Functional Test Automotive Seminar in Mexico

Functional Test
for Automotive Electronics
Manufacturing
Presented by:
Rodrigo Cantu
Agilent Technologies

Agenda

1. Automotive Market Overview

2. Automotive Electronics Functional Test

3. Functional Test Challenges

4. Agilent Functional Test Solutions

5. HEV/EV – Functional test & Solutions

6. Question & Answer (Q&A) Session

Automotive Electronics in Cars Today

Body Electronics - Powertrain & Hybrid
Comfort/Convenience
g. Engine management
j. Instrument Cluster h. Braking System
k. Remote keyless entry i. Power Steering
l. Climate Control
i f
j

d k
l
e
c
g
Air Conditioning
System Infotainment &
a Communications
h
b
d. Audio Systems
e. Multimedia Systems
Safety and f. Rear Seat Entertainment
Driver Assistance
a. Adaptive Cruise Control
b. Collision Warning
c. Tire pressure monitoring

Automotive Market and Applications

Powertrain and Hybrid Systems Body Electronics
 Gasoline and Diesel Engine Management  Convenience and Comfort ECU – Lighting,
 Automatic Gearbox and Transmission Climate Control, Memory Seats, etc.
 Hybrid Drive Train  Driver Assistance ECU – Night Vision, Cruise
Control, Park/Reverse Assist, etc.
 Security ECU – Remote Keyless Entry (RKE)

Safety and Chassis Infotainment and Telematics
 Airbag ECU – Conventional and Adaptive)  In-Car Entertainment – Radio, DAB/DVB, etc.
 Braking Systems – ABS and Traction Control  In-Car Networking – Bluetooth, WiMax, etc.
 Tire Pressure Monitoring Systems (TPMS)  Telematics – GPS Navigation
 Collision Avoidance Electronics – DSRC  Instrument Cluster – Dashboard

The Next Key Agenda for Automotive
Hybrid and Electric Vehicles

Remote Keyless Entry (RKE)

RF
Receiver

Remote Keyless Entry (RKE transmitter) – functional
test
Measurement
Instrument

Stimulate &
Measurement
Signal

Frequency Counter
 Response time

Voltage / Current
Source

 Battery leakage
current
Power Management
Spectrum Analyzer
 Power Analysis, e.g:
output amplitude,
center frequency
Power Supplies

Remote Keyless Entry (RKE receiver) – functional test

Stimulus Signal
Measurement
Instrument

Vector Signal Generator
 As transmitter ( generate
FSK/ ASK modulate data)

Frequency Counter

 Time elapse
Arbitrary Waveform Generator
 Immobilizer testing, e.g:
RFID simulate charge cycle,
ignition

Communication Power Management

CAN/LIN Transceiver Power Supplies

Infotainment System

Input RF signals

RF Power Output Audio Signal
Receiver Amplifier

Microcontroller
Radio station tower
Multi Channel
CAN Power Loudspeaker
Transceiver Supply
Bluetooth devices


GPS Satellite
CAN/LIN Transceiver Vehicle Battery

Infotainment System – functional test

Measurement
instrument

Input RF signals
RF Power
Receiver Amplifier Audio Generator +
Analyzer
 Power level
Vector Signal  Frequency response
Generator
Microcontroller  THD+N
 Generate modulated  SINAD
signal, e.g: GPS,  IMD
FM/AM/RDS  Crosstalk
CAN Power
Transceiver Supply

Wireless Connectivity
Communication Power Management Test Set
 Bluetooth test, e.g:
pairing, headset

CAN/LIN Transceiver Power Supply

Anti-Lock Braking System

Input Sensor

High Side
Switch Output Sensor
Wheel Speed Sensor Sensor Microcontroller
Receiver
Low Side
Switch

CAN Voltage
Transceiver Regulator Valves

Pump Motor



Anti-Lock Braking System – functional test

Sensor Input

Measurement
Arbitrary Waveform
Instrument
Generator High Side
 Wheel slippage Switch
detection Sensor
 Crosstalk
Microcontroller
Receiver
Low Side
Switch
Simulate and
Digital
Measurement Multimeter
CAN Voltage
Signal  Saturation voltage
Transceiver Regulator

Communication Power Management Digitizer
Voltage / Current  Saturation voltage
Source  Flyback voltage
 Flyback voltage
 Leakage current
CAN/LIN Transceiver Power Supply

