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All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
1
Device Modeling Report
Bee Technologies Inc.
COMPONENTS: SiC Schottky Barrier Diode
PART NUMBER: IDK05G65C5
MANUFACTURER: Infineon
REMARK: Professional Model
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
2
Circuit Configuration
DIODE MODEL PARAMETERS
PSpice
model
parameter
Model description
IS Saturation Current
N Emission Coefficient
RS Series Resistance
IKF High-injection Knee Current
CJO Zero-bias Junction Capacitance
M Junction Grading Coefficient
VJ Junction Potential
ISR Recombination Current Saturation Value
BV Reverse Breakdown Voltage(a positive value)
IBV Reverse Breakdown Current(a positive value)
TT Transit Time
EG Energy-band Gap
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
3
U1
IDK05G65C5
R1
0.01m
V1
0Vdc
0
R2
100MEG
V_V1
0V 0.5V 1.0V 1.5V 2.0V 2.5V 3.0V
I(R1)
0A
1A
2A
3A
4A
5A
6A
7A
8A
9A
10A
Forward Current Characteristics
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
4
Comparison Graph
Circuit Simulation result
Comparison table
IF (A)
VF (V)
%Error
Measurement Simulation
0.1 0.928 0.924 -0.43
0.2 0.955 0.952 -0.31
0.5 1.000 1.000 0.00
1 1.075 1.074 -0.09
2 1.190 1.190 0.00
5 1.510 1.517 0.46
10 2.040 2.037 -0.15
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
5
V(R)
100mV 1.0V 10V 100V 1.0KV
I(V2)/(650V/100u)
0
20p
40p
60p
80p
100p
120p
140p
160p
180p
200p
0
R
V1
TD = 0
TF = 100ns
PW = 100us
PER = 10m
V1 = 0
TR = 100us
V2 = 650
V2
0Vdc
R2
100MEG
U1
IDK05G65C5
Junction Capacitance Characteristic
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
6
Comparison Graph
Circuit Simulation result
Comparison table
VR(V)
C (pF)
%Error
Measurement Simulation
0.1 189.000 187.130 -0.99
0.2 185.000 183.500 -0.81
0.5 174.000 172.600 -0.80
1 158.000 158.200 0.13
2 138.000 136.700 -0.94
5 102.000 100.900 -1.08
10 77.000 74.800 -2.86
20 57.000 54.300 -4.74
50 38.500 36.800 -4.42
100 28.000 29.200 4.29
200 23.700 24.700 4.22
500 21.000 21.880 4.19
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
7
V_V1
100V 200V 300V 400V 500V 600V
I(R1)
1.0nA
10nA
100nA
1.0uA
10uA
R4
10G
U1
IDK05G65C5
V1
0Vdc
R1
100m
0
Reverse Characteristic
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
8
Comparison Graph
Circuit Simulation result
Comparison table
IR (A)
VR (V)
%Error
Measurement Simulation
1.00E-09 450.000 444.600 -1.20
1.00E-08 534.000 539.160 0.97
2.70E-07 650.000 650.800 0.12

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SPICE MODEL of IDK05G65C5 (Professional Model) in SPICE PARK

  • 1. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 1 Device Modeling Report Bee Technologies Inc. COMPONENTS: SiC Schottky Barrier Diode PART NUMBER: IDK05G65C5 MANUFACTURER: Infineon REMARK: Professional Model
  • 2. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 2 Circuit Configuration DIODE MODEL PARAMETERS PSpice model parameter Model description IS Saturation Current N Emission Coefficient RS Series Resistance IKF High-injection Knee Current CJO Zero-bias Junction Capacitance M Junction Grading Coefficient VJ Junction Potential ISR Recombination Current Saturation Value BV Reverse Breakdown Voltage(a positive value) IBV Reverse Breakdown Current(a positive value) TT Transit Time EG Energy-band Gap
  • 3. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 3 U1 IDK05G65C5 R1 0.01m V1 0Vdc 0 R2 100MEG V_V1 0V 0.5V 1.0V 1.5V 2.0V 2.5V 3.0V I(R1) 0A 1A 2A 3A 4A 5A 6A 7A 8A 9A 10A Forward Current Characteristics Circuit Simulation result Evaluation circuit
  • 4. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 4 Comparison Graph Circuit Simulation result Comparison table IF (A) VF (V) %Error Measurement Simulation 0.1 0.928 0.924 -0.43 0.2 0.955 0.952 -0.31 0.5 1.000 1.000 0.00 1 1.075 1.074 -0.09 2 1.190 1.190 0.00 5 1.510 1.517 0.46 10 2.040 2.037 -0.15
  • 5. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 5 V(R) 100mV 1.0V 10V 100V 1.0KV I(V2)/(650V/100u) 0 20p 40p 60p 80p 100p 120p 140p 160p 180p 200p 0 R V1 TD = 0 TF = 100ns PW = 100us PER = 10m V1 = 0 TR = 100us V2 = 650 V2 0Vdc R2 100MEG U1 IDK05G65C5 Junction Capacitance Characteristic Circuit Simulation result Evaluation circuit
  • 6. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 6 Comparison Graph Circuit Simulation result Comparison table VR(V) C (pF) %Error Measurement Simulation 0.1 189.000 187.130 -0.99 0.2 185.000 183.500 -0.81 0.5 174.000 172.600 -0.80 1 158.000 158.200 0.13 2 138.000 136.700 -0.94 5 102.000 100.900 -1.08 10 77.000 74.800 -2.86 20 57.000 54.300 -4.74 50 38.500 36.800 -4.42 100 28.000 29.200 4.29 200 23.700 24.700 4.22 500 21.000 21.880 4.19
  • 7. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 7 V_V1 100V 200V 300V 400V 500V 600V I(R1) 1.0nA 10nA 100nA 1.0uA 10uA R4 10G U1 IDK05G65C5 V1 0Vdc R1 100m 0 Reverse Characteristic Circuit Simulation result Evaluation circuit
  • 8. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 8 Comparison Graph Circuit Simulation result Comparison table IR (A) VR (V) %Error Measurement Simulation 1.00E-09 450.000 444.600 -1.20 1.00E-08 534.000 539.160 0.97 2.70E-07 650.000 650.800 0.12