"Federated learning: out of reach no matter how close",Oleksandr Lapshyn
TC7S08F PSpice Model (Free SPICE Model)
1. All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
Device Modeling Report
Bee Technologies Inc.
COMPONENTS : CMOS DIGITAL INTEGRATED CIRCUIT
PART NUMBER : TC7S08F
MANUFACTURER : TOSHIBA
2. All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
GND
INA
OUTY
VCCINB
U1
TC7S08
SPICE MODEL
*$
*PART NUMBER: TC7S08F
*MANUFACTURER: TOSHIBA
*2-INPUT AND GATE
*All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
.SUBCKT tc7s08 A B Y DPWR DGND
+ params: MNTYMXDLY=0 IO_LEVEL=0
U1 and(2) DPWR DGND
+ A B Y
+ D_7S08 IO_S08 MNTYMXDLY={MNTYMXDLY}
+ IO_LEVEL={IO_LEVEL}
.ends
.model D_7S08 ugate (
+ tplhty=4.2ns tplhmx=25ns
+ tphlty=4.6ns tphlmx=25ns )
.model IO_S08 uio (
+ drvh=87 drvl=87
+ inld=5pF
+ AtoD1="AtoD_S08" AtoD2="AtoD_S_NX08"
+ AtoD3="AtoD_S08" AtoD4="AtoD_S_NX08"
+ DtoA1="DtoA_S08" DtoA2="DtoA_S08"
+ DtoA3="DtoA_S_E08" DtoA4="DtoA_S_E08"
+ tswhl1=2.742ns tswlh1=2.758ns
+ tswhl2=2.742ns tswlh2=2.758ns
+ tswhl3=2.751ns tswlh3=2.763ns
+ tswhl4=2.751ns tswlh4=2.763ns
+ DIGPOWER="DIGIFPWR" tpwrt=2ns
+ )
.subckt AtoD_S08 A D DPWR DGND
+ params: CAPACITANCE=0
C1 A DGND {CAPACITANCE+0.01pF}
X1 DGND A S_CLAMP
X2 A DPWR S_CLAMP
ENORM NORM DGND VALUE={V(A,DGND)/(V(DPWR,DGND)+1U)}
O0 NORM DGND DO7S08 DGTLNET=D IO_S08
.ends
.subckt AtoD_S_NX08 A D DPWR DGND
6. All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
Truth Table
Circuit simulation result
Evaluation circuit
Comparison table
Input Output
An Bn Yn (Measurement) Yn (Simulation)
%Error
L L L L 0
TimeTime
0s 0.5us 1.0us
U1:A
U1:B
Y1
0
0
0
LO
R1
1MEG
Y1
0
LO
GND
INA
OUTY
VCCINB
U1
TC7S08
V1
5
7. All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
Truth Table
Circuit simulation result
Evaluation circuit
Comparison table
Input Output
An Bn Yn (Measurement) Yn (Simulation)
%Error
L H L L 0
TimeTime
0s 0.5us 1.0us
U1:A
U1:B
Y1
0
1
0
0
HI
V1
5
LO
Y1
GND
INA
OUTY
VCCINB
U1
TC7S08
R1
1MEG
8. All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
Truth Table
Circuit simulation result
Evaluation circuit
Comparison table
Input Output
An Bn Yn (Measurement) Yn (Simulation)
%Error
H L L L 0
TimeTime
0s 0.5us 1.0us
U1:A
U1:B
Y1
1
0
0
GND
INA
OUTY
VCCINB
U1
TC7S08
R1
1MEG
V1
5
LO
HI
0
Y1
9. All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
Truth Table
Circuit simulation result
Evaluation circuit
Comparison table
Input Output
An Bn Yn (Measurement) Yn (Simulation)
%Error
H H H H 0
TimeTime
0s 0.5us 1.0us
U1:A
U1:B
Y1
1
1
1
R1
1MEG
Y1
HI
HI
V1
5
0
GND
INA
OUTY
VCCINB
U1
TC7S08
10. All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
High Level and Low Level Input Voltage
Circuit simulation result
Evaluation circuit
Comparison table
VCC = 4.5V Measurement Simulation %Error
VIH (V) 3.15 3.218 2.159
VIL (V) 1.35 1.3455 -0.333
Time
0s 1.0ms 2.0ms 3.0ms 4.0ms
V(R1:1) V(V1:+)
0V
2.5V
5.0V
Output
Input
R1
1MEG
V1
TD = 0.5m
TF = 0.1m
PW = 1m
PER = 2m
V1 = 0
TR = 0.1m
V2 = 4.5
V2
4.5
GND
INA
OUTY
VCCINB
U1
TC7S08
0
HI
11. All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
High Level and Low Level Output Voltage
Circuit simulation result
Evaluation circuit
Comparison table
VCC = 4.5V Measurement Simulation %Error
VOH (V) 4.5 4.4955 -0.1
VOL (V) 0 0 0
Time
0s 5ms 10ms
V(V1:+)
0V
2.5V
5.0V
V(R1:1)
0V
2.5V
5.0V
SEL>> Output
Input
HI
R1
1MEG
GND
INA
OUTY
VCCINB
U1
TC7S08
V1
TD = 0.5m
TF = 3n
PW = 1m
PER = 2m
V1 = 0
TR = 3n
V2 = 4.5
0
V2
4.5