The Optoplex III P is an in-line measurement system that can measure up to 50 transmission or reflectance positions per PC at speeds up to 20 measurements per second. It uses a halogen light source and diode array spectrometer to measure the spectral transmission, reflectance, color, and optional sheet resistivity of samples between 380-1000 nm wavelength with 3.3 nm intervals at a 16-bit resolution. Data is analyzed and displayed using software on a connected PC under Windows XP, including color evaluations in various color spaces and the ability to compile and store up to 6 illustrations per monitor.