burn-In
3. Steady State Burn-In
4. Sequential Burn-In
5. Markov Burn-In
Test During Burn-In
Operating Environment
• To determine which type of Burn-In is appropriate for a given system,
we need to know the types of possible defects and the extent to which
these defects are activated by the various techniques.

7. Performance Criteria
Following performance based criteria should be incorporated in a
general cost structure
• Maximum Mission Probability
Let 𝜏 be a fixed mission time and R(t)=1-F(t). Find burn in time which
maximizes,
i.e. find tb such that given the reliability to optimal burn-in time the probability
of completing the mission is as large as possible

8. Performance Criteria
• Maximum Mean Residual Life
Let X be a lifetime, find the burn-In time that maximizes
i.e. find the burn-In time which gives the maximum mean residual life.
• Minimum Burned-In Components
Let {Nb(t), t ≥ 0} be a renewal process of lifetime which are bounded-In for t0
time units. For a fixed mission time 𝜏 find the burn-In time tb which minimizes
E[Nb(t)]
i.e. the mean number of burned-In components which fail during mission time
𝜏.

9. Performance Criteria
• Maximum Warranty Period
For a fixed 𝛼, 0< 𝛼 <1 , find the burn-In time tb which maximizes
i.e. find the burn-In time which gives the maximal warranty period 𝜏 for which
at most 𝛼-percent of items will fail.

10. References
• Reliability, Yield, and Stress Burn-In A Unified Approach for
Microelectronics Systems Manufacturing Software Development by
Way Kuo, Wei-Ting Kary Chien, Taeho Kim

11. Thank You!