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U tokyo 2019
1. Study on new mechanisms for improving
performance of two-photon excitation
fluorescence microscopy using temporal focusing
Song, Qiyuan
Kannari Lab, Keio University
Midorikawa Lab, Riken Center for Advanced Photonics
23/06/2019
3. Wide-field Microscopy Confocal Microscopy
共聚焦显微镜
Example: 2D Image of lily pollen grain
Microscope is focused in a mid depth plane
Without sectioning ability, out-of-focus blurred image is remained 3
6. k1
-k2
OTFzx PSFzx
Image spatial frequency is a differential combination of any two possible
emission electric field vectors: 𝑒𝑖 𝑒𝑗
∗
-k3
-k4
-k5
∆𝑘 𝑥
∆𝑘 𝑧
𝐻 𝐻
6
ki:
any possible
emission
Wavevector
ki-kj:
image intensity
spatial frequency
𝑒𝑖 = exp −1𝑘𝑖 𝑟
7. Definition of sectioning ability
光学切片能力: 从一本书里读一页纸
纸片厚度
𝐼 𝑧 = 𝐻⨂𝛿 𝑧 = 𝐻𝑑𝑥𝑑𝑦; wide-field imaging, 𝐼 𝑧 =constant
⨂ 卷积
In Fourier domain
𝐼 𝑘 𝑧 = 𝐻𝑒−𝑖0𝑥
𝑒−𝑖0𝑦
𝑒−𝑖𝑘 𝑧 𝑧
𝑑𝑥𝑑𝑦𝑑𝑧 = 𝐻 0,0, 𝑘 𝑧 ; wide-field imaging, 𝐼 𝑘 𝑧 = δ(𝑘 𝑧)
It is easy to check whether there is optical sectioning ability by checking 3D OTF
missing cone
7
14. Commercial TPEF Microscopy
∼30fps 512×512pixels
Limitation of Scanning Mirror
Resonant Frequency ∼10kHz
Limitation of sampling rate of
laser source ∼20fps×2k×2k
How fast is TPEF microscopy?
12
27. G. Zhu et al., Optics Express, 13 2153 (2005)
By using spatial disperser, only at focal
plane the pulse is shortest
Out-of-focus pulse is chirped
14
光栅
28. Second-Order Phase Modulation
Temporal Focusing—Quadratic Phase
Z=0
Z=Z0
Z=2Z0
Spatial Focusing—Quadratic Wavefront
Z=0 Z=Z0 Z=2Z0
• In order to modulate the pulse duration, we can modulate the
spectrum second order phase.
• If frequency is linear to space coordinate, then we succeed.
x
G. Zhu et al., Optics
Express, 13 2153
(2005)
29. Li-Chung Cheng et al.,
Opt. Express, 20, 8939 (2012)
200μm×100μm @ 200Hz
Hod Dana et al.,
Nat. Commun., 5, 3997 (2014)
600μm×1000μm×200μm
@ 10 volumes/sec
>1000 developing cells
Use chirped amplified laser (CPA) with temporal focusing to realize fast TPEF
imaging in TF microsocpy
Brownian motions of 1mm beads
Neuron Networks’ functional imaging
16
30. 时空聚焦显微镜的光学切片能力要比点扫描型差!!!
3.7RZ um
int
2
( )
1
1 ( )
Po Scanning
R
I z
z
z
2
( )
1
1 ( )
TF
R
I z
z
z
Thickness of page image
TF is one-dimensional focusing
system, objective lens is two-
dimensional
TF
17
31. Due to scattering, Strong out-of-focus fluorescence on the surface will decrease
the image contrast in deep imaging. It is important to suppress the out-of-focus
excitation intensity (increasing n).
