This document describes using the linear sampling method to reconstruct the shape of two-dimensional dielectric targets from scattered field measurements. The linear sampling method solves an integral equation to determine if a test point is inside the target support. Regularization is used to address ill-posedness. Numerical results show the reconstructed shape varies slightly with frequency and accuracy improves with more transmitters/receivers. The method provides fast reconstruction of target support but not material properties. Future work includes extending to 3D imaging and using linear sampling method results to initialize other reconstruction algorithms.