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International Journal of Electronic Design and Test (JEDT)
https://airccse.com/jedt/index.html
Scope & Topics
International Journal of Electronic Design and Test (JEDT) is a peer-reviewed, open
access journal which invites original works describing the methods used to design and
test electronic product hardware and supportive software. Authors from industry and
academia are invited to submit their original unpublished research works on the topics
listed below:
Topics of Interest include but are not limited to, the following
 IC/module design
 Low-power design
 Electronic design automation
 Design/test verification
 Fault modelling
 Test generation
 Fault simulation
 Design of testability
 Synthesis of testability
 Built-in self-test
 Test specifications
 Formal verification of hardware
 Simulation for verification
 Design debugging
 Testing of VLSI devices printed circuit boards, and electronic systems
 Testing of analog and digital electronic circuits
 Testing of microprocessors, memories and signal processing devices
 SOC and SIP testing
 Memory and FPGA test and repair
 Delay testing
 IDDQ test
 Novel test methods
 Effectiveness of test methods
 Fault models and ATPG, and DPPM prediction
 DFT for analog/mixed signal ICs and system-on-chip
 DFT and BIST for digital and SoC
PaperSubmission
Authors are invited to submit papers for this journal through Submission System .
Submissions must be original and should not have been published previously or be under
consideration for publication while being evaluated for this Journal. For paper format
download the template in this page
Important Dates
 Submission Deadline : March 19, 2022
 Notification : April 19, 2022
 Final Manuscript Due : April 27, 2022
ContactUs
Here's where you can reach us jedtjournal@yahoo.com or jedtjournal@airccse.com

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International Journal of Electronic Design and Test (JEDT)

  • 1. International Journal of Electronic Design and Test (JEDT) https://airccse.com/jedt/index.html Scope & Topics International Journal of Electronic Design and Test (JEDT) is a peer-reviewed, open access journal which invites original works describing the methods used to design and test electronic product hardware and supportive software. Authors from industry and academia are invited to submit their original unpublished research works on the topics listed below: Topics of Interest include but are not limited to, the following  IC/module design  Low-power design  Electronic design automation  Design/test verification  Fault modelling  Test generation  Fault simulation  Design of testability  Synthesis of testability  Built-in self-test  Test specifications  Formal verification of hardware  Simulation for verification  Design debugging  Testing of VLSI devices printed circuit boards, and electronic systems  Testing of analog and digital electronic circuits  Testing of microprocessors, memories and signal processing devices  SOC and SIP testing  Memory and FPGA test and repair  Delay testing  IDDQ test  Novel test methods  Effectiveness of test methods  Fault models and ATPG, and DPPM prediction  DFT for analog/mixed signal ICs and system-on-chip  DFT and BIST for digital and SoC PaperSubmission Authors are invited to submit papers for this journal through Submission System . Submissions must be original and should not have been published previously or be under
  • 2. consideration for publication while being evaluated for this Journal. For paper format download the template in this page Important Dates  Submission Deadline : March 19, 2022  Notification : April 19, 2022  Final Manuscript Due : April 27, 2022 ContactUs Here's where you can reach us jedtjournal@yahoo.com or jedtjournal@airccse.com