ARC's Wil Chin's PAM Presentation from ARC's 2008 Industry Forum in Orlando, FL.

1. Wil Chin
Research Director
ARC Advisory Group
wchin@ARCweb.com
Plant Asset Management
Communication Challenges

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What is PAM?
Utilities
Mechanical
Equipment
Wiring
Valves
Motors
Machinery
Analyzers
Field
Devices
Workers
Switch-
gear
PAM
PAM Solutions Monitor and Protect Assets
Provide Predictive Asset Health Information
Enable Workers to Analyze, Maintain, and Optimize
Assets to Increase Production Availability

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Automation
system
Inspection
Other
Online monitoring
system
What is Your Primary Source of Plant
Asset Condition Information?
Periodical plant inspection
Operator
Automation system (e.g. DCS)
Online monitoring system
Other
8.5 %
16.0 %
52.8 %
12.3 %
10.4 %
Operator

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Which Assets are Appropriate for PAM?
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Field devices
Electrical equipment
DCS, PLC, networks
Logistical equipment
Machinery
Building equipment
Process equipment
Packaging equipment
Process units
Package Units
Plants
Other
69.4 %
47.7 %
58.6 %
11.7 %
69.4 %
11.7 %
72.1 %
18.0 %
34.2 %
43.2 %
31.5 %
1.8 %

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Do Deploy Field Devices Enabled with
HART, Foundation Fieldbus or Profibus?
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None
HART
Foundation Fieldbus H1
Foundation Fieldbus HSE
Profibus PA
Profibus DP
Other
7.2 %
72.1 %
28.8 %
8.1 %
47.7 %
55.0 %
3.6 %
None
HART
Foundation Fieldbus H1
Foundation Fieldbus HSE
Profibus PA
Profibus DP
Other

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Yes (73)
No
(32)
Do You Use an EAM System for
Management and Maintenance Activities?
Yes
No
69.5 %
30.5 %

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What Obstacles are Inhibiting the Growth
of PAM?
Other
806040200
Lacking standardization (field devices, machines, components, etc.
Non existing standardization (field devices, machines, components, etc.
Lack of integration of Plant Asset information, interoperability
Non existence of integration of Plant Asset information, interoperability
Complexity of the technologies (e.g., fieldbus
technology, device descriptions, system, etc.)
Expenses for engineering and support of PAM applications
42.3 %
16.2 %
53.2 %
28.8 %
32.4 %
65.8 %
4.5 %

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© ARC Advisory Group0% 20% 40% 60% 80% 100%
Field device diagnosis
Valve monitoring
Partial stroke test of instruments
Oil analysis
Vibration analysis (rotating equipment)
Sound emission analysis
Thermography
Corrosion monitoring
X-ray radiography
Netw ork monitoring
Electrical equipment monitoring
Alarmmonitoring
Controller performance analysis and monitoring
Soft sensors
Sterility monitoring
Biosensors for fermenter monitoring
Structured plant inspection
Principles, methodology
Accuracy
Robustness, reliability
Interoperability, ease of integration
standardization
Cost/Value ratio
Which Aspects Require Improvement?

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The Future of PAM Needs Interoperability
Detect
Analyze
Correct
Deliver
Integrating Information from Plant Systems, People,
Field Devices, and Applications in Real Time!

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Machinery Process
Supervisory
Control
I/O
Device
PROFInet
DP, PA
NETWORKLEVEL
TYPE OF CONTROL
HSE
H1
PAM Requires Interoperable
Communication Technologies
Interoperability

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Possible Communication Solutions - EDDL
 EDDL acronym for Electronic Device Description
Language used by Fieldbus Foundation, HART, and
Profibus
 EDDL - text-based language, describes digital
communication attributes of intelligent field devices
 Enables host to setup, calibrate, and maintain devices-
meets IEC 61804-2
 EDDL Cooperative team (ECT) - FF, HCF and PNO,
 Enhanced EDDL - graphic visualization and persistent
data storage
 EDDL -operating system independent and host system
independent.
 OPC Foundation joined the ECT to enhance integration

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Possible Communication Solutions - FDT
 FDT is an open universal device communication interface
 Facilitates interoperability to distribute information
 Communication protocol independent- Foundation
Fieldbus, HART, Profibus and others
 Connects old and new legacy assets
 Complements to EDDL- FDT require DDL to function
 Higher cost can be offset by improved user efficiency
 EDDL Cooperation Team (ECT) and the FDT Group agreed
to combine efforts and work toward a unified solution
for device integration
 The unified solution will based on the upcoming OPC
UA technology

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Next Steps
 Confused?
 Our next speakers will provide practical
advice:
• Tom Kuperij, General Manager of WIB
• EDDL and FDT Test Results
• Mr. Sven Seintsch- BIS-Prozesstechnik
• EDDL
 Conclude with an interactive roundtable
discussion

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Thank You.
For more information, contact the author at
wchin@arcweb.com or visit our web pages at
www.arcweb.com