4
Scattering Excitation
x
z z
Image
Intensity
~1/zn n is important
32. K. H. Kim et al, Opt.
Express, 2007
散射的荧光成为了背景光 限制成像深度
Sample
Scattering light
Ballistic light
Parallel detector
18
33. <50nm lateral resolution, Mats G. L. Gustafsson, PNAS, 2005
Wide-filed microscopy Super-resolution microsocpy
To observe 树突棘 (< 2 mm), 轴突 (0.1 mm – 10 mm), 突触 (20-200 nm), we have
to beak the diffraction limitation ~ 200nm lateral, 500nm axial direction (FWHM of
PSF). 19
36. Pulse front tilting supports self-line scanning
Trainset beam size is comparable to a line focusing microscopy
Pulse front tilting in Temporal focusing
Around focal plane
( ) ( )c
2
Delay x
( , ) ( , )E t x A t Delay x
( , ) ( , )exp( ( ))cE x a x ikx
Fourier Transform
36
15
37. Coupling between Time and space in TF
At Focal Plane Outside Focal Plane
Propagation
(Diffraction)
x
t
FTL
Pulse
Transient
Beam waist
Image
Size
Scanning Time
t
x
x
t
Chirped
Pulse
Broadened
Transient Beam
Image
Size
Scanning Time
t
x
• Fix temporal point at every axial position, it’s spatial focusing
• Fix spatial point at every axial position, it’s temporal focusing
38. 2D tilting of pulse front
Discrete in additional dimension
Transient beam at focal plane
our innovation:
2D Self-Scanning
Scan Line by Line
beam at focal plane
α
Focal Plane
A Pulse in 1D-TF
Transient beam at focal plane
1D-TF:
1D Self-Scanning
Line Scanning
beam at focal plane
Review the case of 1D-TF
α
β
Focal Plane
our innovation: a 2D-tilted
pulse front
23
x
Lateral
direction
y
Lateral
direction
z optical axis
Axial direction
42. Objective
Lens
2D spatial chirp
Periodic in additional
dimension
750nm-700nm
700nm-650nm
650nm-600nm
600nm-550nm
550nm-500nm
Chirp
Periodic
chirp
Objective
Lens
Chirp
Review the case of
1D-TF
α
Focal
Plane
α
β
Focal
Plane
Our innovation of
2D-TF
25
Period: Free Spectral Range (FSR)
43. Both envelope-pulse and intra-
pulses are manipulated. Thus
focusing power is enhanced.
Scanningless, frame rate as high
as the reparation rate of laser
source, kHz~MHz
26
We first time invent and analyze the 2D-TF,
which will enhance the ‘focusing power’ for TF
45. Angular
dispersion
θ
Angular Dispersion
Zoom In
Z
X
θ
Wave Front
2 2
( , 0, ) cos( ( ))
( 1 ( ) ) 0.5 ( )
w x z k r kz w
kz w kz kz w
• Angular dispersion offer us the second order spectrum
phase whose value is proportional to the axial position
( ) ( )cw w w
27
or Y
47. 2
2 -
1
( )D TFI z
z
32
Laser source: chirped pulse
amplification (CPA) laser,
50fs, 1 kHz repetition rate
We first time achieve scanning-less
TPEF microscopy with out-of-focus excitation decay
speed of (1/𝑧)2
for TF
48. Setup Axial resolution
comparison
We first time realize VIPA-based 2D-TF microscopy
Sectioning resolution is 1.3 mm for objective lens with NA = 1.2 in 2D-TF
compared to 2.2 mm in 1D-TF, 1.7 times improvement by our new 2D-TF idea
The sectioning resolution of 1.3 mm is world record for scanningless TPEF
microscopy by using TF technology without any post-processing 33
54. Reference Beat image
High Spatial
Frequency
Low Spatial
Frequency
Mats G. L.
Gustafsson,
J. Microsc. 198,
82 (2000);
Original image
Structured illumination
Spatial frequency 𝑘
Optical
Transfer
Function
Image
high spatial
frequency
Interferometry
Spatial frequency
Beat image makes high spatial frequency components
JUMP INSIDE the optical transfer function (OTF)
38
In 1999, Rainer
Heintzmann, Mats G.L.