Body Control Modules (BCM)

Sensor Inputs

Actuators
Wheel speed sensor

High Side
Switches

Switch Low Side
Monitoring
Microcontroller Switches
Throttle Actuator
Break Pedal Sensor
H-Bridges

CAN/LIN Power
Transceiver Supply

Brake Actuators
Radar Sensor


Throttle Plate Sensor

Body Control Modules (BCM) – Functional Test

Sensor Inputs Actuators simulated
simulated by Stimulus by Loads and output
Instrumentation are measured
Device Under Test
(ECU)
Arbitrary Waveform Generator Frequency Counter

Digital Analog
Converter
Data Acquisition Unit
 High Side Driver
 Analog Input  Low Side Driver
 Digital Input

Voltage/ Current Communication Power Management Digital
Source Multimeter

 Leakage Current  Connectivity
 Power On

Engine Control Modules (ECM)

Sensor Inputs
Actuators

Oxygen Sensor

Fuel Injector System

Input Output
Crankshaft Position Sensor
Microcontroller Actuators
Sensor

Throttle Air Bypass
CAN/LIN Power Solenoid
Transceiver Supply

Radar Sensor


EGR Shutoff Solenoid
Mass Air Injection
Sensor

Engine Control Modules (ECM) – functional test

Stimulus Actuators
Instrumentations simulated by
Loads and output
Voltage/ are measured
Current
Source

 Leakage current
Frequency Counter

Input Output
Sensor
Microcontroller Actuators

Arbitrary Waveform
Generator
 Knock Sensor CAN/LIN Power
Transceiver Supply Data Acquisition Unit
 High side driver
 Low side driver

Digital to Analog Digital
Converter Multimeter
 Analog Input
 Digital Input Power Supplies  Open/Short
 Starter Key CAN/LIN Transceiver  Power On

DUT-Assisted (Simulation) Testing Concept

Sensor Inputs Actuators simulated
simulated by Stimulus by Loads and output
Instrumentation are measured

Device Under Test
(ECU)
Frequency Counter
Arbitrary Waveform Generator

Digital Analog
Converter
Data Acquisition Unit

Voltage/ Current
Source Digital
Multimeter

Relays for Input High
Conditioning Current
Relays

Signal Routing and Load Simulation

Stimulus Switching Unit
Instrumentations
ECU

Arbitrary
Waveform Signal
Generator DAC Microcontroller
Routing
Measurement
Instrumentations Input Output
Conditioning Drivers

Power
Communication
Management
Frequency DMM
Counter Load
Simulation
Power Supply

How We Test the ECU Inputs?

Input Conditioning:
- Switch High (with or without loads)
- Switch Low (with or without loads)
- Bridge Load Connections

How We Test the ECU Outputs?

Output Load Simulation:
- Pull-Up (with or without loads)
- Pull-Down (with or without loads)
- Bridge Load Connections

How is UUT flashing done at functional test?

System UUT adapter(s)

Controller Aux. Equipment
Sensors, UUT(s)
(IPC) UUT(s)
Grounding UUT(s)
Switching
Resources
AUX Power
Supplies
UUT Power Fixture (base)
Supplies Platform support
(e.g. sensors,
Others pneumatic lock,
Flash device(s)
(e.g. Functional Test) electricity safety)

Flashing Station Test System Architecture

System

Controller Main
(IPC) Controller

Switching Switching
Resources Modules

AUX Power
Supplies
Power
UUT Power Supplies
Supplies
Others Functional
(e.g. Functional Test) Test

Functional Test Challenge #1 – Functional Test, Need Help?

“Functional Testing is as per customer requirement”
• Customer gives free will to how functional testing is performed
• Understands Pass / Fail…

“Understands importance of Functional Test but need expertise”
• Realizes that good functional test is essential to better yield, quality,
throughput…
• No expertise in production for functional testing / test development

“Team has no bandwidth to cover end of line testing”

• Interested to work with external parties for functional testing
implementation
• Need expert advice and hardware to make functional test a success

Functional Test Challenge #2 – Test Development Problems

Customized Cables

Self Designed
Connections/Circuits

Instruments

Cost $$$

We take these worries away from you!

