This document summarizes the Nanoeducator II scanning probe microscope. It is a new generation educational and research tool produced by NT-MDT with over 20 years of SPM market experience. The Nanoeducator II has two measuring heads, one for educational force microscopy and one for research-grade atomic force microscopy. It provides high-resolution imaging, easy operation and strong support for students and researchers.

1. Nanoeducator II – new generation of educational and Basic research toolAndrew Shubin, VP Marketing, NT-MDT

2. History and Background20 years on the SPM market

3. Over 3800 devices in 59 countries

4. 250 experts in HQ offices

5. 30+distributors worldwideOur mission“To enablescientists to conduct nanoscaleresearch by creating advancedinstruments for nanotechnology”Professor Victor BykovNT-MDTFounder andGeneral Manager

6. World-wide Distribution

7. Global RepresentationNT-MDT Head Office,Moscow, RussiaNT-MDT ShanghaiShanghai, ChinaNT-MDT EuropeEindhoven, NLRepresentativeOfficesNT-MDT S&LLimerick, IrelandNT-MDT AmericaSanta Clara, USA

8. NT-MDT Development, Tempe, ArizonaToaddresstheincreasingactivityof NT-MDT onthe US andworldmarketsofscanningprobemicroscopyinstrumentation, thecompanyhas invited theexperienced AFM developersandpractitioneers: Sergei Magonov, John Alexander and Sergey Belikov toformtheresearchunit NT-MDT Developmentin Tempe, Arizona. Thisteam, whichhasacombined SPM experienceofalmost 60 years, willfocusitseffortsondevelopmentandapplications ofnovelmulti-frequency SPM techniques relatedtoquantitativenanomechanicalandelectricmeasurementsofvariousmaterials. ThecompanywillstartoperationsinApril 2011. Dr. Sergei Magonov was educated in the former USSR where he got his PhD and has conducted research on polymers in the RussianAcademy of Sciences. In 1988 Dr. Magonov moved to Germany (Freiburg University) where he started to apply first scanning tunneling microscopy (STM) and later atomic force microscopy (AFM) to different materials. The scientific results obtained in this period were summarized in the book (written jointly with Prof. M. Whangbo) “Surface Analysis with STM and AFM”, VCH Weinheim 1996. In 1995 Sergei joined Digital Instruments – the leading manufacturer of the scanning probe microscopes where he was involved in development of various AFM applications to soft materials. After spending 12 years with Digital Instruments/Veeco Instruments he moved in 2007 to Agilent Technologies – another manufacturer of scanning probe microscopy, where he was continuing research in AFM. He is the author of 13 chapters/reviews and 175 per-review papers.

9. Product LinePrice range, Euros

10. NANOEDUCATOR IINew generationof scientific training laboratoriesfor nanotechnology

11. NANOEDUCATOR IINew model advantages AFM head availability

12. Low noise - High resolution

13. Fast scanning

14. New digital controller

15. Closed-loop X,Y,Z scanner

16. Even more easy adjustmentsTWO Measuring HEADSForce Probe Head – for educational purposesThe force-probe is a piezo-tube driven into oscillation by a sinewave voltage applied to two electrodes (inverse piezo-effect) and the oscillation amplitude is measured by the voltage generated across the other two electrodes (direct piezo-effect).AFM head – for the research purposesSemiconductor laser-photodiode registration system

17. Technical characteristics

18. Basic Operation ModesAtomic Force Microscopy (AFM): Topography imaging

19. Phase imaging

20. Force imaging

21. Force spectroscopy

22. Scanning Tunneling Microscopy (STM):