Gustafsson invented
structured illumination
microscopy for super-
resolution
55. D. Dan, et al. Sci. Rep. 3,1116(2013)
M. A. A. Neil et al. Opt. Lett. 22,1905(1997)
k1 k2
Objective
Lens
∆k=k1-k2
Illumination
Light Field
Excitation Intensity -∆k=k2-k1
DC1=k1-k1 DC2=k2-k2
𝐼𝑒𝑥𝑐 =
1 + cos(∆𝑘𝑥 + 𝜑0)
𝑒 𝑖𝜑0
/2 𝑒−𝑖𝜑0
/2
𝑒 𝑖𝜑0 𝑒−𝑖𝜑0
𝑒 𝑖0 𝑒 𝑖0
39
56. 𝐼 𝑟𝑎𝑤 𝑖𝑚𝑎𝑔𝑒 = 𝐼 𝑠𝑎𝑚𝑝𝑙𝑒 𝐼 𝑒𝑥𝑐 ⨂ℎ
𝐼 𝑟𝑎𝑤 𝑖𝑚𝑎𝑔𝑒 = 𝐼s𝑎𝑚𝑝𝑙𝑒⨂ℎ + 𝐼𝑠𝑎𝑚𝑝𝑙𝑒cos(∆𝑘x + 𝜑0)⨂ℎ
Beat Image
𝐼 𝑟𝑎𝑤 𝑖𝑚𝑎𝑔𝑒 = 𝐼 𝑠𝑎𝑚𝑝𝑙𝑒ℎ +
𝐼 𝑠𝑎𝑚𝑝𝑙𝑒 (𝑘 − ∆𝑘)𝑒 𝑖𝜑0ℎ +
𝐼 𝑠𝑎𝑚𝑝𝑙𝑒(𝑘 + ∆𝑘)𝑒−𝑖𝜑0ℎ
𝐼 𝑆𝐼𝑀𝑖𝑚𝑎𝑔𝑒 = 𝐼 𝑠𝑎𝑚𝑝𝑙𝑒 × {ℎ + ℎ(𝑘 + ∆𝑘) + ℎ(𝑘 − ∆𝑘)}
In Fourier domain
DC Image
0th order
+1st order
Target
Separate each order image
Compensate offset phase
Shift back each order image in spatial frequency domain
-1st order
ℎ: Point Spread Function of Widefield imaging
40
57. time
Number of
measurement
I
t1 t2 t3
𝜑0
+1st and -1st order component
2𝜋/3 2𝜋/3 2𝜋/3 0th order component
In Fourier domain
j=0th order
j=+1st orderj=-1st order
I1 I2 I3
𝐼𝑗 =
𝑚=1
3
𝐼 𝑚 𝑒−𝑖2𝑗𝑚𝜋/3
41
Number of
measurement
58. 𝐼 𝑆𝐼𝑀𝑖𝑚𝑎𝑔𝑒 = 𝐼 𝑠𝑎𝑚𝑝𝑙𝑒 × {ℎ + ℎ(𝑘 + ∆𝑘) + ℎ(𝑘 − ∆𝑘)}
Effective Optical Transfer Function (OTF)
Effective Point Spread Function (PSF):
ℎ 𝑆𝐼𝑀𝑖𝑚𝑎𝑔𝑒 = ℎ × 𝐼 𝑒𝑥𝑐
Widefield image SIM raw image
SIM raw image Separated images SIM image
SIM image
kx
ky
x
y
R. Heintzmann and M. G. L. Gustafsson, Nat. Photonics 3 362 (2009)
42
61. M. G. L. Gustafsson et al, Biophys. J, 94 4957 (2008)
There is no beat image in z
direction due to z scanning
𝐼 𝑠𝑎𝑚𝑝𝑙𝑒cos(∆𝑘 𝑧 𝑧) ∗ h
There is no need to shift back
in axial spatial frequency
domain
ℎ 𝑒𝑓𝑓 = ℎ𝐼 𝑒𝑥𝑐
B. Balley et al, Nature, 366 44 (1993)
Standing Wave Fluorescence Microscopy
𝐼 𝑠𝑎𝑚𝑝𝑙𝑒 ∗ {hcos ∆𝑘 𝑧 𝑧 }
k
kz
63. Around focal plane
Modulation occurs not only in
lateral direction but also in
axial direction!!!