Agilent
Standardization

Software Full range of Agilent Global
Integration through uncompromised
TestExec SL
Instruments support
Standard
Switch & Load Modules
Standard Design
Interconnect

Standard Cables

System built for
Automotive Tests

Functional Test Challenge #3 – Are you struggling with them?

Toyota recalled 8 million cars in total from 2008 to 2009
• Unwanted acceleration problems ( at least 58 crashes reported in US tied to this)
• NASA and NHTSA investigated found problems within electronic throttle control

Ford recalled 2.1 million trucks in 2011
• Airbags go off without warning
• Root cause, wiring placement caused short circuit triggering air bag blow off

General Motors recalled 1.4 million vehicles in 2010
• Fire Hazard problem from the heated wind shield washer fluid system
• Short Circuit in board causes ground wire to overheat and lead to fire

Most problems when drilled down, came to one common
answer: “Not tested / Test Not Covered / Not Enough
Coverage”

Or do you want to get to the next ADVANCE Level?
We can help you!
Areas: Test Methodologies, Quality & Test Coverage

Want to improve Technical Want to make the
your test coverage Know How best out of your
and confidence? for functional test?
Automotive
Functional
Test

How we help you to be successful?
Maverick Test: Achieve wider test coverage, better test confidence
Scenario: Not all pins are covered during a test, how do you know if there are
unwanted/unknown “remnant signals” or cross talks happening?
Pin No.
DUT Monitored Pins Expected State
14V 3ms V
P01 P09
3ms
P02 P10
3ms P09
3ms
P03 P11 0V
Agilent 3ms
P04 P12 P10
0V
M9216A 3ms
P05
P06
P13
P14
P11
0V
3ms
P07 P15 P12
3ms 0V
P08 P16 P13
0V
0V
T (ms) P14
0V
P15
0V
P16
14V
Pin No. T (ms)
14V 3ms
3ms
3ms
3ms
3ms
Agilent 3ms
M9216A 3ms
3ms
3ms

0V Pins under test
T (ms)
Pins under monitoring

Agenda






6. TS-8900 System Demonstration

Automotive FMT System Architecture

System Controller
(Software & IO)

Serial Communication

Power Sources

Interfaces: PXI, LXI, GPIB Analog Digital Power

Measuring/Stimulus
Instrumentation

DUT-Specific
Connections

Signal/Load
Switching

Device Under Test
Mass Interconnect
(DUT)

Agilent Functional Systems

TS-5400 New
TS-5020 U8972A

TS-5040

High Coverage &
High Performance Performance System
Mid-Size Test System System • Body Electronics
• ABS Sensors, • Body Electronics • Engine Control
Compact Test System • Climate Control • Engine Control • PXI-Based
• RKE • Tire Pressure • VXI-Based • Parallel Test Method
Monitoring (TPMS), Instruments
• Flashing
• Instrument Clusters
• Instrument Clusters

U8972A (Venturi S3) – System Architecture

1. 2.0m rack with solid door and extractor fan
2. 3-Phase only PDU with EMO switch
3. Power Distribution Unit (PDM)
4. Thermistor
U8972A 5. IPC backplane, CPU i5-2400, RAM 4GB, HDD 250GB
6. Windows 7, Agilent IO, TestExec SL 7.1, TS-5000 7.1
CORE 7. PXI-based instrumentation
8. 210 pin & 64 hi-power ICA blocks & cabling
9. N3300A eLoad mainframe & modules
10. 1kW and 400W Modular Power Supplies

Agilent PXI Instruments & Switch Load Unit Macpanel Blocks & Cabling N3300 E-Load Modular Power Supplies
Chassis

U8972A – VALUE PROPOSITION

Value 2
Floorspace
reduction

Value 1
Throughput
Improvement

Value 3
New Applications
Ease of use
Lower maintenance cost

U8972A Value Proposition 1 –
Throughput Improvement via ≥ 2-DUT test operation (Speed is KING!)

TS-5400 (Venturi S2)

DUT DUT Description E8786B U8972A %Savings
(Venturi S2) (Venturi S3)

Test 59s 39s
In-sequence test
Time/DUT
(s)
Est. Annual 285K 431K
output
per system
U8972A (Venturi S3) System $140K $179K
Price

DUT DUT
DUT $0.49 $0.41 15.4%
cost/system/
year

DUT DUT
Note:
Assumption made for Annual output calculation:
1 system is running at 80% capacity for 12 months with 2 shifts (8hr/shift)

Value Proposition 2 –
Floor space & Operator reduction of 50% vs. Venturi S2 via 2-DUT parallel
test support

E8786B
(Venturi S2)
DESCRIPTION 2x 1x %
DUT E8786B U8972A Savings
Test time/DUT (s) 29.5s 39s
E8786B (Venturi 2)
DUT vol. output/year 570K 431K
(K units)
Total system price $280K $179K
DUT (US$K)
System cost/DUT/year $0.49 $0.41
2-DUT test (US$)
Operator wages/DUT/year $0.04 $0.03
(US$)
U8972A
Total Cost/DUT/year (US$) $0.53 $0.44 17%
(Venturi
S3)
DUT

Note:
Operator wages & floor space cost vary from location to location
DUT
Assumption made for Annual output calculation:
1 system is running at 80% capacity for 12 months with 2 shifts (8hr/shift)

Parallel Test Method Enabler for Automotive

Conventional Method DUT
P01 P09
Output Pins 3ms

6ms DMM
 DMM + Pin Matrix P02
P03
P10
P11
9ms
12ms
P04 P12
 Sequential measurement P05 P13
18ms
15ms

P06 P14
21ms
 Path needs to be P07 P15
24ms
P08 P16
switched
Total Test time: 24ms*

DUT
New Method P01 P09
Output Pins 3ms
3ms
P02 P10
 M9216A HV-DAQ P03 P11
3ms
3ms
P04 P12
3ms M9216A
 Parallel measurement P05 P13
3ms
P06 P14
3ms

 Does NOT require an
P07 P15
3ms
P08 P16
external switch matrix
or multiplexer Total Test time: 3ms*
Speed Improvement = 87.5%

Agilent Switch Unit for Automotive

Stimulus and Measurement Load Simulations
Instrumentations

DUT
Pin Matrix Cards Load Cards
• User for DUT load simulation.
• Used for stimulus and • 8 to 48 channels per card.
measurement signal • Up to 30A current with fly-back
routing. protection.
• 32x4 and 64x4 pin matrix • Supports pull-up, pull-down, and
for selection. bridge load connection.
• Up to 24 instrument matrix. • Supports inductive/resistive
• Up to 4 analog bus lines. loads – single or multiple.

E6198B Switch/Load Unit (SLU)
Overview
New E6198B SLU
• Multi-channel support
• Improved reliability and safety
 Lower risk of backplane failure
 Utilization of fuses
• Introducing two versions, available for standalone orders

Standalone System Integrated

SLU Improvements
• Improvements to back plane for reliability and safety
• Break out panel for easy access to SLU settings
• Improved switching speed for better throughput

Introducing the NEW Standalone SLU

• Bench top usable SLU
• External access for cables with protective cover
• SLU setting selection at rear panel

MSD-FMT / SLU SHP & PRC/PC checkpoint
Agilent Restricted
09 June 2010 Page 40

E6198B Switch/Load Unit
Summary

• 150W 5v, 150W 12v and 25W for -12v power supply. Support full switching capability

• Power bus current rating increased from 22A to 30A.

• SLU dimension maintained. Compatible with existing system layout

• Backward compatible with all cards supported by existing SLU

• Fuse protection prevent over current from power supply

• Easy communication connection access at front panel via USB

• Status Indicators

• Qualified as standalone product

Agilent Restricted

E6198B Switch/Load Unit
Summary

New Load and Switch Cards

New Switch Cards New Load Cards

E8782A 64-Channel Matrix with N9377A 16-Channel Dual Load Card (7.5A)
Instrumentation Matrix

N9378A 24-Channel Quad Load Card (2.0A)
E8783A 64-Channel Matrix
without Instrumentation Matrix
N9379A 48-Channel Dual Load Card (2.0A)

Load Cards being Replaced
E6177B 24-Channel Load Card (2.0A) with current sense will replace the older
E6177A model without the I-sense capability

Agilent Restricted

Matrix & Load Cards from Agilent

SLU

E6198B

Pin matrix & load cards
Pin Matrix Cards
 E8782A-FG (24-ch inst, 40-ch matrix)
 E8783A-FG (64-ch matrix)