46We first time invent the idea to use 3D-SIM algorithm for TF
𝜃
64. Missing cone is further filled by axial shift of OTF
Both lateral and axial frequency support is enhanced beyond diffraction
limitation
47
65. 48
We first time invent the
method to implement 3D-
interferometric pattern for TF.
y
z
Measured 3D-
interferometric pattern
CPA fiber laser:
1055 nm,
104 fs,
200 kHz
67. DMD throughput is 54% without pattern, 27% with pattern
Use DMD in TF for patterning
49
68. 0-200 mm depth,
200 nm fluorescent beads
(540/560);
Density: 2.3×1011 beads/mL;
50
First time 3D super-
resolution image in
scanningless TPEF
microscopy
69. TF: axial resolution 820 nm; lateral resolution 300 nm
3D-ITF: axial resolution 660 nm; lateral resolution 180 nm
Spatial resolution improves ~1.6 times in lateral, ~1.2 times in axial direction,
compared to diffraction limited value in TF.
At the first time, 3D super-resolution scanningless TPEF microscopy
51
70. 52
First time 3D super-resolution imaging for scanningless TPEF
microscopy
Imaging depth at(a,b)45 μm and (c, d) 162 μm
72. kx
ky
As there is overlapping region in
spatial domain, we can search
modulation frequency from the
image
73. Temporal focusing (TF):1.7 mm
Three-dimensional temporal focusing (3D-ITF): 0.67 mm
Edge of Rhodamine B bulk solution, excitation wavelength 1055 nm
A world record sectioning resolution in scanningless TPEF microscopy
75. K. H. Kim et al.,
Opt. Express, 15, 11658 (2007)
The scattered fluorescence becomes background
limits the imaging depth
Sample
Scattering light
Ballistic light
2D Detector
54
76. Camera
We first time find out that signal and scattered emission is able to be
discriminated by structured illumination in TF 55
77. We first time remove
the scattered
background in TF
200nm-beads
(540/560), 2.3×1011
beads/mL
2mm-beads (535/575),
9×108 beads/mL
56
78. As a result, the imaging
contrast is enhanced by
our new 3D-ITF method.
57
82. REDUNDANCY(I.E., COPY OF DATA)
We need reliable delivery of
information over unreliable
communication channels.
Simple solution by backups
In spatial domain
In time domain
Even in frequency domain
Redundancy could be applied to
microscopy to construct reliable
image with optical distortions
60
87. With emission wavefront distortion, 3D-ITF could loss sectioning ability like
3D-SIM. Again the redundancy recovers the spatial frequency support
along kz axis so that shows resistance of sectioning ability in 3D-ITF.
On the other hand, TF lose the sectioning ability due to large amount of
background fluorescence.
Astigmatism Spherical aberration
65
89. Point
scanning
TF 2D-TF 3D-ITF
Excitation
region
Point Wide-field Wide-field Wide-field
Sectioning
ability
~1/z2 ~1/z ~1/z2 ~1/z
Point
scanning
TF 2D-TF 3D-ITF*
Spatial
resolution
Diffraction
limitation
Diffraction
limitation
Diffraction
limitation
Super-
resolution
Scattered
emission
background
No problem problem problem No problem
Optical
distortion
affection
problem problem problem has
resistance
Two photon excitation
Fluorescence image
* 3D-ITF fluorescence image requires post-processing from multiple raw images
8