Load Cards
 E6175A-FG (8-ch, 7.5A, inductive load)
 E6176A-FG (16-ch, 7.5A common load)
 E6177A-FG (24-ch, 3A, low current load)
 E6178B-FG (8-ch, 30A, hi-current load)
 N9378A-FG (24-ch, 1A, lo-current, quad load)
 N9379A-FG (48-ch, 1A, lo-current, quad load)
 U7177A-FG (24-ch, 7.5A, common load, I-sense)
 U7178A-FG (8-ch, 40A, hi-current load)
 U7179A-FG (16-ch, 15A, hi-current load)

Market Dynamics

In vehicle – Drive system Outside vehicle - Infrastructure

Battery Management System

Electric vs Internal Combustion
Vehicle • Electric vehicle only constitute 2% of
100.0%
overall market opportunity today
• Infrastructure will be needed in order to
80.0%
make EV successful
60.0%
Light Duty Vehicles • Huge potential growth opportunity for
40.0% Electric Vehicles companies develop batteries, motors, on
20.0% board chargers and EV components that
0.0% enhance performance and safety
2010 2011 2012 2013 2014 2015
Source – Pike Market Research

EV /HEV modules
Battery

Cell Block / Module Pack

Inverter Converter Controller

Inverters Converters BMS

Acronym
BMS – Battery Management System

Agilent focus in HEV, EV & PHEV

Agilent’s focus
Inside the car Outside the car
• Battery Management System • Home charging station
• DC to DC converters • Public charging station
• DC to AC inverters

EV & HEV customer’s challenges

Product
certification
– CE and
Test Speeds safety
– Long test High system
certified with
time 3 – 12 uptime -
extraordinary
mins Designed for
safety
depending on manufacturing
features
the test and easy to
requirements troubleshoot

System price
– Optimized Floor space
power matrix – Solution that
and power optimize floor
supply for space usage
better cost

Acronym
ASP – Average Selling Price

Agilent EV, HEV and PHEV proposal

650mm 650mm 650mm
High Powered Agilent
650mm
Power supply and Eload Standard Platform
650mm 650mm
Value propositions
1. Leverage Agilent Standard
Power Customer’s
platform
Matrix None Compact power switching
2.
Standard• Less floor space required
• Easy maintenance
Functional safety features
3. High
test system
Fixture
DUT

DUT
Cooling
system

Power Supply and 3 Phase motor High power
Electronic Load and added Switch
1950mm
instruments

Agilent application specific value proposition (example)

Cell Balancing – Background information

• Balancing compensates for any underperforming cells in a
battery.
• During charge, a degraded cell with a diminished capacity will
become fully charged sooner so it will be subject to
overcharging until the rest of the cells reach their full charge.
• During discharging, the weakest cell will have the greatest
depth of discharge causing premature failure.
• Cell balancing extends the battery pack’s life by compensating
for weaker cells by equalizing the charge state on each cell.

Cell Balancing Challenges

• Could be a long process. In some cases, takes nearly 1 hour.

• If individual cells are balanced by discharging through resistors --

• Discharging circuit cost and complexity is low, but …

• Time is long: All cells must be discharged to lowest cell voltage.

• Limited control: Fixed R means one discharge rate; Using multiple
Rs to select discharge rate raises cost and complexity.

• Active balancing can significantly speed up balancing process
from 2x to 10x by charging some cells and discharging
others to balance to the mid-voltage point.

Active balancing with Agilent N6783A-BAT
Overview of process
Process:
• Measure voltage of each cell
N6783A-BAT • Calculate mid point (Vmid)
Cell 1 Charger-Discharger • Program cells above Vmid to
#1 = Charging discharge down to Vmid
N6783A-BAT • Program cells below Vmid to
Cell 2 Charger-Discharger charge up to Vmid
# 2 = Discharging • Cuts balancing time in half,
at a minimum
N6783A-BAT
Cell 3 Charger-Discharger
# 3 = Charging
Options:
…

…

• Further decrease balancing time
with higher charge/discharge rates
N6783A-BAT • Maintain cell safety with pulsed or
Cell N Charger-Discharger variable rates
# N = Discharging • Since charge/discharge function is
PC controlled one can develop
Some cells charging, some discharging more advanced algorithms to
optimize speed and complexity

Agenda







58

Functional Test Automotive Seminar in Mexico

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